| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/28/2004 | CN1470881A Time-domain reflectometer for connecting network cable at test end |
| 01/28/2004 | CN1470880A DC system insulating monitor apparatus with remote alarm and inquiry function |
| 01/28/2004 | CN1136582C Internal-circuit timed external regulation circuit and method therefor |
| 01/28/2004 | CN1136461C Fuelcell unit voltage measuring method |
| 01/28/2004 | CN1136460C Current integrating value detection device and current detection device and battery adopting them |
| 01/28/2004 | CN1136458C DC system earthing-point detecting method |
| 01/28/2004 | CN1136457C Automatic sampling and correcting method for voltage of battery |
| 01/27/2004 | US6684359 System and method for test generation with dynamic constraints using static analysis |
| 01/27/2004 | US6684358 Decompressor/PRPG for applying pseudo-random and deterministic test patterns |
| 01/27/2004 | US6684357 Chip testing apparatus and method |
| 01/27/2004 | US6684355 Memory testing apparatus and method |
| 01/27/2004 | US6684179 System for monitoring connection pattern of data ports |
| 01/27/2004 | US6684170 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same |
| 01/27/2004 | US6684169 Facilitating comparisons between simulated and actual behavior of electronic devices |
| 01/27/2004 | US6683688 Method and device for gauging a device for producing electrical components |
| 01/27/2004 | US6683602 Display control apparatus and electronic appliance |
| 01/27/2004 | US6683470 DC testing apparatus and semiconductor testing apparatus |
| 01/27/2004 | US6683469 Regulable test integrated circuit system for signal noise and method of using same |
| 01/27/2004 | US6683468 Method and apparatus for coupling to a device packaged using a ball grid array |
| 01/27/2004 | US6683467 Method and apparatus for providing rotational burn-in stress testing |
| 01/27/2004 | US6683465 Electrical and electronic apparatus comprising substrates having circuits, power sources, switches, controllers and measuring instruments for determination and evaluation of void defects |
| 01/27/2004 | US6683462 Apparatus for and method of measuring capacitance with high accuracy |
| 01/27/2004 | US6683460 Test device for internet and telephone lines |
| 01/27/2004 | US6683459 Identification of a distribution of transformers and fault location in primary underground loop systems |
| 01/27/2004 | US6683449 Apparatus and method for detecting a mechanical component on a computer system substrate |
| 01/27/2004 | US6683447 Electro-optic apparatus for measuring signal potentials |
| 01/27/2004 | US6683440 Detecting method for detecting internal information of a rechargeable battery, detecting apparatus for detecting internal information of a rechargeable battery, apparatus in which said detecting method is applied, apparatus including said detecting apparatus, and storage medium in which a software program of said detecting method is stored |
| 01/27/2004 | US6683323 Semiconductor chip |
| 01/27/2004 | US6682947 Feed forward testing |
| 01/27/2004 | US6682946 Method of using a semiconductor chip package |
| 01/27/2004 | US6682945 Wafer level burn-in and electrical test system and method |
| 01/22/2004 | WO2004008492A2 Mosaic decal probe |
| 01/22/2004 | WO2004008487A2 Test system and methodology |
| 01/22/2004 | WO2004008291A2 Context aware transmission management method |
| 01/22/2004 | WO2004008166A1 Battery state-of-charge estimator |
| 01/22/2004 | WO2004008164A1 Method for generating high-contrast images of semiconductor sites via one-photon optical beaminduced current imaging and confocal reflectance microscopy |
| 01/22/2004 | WO2004008163A2 Assembly for connecting a test device to an object to be tested |
| 01/22/2004 | WO2004008162A2 Compensation for test signal degradation due to dut fault |
| 01/22/2004 | WO2004008158A2 Nestless plunge mechanism for semiconductor testing |
| 01/22/2004 | WO2004008157A2 Event pipeline and summing method and apparatus for event based test system |
| 01/22/2004 | WO2004008053A1 Temperature controlling apparatus and method for an electronic device under test |
| 01/22/2004 | WO2003067941A3 Circuit and method for determining the location of defect in a circuit |
| 01/22/2004 | WO2003065147A3 Method and program product for creating and maintaining self-contained design environment |
| 01/22/2004 | WO2003044852A3 Estimating reliability of components for testing and quality optimization |
| 01/22/2004 | WO2003042710A3 Clock architecture for a frequency-based tester |
| 01/22/2004 | US20040015807 Semiconductor device and semiconductor integrated circuit |
| 01/22/2004 | US20040015803 Timing based scan chain implementation in an IC design |
| 01/22/2004 | US20040015800 Design verification by symbolic simulation using a native hardware description language |
| 01/22/2004 | US20040015798 Reducing verification time for integrated circuit design including scan circuits |
| 01/22/2004 | US20040015793 Methodology for the optimization of testing and diagnosis of analog and mixed signal ICs and embedded cores |
| 01/22/2004 | US20040015792 Method for creating standard VHDL test environments |
| 01/22/2004 | US20040015791 Random code generation using genetic algorithms |
| 01/22/2004 | US20040015788 Scan insertion with bypass login in an IC design |
| 01/22/2004 | US20040015764 Intelligent binning for electrically repairable semiconductor chips |
| 01/22/2004 | US20040015762 Scalable system testing tools |
| 01/22/2004 | US20040015761 Scalable asynchronous I/O testing tool |
| 01/22/2004 | US20040015760 System and method for performing predictable signature analysis in the presence of multiple data streams |
| 01/22/2004 | US20040015759 Mux scan cell with delay circuit for reducing hold-time violations |
| 01/22/2004 | US20040015758 Method and device for testing configuration memory cells in programmable logic devices (PLDS) |
| 01/22/2004 | US20040015751 Updating high speed parallel I/O interfaces based on counters |
| 01/22/2004 | US20040015749 Apparatus and method for data pattern alignment |
| 01/22/2004 | US20040015739 Testbench for the validation of a device under test |
| 01/22/2004 | US20040015526 Apparatus and method for data shifting |
| 01/22/2004 | US20040015330 System and method for testing electronic devices and modules |
| 01/22/2004 | US20040015311 Low-cost, compact, frequency domain reflectometry system for testing wires and cables |
| 01/22/2004 | US20040014489 Cellular mobile phone |
| 01/22/2004 | US20040014346 Socket for electrical parts |
| 01/22/2004 | US20040013396 Pogo contactor assembly for testing of and/or other operations on ceramic surface mount devices and other electronic components |
| 01/22/2004 | US20040013016 Semiconductor circuit device capable of accurately testing embedded memory |
| 01/22/2004 | US20040013015 Semiconductor integrated circuit |
| 01/22/2004 | US20040012996 Memory system |
| 01/22/2004 | US20040012712 Battery remaining amount warning apparatus |
| 01/22/2004 | US20040012552 Image-signal supplying circuit and electro-optical panel |
| 01/22/2004 | US20040012529 Protable radio terminal testing apparatus using single self-complementary antenna |
| 01/22/2004 | US20040012406 Device for analyzing failure in semiconductor device provided with internal voltage generating circuit |
| 01/22/2004 | US20040012404 Thermal control of a DUT using a thermal contro substrate |
| 01/22/2004 | US20040012403 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 01/22/2004 | US20040012402 Integrated circuit test probe |
| 01/22/2004 | US20040012400 Test system and methodology |
| 01/22/2004 | US20040012393 Tester for a plurality of circuit breakers having a range of rated currents and multiple trip functions |
| 01/22/2004 | US20040012373 State-of-charge detector device, program thereof, state-of-charge detecting method, and charge-discharge control device |
| 01/22/2004 | DE10324919A1 Flachleiter Flat Head |
| 01/22/2004 | DE10311719A1 Halbleitermodul Semiconductor module |
| 01/22/2004 | DE10231088A1 Schalteinrichtung für die Startanlage eines Kfz-Verbrennungsmotors Switching means for the starting system of an automotive internal combustion engine |
| 01/22/2004 | DE10216637B3 Verfahren und Vorrichtung zur Bestimmung des Ladezustandes einer Batterie Method and device for determining the charge condition of a battery |
| 01/22/2004 | CA2488865A1 Context aware transmission management method |
| 01/21/2004 | EP1382978A2 Monitoring the residual charge of a battery |
| 01/21/2004 | EP1382977A1 Apparatus and method for determining the performance of micro machines or microelectromechanical devices |
| 01/21/2004 | EP1382976A1 Method of processing test patterns for an integrated circuit |
| 01/21/2004 | EP1382975A1 Method of generating a test pattern for the simulation and/or test of the layout of an integrated circuit |
| 01/21/2004 | EP1382974A1 Method and smart card for testing an appliance having a smart card reader, and a respective appliance |
| 01/21/2004 | EP1382973A1 Method and test adapter for testing an appliance having a smart card reader |
| 01/21/2004 | EP1382104A1 Method and device for measuring the temperature of windings of a drive motor |
| 01/21/2004 | EP1381875A1 Integrated circuit with power supply test interface |
| 01/21/2004 | EP1381874A2 Method and device for contacless testing of non-fitted antennae |
| 01/21/2004 | CN2600825Y Auxiliary testing tool |
| 01/21/2004 | CN2600823Y All-purpose tester for insulating tool |
| 01/21/2004 | CN2600822Y Armour clamp with measuring sensing function for insulator leakage current |
| 01/21/2004 | CN2600821Y Auxiliary working platform for testing |
| 01/21/2004 | CN2600820Y Internal resistance of source measuring instrument |