| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/21/2004 | CN1469998A Device for testing solar cells |
| 01/21/2004 | CN1469396A Memory independent on testing group function and system for replacing fault stored word |
| 01/21/2004 | CN1469394A Diagonal test method of flash memory |
| 01/21/2004 | CN1135612C Hand-held connecting/disconnecting machine |
| 01/21/2004 | CN1135561C 半导体存储器 Semiconductor memory |
| 01/21/2004 | CN1135395C IC testing apparatus and malfunction preventing method of IC test apparatus |
| 01/21/2004 | CN1135392C Stress of incident in digital oscilloscope |
| 01/20/2004 | US6681378 Programming mode selection with JTAG circuits |
| 01/20/2004 | US6681374 Hit-or-jump method and system for embedded testing |
| 01/20/2004 | US6681361 Semiconductor device inspection apparatus and semiconductor device inspection method |
| 01/20/2004 | US6681360 Fault detection method for electronic circuit |
| 01/20/2004 | US6681359 Semiconductor memory self-test controllable at board level using standard interface |
| 01/20/2004 | US6681358 Parallel testing of a multiport memory |
| 01/20/2004 | US6681356 Scan chain connectivity |
| 01/20/2004 | US6681355 Analog boundary scan compliant integrated circuit system |
| 01/20/2004 | US6681354 Embedded field programmable gate array for performing built-in self test functions in a system on a chip and method of operation |
| 01/20/2004 | US6681353 Methods and apparatus for obtaining a trace of a digital signal within a field programmable gate array device |
| 01/20/2004 | US6681352 Method for testing damaged integrated circuits |
| 01/20/2004 | US6681351 Easy to program automatic test equipment |
| 01/20/2004 | US6681337 Method and apparatus for loading data from an address specified by an address register into a different register wherein the registers are clocked in different time domains |
| 01/20/2004 | US6681193 Method for testing a CMOS integrated circuit |
| 01/20/2004 | US6681142 Method and system for testing a test piece |
| 01/20/2004 | US6681038 Electronic assembly video inspection system |
| 01/20/2004 | US6680622 Method and system for disabling a scanout line of a register flip-flop |
| 01/20/2004 | US6680621 Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current |
| 01/20/2004 | US6680618 Leak sensing switch |
| 01/20/2004 | US6680616 In-service testing of current transformers |
| 01/20/2004 | US6680615 Method and device for checking the charge state of a battery, in particular a rechargeable battery for a cellular mobile telephone |
| 01/20/2004 | US6679128 Environmental test chamber |
| 01/20/2004 | CA2157431C Voltage pulse acquisition channel and partial discharge measure process and system using said channel |
| 01/17/2004 | CA2435169A1 Tester for a plurality of circuit breakers having a range of rated currents and multiple trip functions |
| 01/15/2004 | WO2004006265A1 A method and a unit for programming a memory |
| 01/15/2004 | WO2004005949A1 Hierarchical test methodology for multi-core chips |
| 01/15/2004 | WO2004005948A1 Electronic component contact device |
| 01/15/2004 | WO2004005947A1 Time-frequency domain reflectometry apparatus and method |
| 01/15/2004 | WO2004005946A2 Electronic circuit with test unit for testing interconnects |
| 01/15/2004 | WO2004005943A2 Frequency domain reflectometry system for testing wires and cables utilizing in-situ connectors, passive connectivity, cable fray detection, and live wires testing |
| 01/15/2004 | WO2003067271A3 Apparatus and method for dynamic diagnostic testing of integrated circuits |
| 01/15/2004 | WO2003032286A3 Method and apparatus for luminance compensation for emissive displays |
| 01/15/2004 | WO2002101349A3 Device and method for converting a diagnostic interface to spi standard |
| 01/15/2004 | US20040010763 Feed forward testing |
| 01/15/2004 | US20040010741 Functional pattern logic diagnostic method |
| 01/15/2004 | US20040010740 Boundary scan circuit |
| 01/15/2004 | US20040010739 Instrumentation system having a reconfigurable instrumentation card with programmable logic and a modular daughter card |
| 01/15/2004 | US20040010444 Automated infrared printed circuit board failure diagnostic system |
| 01/15/2004 | US20040010394 Systems, methods and computer program products for determining contaminant concentrations in semiconductor materials |
| 01/15/2004 | US20040010388 Method and apparatus for determining proper trace widths for printed circuit board of wireless test fixture |
| 01/15/2004 | US20040010384 System and method for measuring essential power amplification functions |
| 01/15/2004 | US20040008848 Audio loudspeaker detection using back-EMF sensing |
| 01/15/2004 | US20040008560 Synchronous semiconductor memory device having a desired-speed test mode |
| 01/15/2004 | US20040008550 Circuits and methods for screening for defective memory cells in semiconductor memory devices |
| 01/15/2004 | US20040008340 Tool and method for evaluating a pin connector |
| 01/15/2004 | US20040008117 Battery remaining amount warning circuit |
| 01/15/2004 | US20040008053 Inspection method and inspection device for active matrix substrate, inspection program used therefor, and information storage medium |
| 01/15/2004 | US20040008052 Semiconductor testing apparatus and semiconductor testing method |
| 01/15/2004 | US20040008051 Semiconductor characteristic evaluation apparatus |
| 01/15/2004 | US20040008050 Dynamic register with IDDQ testing capability |
| 01/15/2004 | US20040008049 Monitor circuitry and method for testing analog and/or mixed signal integrated circuits |
| 01/15/2004 | US20040008045 Mosaic decal probe |
| 01/15/2004 | US20040008040 Adaptive compensation of measurement error for industrial process control transmitters |
| 01/15/2004 | US20040008034 Testing device and method for testing backplanes and connectors on backplanes |
| 01/15/2004 | US20040008033 Apparatus for determining doping concentration of a semiconductor wafer |
| 01/15/2004 | US20040008024 Compensation for test signal degradation due to DUT fault |
| 01/15/2004 | US20040008021 Method for testing a frequency converter |
| 01/15/2004 | US20040008019 Method and apparatus for electronic meter testing |
| 01/15/2004 | DE20317276U1 Vorrichtung zum Prüfen elektrischer Bauteile Apparatus for testing electrical components |
| 01/15/2004 | DE10303654A1 Integrierte Halbleiterschaltung mit eingebauter Selbsttestfunktion und zugehöriges System A semiconductor integrated circuit with built-in self-test function and associated system |
| 01/15/2004 | DE10228600A1 Vorrichtung zum Behandeln von Bauelementen, insbesondere von elektrischen Bauelementen mit kleinen Abmessungen An apparatus for treating components, in particular electrical components having small dimensions |
| 01/15/2004 | DE10228351A1 Verfahren und Vorrichtung zur Bestimmung des Alterungszustandes einer Batterie Method and device for determining the aging condition of a battery |
| 01/15/2004 | DE10227332A1 Ansteuervorrichtung mit verbesserten Testeneigenschaften Driving device with improved test performance |
| 01/14/2004 | EP1380953A1 Fault-tolerant computer system, re-synchronization method thereof and re-synchronization program thereof |
| 01/14/2004 | EP1380849A1 Process for the determination of the available charge quantity of a storage battery and monitoring device |
| 01/14/2004 | EP1380848A2 Device for measuring and analyzing electrical signals of an integrated circuit component |
| 01/14/2004 | EP1380847A2 Monitor circuitry and method for testing analog and/or mixed signal integrated circuits |
| 01/14/2004 | EP1380068A2 Ultrafast sampler with coaxial transition |
| 01/14/2004 | EP1380050A2 Method for producing a chalcogenide-semiconductor layer of the abc2 type with optical process monitoring |
| 01/14/2004 | EP1379978A2 Extraction method of defect density and size distributions |
| 01/14/2004 | EP1379849A1 Circuit arrangement with several sensor elements in matrix circuit design |
| 01/14/2004 | EP0976189B1 Method for determining the location of a partial discharge |
| 01/14/2004 | CN2599596Y Predetecting and processing device before cell depletion |
| 01/14/2004 | CN2599595Y Line pencil detector |
| 01/14/2004 | CN1468371A Reduction of error alarm in PCB detection |
| 01/14/2004 | CN1467905A 半导体模块 Semiconductor Modules |
| 01/14/2004 | CN1467836A Semiconductor device, semiconductor package, and method for testing semiconductor device |
| 01/14/2004 | CN1467810A Semiconductor device and test method for the same |
| 01/14/2004 | CN1467808A Semiconductor memory device with reduced package test time |
| 01/14/2004 | CN1467806A Contactor block and apparatus for electrical connection |
| 01/14/2004 | CN1467746A Semiconductor memory device with improved saving rate for defective chips |
| 01/14/2004 | CN1467637A Semiconductor integrated circuit with built-in self-test function and system including the same |
| 01/14/2004 | CN1467506A Apparatus and method for automatic testing normal operation of battery protection circuit module |
| 01/14/2004 | CN1467505A Normal work detecting method for drum type motor |
| 01/14/2004 | CN1467504A Method and apparatus for distinguishing cable by simultaneous supplying of tone and intermittent link |
| 01/14/2004 | CN1134877C Battery charge measurement and discharge remaining time prediction technique and apparatus |
| 01/14/2004 | CN1134672C Charging-discharging test system |
| 01/14/2004 | CN1134671C Device for detecting contact fault in IC test |
| 01/14/2004 | CN1134669C Method and device for monitoring power-supply network |
| 01/14/2004 | CN1134667C Microelectronic spring contact element |
| 01/13/2004 | US6678875 Self-contained embedded test design environment and environment setup utility |
| 01/13/2004 | US6678869 Delay calculation method and design method of a semiconductor integrated circuit |
| 01/13/2004 | US6678863 Communication system, information processing apparatus, output apparatus, control method, and memory medium |