Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2003
12/10/2003EP1368672A2 A scan test system and method for manipulating logic values that remain constant during normal operations
12/10/2003EP1368671A2 Built-in-self-test circuitry for testing a phase locked loop circuit
12/10/2003EP1368670A2 Test circuitry of an integrated circuit comprising only one selection element for each signal path
12/10/2003EP1368669A1 Method for testing a measurement recording device and corresponding testing device
12/10/2003EP1368666A2 Method and apparatus for retaining a spring probe
12/10/2003CN2591636Y Adapter mould for printed circuit board testing device
12/10/2003CN2591635Y Testing mould for printed-circuit board tester
12/10/2003CN2591634Y High voltage breakdown voltage comprehensive tester
12/10/2003CN2591633Y Three-phase sinusoidal AC electric power abnormal situation detecting circuit
12/10/2003CN2591632Y Apparatus for measuring electrical property of master plate
12/10/2003CN2591631Y Line detector
12/10/2003CN2591630Y Transmission line short-circuit fault indicator
12/10/2003CN2591628Y Insulating property on-line detector for electrical equipment
12/10/2003CN1461493A Cleaning method and etching method
12/10/2003CN1461412A Module of testing device for testing printed circuit boards
12/10/2003CN1461011A Internal power supply voltage controller with two standard voltage generation circuit
12/10/2003CN1460923A Single-output feedback-free sequential test response compression circuit
12/10/2003CN1460863A Contact MEMS switch life testing method and its testing instrument
12/09/2003US6662347 On-chip diagnostic system, integrated circuit and method
12/09/2003US6662328 Method of making logic devices
12/09/2003US6662327 Method for clustered test pattern generation
12/09/2003US6662326 Circuit cell having a built-in self-test function, and test method therefor
12/09/2003US6662325 Apparatus for on-line circuit debug using JTAG and shadow scan in a microprocessor
12/09/2003US6662324 Global transition scan based AC method
12/09/2003US6662323 Fast error diagnosis for combinational verification
12/09/2003US6662313 System and method for multiple cycle capture of chip state
12/09/2003US6662143 Measuring method and measuring device
12/09/2003US6662142 System for providing information on quality and reliability of optical semiconductor device by using communication network
12/09/2003US6662134 Method and apparatus for enabling extests to be performed in AC-coupled systems
12/09/2003US6662132 Noise analyzing method and apparatus and storage medium
12/09/2003US6662126 Measuring skew using on-chip sampling
12/09/2003US6661839 Method and device for compressing and expanding data pattern
12/09/2003US6661735 Semiconductor memory device
12/09/2003US6661729 Semiconductor device having test mode
12/09/2003US6661727 Dynamic register with low clock rate testing capability
12/09/2003US6661718 Testing device for testing a memory
12/09/2003US6661515 Method for characterizing defects on semiconductor wafers
12/09/2003US6661266 All digital built-in self-test circuit for phase-locked loops
12/09/2003US6661248 Tester for semiconductor integrated circuits
12/09/2003US6661247 Semiconductor testing device
12/09/2003US6661246 Constant-current VDDQ testing of integrated circuits
12/09/2003US6661245 Method to eliminate wiring of electrical fixtures using spring probes
12/09/2003US6661243 Semiconductor device evaluation apparatus and semiconductor device evaluation program product
12/09/2003US6661238 Abnormality diagnosis method and apparatus for separable transformer
12/09/2003US6661237 Smart AWA
12/09/2003US6661235 Method and device for detecting a partial discharge in an electrical device
12/09/2003US6661234 Failure determining apparatus of gas-insulated electrical appliance
12/09/2003US6661231 Battery capacity calculating method and device therefor
12/09/2003US6661202 Degradation degree computing method and unit for battery
12/09/2003US6661200 Rechargeable power supply system and method of protection against abnormal charging
12/09/2003US6660541 Semiconductor device and a manufacturing method thereof
12/09/2003US6659812 Surface mount probe point socket and system
12/09/2003US6658736 Method of fabricating a heat exchanger, for regulating the temperature of multiple integrated circuit modules, having a face of a solid malleable metal coated with a release agent
12/09/2003CA2132137C Self testing circuit breaker ground fault and sputtering arc trip unit
12/04/2003WO2003100847A1 Probe card carrying equipment and connected body moving mechanism
12/04/2003WO2003100837A2 Large substrate test system
12/04/2003WO2003100596A1 Product replacement method and system
12/04/2003WO2003100473A2 Apparatus and method for optically detecting defects in voltage contrast test structures
12/04/2003WO2003100446A2 High performance probe system for testing semiconductor wafers
12/04/2003WO2003073680A3 Jitter measuring apparatus and method
12/04/2003WO2003054562A3 Method for checking the electrical safety of a household appliance, and corresponding household appliance
12/04/2003WO2002075330A3 Universal test interface between a device under test and a test head
12/04/2003US20030226083 Self-synchronous logic circuit having test function and method of testing self-synchronous logic circuit
12/04/2003US20030226081 On chip debugging method of microcontrollers
12/04/2003US20030226080 Method and apparatus for affecting a portion of an integrated circuit
12/04/2003US20030226079 Scan-path flip-flop circuit for integrated circuit memory
12/04/2003US20030226078 Apparatus and method for programmable fuse repair to support dynamic relocate and improved cache testing
12/04/2003US20030226077 Low power level-sensitive scan mechanism
12/04/2003US20030226076 PC and ATE integrated chip test equipment
12/04/2003US20030226072 Hidden failure detection
12/04/2003US20030226071 System and method for retransmission of data
12/04/2003US20030226064 Semiconductor memory device
12/04/2003US20030226002 Devices, systems and methods for conditional instructions notice
12/04/2003US20030225558 Logic simulation method for information handling system incorporated with memory macro
12/04/2003US20030224650 Semiconductor socket and replacing method of its probe of semiconductor socket
12/04/2003US20030224635 Contactor block and apparatus for electrical connection
12/04/2003US20030224627 Probe card, probe card manufacturing method, and contact
12/04/2003US20030224545 Direct determination of interface traps in mos devices
12/04/2003US20030224540 Recognition method of a mark provided on a semiconductor device
12/04/2003US20030223526 On-chip system and method for measuring jitter tolerance of a clock and data recovery circuit
12/04/2003US20030223423 Classifying traffic at a network node using multiple on-chip memory arrays
12/04/2003US20030223364 Classifying and distributing traffic at a network node
12/04/2003US20030223363 Image forming apparatus connected to network
12/04/2003US20030223297 Semiconductor device and method for testing the same
12/04/2003US20030223295 Field programmable gate array with a variably wide word width memory
12/04/2003US20030222867 Energy consumption-rate indication for a battery-powered electronic device
12/04/2003US20030222786 Method and apparatus for tracking remote ends of networking cables
12/04/2003US20030222681 Comparator
12/04/2003US20030222677 Scan flip-flop circuit, scan flip-flop circuit array, and integrated circuit device
12/04/2003US20030222671 Method and system for wafer level testing and burning-in semiconductor components
12/04/2003US20030222670 Semiconductor testing apparatus
12/04/2003US20030222669 Method and system of evaluating pll built-in circuit
12/04/2003US20030222667 Probe card assembly
12/04/2003US20030222666 Probe applied to semiconductor package test and method for testing semiconductor package
12/04/2003US20030222654 Cable testing, cable length, and liquid level determination system utilizing a standing wave reflectometer
12/04/2003US20030222653 Method of and apparatus for simultaneously providing tone and intermittent link onto a cable to assist identifying the cable
12/04/2003US20030222636 Handling apparatus and test set using the handling apparatus
12/04/2003US20030222612 Motor abnormality detection apparatus and electric power steering control system
12/04/2003US20030222283 Semiconductor integrated circuit and testing method thereof
12/04/2003US20030222220 Methods for analyzing defect artifacts to precisely locate corresponding defects
1 ... 1131 1132 1133 1134 1135 1136 1137 1138 1139 1140 1141 1142 1143 1144 1145 1146 1147 1148 1149 1150 1151 ... 1523