Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2003
11/27/2003US20030218869 Docking apparatus
11/27/2003US20030218488 Scan capable dual edge-triggered state element for application of combinational and sequential scan test patterns
11/27/2003US20030218475 Circuit configuration and method for detecting an unwanted attack on an integrated circuit
11/27/2003US20030218474 Wafer testing apparatus
11/27/2003US20030218473 Semiconductor device and capacitance measurement method
11/27/2003US20030218472 Apparatus for interfacing electronic packages and test equipment
11/27/2003US20030218471 Reticle inspection
11/27/2003US20030218463 Time domain reflectometer probe having a built-in reference ground point
11/27/2003US20030218456 Large substrate test system
11/27/2003US20030218439 Diagnostic method for an electric drive assembly
11/27/2003US20030218255 Semiconductor integrated circuit device with test element group circuit
11/27/2003US20030218167 Carrier module for mu-BGA type device
11/27/2003US20030217558 Apparatus and method for controlling the temperature of an electronic device under test
11/27/2003US20030217477 Guiding apparatus for docking a testing head for electronic components
11/27/2003CA2485880A1 Methods and apparatus for indicating a fault condition in fuel cells and fuel cell components
11/26/2003EP1365632A1 Inspection method and device for active matrix
11/26/2003EP1365479A1 Anisotropic conductive connector, its manufacture method and probe member
11/26/2003EP1364436A1 Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (dfd) techniques
11/26/2003EP1364318A2 Systems and methods for generating hardware description code
11/26/2003EP1364222A1 Method and device for testing the quality of printed circuits
11/26/2003EP1364221A1 Planarizing interposer
11/26/2003EP1364218A1 Electronic voltage transformer
11/26/2003EP0931392B1 Apparatus and method for restoring fiber optic communications network connections
11/26/2003EP0926799B1 Power supply apparatus
11/26/2003CN2588518Y Check corrector for electromagnetic relay
11/26/2003CN2588383Y Multi-purpose comprehensive cable test interface inserting-board
11/26/2003CN2588382Y Multi-purpose sundry cable test interface inserting-board
11/26/2003CN2588381Y Multi-purpose multi-point cable test interface inserting-board
11/26/2003CN2588378Y AC/dc source and drainage carrent free transducer
11/26/2003CN1459027A Integrated circuit testing device with improved reliability
11/26/2003CN1459026A Re-locatable partial discharge transducer head
11/26/2003CN1458714A Electric contact piece for improving scraping function
11/26/2003CN1458678A Integrated circuit chip and wafer and its producing and detecting method
11/26/2003CN1458533A Distributive intelligent motor detecting system
11/26/2003CN1458532A Automatic detecting method and device fr signal quality and time sequence
11/26/2003CN1129145C Overvoltage protective discharger for high or medium voltage
11/26/2003CN1129007C Integrated circuit having frequency division opevation testing function
11/26/2003CN1129006C Device for distinguishing interference radiation
11/25/2003US6654939 Method of designing logic circuit, and computer product
11/25/2003US6654938 Delay characteristic analyzing method and delay characteristic analyzing system for a custom LSI
11/25/2003US6654934 Programmable event engine
11/25/2003US6654920 LBIST controller circuits, systems, and methods with automated maximum scan channel length
11/25/2003US6654919 Automated system for inserting and reading of probe points in silicon embedded testbenches
11/25/2003US6654918 Method and system for partial-scan testing of integrated circuits
11/25/2003US6654917 Method and apparatus for scanning free-running logic
11/25/2003US6654916 Waveform generator, semiconductor testing device and semiconductor device
11/25/2003US6654702 Method of checking vehicle mounted electronic units
11/25/2003US6654700 Testing method of semiconductor integrated circuit and equipment thereof
11/25/2003US6654640 Method for monitoring end of life for battery
11/25/2003US6654351 Configurable multi-protocol vehicle communication circuit and method
11/25/2003US6654349 Real time automated checking mechanism for a bus protocol on an integrated bus system
11/25/2003US6654300 Semiconductor memory device having internal circuit screening function
11/25/2003US6654290 Flash memory device with cell current measuring scheme using write driver
11/25/2003US6654286 Nonvolatile semiconductor memory device detecting sign of data transformation
11/25/2003US6654218 Protection circuit module for rechargeable battery and method of making the same
11/25/2003US6653957 SERDES cooperates with the boundary scan test technique
11/25/2003US6653928 Dry load test apparatus
11/25/2003US6653856 Method of determining reliability of semiconductor products
11/25/2003US6653855 External test auxiliary device to be used for testing semiconductor device
11/25/2003US6653854 Test pin unit
11/25/2003US6653853 Multiple test probe system and method
11/25/2003US6653851 Refocusing wavelengths to a common focal plane for electrical trace testing
11/25/2003US6653850 Surface passivation method and arrangement for measuring the lifetime of minority carriers in semiconductors
11/25/2003US6653849 IC analysis involving logic state mapping in a SOI die
11/25/2003US6653846 Multifunction circuit continuity and sensor tester
11/25/2003US6653845 Addressable open connector test circuit
11/25/2003US6653827 Analog signal test circuit and method
11/25/2003US6653818 Method for predicting the equilibrated open-circuit voltage of an electrochemical energy store
11/25/2003US6653817 State-of-charge detection device for a battery
11/25/2003US6653629 Specimen inspection instrument
11/25/2003US6652138 Semiconductor wire bond machine leadframe thermal map system
11/25/2003US6651817 Test tray insert of test handler
11/20/2003WO2003096353A1 Method and apparatus for improving the reliability of the reading of integrated circuit fuses
11/20/2003WO2003096040A1 Battery capacity calculation method
11/20/2003WO2003096039A1 Tester system having a multi-purpose memory
11/20/2003WO2003096038A1 Test access circuit and method of accessing embedded test controllers in an integrated circuit
11/20/2003WO2003096037A1 Device and method for testing printed circuit boards, and testing probe for said device and method
11/20/2003WO2003096035A1 Probe card for testing integrated circuits
11/20/2003WO2003096034A2 Tester system having multiple instruction memories
11/20/2003WO2003096033A1 Test apparatus
11/20/2003WO2003095970A2 Hybrid mode stirred and mode tuned chamber
11/20/2003WO2003094765A2 Method and system for power line network fault detection and quality monitoring
11/20/2003WO2003085831A3 A method and apparatus for precise signal interpolation
11/20/2003WO2003067277A3 Method and apparatus for testing assisted position location capable devices
11/20/2003WO2003034387A3 Method and clamping apparatus for securing a minimum reference voltage in a video display boost regulator
11/20/2003WO2003027697A3 Electronic component
11/20/2003US20030217345 Event based IC test system
11/20/2003US20030217343 Manufacturing method and apparatus to avoid prototype-hold in ASIC/SOC manufacturing
11/20/2003US20030217341 Architecture and design of universal IC test system
11/20/2003US20030217317 Method and apparatus for displaying test results and recording medium
11/20/2003US20030217316 Method for programming and/or testing for correct functioning of an electronic circuit
11/20/2003US20030217315 Method of and program product for performing gate-level diagnosis of failing vectors
11/20/2003US20030217307 Error detection in dynamic logic circuits
11/20/2003US20030215699 Electrochemical energy store and method for determining the wear to an electrochemical energy store
11/20/2003US20030214845 Semiconductor integrated circuit device having data input/output configuration variable
11/20/2003US20030214414 Front panel light system for an electronic instrument which indicates the operating condition of the front panel lights and selected portions of the instrument
11/20/2003US20030214318 Method and system for disabling a scanout line of a register flip-flop
11/20/2003US20030214317 High speed wafer sort and final test
11/20/2003US20030214316 Integrated circuit burn-in test system and associated methods
11/20/2003US20030214313 Current detection equipment and semiconductor device
1 ... 1133 1134 1135 1136 1137 1138 1139 1140 1141 1142 1143 1144 1145 1146 1147 1148 1149 1150 1151 1152 1153 ... 1523