| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/03/2004 | US6686760 Photosensors for testing an integrated circuit |
| 02/03/2004 | US6686759 Techniques for testing embedded cores in multi-core integrated circuit designs |
| 02/03/2004 | US6686758 Engagement probe and apparatuses configured to engage a conductive pad |
| 02/03/2004 | US6686757 Defect detection in semiconductor devices |
| 02/03/2004 | US6686756 Vddq integrated circuit testing system and method |
| 02/03/2004 | US6686755 Methods for wireless testing of integrated circuits |
| 02/03/2004 | US6686753 Prober and apparatus for semiconductor chip analysis |
| 02/03/2004 | US6686747 Programmable voltage divider and method for testing the impedance of a programmable element |
| 02/03/2004 | US6686746 Method and apparatus for monitoring integrity of wires or electrical cables |
| 02/03/2004 | US6686744 Adapter for use in measuring electrical current drawn across a fuse in a circuit |
| 02/03/2004 | US6686732 Low-cost tester interface module |
| 02/03/2004 | US6686657 Interposer for improved handling of semiconductor wafers and method of use of same |
| 02/03/2004 | US6686224 Chip manufacturing method for cutting test pads from integrated circuits by sectioning circuit chips from circuit substrate |
| 02/03/2004 | US6685817 Controlling thickness of plating over a width of a substrate |
| 02/03/2004 | CA2342413C A method of isolating an electrical fault |
| 01/29/2004 | WO2004010522A2 Method and apparatus for fuel cell protection |
| 01/29/2004 | WO2004010491A1 Probe device, probe card channel information creation program, and probe card channel information creation device |
| 01/29/2004 | WO2004010437A1 Built-in-self-test of flash memory cells |
| 01/29/2004 | WO2004010158A1 Method and device for voltage measurement of an ac power supply |
| 01/29/2004 | WO2004010157A1 Method for measuring a physical or chemical operating parameter for an analysis system |
| 01/29/2004 | WO2004010156A1 Method and test adapter for testing an appliance having a smart card reader |
| 01/29/2004 | WO2004010153A2 Probe device cleaner and method |
| 01/29/2004 | WO2004010152A1 Method of making microelectronic spring contact array |
| 01/29/2004 | WO2003069487A3 Data bus for electrically controlling the installation of modules |
| 01/29/2004 | WO2003040740A3 Feedforward temperature control of device under test |
| 01/29/2004 | WO2003033749A3 Matrix element precharge voltage adjusting apparatus and method |
| 01/29/2004 | US20040019863 Circuit verification apparatus, circuit verification program, and circuit verification method |
| 01/29/2004 | US20040019860 Test program emulators, methods, and computer program products for emulating a test program of an integrated circuit semiconductor device |
| 01/29/2004 | US20040019841 Internally generating patterns for testing in an integrated circuit device |
| 01/29/2004 | US20040019840 Connection verification apparatus for verifying interconnection between multiple logic blocks |
| 01/29/2004 | US20040019839 Reconstruction of non-deterministic algorithmic tester stimulus used as input to a device under test |
| 01/29/2004 | US20040019838 Method, circuit and system for determining burn-in reliability from wafer level burn-in |
| 01/29/2004 | US20040019830 Test apparatus of semiconductor integrated circuit with hold error preventing function |
| 01/29/2004 | US20040019829 Method and apparatus for implementing multiple remote diagnose register chains |
| 01/29/2004 | US20040019827 Emulation interface system |
| 01/29/2004 | US20040019458 Jitter measuring system in high speed data output device and total jitter measuring method |
| 01/29/2004 | US20040019452 Methods for compensating for a test temperature deviation |
| 01/29/2004 | US20040019439 Induction motor module and motor incorporating same |
| 01/29/2004 | US20040018753 Flexible electric-contact structure for IC package |
| 01/29/2004 | US20040018663 .Lead frame, and method for manufacturing semiconductor device and method for inspecting electrical properties of small device using the lead frame |
| 01/29/2004 | US20040018651 Method of decapsulating a packaged copper-technology integrated cirucit |
| 01/29/2004 | US20040018418 Bi-metallic test switch |
| 01/29/2004 | US20040018048 Pneumatic docking system |
| 01/29/2004 | US20040017399 Markers positioned in the trace of a logic analyzer snap to locations defined by clock transitions |
| 01/29/2004 | US20040017371 Recapture of a portion of a displayed waveform without loss of existing data in the waveform display |
| 01/29/2004 | US20040017219 System on chip (SOC) and method of testing and/or debugging the system on chip |
| 01/29/2004 | US20040017218 Digital overcurrent test |
| 01/29/2004 | US20040017217 Semiconductor device having test element groups |
| 01/29/2004 | US20040017216 Multi-socket board for open/short tester |
| 01/29/2004 | US20040017215 High input/output density optoelectronic probe card for wafer-level test of electrical and optical interconnect components, methods of fabrication, and methods of use |
| 01/29/2004 | US20040017213 System and method for measuring fault coverage in an integrated circuit |
| 01/29/2004 | US20040017212 Apparatus and method for enhanced voltage contrast analysis |
| 01/29/2004 | US20040017208 Time-domain reflectometer for testing terminated network cable |
| 01/29/2004 | US20040017205 Method for monitoring a power supply of a control unit in a motor vehicle |
| 01/29/2004 | US20040017204 Interchangeable fan control board with fault detection |
| 01/29/2004 | US20040017203 Fuse saving tester for fused circuit |
| 01/29/2004 | US20040017199 Battery remaining amount warning circuit |
| 01/29/2004 | US20040017198 Low loss fuel cell configuration |
| 01/29/2004 | US20040017185 Device for compensating for a test temperature deviation in a semiconductor device handler |
| 01/29/2004 | US20040017184 Simultaneous display of data gathered using multiple data gathering mechanisms |
| 01/29/2004 | US20040017180 Battery life estimator |
| 01/29/2004 | US20040017118 System and method for estimating electric motor operating parameters |
| 01/29/2004 | US20040016997 Socket for semiconductor package |
| 01/29/2004 | US20040016993 Test tray with carrier modules for a semiconductor device handler |
| 01/29/2004 | US20040016872 Radiation hardened visible p-i-n detector |
| 01/29/2004 | US20040016119 Method of making microelectronic spring contact array |
| 01/29/2004 | DE4417129B4 Verfahren und Vorrichtung zur Überprüfung von Überspannungsschutzanlagen Method and device for checking of overvoltage protection systems |
| 01/29/2004 | DE10328344A1 Schaltkreis zur Strommessung und Verfahren für spannungsgeregelte integrierte Halbleiterschaltungen Circuit for measuring current and voltage-controlled method for semiconductor integrated circuits |
| 01/29/2004 | DE10320622A1 Verfahren und Vorrichtung zum Bestimmen korrekter Spurbreiten für eine gedruckte Schaltungsplatine einer drahtlosen Testhalterung Method and apparatus for determining the correct lane widths for a printed circuit board of a wireless test fixture |
| 01/29/2004 | DE10318221A1 System und Verfahren zum Messen von essentiellen Leistungsverstärkungsfunktionen System and method for measuring power amplification essential functions |
| 01/29/2004 | DE10318183A1 Permanente Chip-ID unter Verwendung eines FeRAM Permanent chip ID using a FeRAM |
| 01/29/2004 | DE10317102A1 Verfahren zum Ermitteln einer Position einer Unterbrechnung in einem Schaltkreis A method for determining a position of an interruption in a circuit |
| 01/29/2004 | DE10313365A1 Genauigkeitsbestimmung bei Bitleitungsspannungmessungen Accuracy in determination Bitleitungsspannungmessungen |
| 01/29/2004 | DE10255890A1 Motoranormalitäts-Detektionsgerät und elektrisches Servolenksteuersystem Motoranormalitäts detection device and electric power steering control system |
| 01/29/2004 | DE10231700A1 Verfahren zur Ermittlung der entnehmbaren Ladungsmenge einer Speicherbatterie und Überwachungseinrichtung Method for determining the amount of charge of a storage battery monitoring device and |
| 01/29/2004 | DE10230527A1 Verfahren und Einrichtung zur Überwachung der Funktionstüchtigkeit elektronischer Leistungsbauelemente Method and apparatus for monitoring the functionality of electronic power devices |
| 01/29/2004 | DE10229946A1 Verfahren und Vorrichtung zur Prüfung elektrischer oder elektronischer Baugruppen Method and apparatus for testing of electrical or electronic assemblies |
| 01/29/2004 | DE10228983A1 Elektrisches Leistungsversorgungssystem, Kennwertermittlung- und Diagnosesystem und Diagnoseverfahren An electrical power supply system, Kennwertermittlung- and diagnostic system and diagnostic methods |
| 01/29/2004 | DE10228764A1 Anordnung zum Testen von Halbleitereinrichtungen Arrangement for the testing of semiconductor devices |
| 01/29/2004 | DE10228526A1 Anordnung und Verfahren zum Testen einer integrierten Schaltung Arrangement and method for testing an integrated circuit |
| 01/29/2004 | DE10227613A1 Steckverbinder und zu diesem komplementärer Prüfsteckverbinder Connectors and this complementary Test Connectors |
| 01/29/2004 | DE10121309B4 Testschaltung zum Testen einer zu testenden Schaltung Test circuitry for testing a circuit to be tested |
| 01/28/2004 | EP1385016A1 Bi-metallic test switch |
| 01/28/2004 | EP1385015A2 Tester for a plurality of circuit breakers having a range of rated currents and multiple trip functions |
| 01/28/2004 | EP1385014A2 Signal sampling with sampling and reference paths |
| 01/28/2004 | EP1385011A1 Integrated circuit test probe |
| 01/28/2004 | EP1384305A1 Method and apparatus for high-voltage battery array monitoring sensors network |
| 01/28/2004 | EP1384179A2 System and method for product yield prediction |
| 01/28/2004 | EP1384086A1 Method for determining state of charge of a battery by measuring its open circuit voltage |
| 01/28/2004 | EP1384085A2 Voltage acquisition with open-loop charged-particle-beam probe system |
| 01/28/2004 | EP1204872B1 Electrical contactor, especially wafer level contactor, using fluid pressure |
| 01/28/2004 | CN2601406Y Computer controllet transformer test bench |
| 01/28/2004 | CN1471640A Method for testing a testable electronic device |
| 01/28/2004 | CN1471156A Socket for semiconductor package |
| 01/28/2004 | CN1471151A Test tray with carrier assembly for semiconductor device processing machine |
| 01/28/2004 | CN1471150A Apparatus for compensatnig deviation of test temperature is semiconductor device processing machine |
| 01/28/2004 | CN1471149A Lead frame, method for manufacturing semiconductor device using same |
| 01/28/2004 | CN1471106A Read-out circuit |
| 01/28/2004 | CN1470966A Method for compensating deviation of test temperature |
| 01/28/2004 | CN1470882A Checking tool for printed circuit-board |