| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/17/2004 | US6693446 Apparatus for testing reliability of interconnection in integrated circuit |
| 02/17/2004 | US6693437 Method and apparatus for identifying state-dependent, defect-related leakage currents in memory circuits |
| 02/17/2004 | US6693436 Method and apparatus for testing an integrated circuit having an output-to-output relative signal |
| 02/17/2004 | US6693434 Automated system for estimating ring oscillator reliability and testing AC response and method of operation thereof |
| 02/17/2004 | US6693431 Battery system and method of determining battery condition |
| 02/17/2004 | US6693025 Local interconnect structures for integrated circuits and methods for making the same |
| 02/17/2004 | US6692267 Printed circuit board testing module |
| 02/12/2004 | WO2003090253A8 Single axis manipulator with controlled compliance |
| 02/12/2004 | WO2003075344B1 Method for processing multiple semiconductor devices for test |
| 02/12/2004 | WO2003052436A3 Flexible interface for a test head |
| 02/12/2004 | WO2003041157A3 Large area silicon carbide devices and manufacturing methods therefor |
| 02/12/2004 | WO2002079788A3 Validation fub for an agent |
| 02/12/2004 | WO2002075336A9 Test system algorithmic program generators |
| 02/12/2004 | WO2002045277A3 A method and system for infrared detection of electrical short defects |
| 02/12/2004 | WO2002037679A3 Transmitter circuit comprising timing deskewing means |
| 02/12/2004 | US20040030999 Method and system for debugging using replicated logic |
| 02/12/2004 | US20040030978 Semiconductor integrated circuit device having operation test function |
| 02/12/2004 | US20040030976 Partial BIST with recording of the connections between individual blocks |
| 02/12/2004 | US20040030974 Fast error diagnosis for combinational verification |
| 02/12/2004 | US20040030973 Method and apparatus for high update rate integrated circuit boundary scan |
| 02/12/2004 | US20040030972 Semiconductor memory device having time reduced in testing of memory cell data reading or writing, or testing of sense amplifier performance |
| 02/12/2004 | US20040030512 Characterization of self-timed sequential circuits |
| 02/12/2004 | US20040029427 Socket for electrical parts and method for using the same |
| 02/12/2004 | US20040029390 Method for evaluating a crystalline semiconductor substrate |
| 02/12/2004 | US20040028065 Built-in-self test for high-speed serial bit stream multiplexing and demultiplexing chip set |
| 02/12/2004 | US20040027988 Wireless local or metropolitan area network with intrusion detection features and related methods |
| 02/12/2004 | US20040027895 Semiconductor memory device and method for testing semiconductor memory device |
| 02/12/2004 | US20040027891 Configuration for testing semiconductor devices |
| 02/12/2004 | US20040027882 Semiconductor memory device and control method therefor |
| 02/12/2004 | US20040027880 Memory circuit with redundant memory cell array allowing simplified shipment tests and reduced power consumptions |
| 02/12/2004 | US20040027586 Processing apparatus, processing method and position detecting device |
| 02/12/2004 | US20040027249 Battery capacity and usage system |
| 02/12/2004 | US20040027227 Apparatus diagnosing a breaking of a fuse for a vehicle |
| 02/12/2004 | US20040027150 Semiconductor device downsizing its built-in driver |
| 02/12/2004 | US20040027149 Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies |
| 02/12/2004 | US20040027147 Holding device for electronic part test, and device and method for electronic part test |
| 02/12/2004 | US20040027146 Sensor probe for use in board inspection and manufacturing method thereof |
| 02/12/2004 | US20040027144 Probe station having multiple enclosures |
| 02/12/2004 | US20040027143 Apparatus and method for inspecting electronic circuits |
| 02/12/2004 | US20040027142 Apparatus and method for inspecting electronic circuits |
| 02/12/2004 | US20040027135 Signal supply apparatus and method for examining the same, and semiconductor device, electro-optical apparatus and electronic apparatus using the same |
| 02/12/2004 | US20040027134 Systems and methods for locating a ground fault without de-energizing the circuit |
| 02/12/2004 | US20040027113 Portable VI probe |
| 02/12/2004 | US20040027094 Battery monitoring network |
| 02/12/2004 | US20040026633 Inspection method and inspection apparatus using electron beam |
| 02/12/2004 | US20040025496 System and method for synchronizing electrical generators |
| 02/12/2004 | DE20317778U1 Test system for the energy voltage supply used in computer systems having an exchangeable processor |
| 02/12/2004 | DE19737838B4 Halbleiterspeichereinrichtung A semiconductor memory device |
| 02/12/2004 | DE10330903A1 Audiolautsprechererkennung mithilfe einer Gegen-EMK-Abtastung Audio speaker recognition using a back EMF sensing |
| 02/12/2004 | DE10306286A1 Zuleitungsrahmen, Verfahren zum Herstellen einer Halbleitervorrichtung und Verfahren zum Prüfen der elektrischen Eigenschaften kleiner Vorrichtungen unter Verwendung des Zuleitungsrahmens Lead frame, method of manufacturing a semiconductor device and method for testing the electrical properties of small devices using the lead frame |
| 02/12/2004 | DE10236377A1 Verfahren zur Fehlererkennung bei einer Antriebseinrichtung Method for detecting faults in a drive mechanism |
| 02/12/2004 | DE10232251A1 Verfahren zur Bestimmung der einer Speicherbatterie noch entnehmbaren Ladungsmenge und Speicherbatterie Method for determining the a storage battery or storage battery amount of charge and |
| 02/11/2004 | EP1388920A2 Directional ground relay system |
| 02/11/2004 | EP1388865A2 Semiconductor memory device and control method therefor |
| 02/11/2004 | EP1388788A1 Built-in self test circuit for integrated circuits |
| 02/11/2004 | EP1388771A2 Control Unit for a Vehicle |
| 02/11/2004 | EP1388738A1 Inspection data producing method and board inspection apparatus using the method |
| 02/11/2004 | EP1388041A1 Measuring apparatus with value editor and corresponding method |
| 02/11/2004 | EP1388015A1 Contact control |
| 02/11/2004 | EP0633530B1 Testing sequential logic circuit upon changing into combinatorial logic circuit |
| 02/11/2004 | CN2603401Y Automatic electronic component detection equipment |
| 02/11/2004 | CN2603398Y Distribution facilities operation indicator |
| 02/11/2004 | CN2603397Y Automatic power cut off alarm for storey |
| 02/11/2004 | CN1474945A Electronic test head positioner |
| 02/11/2004 | CN1474508A High frequency clock pulse loss monitoring detection circuit with low frequency clock |
| 02/11/2004 | CN1474493A Extensible cell state monitoring circuit for cell managing system |
| 02/11/2004 | CN1474445A Evaluating method for semiconductor crystal chip |
| 02/11/2004 | CN1474416A Semiconductor storage of shortening detection time |
| 02/11/2004 | CN1474192A Detecting method for motor phase current |
| 02/11/2004 | CN1474191A Combined switch on-line detecting instrument |
| 02/11/2004 | CN1474190A Precisely Positioning method and device for power transmission line fault using multiple terminal signals |
| 02/11/2004 | CN1474189A Automatic pressure sensitive resistor detecting machine |
| 02/11/2004 | CN1138358C Optical cable real time monitoring system |
| 02/11/2004 | CN1138329C Method for protecting power transmission line and fault locating and travelling wave sensor for it |
| 02/11/2004 | CN1138279C Circuit for producing scan path |
| 02/11/2004 | CN1138208C Burning frame detector, device and method for detection computer |
| 02/11/2004 | CN1138152C Combined testing system and testing method using same |
| 02/11/2004 | CN1138151C Method and device for detecting zero-line deficiency of three-phase circuit |
| 02/11/2004 | CN1138150C According to load current compensation type voltage sampling measurement circuit |
| 02/10/2004 | US6691289 Semiconductor integrated circuit including circuit for selecting embedded tap cores |
| 02/10/2004 | US6691272 Testing of high speed DDR interface using single clock edge triggered tester data |
| 02/10/2004 | US6691271 Built-in self-test apparatus |
| 02/10/2004 | US6691270 Integrated circuit and method of operation of such a circuit employing serial test scan chains |
| 02/10/2004 | US6691269 Method for scan controlled sequential sampling of analog signals and circuit for use therewith |
| 02/10/2004 | US6691268 Method and apparatus for swapping state data with scan cells |
| 02/10/2004 | US6691267 Technique to test an integrated circuit using fewer pins |
| 02/10/2004 | US6691266 Bus mastering debugging system for integrated circuits |
| 02/10/2004 | US6691249 Probabilistic diagnosis, in particular for embedded and remote applications |
| 02/10/2004 | US6691181 Programmatic time-gap defect detection apparatus and method |
| 02/10/2004 | US6691095 Method and system to determine state-of-health of a fuel cell using an intelligent system |
| 02/10/2004 | US6691079 Method and system for analyzing test coverage |
| 02/10/2004 | US6691077 Capture and conversion of mixed-signal test stimuli |
| 02/10/2004 | US6691055 Integrated circuit provided with means for calibrating an electronic module and method for calibrating an electronic module of an integrated circuit |
| 02/10/2004 | US6691050 Data acquisition instrument architecture with flexible data acquisition, processing and display |
| 02/10/2004 | US6690780 Apparatus and method for network-initiated real-time multi-party communications |
| 02/10/2004 | US6690722 Method for characterizing frequency translation devices |
| 02/10/2004 | US6690284 Method of controlling IC handler and control system using the same |
| 02/10/2004 | US6690190 Motor component test arrangement including multiple test stations |
| 02/10/2004 | US6690189 Apparatus and method for testing semiconductor integrated circuit |
| 02/10/2004 | US6690187 Apparatus for testing reliability of interconnection in integrated circuit |