| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/07/2004 | EP1377840A2 Test system algorithmic program generators |
| 01/07/2004 | CN2597999Y High-voltage leak detector |
| 01/07/2004 | CN2597998Y Testing stand |
| 01/07/2004 | CN2597997Y Flashover telemetering system for isolator for high-voltage transmission line |
| 01/07/2004 | CN2597995Y Energy storage flash low-voltage electrometer |
| 01/07/2004 | CN1466689A Measurement of fuel cell impedance |
| 01/07/2004 | CN1466687A Interface module for high performance detector |
| 01/07/2004 | CN1466184A Method for directly calculating interface defect quantity of MOS FET |
| 01/07/2004 | CN1465986A Method for testing single phase grounding current of electric power network |
| 01/07/2004 | CN1465985A IC test processing machine for high-frequency IC test |
| 01/07/2004 | CN1465984A Unusual detector for vehicle carried electric loading driving system |
| 01/07/2004 | CN1134017C Semiconductor device having semiconductor memory circuit to be tested |
| 01/07/2004 | CN1134015C Integrated storage unit having at least two slice frayments |
| 01/06/2004 | US6675364 Insertion of scan hardware |
| 01/06/2004 | US6675362 Method and apparatus for managing circuit tests |
| 01/06/2004 | US6675360 System of management of the trimming of integrated fuses within a scan test architecture |
| 01/06/2004 | US6675339 Single platform electronic tester |
| 01/06/2004 | US6675338 Internally generated vectors for burnin system |
| 01/06/2004 | US6675337 Built-in self verification circuit for system chip design |
| 01/06/2004 | US6675336 Distributed test architecture for multiport RAMs or other circuitry |
| 01/06/2004 | US6675335 Method and apparatus for exercising external memory with a memory built-in self-test |
| 01/06/2004 | US6675334 Apparatus and method for multi-cycle memory access mapped to JTAG finite state machine with external flag for hardware emulation |
| 01/06/2004 | US6675333 Integrated circuit with serial I/O controller |
| 01/06/2004 | US6675332 LSI communication device with automatic test capability |
| 01/06/2004 | US6675331 Testable transparent latch and method for testing logic circuitry that includes a testable transparent latch |
| 01/06/2004 | US6675330 Testing the operation of integrated circuits by simulating a switching-mode of their power supply inputs |
| 01/06/2004 | US6675322 Integrated circuit having a self-test device |
| 01/06/2004 | US6675138 System and method for measuring temporal coverage detection |
| 01/06/2004 | US6675120 Color optical inspection system |
| 01/06/2004 | US6675118 System and method of determining the noise sensitivity characterization for an unknown circuit |
| 01/06/2004 | US6675117 Calibrating single ended channels for differential performance |
| 01/06/2004 | US6674890 Defect inspection method and apparatus therefor |
| 01/06/2004 | US6674627 Needle-card adjusting device for planarizing needle sets on a needle card |
| 01/06/2004 | US6674383 PWM-based measurement interface for a micro-machined electrostatic actuator |
| 01/06/2004 | US6674318 Semiconductor integrated circuit |
| 01/06/2004 | US6674301 Method and system of evaluating PLL built-in circuit |
| 01/06/2004 | US6674300 Method for testing a semiconductor integrated circuit when a difference between two consecutive current exceeds a threshold value |
| 01/06/2004 | US6674299 Semiconductor tester, semiconductor integrated circuit and semiconductor testing method |
| 01/06/2004 | US6674291 Method and apparatus for determining and/or improving high power reliability in thin film resonator devices, and a thin film resonator device resultant therefrom |
| 01/06/2004 | US6674290 Method and system for multi-port synchronous high voltage testing |
| 01/06/2004 | US6674288 Vehicle lamp inspection system |
| 01/06/2004 | US6674287 Method for grouping unit cells using pattern matching technology of impedance spectrum |
| 01/06/2004 | US6674266 Method for determining the operating state of an energy-storage battery |
| 01/06/2004 | US6674265 Operation method for secondary battery and secondary battery device |
| 01/06/2004 | US6674264 Cell voltage detector for fuel cell |
| 01/06/2004 | US6674153 Semiconductor device utilizing pad to pad wire interconnection for improving detection of failed region on the device |
| 01/06/2004 | US6672877 Contactor block and apparatus for electrical connection |
| 01/06/2004 | US6672874 Electrical connection structure in a motor vehicle |
| 01/06/2004 | CA2300455C Fault determination apparatus and fault determination method for a battery set |
| 01/06/2004 | CA2266696C Automatic fault location in cabling systems |
| 01/06/2004 | CA2259659C Automatic semiconductor wafer sorter/prober with extended optical inspection |
| 01/06/2004 | CA2209551C Improved protective grounding jumper cable tester |
| 01/02/2004 | EP1376681A2 Data analysis apparatus |
| 01/02/2004 | EP1376603A2 Charge sensing circuit |
| 01/02/2004 | EP1376417A1 Method and system for emulating a circuit under test associated with a test environment |
| 01/02/2004 | EP1376414A2 Method and apparatus for verifying circuit board design |
| 01/02/2004 | EP1376393A2 Method and apparatus for data analysis |
| 01/02/2004 | EP1376362A1 Device for fault localization in a complex system |
| 01/02/2004 | EP1376357A2 Integrated circuit having internal signature |
| 01/02/2004 | EP1376144A2 Test data analysis system |
| 01/02/2004 | EP1376143A2 Apparatus for displaying the distribution of an electric property of an electronic appliance |
| 01/02/2004 | EP1376141A1 Method for producing a captive wired test fixture and fixture therefor |
| 01/02/2004 | EP1376140A2 Probe card contact block and apparatus for electrical connection |
| 01/02/2004 | EP1375979A2 Electrical power supply system, system for determination of characteristic values, diagnostic system and diagnostic method |
| 01/02/2004 | EP1374364A1 Terminal assembly for battery |
| 01/02/2004 | EP1374250A2 Memory cell structural test |
| 01/02/2004 | EP1374107A2 Computer-aided design system to automate scan synthesis at register-transfer level |
| 01/02/2004 | EP1374103A2 System and method for test generation with dynamic constraints using static analysis |
| 01/02/2004 | EP1373915A2 Method of and apparatus for estimating the state of charge of a battery |
| 01/02/2004 | EP1373914A1 Anionic polymers composed of dicarboxylic acids and uses thereof |
| 01/02/2004 | EP1373913A1 Apparatus and method for testing circuit modules |
| 01/02/2004 | EP1373909A2 Circuit for improved test and calibration in automated test equipment. |
| 01/02/2004 | EP1373017A1 System and method for supervision |
| 01/01/2004 | US20040003358 Methods and apparatus for verifying circuit board design |
| 01/01/2004 | US20040003332 At speed testing of asynchronous signals |
| 01/01/2004 | US20040003330 Logic built-in self-test (BIST) |
| 01/01/2004 | US20040003329 Scan test method for providing real time identification of failing test patterns and test bist controller for use therewith |
| 01/01/2004 | US20040003328 Instrument initiated communication for automatic test equipment |
| 01/01/2004 | US20040002836 Apparatus and method for testing and charging a power source with ethernet |
| 01/01/2004 | US20040002832 Method and apparatus for boundary scan of serial interfaces |
| 01/01/2004 | US20040002831 Method for verifying cross-sections |
| 01/01/2004 | US20040002829 Semiconductor test data analysis system |
| 01/01/2004 | US20040002827 Data analysis method and apparatus therefor |
| 01/01/2004 | US20040002825 microprocessor linked to the battery charger, and an automatic temperature sensor linked to the microprocessor; notifies operator if temperature exceeds a predetermined amount |
| 01/01/2004 | US20040002824 Field programmable gate array (FPGA) linked to a battery charger; microprocessor allows battery information to be collected and transmitted to a variety of sources |
| 01/01/2004 | US20040002791 Measurement of voltage; calibration |
| 01/01/2004 | US20040002175 On-wafer burn-in of semiconductor devices using thermal rollover |
| 01/01/2004 | US20040002174 Current measurement circuit and method for voltage regulated semiconductor integrated circuit devices |
| 01/01/2004 | US20040001996 Abnormality diagnosis device and method for battery pack |
| 01/01/2004 | US20040001377 Semiconductor memory device |
| 01/01/2004 | US20040001096 Data analysis apparatus |
| 01/01/2004 | US20040001017 Measuring skew between digitizer channels using fourier transform |
| 01/01/2004 | US20040000944 Switching point detection circuit and semiconductor device using the same |
| 01/01/2004 | US20040000923 Electromagnetic stator insulation flaw detector |
| 01/01/2004 | US20040000922 System and method for measuring fault coverage in an integrated circuit |
| 01/01/2004 | US20040000921 Method and apparatus for measuring frequency pulling in oscillators |
| 01/01/2004 | US20040000917 System and method for measuring a capacitance associated with an integrated circuit |
| 01/01/2004 | US20040000916 Method and apparatus for detecting conditions in paralleled DC power cables |
| 01/01/2004 | US20040000915 Battery clamp connection detection method and apparatus |
| 01/01/2004 | US20040000914 Apparatus for accurately measuring battery voltage |