| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/18/2003 | CA2416350A1 Display apparatus for displaying property of electronic appliance |
| 12/17/2003 | EP1372112A2 Combined laser/flir optics system |
| 12/17/2003 | EP1371995A1 Serial communication testing |
| 12/17/2003 | EP1370940A2 A system and method to enhance manufacturing test failure analysis with dedicated pins |
| 12/17/2003 | EP1370883A1 Integrated circuit testing device with improved reliability |
| 12/17/2003 | EP1370882A2 Test system formatters |
| 12/17/2003 | EP1370881A2 Method for testing an electronic device |
| 12/17/2003 | EP1370880A1 A multiple-capture dft system for scan-based integrated circuits |
| 12/17/2003 | EP1370879A2 System and method for fault isolation for dsl loop extenders |
| 12/17/2003 | EP1370878A1 Low profile pneumatically actuated docking module with power fault release |
| 12/17/2003 | EP1071962B1 Automatic test equipment with internal high speed interconnections |
| 12/17/2003 | EP0780037B1 A method for testing an electronic circuit by logically combining clock signals, and an electronic circuit provided with facilities for such testing |
| 12/17/2003 | CN2593375Y Polymer cell clamp for chemical component content detection apparatus |
| 12/17/2003 | CN2593209Y Battery constant current discharge detecting apparatus |
| 12/17/2003 | CN2593208Y Circuit treaker action reliability test prompting apparatus |
| 12/17/2003 | CN2593207Y Element measuring apparatus |
| 12/17/2003 | CN2593206Y Motor winding welding and coil resistance measuring clamp |
| 12/17/2003 | CN2593205Y Insulation detection isolator |
| 12/17/2003 | CN2593204Y Multifunctional comprehensive power virtual measuring analyser |
| 12/17/2003 | CN2593203Y Pneumatic separation test platform |
| 12/17/2003 | CN2593200Y Silicon rectifier generator, storage battery fault indicator |
| 12/17/2003 | CN1462475A Method for evaluating system-on-chip (SOC) having core as its base and SOC stracture realizing the method |
| 12/17/2003 | CN1462373A Inspection device for liquid crystal driving substrate |
| 12/17/2003 | CN1462371A Display device comprising plurality of LEDS |
| 12/17/2003 | CN1462370A Sequence generation with high-time-precision by using general-purpose operating system in semiconductor test system |
| 12/17/2003 | CN1462086A Recharageable battery antiforge system |
| 12/17/2003 | CN1462068A Semiconductor device and capacitance measuring method |
| 12/17/2003 | CN1461954A Printed circuit board testing unit |
| 12/17/2003 | CN1131438C Defect detector for cage type motor cast alumiuium rotor in hot state |
| 12/17/2003 | CN1131437C Circuit for testing allowable current of capacitor |
| 12/17/2003 | CN1131434C Power supply circuit for electricity meter |
| 12/16/2003 | US6665828 Globally distributed scan blocks |
| 12/16/2003 | US6665827 Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system for utilizing the semiconductor integrated circuit |
| 12/16/2003 | US6665826 Method and apparatus for testing the timing of integrated circuits |
| 12/16/2003 | US6665820 Method and system for communications connectivity failure diagnosis |
| 12/16/2003 | US6665817 Apparatus and method for implementing a wireless system-on-a-chip with a reprogrammable tester, debugger, and bus monitor |
| 12/16/2003 | US6665816 Data shift register |
| 12/16/2003 | US6665627 Method and apparatus for evaluating and correcting the tester derating factor (TDF) in a test environment |
| 12/16/2003 | US6665626 Network-based computer testing system |
| 12/16/2003 | US6665624 Generating and using calibration information |
| 12/16/2003 | US6665623 Method and apparatus for optimizing downstream uniformity |
| 12/16/2003 | US6665621 System and method for waveform processing |
| 12/16/2003 | US6665367 Embedded frequency counter with flexible configuration |
| 12/16/2003 | US6665162 Apparatus for determining failure of electromagnetic clutch |
| 12/16/2003 | US6664808 Method of using partially defective programmable logic devices |
| 12/16/2003 | US6664803 Method and apparatus for selecting an encryption integrated circuit operating mode |
| 12/16/2003 | US6664802 System and method for diagnosing fault conditions associated with powering an electrical load |
| 12/16/2003 | US6664801 IDDQ test methodology based on the sensitivity of fault current to power supply variations |
| 12/16/2003 | US6664800 Non-contact method for determining quality of semiconductor dielectrics |
| 12/16/2003 | US6664799 Method and apparatus for enabling a digital memory tester to read the frequency of a free running oscillator |
| 12/16/2003 | US6664798 Integrated circuit with test interface |
| 12/16/2003 | US6664797 Method for profiling semiconductor device junctions using a voltage contrast scanning electron microscope |
| 12/16/2003 | US6664794 Apparatus and method for evaluating the surface insulation resistance of electronic assembly manufacture |
| 12/16/2003 | US6664792 Method and apparatus for battery power pre-check at system power-on |
| 12/16/2003 | US6664791 Alternator tester with improved heat dissipation |
| 12/16/2003 | US6664790 Automated diagnostic tester for HID lamp luminaires |
| 12/16/2003 | US6664778 Circuit board coupon tester |
| 12/16/2003 | US6664764 Apparatus and method for detecting a battery use state and mitigating battery deterioration |
| 12/16/2003 | US6664761 Battery voltage detection device |
| 12/16/2003 | US6663092 Holding apparatus |
| 12/16/2003 | CA2255916C Test system and test method for testing the operability of test samples |
| 12/11/2003 | WO2003103351A1 Fixing means |
| 12/11/2003 | WO2003103314A1 System and method for retransmission of data |
| 12/11/2003 | WO2003102747A2 Method and control circuitry for accessing multiple taps (test access ports) via a single tap |
| 12/11/2003 | WO2003102679A1 Apparatus for inspecting flat panel display |
| 12/11/2003 | WO2003102613A1 Electric arc testing systems |
| 12/11/2003 | WO2003102612A2 Fixing means for components and cards |
| 12/11/2003 | WO2003102611A1 Device for testing cables provided with luminous signals |
| 12/11/2003 | WO2003102610A2 Method and device for detection in the frequency range, based on a time range measurement |
| 12/11/2003 | WO2003102604A1 Device and method of testing an electronic component |
| 12/11/2003 | WO2003075321A3 An apparatus and method for measuring a property of a layer in a multilayered structure |
| 12/11/2003 | WO2003019184A9 Biometric quality control process |
| 12/11/2003 | US20030229886 Semiconductor integrated circuit, design support apparatus, and test method |
| 12/11/2003 | US20030229838 Apparatus and method for diagnosing integrated circuit, and integrated circuit |
| 12/11/2003 | US20030229837 Method and apparatus for testing a logic cell in a semiconductor device |
| 12/11/2003 | US20030229836 Integrated circuit |
| 12/11/2003 | US20030229835 High speed interconnect circuit test method and apparatus |
| 12/11/2003 | US20030229834 Variable clocked scan test circuitry and method |
| 12/11/2003 | US20030229833 Method of masking corrupt bits during signature analysis and circuit for use therewith |
| 12/11/2003 | US20030229832 Method and apparatus for providing a preselected voltage to test or repair a semiconductor device |
| 12/11/2003 | US20030229829 Data transmission apparatus and method |
| 12/11/2003 | US20030229730 Performance tuning using device signature information |
| 12/11/2003 | US20030229488 Algorithms for determining path coverages and activity |
| 12/11/2003 | US20030229473 Event processing apparatus and method for high speed event based test system |
| 12/11/2003 | US20030229467 Methods and structure for maintaining state information to resume automated test processing after reset |
| 12/11/2003 | US20030229466 Test method and apparatus for source synchronous signals |
| 12/11/2003 | US20030229465 Method and program product to optimize manufacturing test time of electrical devices |
| 12/11/2003 | US20030228503 Fuel cell system and method for voltage monitoring for a fuel cell system |
| 12/11/2003 | US20030227806 Semiconductor memory device |
| 12/11/2003 | US20030227390 Low-battery-status informing device and method for portable electronic apparatus |
| 12/11/2003 | US20030227292 Non-invasive electrical measurement of semiconductor wafers |
| 12/11/2003 | US20030226704 Failure diagnostic system for seat belt retractor |
| 12/11/2003 | CA2485234A1 Device for testing cables provided with luminous signals |
| 12/10/2003 | EP1370030A2 Method of and apparatus for simultaneously providing tone and intermittent pulses onto a cable in order to identify the cable |
| 12/10/2003 | EP1369878A1 System for testing a group of functionally independent memories and for replacing failing memory words |
| 12/10/2003 | EP1369700A2 Distributed interface for parallel testing of multiple devices using a single tester channel |
| 12/10/2003 | EP1369320A2 Failure diagnostic system for seat belt retractor |
| 12/10/2003 | EP1368974A1 Method and device for testing the electromagnetic compatibility of screen devices |
| 12/10/2003 | EP1368943A1 Apparatus and method for network-initiated real-time multi-party communications |
| 12/10/2003 | EP1368812A2 Circuit and method for test and repair |