Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2003
11/13/2003US20030212942 Highly reliable distributed system
11/13/2003US20030212940 Interface architecture for embedded field programmable gate array cores
11/13/2003US20030212938 Method and apparatus for generating electronic test and data structure
11/13/2003US20030212937 System and method for exposing state based logic signals within an electronics system over an existing network conduit
11/13/2003US20030212932 Remote diagnostic packets
11/13/2003US20030212524 Test access circuit and method of accessing embedded test controllers in integrated circuit modules
11/13/2003US20030212523 Dynamically adaptable semiconductor parametric testing
11/13/2003US20030212522 Externally controllable electronic test program
11/13/2003US20030212517 Method for testing an electronic component; computer program product, computer readable medium, and computer embodying the method; and method for downloading the program embodying the method
11/13/2003US20030211639 Microelectronic fabrication die electrical test method providing enhanced microelectronic fabrication die electrical test efficiency
11/13/2003US20030210594 Semiconductor memory device having multi-bit testing function
11/13/2003US20030210069 Semiconductor device, and the method of testing or making of the semiconductor device
11/13/2003US20030210068 Apparatus of testing semiconductor
11/13/2003US20030210067 Test signal distribution system for IC tester
11/13/2003US20030210066 Apparatus and method for determining electrical properties of a semiconductor wafer
11/13/2003US20030210063 Contact probe with guide unit and fabrication method thereof
11/13/2003US20030210059 Method and system for evaluating core stack pressure
11/13/2003US20030210058 Electrical print resolution test die
11/13/2003US20030210057 Time resolved non-invasive diagnostics system
11/13/2003US20030210056 Battery status monitoring apparatus, saturation polarization detecting method and dischargeable capacity detecting method
11/13/2003US20030210055 Control arrangement for power electronic system
11/13/2003US20030210034 Apparatus and methods for testing circuit boards
11/13/2003US20030210033 System for evaluating probing networks
11/13/2003US20030210031 Tester channel to multiple IC terminals
11/13/2003US20030210030 Physical linearity test for integrated circuit delay lines
11/13/2003US20030210028 Timing variation measurements
11/13/2003CA2484720A1 Inherently fail safe processing or control apparatus
11/13/2003CA2483978A1 Secure scan
11/12/2003EP1361451A1 Contacting piece for the inspection of microlectronic devices and inspection device using this contact piece
11/12/2003EP1361450A1 Method for testing an electronic component
11/12/2003EP1361449A2 Time domain reflectometer display method
11/12/2003EP1361448A1 Method and device for detecting the bad functioning of a vehicle's battery
11/12/2003EP1361447A2 Externally controllable electronic test system and corresponding method
11/12/2003EP1361446A2 Method and apparatus for generating electronic test programs and data structure
11/12/2003EP1360513A1 Multiple-capture dft system for detecting or locating crossing clock-domain faults during self-test or scan test
11/12/2003EP1116423B1 Vertically actuated bga socket
11/12/2003EP0929819B1 Membrane probing system with local contact scrub
11/12/2003EP0706663B2 Electrical test instrument
11/12/2003CN2586169Y Pin control format/responser for integrated circuit test system
11/12/2003CN2586168Y Line fail inspection alarmer
11/12/2003CN2586167Y Shock-proof hammer line fail indicator
11/12/2003CN2586166Y Intelligence fast line inspection instrument
11/12/2003CN2586165Y Multiroute cable insulation measurer
11/12/2003CN2586163Y Shearing appts. for power plug cord
11/12/2003CN1455871A 集成电路 IC
11/12/2003CN1455863A Improved consumer product kit and method of use therefor
11/12/2003CN1455264A Reference voltage generating apparatus and semiconductor integrated circuit, its checking device and method thereof
11/12/2003CN1455259A Method for producing probe, mask used therefor and probe therefrom
11/11/2003US6647538 Apparatus and method for signal skew characterization utilizing clock division
11/11/2003US6647526 Modular/re-configurable test platform
11/11/2003US6647525 Electronics testing circuit and method
11/11/2003US6647524 Built-in-self-test circuit for RAMBUS direct RDRAM
11/11/2003US6647522 Semiconductor devices having multiple memories
11/11/2003US6647521 Memory testing method and apparatus, and computer-readable recording medium
11/11/2003US6647520 Semiconductor device
11/11/2003US6647309 Method and apparatus for automated generation of test semiconductor wafers
11/11/2003US6646982 Redundant source synchronous busses
11/11/2003US6646952 Semiconductor circuit and semiconductor device
11/11/2003US6646936 Semiconductor memory device shiftable to test mode in module as well as semiconductor memory module using the same
11/11/2003US6646935 Semiconductor memory device for reducing number of input cycles for inputting test pattern
11/11/2003US6646934 Semiconductor device
11/11/2003US6646561 Method and device for in-use detecting low cranking strength of a combustion engine battery during engine starting
11/11/2003US6646503 Circuit configuration for detecting a functional disturbance
11/11/2003US6646461 Method and apparatus for testing semiconductor devices using improved testing sequence
11/11/2003US6646460 Parallel scan distributors and collectors and process of testing integrated circuits
11/11/2003US6646459 Method for disabling and re-enabling access to IC test functions
11/11/2003US6646458 Apparatus for forming coaxial silicon interconnects
11/11/2003US6646456 Conductive material for integrated circuit fabrication
11/11/2003US6646451 Time domain reflectometer display method
11/11/2003US6646448 Data head writer coil testing
11/11/2003US6646446 Method and apparatus for fault detection in a resistive bridge sensor
11/11/2003US6646442 Voltage detection device for a battery package
11/11/2003US6646421 Method and apparatus for controlling residual battery capacity of secondary battery
11/11/2003US6646419 State of charge algorithm for lead-acid battery in a hybrid electric vehicle
11/11/2003US6646418 Method and apparatus for fuel cell protection
11/11/2003US6645790 System and method for prototyping and fabricating complex microwave circuits
11/11/2003US6644982 Method and apparatus for the transport and tracking of an electronic component
11/11/2003US6644981 Socket for electrical parts having horizontal guide portion
11/11/2003US6643922 Device testing contactor, method of producing the same, and device testing carrier
11/06/2003WO2003091949A2 Switched fabric based inspection system
11/06/2003WO2003091743A1 Method for diagnosing deterioration of coil and system for diagnosing deterioration of coil
11/06/2003WO2003091742A1 Semiconductor test device
11/06/2003WO2003091741A1 Electronic component test apparatus
11/06/2003WO2003091740A1 Electronic component test apparatus
11/06/2003WO2003091739A1 Electronic component characteristic measuring device
11/06/2003WO2003091077A1 Method for determining charging capacitance of capacitor
11/06/2003WO2003023427A3 Method of assembling and testing an electronics module
11/06/2003WO2003007002A3 Interface apparatus for integrated circuit testing
11/06/2003WO2002075336A3 Test system algorithmic program generators
11/06/2003US20030208734 Time domain measurement systems and methods
11/06/2003US20030208729 Method of using testbench tests to avoid task collisions in hardware description language
11/06/2003US20030208722 Chip fabrication procedure and simulation method for chip testing with performance pre-testing
11/06/2003US20030208717 Skew calibration means and a method of skew calibration
11/06/2003US20030208713 Test system rider board utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices
11/06/2003US20030208711 Comparator circuit for semiconductor test system
11/06/2003US20030208710 Method and apparatus for determining the failing operation of a device-under-test
11/06/2003US20030208709 Data alignment for telecommunications networks
11/06/2003US20030208708 Circuit and method for adding parametric test capability to digital boundary scan
11/06/2003US20030208707 Method and apparatus for evaluating and optimizing a signaling system
11/06/2003US20030208328 Acquisition system for a multi-channel relatively long record length digital storage oscilloscope
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