Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2003
11/06/2003US20030208327 Methods for embedding and de-embedding using a circulator
11/06/2003US20030207541 Method for protecting MOS components from antenna effect and the apparatus thereof
11/06/2003US20030206627 Secure scan
11/06/2003US20030206127 Method and device for use in DC parametric tests
11/06/2003US20030206111 Monitoring system and method for wiring systems
11/06/2003US20030206040 Semiconductor device
11/06/2003US20030206039 Semiconductor device
11/06/2003US20030206035 Conductive material for integrated circuit fabrication
11/06/2003US20030206034 Method of temporarily securing a die to a burn-in carrier
11/06/2003US20030206030 Universal wafer carrier for wafer level die burn-in
11/06/2003US20030206029 Method of forming an electrical contact
11/06/2003US20030206028 Method of forming an electrical contact
11/06/2003US20030206027 Method of inspecting circuit pattern and inspecting instrument
11/06/2003US20030206025 Testing integrated circuits and integrated power transistors
11/06/2003US20030206021 Method and apparatus for measuring and analyzing electrical or electrochemical systems
11/06/2003US20030205997 Wafer probe station having environment control enclosure
11/06/2003US20030205737 Method and apparatus for wafer-level burn-in and testing of integrated circuits
11/05/2003EP1359438A2 Combined laser/FLIR optics system
11/05/2003EP1359426A2 Electronic device testing
11/05/2003EP1358706A1 Detecting a microcurrent and a microcurrent detecting circuit
11/05/2003EP1358705A1 Detecting a remaining battery capacity and a battery remaining capacity circuit
11/05/2003EP1358524A1 Power supply device for a component testing installation
11/05/2003EP1358500A1 Tap changer condition diagnosing
11/05/2003EP1358499A1 Tap changer monitoring
11/05/2003EP1358498A1 Input/output continuity test mode circuit
11/05/2003EP1358497A1 Apparatus and method for driving circuit pins in a circuit testing system
11/05/2003EP1358496A2 System and method for sampling timing error reduction
11/05/2003EP1357985A1 Inductive sensory apparatus
11/05/2003EP1066535B1 Device and assembly for testing electronic components
11/05/2003EP1012607B1 Sensor device
11/05/2003EP0979418B1 Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuit
11/05/2003EP0886785B1 Method for monitoring of tap changers by acoustic analysis
11/05/2003CN2585426Y Four-wire type polymer lithium battery holder
11/05/2003CN2585243Y Multi-function instrument for testing instrument
11/05/2003CN1454321A Automated protection of IC devices from EOS (electro over stress) damage due to an undesired DC transient
11/05/2003CN1454320A System configuration and methods for on-the-fly testing of integrated circuits
11/05/2003CN1454319A Insulation tester for squirrel cage rotors
11/05/2003CN1454318A System, method, and apparatus for electromagnetic compatibility-driven product design
11/05/2003CN1453842A Ball array-type test card
11/05/2003CN1453798A Analytical system of semiconductor device
11/05/2003CN1453793A Semiconductor memory with test mode and storing system using the same
11/05/2003CN1453593A Logic cluster fault testing method for non-boundary scanning device
11/05/2003CN1453574A Complex microwave dielectric constant measuring method for ceramic with high dielectric constant and low loss
11/05/2003CN1127021C Method for detecting the open-circuit, earthing and short-circuit state of pins in computer parallel port
11/04/2003US6643830 Fault portion locating method for semiconductor integrated circuit device
11/04/2003US6643823 Waveform generating circuit
11/04/2003US6643812 Manipulation of hardware control status registers via boundary scan
11/04/2003US6643811 System and method to test internal PCI agents
11/04/2003US6643810 Integrated circuits carrying intellectual property cores and test ports
11/04/2003US6643809 Semiconductor device and semiconductor device testing method
11/04/2003US6643805 Memory circuit being capable of compression test
11/04/2003US6643601 Apparatus and method for testing snow removal equipment
11/04/2003US6643592 System and method for fault diagnosis
11/04/2003US6643218 Precharge control signal generator, and semiconductor memory device using the same
11/04/2003US6643217 Semiconductor memory device permitting early detection of defective test data
11/04/2003US6643203 Semiconductor memory device including clock-independent sense amplifier
11/04/2003US6643191 Semiconductor device having chip selection circuit and method of generating chip selection signal
11/04/2003US6643180 Semiconductor memory device with test mode
11/04/2003US6643175 Nonvolatile semiconductor storage device and test method therefor
11/04/2003US6643164 Method and circuit for determining sense amplifier sensitivity
11/04/2003US6643111 Electronic transducer device
11/04/2003US6642926 Test and measurement instrument having telecommunications mask testing capability with a mask zoom feature
11/04/2003US6642861 Arrangements having ternary-weighted parameter stepping
11/04/2003US6642737 Method of generating transistor ac scattering parameters simultaneously with dc characteristics using a single circuit simulation with a self-correction scheme for the artificial dc voltage dropped across the 50-ohm resistor representing transmission line impedance
11/04/2003US6642736 Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits
11/04/2003US6642735 Semiconductor package for chip with testing contact pad connected to outside
11/04/2003US6642734 Method and apparatus to generate a ground level of a semiconductor IC tester having a plurality of substrates
11/04/2003US6642732 Probe station thermal chuck with shielding for capacitive current
11/04/2003US6642729 Probe card for tester head
11/04/2003US6642728 Holder of electroconductive contactor, and method for producing the same
11/04/2003US6642727 Chip carrier device and method for the production of a chip carrier device with an electrical test
11/04/2003US6642726 Apparatus and methods for reliable and efficient detection of voltage contrast defects
11/04/2003US6642725 Method of testing radiation for a SDRAM
11/04/2003US6642724 Valve seating with electrodes, especially for <<enamel-test>> type control device
11/04/2003US6642721 Method of measuring insulation resistance of capacitor and insulation resistance measuring apparatus of the same
11/04/2003US6642719 Device for judging life of auxiliary battery
11/04/2003US6642707 High-speed peaking circuit for characteristic impedance control
11/04/2003US6642701 Device and method for testing phase-locked loops
11/04/2003US6641430 Contact structure and production method thereof and probe contact assembly using same
11/04/2003US6640417 Method for determining correct phasing of a three-phase brushless DC motor
11/04/2003US6640415 Segmented contactor
11/03/2003CA2426530A1 Monitoring system and method for wiring systems
11/03/2003CA2384627A1 Method and device for use in dc parametric tests
10/2003
10/30/2003WO2003090253A2 Single axis manipulator with controlled compliance
10/30/2003WO2003090178A1 Remote control with low battery indication
10/30/2003WO2003090018A2 Network processor architecture
10/30/2003WO2003089943A2 Test plate for ceramic surface mount devices and other electronic components
10/30/2003WO2003089941A2 Semiconductor test system with easily changed interface unit
10/30/2003WO2003089834A2 Test head positioner system
10/30/2003WO2003014753A3 Methods and apparatus for testing a semiconductor with temperature desoak
10/30/2003WO2002084312A3 Measuring back-side voltage of an integrated circuit
10/30/2003WO2001035718A3 System and method for product yield prediction
10/30/2003US20030204828 Method for calculation of cell delay time and method for layout optimization of semiconductor integrated circuit
10/30/2003US20030204826 Inspection method and inspection system using charged particle beam
10/30/2003US20030204825 Knowledge-based intelligent full scan dump processing methodology
10/30/2003US20030204820 Method and apparatus for examining semiconductor apparatus and method for designing semiconductor apparatus
10/30/2003US20030204803 Method and apparatus for improving observability of signals internal to VLSI chips
10/30/2003US20030204802 Multiple scan chains with pin sharing
10/30/2003US20030204801 Method and apparatus for secure scan testing
10/30/2003US20030204800 Method and system for an on-chip AC self-test controller
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