Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2003
10/16/2003WO2003036687A3 Non-contacting capacitive diagnostic device
10/16/2003WO2003034386A3 Method and system for ramp control of precharge voltage
10/16/2003WO2002095586A3 Hierarchical built-in self-test for system-on-chip design
10/16/2003WO2002084786A3 Ultrafast sampler with coaxial transition
10/16/2003WO2002071083A3 Circuit for improved test and calibration in automated test equipment.
10/16/2003WO2002061913A3 Method of and apparatus for estimating the state of charge of a battery
10/16/2003WO2002037340A3 System and method for test generation with dynamic constraints using static analysis
10/16/2003US20030196179 Method and apparatus for fault injection using boundary scan for pins enabled as outputs
10/16/2003US20030196153 Test head utilized in a test system to perform automated at-speed testing of multiple gigabit per second high serial pin count devices
10/16/2003US20030196152 Method of testing a circuit using an output vector
10/16/2003US20030196151 Test system rider board utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices
10/16/2003US20030196150 Differential self-test of input/output circuits
10/16/2003US20030196144 Processor condition sensing circuits, systems and methods
10/16/2003US20030196140 Semiconductor integrated circuit
10/16/2003US20030196139 System for at-speed automated testing of high serial pin count multiple gigabit per second devices
10/16/2003US20030195721 Acquisition unit and method for infrequent capturing of data samples with associated timing information
10/16/2003US20030195719 State detecting system and device employing the same
10/16/2003US20030195715 Automatic test vector generation method, test method making use of the test vectors as automatically generated, chip manufacturing method and automatic test vector generation program
10/16/2003US20030195712 Inspection condition setting program, inspection device and inspection system
10/16/2003US20030195711 Apparatus for processing items of electronic equipment
10/16/2003US20030195315 Anionic polymers composed of dicarboxylic acids and uses thereof
10/16/2003US20030194898 Socket for electrical parts
10/16/2003US20030194821 Semiconductor test system with easily changed interface unit
10/16/2003US20030194672 Handheld tester for starting/charging systems
10/16/2003US20030194492 Coating a fertilizer product with a polymer to decrease nitrogen volatilization
10/16/2003US20030194046 Method for period counting using a tunable oscillator
10/16/2003US20030194038 Delay clock generating apparatus and delay time measuring apparatus
10/16/2003US20030193897 Methods used to simultaneously perform automated at-speed testing of multiple gigabit per second high serial pin count devices
10/16/2003US20030193892 Credit initialization in systems with proactive flow control
10/16/2003US20030193762 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system
10/16/2003US20030193560 Precise position control apparatus and precise position control method using the same
10/16/2003US20030193346 Sensor device for determining the layer thickness of a thin layer
10/16/2003US20030193345 Optics landing system and method therefor
10/16/2003US20030193344 Test assembly for integrated circuit package
10/16/2003US20030193343 IC testing apparatus
10/16/2003US20030193342 Wafer-level contactor
10/16/2003US20030193327 Single axis manipulator with controlled compliance
10/16/2003US20030193326 Test method for characterizing currents associated with powered components in an electronic system
10/16/2003US20030193325 Radio frequency oscillation detector
10/16/2003US20030193318 Method for predicting remaining charge of portable electronics battery
10/16/2003US20030193051 Metal oxide semiconductor field effect transistor having a drain; junction diode with terminal connected to gate; integrated circuits; capacitor charged via the forward-biased diode
10/16/2003US20030193050 Test patterns and methods of controlling CMP process using the same
10/16/2003US20030192183 Method for constructing a membrane probe using a depression
10/16/2003US20030192181 Method of making an electronic contact
10/16/2003CA2480713A1 Driver circuit employing high-speed tri-state for automatic test equipment
10/15/2003EP1353367A2 Apparatus and method for determining doping concentration of a semiconductor wafer
10/15/2003EP1353366A2 Non-invasive electrical measurement of semiconductor wafers
10/15/2003EP1353191A2 Apparatus and method for detecting the state of a battery
10/15/2003EP1353190A1 Method for determining the deterioration of an electro chemical energy storage device
10/15/2003EP1353189A2 Systems and methods utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices
10/15/2003EP1353188A2 High resolution analytical probe station
10/15/2003EP1353187A2 Measuring junction leakage
10/15/2003EP1353162A1 Determination of a device signal response characteristic using multiple varied signals
10/15/2003EP1352396A2 Method and apparatus for built-in self-repair of memory storage arrays
10/15/2003EP1352370A1 Method and device for in-use detecting low cranking strength of a combustion engine battery during engine starting
10/15/2003EP1352256A2 APPARATUS AND METHOD FOR DRIVING CIRCUIT PINS IN A CIRCUIT testing system
10/15/2003EP1352223A1 Testing apparatus with environmentally-controlled vibrator compartment
10/15/2003EP1200846B1 Actuator arrangement, especially for controlling an injection valve in an internal combustion engine
10/15/2003EP1173853B1 Failure capture apparatus and method for automatic test equipment
10/15/2003EP0861130B1 Electrical circuit component handler
10/15/2003CN2580451Y Current patrol detector
10/15/2003CN1449499A Method and device for testing printed circuit boards with a parallel tester
10/15/2003CN1449498A Test systems for wireless-communications devices
10/15/2003CN1449010A Semiconductor test device, contacting substrate for semiconductor device testing, semiconductor device testing method, semiconductor device and manufacturing method
10/15/2003CN1449009A Contactor, method of producing the same, and method of testing using the same
10/15/2003CN1448957A Method for testing memory apparatus
10/15/2003CN1448956A Method for testing non-volatile memory
10/15/2003CN1124746C Single board festing method and device
10/15/2003CN1124660C Antenna adapter
10/15/2003CN1124493C Chargeable cell test loop contact resistance monitoring method
10/15/2003CN1124492C IC test device
10/15/2003CN1124491C Propagation delay measuring circuit of signal for measuring
10/15/2003CN1124490C Layout, method and current measuring device for measuring a current in a conductor
10/15/2003CN1124282C Conformationally constrained backbone cyclized somatostatin analogs
10/14/2003US6634016 Arrangement for partitioning logic into multiple field programmable gate arrays
10/14/2003US6634015 Computer-readable storage media stored with a delay library for designing a semiconductor integrated circuit device
10/14/2003US6634012 Design verification by symbolic simulation using a native hardware description language
10/14/2003US6634005 System and method for testing an interface between two digital integrated circuits
10/14/2003US6634004 Threshold analysis system capable of deciding all threshold voltages included in memory device through single processing
10/14/2003US6634002 Test circuit of semiconductor memory
10/14/2003US6633999 Integrated circuit with on-chip data checking resources
10/14/2003US6633876 Analyzing post-mortem information on a remote computer system using a downloadable code module
10/14/2003US6633824 Direct current electrical system arc detection apparatus and method
10/14/2003US6633502 Test device for semiconductor memory circuit
10/14/2003US6633376 Apparatus for inspecting a printed circuit board
10/14/2003US6633335 CMOS image sensor with testing circuit for verifying operation thereof
10/14/2003US6633177 Method of predicting lifetime of semiconductor integrated circuit and method for reliability testing of the circuit
10/14/2003US6633175 Temperature compensated vertical pin probing device
10/14/2003US6633174 Stepper type test structures and methods for inspection of semiconductor integrated circuits
10/14/2003US6633173 Method and apparatus for testing for latch-up in integrated circuits
10/14/2003US6633169 Monitoring leakage currents from high-voltage devices
10/14/2003US6633168 Method and apparatus for detecting partial discharge in a voltage transformer
10/14/2003US6633167 Signal supply apparatus and method for examining the same, and semiconductor device, electro-optical apparatus and electronic apparatus using the same
10/14/2003US6633165 In-vehicle battery monitor
10/14/2003US6633156 Device for monitoring the flow of a substantially direct current in a load and method for the implementation of this device
10/14/2003US6633135 Apparatus and method for evaluating organic EL display
10/14/2003US6632691 Apparatus and method for determining doping concentration of a semiconductor wafer
10/14/2003US6632687 Methods of compensating for wafer parameters
10/14/2003CA2162785C Method and apparatus for automatic loading and unloading of printed circuit boards on machines for electrical testing
10/09/2003WO2003083904A2 Serial integrated scan-based testing of ink jet print head
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