| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/24/2004 | US6696849 Fabrication method of semiconductor integrated circuit device and its testing apparatus |
| 02/24/2004 | US6696847 Photo assisted electrical linewidth measurement method and apparatus |
| 02/24/2004 | US6696845 Noise evaluation circuit for IC tester |
| 02/24/2004 | US6696842 Electronic unit for detecting the charging condition and/or the wear of a motor vehicle battery using the engine rotational speed and battery voltage |
| 02/24/2004 | US6696828 Integrated circuit and lot selection system therefor |
| 02/24/2004 | US6696818 Method and unit for computing charging efficiency and charged electrical quantity of battery |
| 02/24/2004 | US6695640 Ultrasonic diagnostic equipment |
| 02/24/2004 | US6695571 Vertical magazine method for integrated circuit device dispensing, receiving, storing, testing or binning |
| 02/24/2004 | US6694831 Method and system for automatically locating a component on a planar |
| 02/24/2004 | CA2380707C Semiconductor device evaluation apparatus and semiconductor device evaluation program product |
| 02/24/2004 | CA2239717C Device and method for testing electrosurgical instruments |
| 02/19/2004 | WO2004015766A1 Method of fabricating a heat exchanger for regulating the temperature of multiple integrated circuit modules |
| 02/19/2004 | WO2004015762A1 Anisotropic conductivity connector, probe member, wafer inspecting device, and wafer inspecting method |
| 02/19/2004 | WO2004015761A1 Anisotropic conductivity connector, conductive paste composition, probe member, wafer inspecting device, and wafer inspecting method |
| 02/19/2004 | WO2004015596A2 Method and system for debugging using replicated logic |
| 02/19/2004 | WO2004015540A2 Wireless local on metropolitan area network with intrusion detection features and related methods |
| 02/19/2004 | WO2004015434A1 Placing table drive device and probe method |
| 02/19/2004 | WO2004015433A1 System and method for synchronizing electrical generators |
| 02/19/2004 | WO2003100473A3 Apparatus and method for optically detecting defects in voltage contrast test structures |
| 02/19/2004 | WO2003096034A3 Tester system having multiple instruction memories |
| 02/19/2004 | WO2003065063A8 Picosecond imaging circuit analysis(pica)timing system measurement and calibration |
| 02/19/2004 | WO2003054564A3 Probe card covering system and method |
| 02/19/2004 | WO2002097946A8 Back-up power system |
| 02/19/2004 | WO2002084487A3 Method and apparatus for performing failure recovery in a java platform |
| 02/19/2004 | US20040034840 Method for analysis of interconnect coupling in VLSI circuits |
| 02/19/2004 | US20040034839 Methods for making contact device for making connection to an electronic circuit device and methods of using the same |
| 02/19/2004 | US20040034838 Method of generating a test pattern for simulating and/or testing the layout of an integrated circuit |
| 02/19/2004 | US20040034824 System, method and computer program product for receiving and displaying store delivery system built-in-test data |
| 02/19/2004 | US20040034508 Method and apparatus for measuring fault diagnostics on insulated gate bipolar transistor converter circuits |
| 02/19/2004 | US20040034495 Method for determining fault coverage from RTL description |
| 02/19/2004 | US20040034493 Multiprobe blob test in lieu of 100% probe test |
| 02/19/2004 | US20040034490 Observation and/or failure inspection apparatus, method and program therefor |
| 02/19/2004 | US20040034463 Sensor for monitoring electronic detonation circuits |
| 02/19/2004 | US20040033633 Photonic devices and pics including sacrificial testing structures and method of making the same |
| 02/19/2004 | US20040032915 Semiconductor integrated circuit comprising functional modes |
| 02/19/2004 | US20040032544 Liquid crystal display panel with static electricity prevention circuit |
| 02/19/2004 | US20040032358 Interleaving AD conversion type waveform digitizer |
| 02/19/2004 | US20040032280 Integrated visual imaging and electronic sensing inspection systems |
| 02/19/2004 | US20040032278 Inspecting method, semiconductor device, and display |
| 02/19/2004 | US20040032277 Method for wafer-level burn-in stressing of semiconductor devices and semiconductor device substrates configured to effect the method |
| 02/19/2004 | US20040032275 Spray cooling and transparent cooling plate thermal management system |
| 02/19/2004 | US20040032273 Methods and apparatus for testing and burn-in of semiconductor devices |
| 02/19/2004 | US20040032272 Contactor having contact electrodes formed by laser processing |
| 02/19/2004 | US20040032265 Double-ended distance-to-fault location system using time-synchronized positive-or negative-sequence quantities |
| 02/19/2004 | US20040032264 Methods for determining the charge state and/or the power capacity of a charge store |
| 02/19/2004 | US20040032249 Electric component test system and electric component test method |
| 02/19/2004 | US20040032248 Side supports with adjustable center of gravity |
| 02/19/2004 | US20040031997 Semiconductor device, method for evaluating the same, and method for fabricating the same |
| 02/19/2004 | DE69628034T2 Hochimpedanzmodus für jtag High impedance mode for jtag |
| 02/19/2004 | DE69626583T2 Schnellfehlendes, funktionellfehlendes, fehlertolerantes Multiprozessorsystem Quick missing, missing functional, fault-tolerant multiprocessor system |
| 02/19/2004 | DE20318266U1 Car battery current measurement unit has resistance connected to electronics by spring contacts |
| 02/19/2004 | DE19816942B4 Schaltungsanordnung zur Überwachung eines Stromkreises auf Leitungsbruch Circuit arrangement for monitoring a circuit for line break |
| 02/19/2004 | DE19520373B4 Fehlerdiagnosevorrichtung für eine Fahrgastschutzvorrichtung A failure diagnosis apparatus for a passenger protection device |
| 02/19/2004 | DE10236312A1 Electrical conductivity tester comprises a hand held unit with a single contact and a conducting housing so that an object is tested by virtue of a current flowing through the tester |
| 02/19/2004 | DE10235161A1 Sensor, control unit and method for monitoring a sensor, whereby if a sensor error occurs, an error pattern or signal is generated that is transmitted to a control unit, so that the sensor signal can be evaluated accordingly |
| 02/19/2004 | DE10235139A1 Lead-acid battery monitoring arrangement, especially for a motor vehicle, in which a minimum terminal voltage value at which the battery is isolated is adjusted over time to match battery state and operating conditions |
| 02/19/2004 | DE10234662A1 Device and process for digital detection of the phase difference between two periodic signals finds the time interval between reference and equalizing clock signals |
| 02/19/2004 | DE10234537A1 Verfahren und Vorrichtung zum Orten von Kabelmuffen und Kabelfehlern bei verlegten Kabeln Method and apparatus for locating cable glands and cable faults in cables laid |
| 02/19/2004 | DE10135169B4 Widerstandsanordnung und Strommesser Resistor assembly and ammeter |
| 02/19/2004 | CA2495091A1 Wireless local or metropolitan area network with intrusion detection features and related methods |
| 02/18/2004 | EP1389336A1 Test method for testing a data memory |
| 02/18/2004 | EP1389315A2 Hierarchical built-in self-test for system-on-chip design |
| 02/18/2004 | EP1008025B1 Configuration control in a programmable logic device using non-volatile elements |
| 02/18/2004 | EP0768676B1 A semiconductor memory with sequential clocked access codes for test mode entry |
| 02/18/2004 | CN2603943Y Integrated monitoring apparatus for electric energy meter |
| 02/18/2004 | CN1476174A Testing data compression code, decoding method and special decoding element of slice system |
| 02/18/2004 | CN1476071A Chip elements transporting holder |
| 02/18/2004 | CN1476068A Contactor having contact electrode formed by laser |
| 02/18/2004 | CN1475811A Semiconductor measurer and semiconductor measuring method |
| 02/18/2004 | CN1475810A Cable testing device and method |
| 02/18/2004 | CN1139251C Detection-digital-signal processor in digital video-disk reproducing device |
| 02/18/2004 | CN1139227C Method and circuit configuration for determining functional performance and ordered use of connection cables in switching device |
| 02/18/2004 | CN1139167C Charger |
| 02/18/2004 | CN1139019C Packed battery tester |
| 02/18/2004 | CN1138985C Calibrating method of rechargeable battery capacity |
| 02/18/2004 | CN1138984C Test method of electronic element and its testing equipment |
| 02/18/2004 | CN1138983C Method and apparatus for electronic meter testing |
| 02/17/2004 | US6694500 Design circuit pattern for test of semiconductor circuit |
| 02/17/2004 | US6694497 Method of testing integrated circuitry at system and module level |
| 02/17/2004 | US6694492 Method and apparatus for optimizing production yield and operational performance of integrated circuits |
| 02/17/2004 | US6694489 Test interface for a configurable system on-chip |
| 02/17/2004 | US6694467 Low power testing of very large circuits |
| 02/17/2004 | US6694466 Method and system for improving the test quality for scan-based BIST using a general test application scheme |
| 02/17/2004 | US6694465 Low overhead input and output boundary scan cells |
| 02/17/2004 | US6694464 Method and apparatus for dynamically testing electrical interconnect |
| 02/17/2004 | US6694463 Input/output continuity test mode circuit |
| 02/17/2004 | US6694462 Capturing and evaluating high speed data streams |
| 02/17/2004 | US6694454 Stuck and transient fault diagnostic system |
| 02/17/2004 | US6694432 Securing data in a machine for testing electronic components |
| 02/17/2004 | US6694274 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same |
| 02/17/2004 | US6694208 Method for prioritizing failure modes to improve yield rate in manufacturing semiconductor devices |
| 02/17/2004 | US6693845 Semiconductor device having PLL-circuit |
| 02/17/2004 | US6693817 Reversed memory module socket, motherboard and test system including same, and method of modifying motherboard |
| 02/17/2004 | US6693816 Reversed memory module socket, motherboard and test system including same, and method of modifying motherboard |
| 02/17/2004 | US6693778 Diode fault detection and ground fault detection systems |
| 02/17/2004 | US6693668 Self-diagnostic image sensor |
| 02/17/2004 | US6693460 Scan flip-flop and semiconductor integrated circuit device |
| 02/17/2004 | US6693449 Circuit and method for determining the operating point of a semiconductor device |
| 02/17/2004 | US6693448 Semiconductor integrated circuit |
| 02/17/2004 | US6693447 Configuration for identifying contact faults during the testing of integrated circuits |