| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/25/2003 | US20030234643 Diagnostic adaptor with threadless docking fixture |
| 12/25/2003 | US20030234640 Method for producing a captive wired test fixture and fixture therefor |
| 12/25/2003 | US20030234394 Measuring force on dies and substrates |
| 12/25/2003 | US20030234393 Isolation circuit |
| 12/24/2003 | WO2003107488A1 Connector, electronic component fixing device, and tester |
| 12/24/2003 | WO2003107059A1 Laser production and product qualification via accelerated life testing based on statistical modeling |
| 12/24/2003 | WO2003107023A1 Method and apparatus for testing and characterizing a circuit comprising a phase-locked loop |
| 12/24/2003 | WO2003107022A1 Module-testing device |
| 12/24/2003 | WO2003107021A1 Method for determining an equivalent circuit for a solar cell |
| 12/24/2003 | WO2003107020A2 Integrated battery service system |
| 12/24/2003 | WO2003107019A2 A digital system and method for testing analogue and mixed-signal circuits or systems |
| 12/24/2003 | WO2003106925A1 Semiconductor wafer shape evaluating method and shape evaluating device |
| 12/24/2003 | WO2003040732A3 Impedance stabilization network for determining the electromagnetic interfering radiation of a modem |
| 12/24/2003 | WO2003034083A3 Automatic scan-based testing of complex integrated circuits |
| 12/24/2003 | WO2003016929A8 Pin electronics interface circuit |
| 12/24/2003 | WO2002045213A3 Tapped delay line high speed register |
| 12/24/2003 | CN2594805Y 6-10 KV zinc oxide lightning arrester online tester |
| 12/24/2003 | CN2594804Y Cable checking instrument |
| 12/24/2003 | CN2594803Y Extending board tray for testing electric circuit boards |
| 12/24/2003 | CN2594802Y Digital capacitance meter with wide measurement range |
| 12/24/2003 | CN2594801Y Intellectual range finder |
| 12/24/2003 | CN2594799Y Equipotential coupling resistor measuring device with storage function |
| 12/24/2003 | CN1463365A Low noise microwave synthesizer employing high frequency combs for tuning drift cancel loop |
| 12/24/2003 | CN1463032A Identifying method of mark on semiconductor device |
| 12/24/2003 | CN1463031A Fault-telerance method and system of testing chip for boundary scanning |
| 12/24/2003 | CN1462887A Processor and experimental equipment using same |
| 12/24/2003 | CN1132510C Transfer appts. |
| 12/24/2003 | CN1132285C Accumulator controller and management method |
| 12/24/2003 | CN1132272C Pressing-in contact element |
| 12/24/2003 | CN1132246C Acceleration test method of semiconductor memory |
| 12/24/2003 | CN1132133C 可母线驱动的传感装置及相应的检验方法 The sensing means may be the bus driver and the corresponding test methods |
| 12/24/2003 | CN1132130C 电力系统中断路器状态确定时的衰耗电流检测 Attenuation of the power system to determine when the current detection circuit breaker status of |
| 12/24/2003 | CN1132105C 电子设备与电池组之间通信的方法及相关的装置和电池 The method of communication between the electronic device and the battery pack and the associated devices and batteries |
| 12/24/2003 | CN1132052C 制造液晶显示模块的方法 The method of manufacturing a liquid crystal display module |
| 12/24/2003 | CN1132047C Driving chip, liquid crystal panel, liquid crystal device and electronic equipment |
| 12/24/2003 | CN1132015C Non-destructive measuring method for minotiry carrier diffusion length and life of semiconductor device |
| 12/24/2003 | CN1131833C Gripping jaw of gripping deivce for use in modular integrated circuit information processor |
| 12/24/2003 | CA2483369A1 Integrated battery service system |
| 12/23/2003 | US6668348 Memory-mounting integrated circuit and test method thereof |
| 12/23/2003 | US6668347 Built-in self-testing for embedded memory |
| 12/23/2003 | US6668346 Digital process monitor |
| 12/23/2003 | US6668334 Apparatus for detecting clock failure within a fixed number of cycles of the clock |
| 12/23/2003 | US6668332 Functional clock observation controlled by JTAG extensions |
| 12/23/2003 | US6668331 Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory |
| 12/23/2003 | US6668247 Method and system for determining state-of-health of a lead-acid defibrillator battery using an intelligent system |
| 12/23/2003 | US6668242 Emulator chip package that plugs directly into the target system |
| 12/23/2003 | US6668237 Run-time reconfigurable testing of programmable logic devices |
| 12/23/2003 | US6668235 Identification of channels and associated signal information contributing to a portion of a composite eye diagram |
| 12/23/2003 | US6668233 Method for identifying the condition of an energy accumulator |
| 12/23/2003 | US6668076 Apparatus and method for projecting an alignment image |
| 12/23/2003 | US6667928 Semiconductor device in which a chip is supplied either a first voltage or a second voltage |
| 12/23/2003 | US6667691 Apparatus for the detection and early warning of electrical arcing fault |
| 12/23/2003 | US6667632 Potential sensor for detecting voltage of inspection target at non-contact condition to attain higher speed of inspection |
| 12/23/2003 | US6667630 Universal flying probe fixture |
| 12/23/2003 | US6667628 Method and apparatus for the management of forces in a wireless fixture |
| 12/23/2003 | US6667627 Probe for inspecting semiconductor device and method of manufacturing the same |
| 12/23/2003 | US6667626 Probe card, and testing apparatus having the same |
| 12/23/2003 | US6667625 Method and apparatus for detecting wire in an ultrasonic bonding tool |
| 12/23/2003 | US6667624 Battery clamp connection detection method and apparatus |
| 12/23/2003 | US6667623 Light degradation sensing led signal with visible fault mode |
| 12/23/2003 | US6667601 Control arrangement and method for power electronic system |
| 12/23/2003 | US6666691 Socket for removably mounting electronic packages |
| 12/18/2003 | WO2003105341A1 Active load arrangement |
| 12/18/2003 | WO2003105288A1 Contact for spiral contactor and spiral contactor |
| 12/18/2003 | WO2003105157A1 Semiconductor memory device with test mode to monitor internal timing control signals at 1/0 |
| 12/18/2003 | WO2003104828A1 Variable clock scan test circuitry and method |
| 12/18/2003 | WO2003104827A1 Method of masking corrupt bits during signature analysis and circuit for use therewith |
| 12/18/2003 | WO2003104826A1 Semiconductor test apparatus |
| 12/18/2003 | WO2003104038A1 Circuit for detecting ground offset of parts of a network |
| 12/18/2003 | WO2003090253A3 Single axis manipulator with controlled compliance |
| 12/18/2003 | WO2003081400A3 Integrated circuit security and method therefor |
| 12/18/2003 | WO2003075344A3 Method for processing multiple semiconductor devices for test |
| 12/18/2003 | WO2003047064A3 Remote battery monitoring systems and sensors |
| 12/18/2003 | WO2003041209A3 Device and method for the temporally and spatially dependent measuring of an operating parameter of an electrochemical cell |
| 12/18/2003 | WO2003038617A3 Electronic component with output buffer control |
| 12/18/2003 | WO2003034385A3 System and method for illumination timing compensation in response to row resistance |
| 12/18/2003 | WO2003034384A3 Method and system for precharging oled/pled displays with a precharge latency |
| 12/18/2003 | WO2003029833A3 Stackable semiconductor test system and method for operating same |
| 12/18/2003 | WO2003023616A3 Method for debugging reconfigurable architectures |
| 12/18/2003 | WO2003017335A3 Systems for wafer level burn-in of electronic devices |
| 12/18/2003 | WO2002079887A3 Apparatus and methods with resolution enhancement feature for improving accuracy of conversion of required chemical mechanical polishing pressure to force to be applied by polishing head to wafer |
| 12/18/2003 | WO2002063323A3 Method and apparatus for contactless capacitive testing of integrated circuits |
| 12/18/2003 | US20030233624 Method for predicting the degradation of an integrated circuit performance due to negative bias temperature instability |
| 12/18/2003 | US20030233608 Round-robin updating for high speed i/o parallel interfaces |
| 12/18/2003 | US20030233606 Test facilitation circuit |
| 12/18/2003 | US20030233600 Reducing the complexity of finite state machine test generation using combinatorial designs |
| 12/18/2003 | US20030233504 Method for detecting bus contention from RTL description |
| 12/18/2003 | US20030233216 Tester information web service |
| 12/18/2003 | US20030233208 Test system for circuits |
| 12/18/2003 | US20030233207 Apparatus and method for testing a computer system by utilizing FPGA and programmable memory module |
| 12/18/2003 | US20030233173 Method and apparatus for latent temperature control for a device under test |
| 12/18/2003 | US20030231145 Display apparatus for displaying property of electronic appliance |
| 12/18/2003 | US20030231028 Method of determining reliability of semiconductor products |
| 12/18/2003 | US20030231027 Semiconductor device socket and semiconductor device connecting method using anisotropic conductive sheet |
| 12/18/2003 | US20030231025 System and method for measuring a capacitance of a conductor |
| 12/18/2003 | US20030231021 Dynamic trimming technique for variations in oscillator parameters |
| 12/18/2003 | US20030231006 Deterioration degree calculating apparatus and deterioration degree calculating method for a battery |
| 12/18/2003 | US20030230937 Sag generator with plurality of switch technologies |
| 12/18/2003 | US20030230810 Semiconductor device including evaluation elements |
| 12/18/2003 | US20030230155 Manipulator apparatus with low-cost compliance |