| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/10/2004 | US6690186 Methods and structures for electronic probing arrays |
| 02/10/2004 | US6690185 Large contactor with multiple, aligned contactor units |
| 02/10/2004 | US6690178 On-board microelectromechanical system (MEMS) sensing device for power semiconductors |
| 02/10/2004 | US6690174 Method and arrangement for load testing electrical systems of a motor vehicle |
| 02/10/2004 | US6690171 Battery capacity detection device and method |
| 02/10/2004 | US6690154 High-frequency tester for semiconductor devices |
| 02/10/2004 | US6690153 Method of testing and/or monitoring the system frequency of a microcontroller and a microcontroller |
| 02/10/2004 | US6690152 Acceleration of automatic test |
| 02/10/2004 | US6687986 Method of programming a programmable electronic device by an in-line programming system |
| 02/10/2004 | US6687978 Method of forming tester substrates |
| 02/10/2004 | CA2191813C Radio navigation testing method and device using standard signal measuring and generating equipment |
| 02/05/2004 | WO2004012289A2 Low loss fuel cell configuration |
| 02/05/2004 | WO2004012241A2 Radiation hardened visible p-i-n detector |
| 02/05/2004 | WO2004011952A1 Electronic device test system |
| 02/05/2004 | WO2004010847A2 Cardiac diagnostics using wall motion and perfusion cardiac mri imaging and systems for cardiac diagnostics |
| 02/05/2004 | WO2003071652A3 Battery monitoring method and apparatus |
| 02/05/2004 | US20040025124 Apparatus and method for calculating simulation coverage |
| 02/05/2004 | US20040025123 System and method to facilitate evaluation of integrated circuits through delay testing |
| 02/05/2004 | US20040025097 Error detection in user input device using general purpose input-output |
| 02/05/2004 | US20040025096 Uniform testing of tristate nets in logic BIST |
| 02/05/2004 | US20040024577 Method and system for automatic recognition of simulation configurations of an integrated circuit |
| 02/05/2004 | US20040024557 Control method of an automatic integrated circuit full testing system |
| 02/05/2004 | US20040024556 Method for testing chip configuration settings |
| 02/05/2004 | US20040024555 Testing interface for railroad signal relays |
| 02/05/2004 | US20040024551 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture |
| 02/05/2004 | US20040024546 Method and device for determining the state of function of an energy storage battery |
| 02/05/2004 | US20040024426 Method for monitoring end of life for battery |
| 02/05/2004 | US20040023422 Laser production and product qualification via accelerated life testing based on statistical modeling |
| 02/05/2004 | US20040023083 Device and method for controlling fuel cell system |
| 02/05/2004 | US20040022428 Automatic system-level test apparatus and method |
| 02/05/2004 | US20040022337 Signal sampling with clock recovery |
| 02/05/2004 | US20040022196 Oversampling bit stream recovery |
| 02/05/2004 | US20040022195 Fault severity check and source identification |
| 02/05/2004 | US20040022042 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 02/05/2004 | US20040021493 Clocked-scan flip-flop for multi-threshold voltage CMOS circuit |
| 02/05/2004 | US20040021480 Method and system having switching network for testing semiconductor components on a substrate |
| 02/05/2004 | US20040021479 Semiconductor wafer and testing method for the same |
| 02/05/2004 | US20040021478 High resolution current measurement method |
| 02/05/2004 | US20040021476 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability |
| 02/05/2004 | US20040021475 Wafer prober |
| 02/05/2004 | US20040021471 Circuit analyzer with component testing capability |
| 02/05/2004 | US20040021470 System and method for island detection |
| 02/05/2004 | US20040021468 Battery test system |
| 02/05/2004 | US20040021452 Group wiring patching system and method for wire pair identification |
| 02/05/2004 | US20040021449 Tap changer condition diagnosing |
| 02/05/2004 | US20040020529 Device for testing solar cells |
| 02/05/2004 | US20040020514 For cleaning the probes of a probe device (e.g., a probe card) used to electrical characteristics of electrical devices, such as integrated circuits on a semiconductor wafer |
| 02/05/2004 | US20040020311 Method and apparatus for differential test probe retention with compliant Z-axis positioning |
| 02/05/2004 | DE10234091A1 Solenoid valve supply current monitoring method for a combustion engine, especially a motor vehicle engine, involves comparing the total valve supply current with a total theoretical value |
| 02/05/2004 | DE10234032A1 Energiespeicher und Verfahren zur Ermittlung des Verschleißes eines elektrochemischen Energiespeichers Energy storage and method for determining the wear of a electrochemical energy storage device |
| 02/05/2004 | DE10233855A1 Process and arrangement to optimize the production of photovoltaic units uses comparison with test data to sort the individual cells |
| 02/05/2004 | DE10232294A1 Determining electromagnetic losses in collectorless electrical machine with number of coil windings involves deriving losses from measured current in winding, applied voltage between two time points |
| 02/05/2004 | DE10122081B4 Verfahren zum Kalibrieren eines Testsystems für eine integrierte Halbleiterschaltung und kalibrierbares Testystem A method for calibrating a test system for a semiconductor integrated circuit and calibratable Testystem |
| 02/05/2004 | CA2494753A1 Cardiac diagnostics using wall motion and perfusion cardiac mri imaging and systems for cardiac diagnostics |
| 02/04/2004 | EP1387459A1 Fault detection method for a drive assembly |
| 02/04/2004 | EP1387270A1 Method and system for automatic recognition of simulation configurations of an integrated circuit |
| 02/04/2004 | EP1387177A2 Energy storage device and method for the evaluation of wear in an electro-chemical energy storage device |
| 02/04/2004 | EP1387176A2 Time-domain reflectometer for testing terminated network cable |
| 02/04/2004 | EP1387175A1 Method and apparatus for locating sleeves and faults in buried conductors |
| 02/04/2004 | EP1386134A2 Method and apparatus for nondestructive measurement and mapping of sheet materials |
| 02/04/2004 | EP1042683B1 Method and fixture for evaluating stator core quality in production |
| 02/04/2004 | CN2602381Y Generator accumulator cell aptitude discretion equipment |
| 02/04/2004 | CN2602380Y Testing arrangement having eight probes for solar battery gate electrode |
| 02/04/2004 | CN1473371A Voltage measuring circuit of battery pack |
| 02/04/2004 | CN1473273A Method and apparatus of nondestructive insulation test for small electric machine |
| 02/04/2004 | CN1472927A Method for verifying wideband communication logic emulating platform design |
| 02/04/2004 | CN1472885A Semiconductor device for making built-in drive small |
| 02/04/2004 | CN1472858A Circuit breakdown and oscillation identifying method based on resistance change rule |
| 02/04/2004 | CN1472810A Semiconductor integrated circuits |
| 02/04/2004 | CN1472800A Retreating method for saving integrated circuit assembly |
| 02/04/2004 | CN1472542A Method for testing synchronous motor operational state utilizing composite power-angle instrument |
| 02/04/2004 | CN1472541A Disc chip testing board and phase-shift radio-frequency signal generating circuit thereof |
| 02/04/2004 | CN1472540A Production of testing clamping device with connection wires and clamping device |
| 02/04/2004 | CN1137536C A.c. electron load simulator |
| 02/04/2004 | CN1137527C Method for display cell fully-charged |
| 02/04/2004 | CN1137516C Semiconductor device and method for controlling the same |
| 02/04/2004 | CN1137508C Semiconductor device testing apparatus and semiconductor device testing system |
| 02/04/2004 | CN1137388C DC electronic load simulator |
| 02/04/2004 | CN1137387C Method for testing abnormality of electronic element and device on printed circuit board |
| 02/04/2004 | CN1137385C Improving multi-chip module testability using poled-polymer interlayer dielectrics |
| 02/04/2004 | CN1137384C Test head for microstructures with interface |
| 02/03/2004 | US6687890 Method for layout design and timing adjustment of logically designed integrated circuit |
| 02/03/2004 | US6687884 Testing for shorts between interconnect lines in a partially defective programmable logic device |
| 02/03/2004 | US6687868 Test device and method for electrically testing electronic device |
| 02/03/2004 | US6687866 LSI having a built-in self-test circuit |
| 02/03/2004 | US6687865 On-chip service processor for test and debug of integrated circuits |
| 02/03/2004 | US6687864 Macro-cell flip-flop with scan-in input |
| 02/03/2004 | US6687863 Integrated circuit internal signal monitoring apparatus |
| 02/03/2004 | US6687861 Memory tester with enhanced post decode |
| 02/03/2004 | US6687858 Software-hardware welding system |
| 02/03/2004 | US6687857 Microcomputer which can execute a monitor program supplied from a debugging tool |
| 02/03/2004 | US6687662 System and method for automated design verification |
| 02/03/2004 | US6687641 Network diagnostic apparatus |
| 02/03/2004 | US6687639 Processing system for a wiring harness, a method for testing an electrical connection of a wiring harness, computer-readable storage medium and a wire connection assisting system |
| 02/03/2004 | US6687631 Laplace transform impedance spectrometer and its measurement method |
| 02/03/2004 | US6687630 Low leakage technique for determining power spectra of non-coherently sampled data |
| 02/03/2004 | US6687140 Disconnection detecting circuit detecting disconnection based on a change in detection signal |
| 02/03/2004 | US6686996 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool |
| 02/03/2004 | US6686775 Dynamic scan circuitry for B-phase |
| 02/03/2004 | US6686761 Method for determining whether a rotor is good in magnetic induction by measuring the EMF of a motor |