Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2003
10/23/2003WO2002099930B1 Socket connector and contact for use in a socket connector
10/23/2003WO2002075337A3 Low-jitter clock for test system
10/23/2003US20030200498 Method for arranging data output by semiconductor testers to packet-based devices under test
10/23/2003US20030200495 Semiconductor integrated circuit and its design methodology
10/23/2003US20030200494 Dynamic scan circuitry for A-phase
10/23/2003US20030200493 Scan Interface
10/23/2003US20030200492 Semiconductor integrated circuit and its analyzing method
10/23/2003US20030200484 System and method for temporally isolating environmentally sensitive integrated circuit faults
10/23/2003US20030200483 Electronic test program that can distinguish results
10/23/2003US20030200359 Serial data interface
10/23/2003US20030200056 Semiconductor device analysis system
10/23/2003US20030200049 Electronic test program with run selection
10/23/2003US20030200048 Testing unit and self-evaluating device
10/23/2003US20030200046 Apparatus and method for determining effect of on-chip noise on signal propagation
10/23/2003US20030200045 Input/output characterization chain for an integrated circuit
10/23/2003US20030199208 Surface mount probe point socket and system
10/23/2003US20030199158 Method of forming an electrical contact
10/23/2003US20030199119 High performance sub-system design and assembly
10/23/2003US20030199111 System for testing electronic devices
10/23/2003US20030199110 Method for test conditions
10/23/2003US20030199107 Method of manufacturing electronic devices
10/23/2003US20030198309 Channel time calibration means
10/23/2003US20030198185 Use of SMBus to provide JTAG support
10/23/2003US20030198116 Semiconductor memory device equipped with control circuit for controlling memory cell array in non-normal operation mode
10/23/2003US20030197859 Measuring variations in intensity of reflective light to determine film thickness
10/23/2003US20030197541 Conditional clock buffer circuit
10/23/2003US20030197529 Dynamic scan circuitry for b-phase
10/23/2003US20030197524 Test board for testing semiconductor device
10/23/2003US20030197523 Method of testing electronic devices
10/23/2003US20030197522 Photomask for test wafers
10/23/2003US20030197520 Systems and methods for facilitating driver strength testing of integrated circuits
10/23/2003US20030197519 Full wafer silicon probe card for burn-in and testing and test system including same
10/23/2003US20030197518 Semiconductor device low temperature test apparatus using electronic cooling element
10/23/2003US20030197515 Fault tolerant semiconductor system
10/23/2003US20030197513 Open-circuit failure detection circuit
10/23/2003US20030197512 Battery analyzer
10/23/2003US20030197501 Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor
10/23/2003US20030197500 Test plate for ceramic surface mount devices and other electronic components
10/23/2003DE10161049C2 Integrierte Testschaltung Integrated test circuit
10/22/2003EP1355443A1 Oversampling bit stream recovery
10/22/2003EP1355163A2 Process for testing a converter
10/22/2003EP1354344A2 Method and apparatus for monitoring a semiconductor wafer during a spin drying operation
10/22/2003EP1354213A1 Device and method for testing electronic components
10/22/2003EP0792517B1 Electrical contact structures from flexible wire
10/22/2003CN2582008Y Intelligent digital measurer for battery capacity
10/22/2003CN2582007Y Anti-theft alarm for transmission line
10/22/2003CN2582006Y Measurer
10/22/2003CN1451190A Ic test socket
10/22/2003CN1451097A Testing device for printed boards
10/22/2003CN1450842A Single lamp monitor-control system for road lamp
10/22/2003CN1450617A Hazard detection and elimination method based on circuit static time-delay property
10/22/2003CN1450566A Method for quickly identifying element line defect kenel
10/22/2003CN1450357A Full speed current test method for IC
10/22/2003CN1450356A Detection head for checking display control panel
10/22/2003CN1450355A 信号故障注入机 Signal fault injection machine
10/22/2003CN1450354A Integrated adjustable short-haul/long-haul time domain reflectometry
10/22/2003CN1450353A Method for checking LCD device
10/22/2003CN1125496C Automatic testing sorting machine for alkali-manageness cell
10/22/2003CN1125350C Radiation effect detector for satellite
10/22/2003CN1125349C Voltage indicator for indicating that voltage of battery passes given value
10/22/2003CN1125348C Method for displaying a low battery state in electrical equipment with electrical energy stores and electrical equipment with said display
10/22/2003CN1125347C Method for automatic measuring asynchronous machine rotor ohmic resistance
10/22/2003CN1125346C Internally-arranged device for preventing integrated circuit errorly going into testing mode
10/22/2003CN1125345C Socket for testing connector of circuit board
10/22/2003CN1125344C Apparatus and method for inspecting leads of IC
10/21/2003US6636997 System and method for improving LBIST test coverage
10/21/2003US6636996 Method and apparatus for testing pipelined dynamic logic
10/21/2003US6636995 Method of automatic latch insertion for testing application specific integrated circuits
10/21/2003US6636932 Crossbar switch and control for data networks switching
10/21/2003US6636824 Method of and apparatus for inspecting semiconductor device
10/21/2003US6636823 Method and apparatus for motor fault diagnosis
10/21/2003US6636816 Vector signal analysis method and apparatus therefor
10/21/2003US6636455 Semiconductor memory device that operates in synchronization with a clock signal
10/21/2003US6636068 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
10/21/2003US6636067 Method of testing for micro latch-up
10/21/2003US6636066 Semiconductor integrated circuit and method for testing the same
10/21/2003US6636065 System and method for a device reliability and test circuit
10/21/2003US6636064 Dual probe test structures for semiconductor integrated circuits
10/21/2003US6636059 Wafer probe station having environment control enclosure
10/21/2003US6636057 Electric part testing apparatus with movable adapter
10/21/2003US6636056 Apparatus and method for testing integrated circuits
10/21/2003US6636052 Apparatus and related methods for detecting insulation breakdown in insulated through-bolts in power generator
10/21/2003US6636048 Method for diagnosing performance problems in cabling
10/21/2003US6635839 Semiconductor analysis arrangement and method therefor
10/21/2003US6635516 Substrate dropping prevention mechanism and substrate inspection device provided therewith
10/21/2003US6634896 Method and apparatus for transferring electrical signals among electrical devices
10/21/2003US6634847 Method and an apparatus for picking up a module IC in a customer tray of a module IC handler
10/21/2003US6634245 Drivingly rotatable mechanism of specimen loading table and specimen loading mechanism
10/16/2003WO2003085831A2 A method and apparatus for precise signal interpolation
10/16/2003WO2003085772A1 Storage battery
10/16/2003WO2003085706A1 Manufacturing method and apparatus to avoid prototype-hold in asic/soc manufacturing
10/16/2003WO2003085586A1 Metrology diffraction signal adaptation for tool-to-tool matching
10/16/2003WO2003085563A1 Inter-dice wafer level signal transfer methods for integrated circuits
10/16/2003WO2003085411A1 Battery management system
10/16/2003WO2003085410A1 Method and arrangement for protecting a chip and checking its authenticity
10/16/2003WO2003085409A1 Driver circuit employing high-speed tri-state for automatic test equipment
10/16/2003WO2003067274A3 Method and device for detecting faults on integrated circuits
10/16/2003WO2003065064A3 Predictive, adaptive power supply for an integrated circuit under test
10/16/2003WO2003058516A3 Verification test method for programmable logic devices
10/16/2003WO2003041122A3 Preconditioning integrated circuit for integrated circuit testing
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