Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2003
10/30/2003US20030204799 Built-in functional tester for search engines
10/30/2003US20030204795 Testing of ECC memories
10/30/2003US20030204790 Computer main board on/off testing device, method and system
10/30/2003US20030204783 Repair analyzer of dram in semiconductor integrated circuit using built-in CPU
10/30/2003US20030204356 System for monitoring connection pattern of data ports
10/30/2003US20030204354 Apparatus and method for determining effect of on-chip noise on signal propagation
10/30/2003US20030204353 Apparatus and method for determining effect of on-chip noise on signal propagation
10/30/2003US20030204352 Apparatus and method for determining effect of on-chip noise on signal propagation
10/30/2003US20030204351 Apparatus and method for determining effect of on-chip noise on signal propagation
10/30/2003US20030204350 Method and apparatus for measuring the quality of delay test patterns
10/30/2003US20030204349 Data-based control of integrated circuits
10/30/2003US20030204340 Power supply voltage fluctuation analyzing method
10/30/2003US20030204328 Multiple model systems and methods for testing electrochemical systems
10/30/2003US20030203520 Method for characterizing defects on semiconductor wafers
10/30/2003US20030202573 Measuring apparatus and measuring method
10/30/2003US20030202464 Collective monitor and control system for plural networks
10/30/2003US20030202409 Semiconductor memory device having test mode and memory system using the same
10/30/2003US20030201788 Reference voltage generating device, semiconductor integrated circuit including the same, and testing device and method for semiconductor integrated circuit
10/30/2003US20030201787 Circuit for configuring a redundant bond pad for probing a semiconductor
10/30/2003US20030201786 PLL semiconductor device with testability, and method and apparatus for testing same
10/30/2003US20030201785 Method of forming an electrical contact
10/30/2003US20030201782 Test device for internet and telephone lines
10/30/2003US20030201780 Parallel arc fault diagnostic for aircraft wiring
10/30/2003US20030201778 Electrostatic discharges and transient signals monitoring system and method
10/30/2003US20030201777 Testing circuit and method for MEMS sensor packaged with an integrated circuit
10/30/2003US20030201765 Inspection stage having a plurality of Z axes
10/30/2003US20030201764 Unified apparatus and method to assure probe card-to-wafer parallelism in semiconductor automatic wafer test, probe card measurement systems, and probe card manufacturing
10/30/2003US20030201763 Battery gauge
10/30/2003US20030201391 Method of inspecting a circuit pattern and inspecting instrument
10/30/2003DE19955380C2 Prüfmustergenerator, Prüfvorrichtung und Verfahren zum Erzeugen von Prüfmustern Test pattern, test device and method for generating test patterns
10/29/2003EP1357702A1 Method to test the broadband access for a subscriber connection line
10/29/2003EP1357473A1 Method and circuit arrangement for testing electronic components and modules
10/29/2003EP1357398A2 Combined laser/FLIR optics system
10/29/2003EP1357397A2 Combined laser/FLIR optics system
10/29/2003EP1357390A1 System for dynamic evaluation of the state of health and charge of a vehicle battery
10/29/2003EP1357389A2 Electronic test program with run selection
10/29/2003EP1357388A2 Input/output characterization register (chain) for an integrated circuit
10/29/2003EP1357387A1 Partial BIST including testing of the connections between different blocks
10/29/2003EP1357385A1 Contact probe, mask and fabrication method thereof
10/29/2003EP1356996A2 Method and system for on-board diagnostics testing of a vehicle
10/29/2003EP1356499A2 Wafer chuck with interleaved heating and cooling elements
10/29/2003EP1356308A2 Apparatus and method for detecting and calculating ground fault resistance
10/29/2003EP1356307A1 Nickel alloy probe card frame laminate
10/29/2003EP1224480B1 Programme-controlled unit and method for identifying and/or analysing errors in programme-controlled units
10/29/2003EP1200842B1 Automatic test manipulator with support internal to test head
10/29/2003EP1034100B1 Control Device for a Motor Vehicle with a Remote Control or Transponder
10/29/2003CN2583687Y High voltage switch contact monitoring device
10/29/2003CN2583686Y Regulatable grounding device
10/29/2003CN2583685Y Computer-controlling voltage breakdown experiment apparatus
10/29/2003CN2583684Y Small festival lamp current test machine wiring structure
10/29/2003CN1452316A Scanning path circuit and semiconductor IC contg. said scanning path circuit
10/29/2003CN1452231A Testing board for testing semiconductor
10/29/2003CN1452146A Picture signal providing circuit and electrooptical panel
10/29/2003CN1452080A Semiconductor integrated circuit
10/29/2003CN1451973A Cell low potential warning device
10/29/2003CN1451972A UPS cell on-line monitoring method and device
10/29/2003CN1451971A Turn-to-turn short protection zero-sequence impedance discriminating method for parallel reactor
10/29/2003CN1451970A Method for identifying abnormal condition in power transformer
10/29/2003CN1125990C Battery capacity meter and battery capacity calculation method
10/29/2003CN1125989C Circuit time delay measuring method
10/29/2003CN1125988C Method for Real time metering junction temp of transistor during steady stateservice life test
10/28/2003US6640324 Boundary scan chain routing
10/28/2003US6640323 Testing system for evaluating integrated circuits, a testing system, and a method for testing an integrated circuit
10/28/2003US6640198 Semiconductor device having self test function
10/28/2003US6640196 System and method for motor fault detection by space vector angular fluctuation
10/28/2003US6640166 Diagnostic tool graphical display apparatus and method
10/28/2003US6639859 Test array and method for testing memory arrays
10/28/2003US6639854 Redundancy circuit of semiconductor memory device
10/28/2003US6639850 Semiconductor integrated circuit having latching means capable of scanning
10/28/2003US6639848 Semiconductor memory device and method for testing the same
10/28/2003US6639661 Technique for imaging electrical contacts
10/28/2003US6639624 Machine vision methods for inspection of leaded components
10/28/2003US6639443 Conditional clock buffer circuit
10/28/2003US6639442 Integrated circuit comprising at least two clock systems
10/28/2003US6639421 Measuring apparatus and method for measuring characteristic of solar cell
10/28/2003US6639420 Common probe card for flip-chip devices
10/28/2003US6639417 Semiconductor parametric testing apparatus
10/28/2003US6639416 Method and apparatus for testing semiconductor dice
10/28/2003US6639415 Probe station having multiple enclosures
10/28/2003US6639414 Circuit for measuring changes in capacitor gap using a switched capacitor technique
10/28/2003US6639412 Coaxial cable voltage test indicator
10/28/2003US6639409 Battery voltage measurement device
10/28/2003US6639408 Battery voltage measurement device
10/28/2003US6639407 Charging/discharging electrical energy indication apparatus and electrical energy calculation method for use in the apparatus
10/28/2003US6639397 Automatic test equipment for testing a device under test
10/28/2003US6639396 Detecting structure formed on a PCB to detect unavailability of the lines
10/28/2003US6639387 Battery pack and inspection device therefor
10/28/2003US6639385 State of charge method and apparatus
10/28/2003US6638779 Fabrication method of semiconductor integrated circuit device and testing method
10/28/2003US6638091 Socket for electrical parts
10/28/2003US6637079 Multi-layer female component for refastenable fastening device and method of making the same
10/28/2003CA2322791C Electric motor monitoring circuit
10/23/2003WO2003088574A1 Method for testing subscriber connection lines for broadband services
10/23/2003WO2003088349A1 Signal detection contactor and signal correcting system
10/23/2003WO2003088323A1 Method and device for conditioning semiconductor wafers and/or hybrids
10/23/2003WO2003088221A1 Optical information device, optical storage medium, optical storage medium inspection device, and optical storage inspection method
10/23/2003WO2003088040A1 Method and apparatus for unifying self-test with scan-test during prototype debug and production test
10/23/2003WO2003087858A1 Test system rider board utilized for automated at-speed testing
10/23/2003WO2003087731A1 Semiconductor load port alignment device
10/23/2003WO2003041158A3 Semiconductor package device and method of formation and testing
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