Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/2004
01/01/2004US20040000913 Apparatus and method for data and/or command input and display in a battery charger and/or tester
01/01/2004US20040000898 Method and apparatus for identifying, locating and tracing wires in a multiple wire electrical system
01/01/2004US20040000892 Method for determining a maximum charge current and a maximum discharge current of a battery
01/01/2004US20040000891 Battery charger/tester with storage media
01/01/2004US20040000706 Semiconductor device, semiconductor package, and method for testing semiconductor device
01/01/2004US20040000590 Bar code reading method and apparatus for a battery tester charger
12/2003
12/31/2003WO2004002050A1 A fault-tolerant broadcast router
12/31/2003WO2004001807A2 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs
12/31/2003WO2004001706A2 Control device of an optoelectronic device having improved testing properties
12/31/2003WO2004001674A1 Optical inspection of electronic circuit boards, wafers and the like, using skeletal reference images and separately programmable alignment tolerance and detection parameters
12/31/2003WO2004001568A2 Single pin multilevel integrated circuit test interface
12/31/2003WO2004001437A1 Circuit for simultaneous testing of electricity meters with interconnected current and voltage circuits
12/31/2003WO2004001433A1 Electronic circuit with asynchronously operating components
12/31/2003WO2004001432A1 Electromigration test device and electromigration test method
12/31/2003WO2004001431A1 Fault location using measurements of current and voltage from one end of a line
12/31/2003WO2004001430A1 Electric power line on-line diagnostic method
12/31/2003WO2004001429A1 Multi-socket board for open/short tester
12/31/2003WO2004001428A1 Test method for yielding a known good die
12/31/2003WO2003034199A9 Interface architecture for embedded field programmable gate array cores
12/31/2003CN2596369Y High voltage motor insulation on-line monitor
12/31/2003CN2596368Y Magnetic field modifier for detecting Hall integrated circuit
12/31/2003CN2596367Y High voltage breakdown indicator
12/31/2003CN2596366Y High voltage test wire connection mechanical hand for 110KV and more transforming station main transformer
12/31/2003CN2596365Y Device for detecting circuit base board
12/31/2003CN1465198A Method and device for testing the electromagnetic compatibility of screen devices
12/31/2003CN1464980A Method for calibrating semiconductor test instrument
12/31/2003CN1464979A Low leakage technique for determining power spectra of non-coherently sampled data
12/31/2003CN1464542A Three-end electrical measuring process for quantum spots
12/31/2003CN1464312A Machine allocation of IC test processor and process for making the same
12/31/2003CN1464311A Process for determining quality of medium and small power triode by the resistance method
12/31/2003CN1464310A Method for detecting false welding and short circuit defect using universal meter
12/31/2003CN1133207C Circuit board for screening detection and mfg. method of known qualified tube core
12/31/2003CN1133174C Semiconductor memory device and method of burn-in testing
12/31/2003CN1133173C 用于检测数字半导体电路装置的测试电路和方法 Test circuit and method for detecting digital semiconductor circuit device for
12/31/2003CN1133172C 测试可读写的集成电子电路的总线接线的方法 Can read and write test integrated electronic circuits bus wiring method
12/31/2003CN1133171C Test method for high speed memory devices by using clock modulation technique
12/31/2003CA2490472A1 Electric power line on-line diagnostic method
12/30/2003US6671870 Computer implemented circuit synthesis system
12/30/2003US6671860 Method and apparatus for fault injection using boundary scan for pins enabled as outputs
12/30/2003US6671848 Test circuit for exposing higher order speed paths
12/30/2003US6671847 I/O device testing method and apparatus
12/30/2003US6671846 Method of automatically generating schematic and waveform diagrams for isolating faults from multiple failing paths in a circuit using input signal predictors and transition times
12/30/2003US6671845 Packet-based device test system
12/30/2003US6671841 Method for on-line circuit debug using JTAG and shadow scan in a microprocessor
12/30/2003US6671840 Communication system with boundary scan elements
12/30/2003US6671839 Scan test method for providing real time identification of failing test patterns and test bist controller for use therewith
12/30/2003US6671838 Method and apparatus for programmable LBIST channel weighting
12/30/2003US6671835 Error detection in digital scanning device having parallel data streams
12/30/2003US6671663 Time domain noise analysis
12/30/2003US6671654 Apparatus and method for measuring and reporting the reliability of a power distribution system
12/30/2003US6671653 Semiconductor test system and monitor apparatus thereof
12/30/2003US6671652 Clock skew measurement circuit on a microprocessor die
12/30/2003US6671644 Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection
12/30/2003US6671638 Oscillation measuring method and frequency measuring apparatus
12/30/2003US6671637 Thrust ripple measuring apparatus and method in linear motor
12/30/2003US6671204 Nonvolatile memory device with page buffer having dual registers and methods of using the same
12/30/2003US6670820 Method and apparatus for evaluating electroluminescence properties of semiconductor materials and devices
12/30/2003US6670819 Methods of engaging electrically conductive pads on a semiconductor substrate
12/30/2003US6670816 Test coupon for measuring a dielectric constant of a memory module board and method of use
12/30/2003US6670815 Electric device as well as process for its operation
12/30/2003US6670802 Integrated circuit having a test operating mode and method for testing a multiplicity of such circuits
12/30/2003US6670800 Timing variation measurements
12/30/2003US6670720 Semiconductor chip package with alignment structure
12/30/2003US6670717 Structure and method for charge sensitive electrical devices
12/30/2003US6670633 System for split package power and rotational burn-in of a microelectronic device
12/30/2003US6670622 Electron exposure device and method and electronic characteristics evaluation device using scanning probe
12/30/2003US6670201 Manufacturing method of semiconductor device
12/30/2003US6669489 Interposer, socket and assembly for socketing an electronic component and method of making and using same
12/30/2003US6668570 Apparatus and method for controlling the temperature of an electronic device under test
12/30/2003US6668448 Method of aligning features in a multi-layer electrical connective device
12/30/2003CA2202738C Apparatus for detecting and responding to series arcs in ac electrical systems
12/27/2003CA2433539A1 Apparatus and method for determining the temperature of a charging power source
12/25/2003US20030237065 Method and apparatus for verifying logical equivalency between logic circuits
12/25/2003US20030237062 Application of co-verification tools to the testing of IC designs
12/25/2003US20030237061 Test method for yielding a known good die
12/25/2003US20030237060 Pin toggling using an object oriented programming language
12/25/2003US20030237036 Semiconductor integrated circuit with built-in self-test function and system including the same
12/25/2003US20030237034 On-chip design for monitor
12/25/2003US20030237033 System for testing a group of functionally independent memories and for replacing failing memory words
12/25/2003US20030237032 Method for electronically testing memory modules
12/25/2003US20030237029 Method and apparatus for characterizing a circuit with multiple inputs
12/25/2003US20030237025 Automatic test equipment for test and analysis of analog DFT/BIST circuitry
12/25/2003US20030236656 Battery characterization system
12/25/2003US20030236644 Methods and systems for enhanced automated system testing
12/25/2003US20030236640 Fast waveform display method and system
12/25/2003US20030236597 Method of monitoring utility lines with aircraft
12/25/2003US20030235929 Signal sharing circuit with microelectronic die isolation features
12/25/2003US20030235754 End-of-discharge control apparatus for a battery of rechargeable electrochemical cells
12/25/2003US20030235156 Methods and structure for improved testing of embedded systems
12/25/2003US20030235117 Electronic timepiece, information processing device, method of displaying charged condition of seconary cell, and computer product
12/25/2003US20030235094 Semiconductor memory device with built-in self-diagnostic function and semiconductor device having the semiconductor memory device
12/25/2003US20030235090 Semiconductor memory device with reduced package test time
12/25/2003US20030234661 Semiconductor device and test method for the same
12/25/2003US20030234659 Electrical isolation between pins sharing the same tester channel
12/25/2003US20030234658 System and method for testing integrated circuits by transient signal analysis
12/25/2003US20030234657 Method for producing a probe, mask for producing the probe, and probe
12/25/2003US20030234654 Apparatus for calibrating high frequency signal measurement equipment
12/25/2003US20030234653 Method and device for insulation monitoring of a DC network
12/25/2003US20030234652 System and method for verifying failure detect circuitry in safety compliance test instruments
12/25/2003US20030234651 Automated electrostatic discharge device testing system
1 ... 1128 1129 1130 1131 1132 1133 1134 1135 1136 1137 1138 1139 1140 1141 1142 1143 1144 1145 1146 1147 1148 ... 1523