Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2003
12/03/2003EP1367405A1 Apparatus and method for determining the performance of micro machines or microelectromechanical devices
12/03/2003EP1367404A2 Scan-path flip-flop circuit for integrated circuit memory
12/03/2003EP1367403A2 A method for detecting faults in electronic devices, based on quiescent current measurements
12/03/2003EP1367400A2 Printed circuit boards testing unit
12/03/2003EP1366478A2 Remaining life prediction for field device electronics board
12/03/2003EP1366417A2 Enhanced loopback testing of serial devices
12/03/2003EP1226444B1 Multi-stage algorithmic pattern generator for testing ic chips
12/03/2003EP0920636B1 Cable fault monitoring system
12/03/2003EP0907311B1 Sucked material detector, sucked material detecting method using the same detector, shift detecting method using the same detector, and cleaning method using the same detector
12/03/2003CN2590007Y Tester for pressure regulating module of automobile generator
12/03/2003CN2590006Y Environment protective printed circuit board testing equipment
12/03/2003CN2590005Y Frame for testing equipment of printed circuit board
12/03/2003CN2590004Y Switch probe for printed circuit board testing arrangement
12/03/2003CN2590003Y Bottom board of printed circuit board testing arrangement
12/03/2003CN2590002Y Transformer partial discharge online monitor
12/03/2003CN2590001Y Residual current detecting instrument
12/03/2003CN2590000Y Burglar alarm for power line
12/03/2003CN2589994Y Portable voltage detecting instrument
12/03/2003CN2589990Y Insulating casing of electroscopic earthing ring
12/03/2003CN2589986Y Probe device for testing
12/03/2003CN1460269A At-speed built-in self testing of multi-port compact SRAMS
12/03/2003CN1460203A Circuit arrangement and method for detecting undesired attack on integrated circuit
12/03/2003CN1460184A Integrated circuit with power supply test interface
12/03/2003CN1460183A Circuit for detecting leak from power supply
12/03/2003CN1460045A Vacuum chuck with integrated electrical testing points
12/03/2003CN1459801A Method for analyzing poor state
12/03/2003CN1459637A Working voltage testing method of power supplier and its system
12/03/2003CN1129990C Conductive contactor
12/03/2003CN1129798C Optical driver, optical output type voltage sensor and IC tester using them
12/03/2003CN1129788C Device for inspecting printed circuit board
12/02/2003US6658639 Semiconductor integrated circuit provided with determination circuit
12/02/2003US6658635 Static-dynamic timing analysis method and storage medium
12/02/2003US6658632 Boundary scan cell architecture with complete set of operational modes for high performance integrated circuits
12/02/2003US6658617 Handling a 1-hot multiplexer during built-in self-testing of logic
12/02/2003US6658616 Method for improving the efficiency of weighted random pattern tests through reverse weight simulation using effective pattern masks
12/02/2003US6658615 IC with IP core and user-added scan register
12/02/2003US6658614 Boundary scan element and communication device made by using the same
12/02/2003US6658613 Systems and methods for facilitating testing of pad receivers of integrated circuits
12/02/2003US6658612 Test signal generating circuit of a semiconductor device with pins receiving signals of multiple voltage levels and method for invoking test modes
12/02/2003US6658610 Compilable address magnitude comparator for memory array self-testing
12/02/2003US6658604 Method for testing and guaranteeing that skew between two signals meets predetermined criteria
12/02/2003US6658368 On-chip histogram testing
12/02/2003US6658363 Digital data pattern detection methods and arrangements
12/02/2003US6657904 Semiconductor device
12/02/2003US6657648 Display unit, electronic device using the same, and method of inspecting the display unit
12/02/2003US6657504 System and method of determining ring oscillator speed
12/02/2003US6657461 System and method for high speed integrated circuit device testing utilizing a lower speed test environment
12/02/2003US6657455 Predictive, adaptive power supply for an integrated circuit under test
12/02/2003US6657454 High speed threshold voltage and average surface doping measurements
12/02/2003US6657453 Semiconductor wafer testing system and method
12/02/2003US6657452 Configuration for measurement of internal voltages of an integrated semiconductor apparatus
12/02/2003US6657451 Method and integrated circuit arranged for feeding a test forcing pattern on a single shared pin of the circuit
12/02/2003US6657450 Methods of engaging electrically conductive test pads on a semiconductor substrate removable electrical interconnect apparatuses, engagement probes and removable engagement probes
12/02/2003US6657449 Test pin unit for PCB test device and feeding device of the same
12/02/2003US6657447 Liquid crystal method to localize metal short on multi-layer metal CMOS process
12/02/2003US6657446 Picosecond imaging circuit analysis probe and system
12/02/2003US6657438 Testing unit and a connector testing apparatus using the same
12/02/2003US6657437 Method and system for performing time domain reflectometry contemporaneously with recurrent transmissions on computer network
12/02/2003US6657436 Sheath monitoring technique
12/02/2003US6657435 Audible circuit breaker
12/02/2003US6657423 Physical quantity detection device with error detection in power supply line thereto
12/02/2003US6656751 Self test method and device for dynamic voltage screen functionality improvement
12/02/2003US6656750 Method for testing chips on flat solder bumps
12/02/2003US6655974 Semiconductor device-socket
12/02/2003US6655965 Interconnect device for electrically coupling a test system to a circuit board adapted for use with a ball-grid array connector
12/02/2003US6655023 Method and apparatus for burning-in semiconductor devices in wafer form
11/2003
11/27/2003WO2003098774A1 Secondary cell charger and charging method
11/27/2003WO2003098769A2 Methods and apparatus for indicating a fault condition in fuel cells and fuel cell components
11/27/2003WO2003098638A1 Fault tolerant computer
11/27/2003WO2003098491A1 Method and mechanism for improved performance analysis in transaction level models
11/27/2003WO2003098244A1 Cell with fixed output voltage for integrated circuit
11/27/2003WO2003098243A1 System for testing digital components
11/27/2003WO2003098241A1 Method of and program product for performing gate-level diagnosis of failing vectors
11/27/2003WO2003098240A1 Event based ic test system
11/27/2003WO2003098231A2 Monolithic i-load architectures for automatic test equipment
11/27/2003WO2003098197A1 Method and device for measuring the diffusion length of minority carriers in a semiconductor sample
11/27/2003WO2003081747A3 Method and system for monitoring winding insulation resistance
11/27/2003WO2003077078A3 Hub array system and method
11/27/2003WO2003027696A3 Electronic component and method for measuring its qualification
11/27/2003WO2003005041A3 A test handling apparatus and method
11/27/2003WO2002082330A3 Method and system an algorithm for finding vectors to stimulate all paths and arcs through an lvs gate
11/27/2003WO2002069565A3 Network documentation system with electronic modules
11/27/2003US20030221180 System and method for creating probe masks
11/27/2003US20030221153 Shmoo plot evaluation method with a relief analysis
11/27/2003US20030221152 System and method for testing circuitry on a wafer
11/27/2003US20030221151 Field programmable device
11/27/2003US20030221150 Method of testing multiple modules on an integrated circuit
11/27/2003US20030221149 Test configuration with automatic test machine and integrated circuit and method for determining the time behavior of an integrated circuit
11/27/2003US20030221148 Failure analysis method that allows high-precision failure mode classification
11/27/2003US20030221144 Devices for storing and accumulating defect information, semiconductor device and device for testing the same
11/27/2003US20030221134 Electronic equipment, display control method, recording medium and program
11/27/2003US20030220997 Switched fabric based inspection system
11/27/2003US20030220803 Product replacement method and system
11/27/2003US20030220760 Universal diagnostic platform for specimen analysis
11/27/2003US20030220759 Fail analyzer
11/27/2003US20030220758 Method for testing an AD-converter
11/27/2003US20030220754 Semiconductor production system
11/27/2003US20030220078 Circuit for testing functions of a radio-frequency circuit
11/27/2003US20030219913 Structure and method for parallel testing of dies on a semiconductor wafer
11/27/2003US20030218928 Semiconductor memory device having a circuit for fast operation
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