| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/13/2004 | US6678853 Method and apparatus for generating random code |
| 01/13/2004 | US6678852 Semiconductor device testing apparatus |
| 01/13/2004 | US6678851 Semiconductor device |
| 01/13/2004 | US6678850 Distributed interface for parallel testing of multiple devices using a single tester channel |
| 01/13/2004 | US6678849 Semiconductor integrated circuit and test pattern generation method therefor |
| 01/13/2004 | US6678848 Programming circuitry for configurable FPGA I/O |
| 01/13/2004 | US6678847 Real time function view system and method |
| 01/13/2004 | US6678846 Semiconductor integrated circuit with a scan path circuit |
| 01/13/2004 | US6678841 Function test support system and function test support method and hardware description model |
| 01/13/2004 | US6678739 System, method, and computer program product for compressing test pattern set |
| 01/13/2004 | US6678707 Generation of cryptographically strong random numbers using MISRs |
| 01/13/2004 | US6678645 Method and apparatus for SoC design validation |
| 01/13/2004 | US6678643 Event based semiconductor test system |
| 01/13/2004 | US6678623 Failure analysis device and failure analysis method |
| 01/13/2004 | US6678244 Congestion management system and method |
| 01/13/2004 | US6678241 Fast convergence with topology switching |
| 01/13/2004 | US6678205 Multi-mode synchronous memory device and method of operating and testing same |
| 01/13/2004 | US6678055 Method and apparatus for measuring stress in semiconductor wafers |
| 01/13/2004 | US6677860 Method and apparatus for end of discharge indication based on critical energy requirement |
| 01/13/2004 | US6677777 Short circuit generator for testing power supplies |
| 01/13/2004 | US6677776 Method and system having switching network for testing semiconductor components on a substrate |
| 01/13/2004 | US6677775 Circuit testing device using a driver to perform electronics testing |
| 01/13/2004 | US6677774 Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester |
| 01/13/2004 | US6677773 Testing device for printed circuit boards |
| 01/13/2004 | US6677772 Contactor with isolated spring tips |
| 01/13/2004 | US6677770 Programmable test socket |
| 01/13/2004 | US6677769 Scanning electromagnetic-field imager with optical-fiber-based electro-optic field-mapping system |
| 01/13/2004 | US6677761 Wire insulation defect detector |
| 01/13/2004 | US6677760 Method of and apparatus for analyzing failure |
| 01/13/2004 | US6677759 Method and apparatus for high-voltage battery array monitoring sensors network |
| 01/13/2004 | US6677758 Multiplex voltage measurement apparatus |
| 01/13/2004 | US6677745 Test apparatus for parallel testing a number of electronic components and a method for calibrating the test apparatus |
| 01/13/2004 | US6677744 System for measuring signal path resistance for an integrated circuit tester interconnect structure |
| 01/13/2004 | US6677729 Method and unit for computing voltage drop divided along factors for battery |
| 01/13/2004 | US6677245 Contact structure production method |
| 01/13/2004 | US6677172 On-wafer burn-in of semiconductor devices using thermal rollover |
| 01/13/2004 | US6677169 Method and system for backside device analysis on a ball grid array package |
| 01/13/2004 | US6676438 Contact structure and production method thereof and probe contact assembly using same |
| 01/13/2004 | US6676418 Socket for electrical parts |
| 01/13/2004 | US6675473 Method of positioning a conductive element in a laminated electrical device |
| 01/13/2004 | US6675450 Method of manufacturing and mounting electronic devices to limit the effects of parasitics |
| 01/12/2004 | CA2435102A1 Device and method for controlling fuel cell system |
| 01/08/2004 | WO2004003967A2 Scan test method providing real time identification of failing test patterns and test controller for use therewith |
| 01/08/2004 | WO2004003584A1 Device and method for determining a charged state of a battery |
| 01/08/2004 | WO2004003583A1 Instrument initiated communication for automatic test equipment |
| 01/08/2004 | WO2004003582A1 Methods for delay-fault testing in field-programmable gate arrays |
| 01/08/2004 | WO2004003581A1 A system for burn-in testing of electronic devices |
| 01/08/2004 | WO2004003580A1 Medical device testing apparatus |
| 01/08/2004 | WO2004003578A1 Method for determination of a parameter of an electrical network |
| 01/08/2004 | WO2004003577A1 Apparatus and method for identifying conductors |
| 01/08/2004 | WO2004003576A2 Cell buffer with built-in test |
| 01/08/2004 | WO2004003574A1 Under-voltage detection circuit |
| 01/08/2004 | WO2004003572A2 Methods and apparatus for test process enhancement |
| 01/08/2004 | WO2003090018A3 Network processor architecture |
| 01/08/2004 | WO2003089943A3 Test plate for ceramic surface mount devices and other electronic components |
| 01/08/2004 | WO2003065063A3 Picosecond imaging circuit analysis(pica)timing system measurement and calibration |
| 01/08/2004 | WO2003034388A3 Circuit for predictive control of boost current in a passive matrix oled display and method therefor |
| 01/08/2004 | WO2003017325A3 Providing current control over wafer borne semiconductor devices using trenches |
| 01/08/2004 | WO2002099888A3 Composite semiconductor structure and device with optical testing elements |
| 01/08/2004 | WO2002047298A3 Method and apparatus for creating and testing a channel decoder with built-in self-test (bist) |
| 01/08/2004 | WO2002035169A3 Methods and apparatus for recycling cryogenic liquid or gas from test chamber |
| 01/08/2004 | US20040006752 Accelerating scan test by re-using response data as stimulus data |
| 01/08/2004 | US20040006731 Method for detecting faults in electronic devices, based on quiescent current measurements |
| 01/08/2004 | US20040006730 Apparatus and method for testing on-chip ROM |
| 01/08/2004 | US20040006729 Hierarchical test methodology for multi-core chips |
| 01/08/2004 | US20040006728 Method and device for simultaneous testing of a plurality of integrated circuits |
| 01/08/2004 | US20040006727 Method and apparatus for testing multi-port memories |
| 01/08/2004 | US20040006447 Methods and apparatus for test process enhancement |
| 01/08/2004 | US20040006441 Accuracy determination in bit line voltage measurements |
| 01/08/2004 | US20040006440 Method for evaluating capacity of secondary battery using mathematical calculation of specific resistance components of equivalent circuit model fitted from impedance spectrum |
| 01/08/2004 | US20040006404 Permanent chip ID using FeRAM |
| 01/08/2004 | US20040004888 Scan path circuit and semiconductor integrated circuit comprising the scan path circuit |
| 01/08/2004 | US20040004866 Semiconductor memory device with improved saving rate for defective chips |
| 01/08/2004 | US20040004590 Method and system for adjusting precharge for consistent exposure voltage |
| 01/08/2004 | US20040004505 Data delay circuit |
| 01/08/2004 | US20040004502 Semiconductor module |
| 01/08/2004 | US20040004493 Device and method for electronic device test |
| 01/08/2004 | US20040004492 Method of determining disconnection location in a circuit |
| 01/08/2004 | US20040004483 Method and apparatus for control and fault detection of an electric load circuit |
| 01/08/2004 | US20040004482 Industrial inspection using combination of functional testing and structural inspection |
| 01/08/2004 | US20040004279 Built-in debug feature for complex VLSI chip |
| 01/08/2004 | US20040004216 Test assembly including a test die for testing a semiconductor product die |
| 01/08/2004 | DE69719416T2 Abtastpfadzelle Abtastpfadzelle |
| 01/08/2004 | DE69627240T2 Synchronisierte Datenübermittlung zwischen Einheiten eines Verarbeitungssystems Synchronized data transmission between units of a processing system |
| 01/08/2004 | DE69626239T2 Fehlertolerantes Multiprozessorsystem A fault-tolerant multiprocessor system |
| 01/08/2004 | DE10325751A1 Vorrichtung und Verfahren zur Berechnung eines Verschlechterungsgrades für eine Batterie Device and method for calculating a degree of deterioration of a battery |
| 01/08/2004 | DE10227821A1 Bestimmen von Lastmoment und Ausgangsstrom eines Fahrzeuggenerators durch Messen des Erregerstromes Determine the load torque and output power of a vehicle generator by measuring the excitation current |
| 01/08/2004 | DE10226782A1 Schaltungsanordnung und Verfahren zur Überprüfung von elektrischen Einrichtungen in einem Fahrzeug sowie Verwendung eines Strommess-Systems eines Steuergerätes dazu Circuit arrangement and method for testing of electrical equipment in a vehicle and using a current measurement system of a control device to |
| 01/08/2004 | DE10226615A1 Teilentladungsprüfung von Motorwicklungen mit einer Pulsspannung variabler Amplitude und variabler Anstiegszeit Partial discharge testing of motor windings with a pulse voltage of variable amplitude and variable rise time |
| 01/08/2004 | DE10225058A1 Verfahren und Vorrichtung zur selektiven Erfassung von Erdschlusswischern in Drehstromnetzen Method and apparatus for selective detection of Erdschlusswischern in three-phase systems |
| 01/08/2004 | DE10219635B3 Vorrichtung zur Fehlererkennung in Verkabelungen A device for detecting errors in cabling |
| 01/08/2004 | CA2490404A1 Methods and apparatus for test process enhancement |
| 01/07/2004 | EP1378758A1 Device for monitoring quiescent current of an electronic device |
| 01/07/2004 | EP1378757A2 Method and device for the evaluation of the state of charge of a battery |
| 01/07/2004 | EP1378080A1 On-chip method and apparatus for testing semiconductor circuits |
| 01/07/2004 | EP1377981A1 Method and system to optimize test cost and disable defects for scan and bist memories |
| 01/07/2004 | EP1377844A1 Method and system for determining the buffer action of a battery |
| 01/07/2004 | EP1377843A2 Method and apparatus for transmission line analysis |
| 01/07/2004 | EP1377842A1 Method of detecting carrier dose of a semiconductor wafer |
| 01/07/2004 | EP1377841A2 Low-jitter clock for test system |