Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
02/2004
02/26/2004WO2004017081A1 Electronic circuit testing method and apparatus
02/26/2004WO2004017080A1 Method for monitoring at least two electromagnetic valves of an internal combustion engine, especially an internal combustion engine of a motor vehicle
02/26/2004WO2004017076A1 Press assembly for electronic board testing
02/26/2004WO2004017035A2 Method and apparatus for temperature control
02/26/2004WO2004003576A3 Cell buffer with built-in test
02/26/2004WO2004001706A3 Control device of an optoelectronic device having improved testing properties
02/26/2004WO2003069787A3 System and method for fault tolerant multimedia communication
02/26/2004WO2003060593A3 Multi-beam polygon scanning system
02/26/2004WO2003052429A3 Method and apparatus for in-circuit impedance measurement
02/26/2004US20040040006 Design method for integrated circuit having scan function
02/26/2004US20040040005 Method for effectively embedding various integrated circuits within field programmable gate arrays
02/26/2004US20040039977 Tester system having a multi-purpose memory
02/26/2004US20040039976 Digital spread spectrum methods and apparatus for testing aircraft wiring
02/26/2004US20040039975 Slowing graphics system for application optimization
02/26/2004US20040039974 Method for setting system working frequency
02/26/2004US20040039552 Signal sampling with sampling and reference paths
02/26/2004US20040039538 Apparatus and method for measuring a parameter in a host device
02/26/2004US20040039536 Latent fault detection in redundant power supply systems
02/26/2004US20040038571 Extender card with insertion/removal arrangement
02/26/2004US20040037405 Apparatus and method for network-initiated real-time multi-party communications
02/26/2004US20040037303 Linking addressable shadow port and protocol for serial bus networks
02/26/2004US20040037227 Circuit for enhancing scan testing capability of a digital IC tester
02/26/2004US20040037149 Semiconductor memory device capable of normal transition to test mode
02/26/2004US20040037148 improved gate dielectric characteristics
02/26/2004US20040036861 Probe apparatus
02/26/2004US20040036620 Battery charging status indication circuit
02/26/2004US20040036614 Water monitoring system and water monitoring method for high voltage cables
02/26/2004US20040036496 Electronic load simulation circuit with serially connected impedance element
02/26/2004US20040036491 Probe card
02/26/2004US20040036490 Selectively configurable probe structures, e.g., for testing microelectronic components
02/26/2004US20040036489 Electron microscopic inspection apparatus
02/26/2004US20040036480 Automobile multi-purpose DC source protection monitor
02/26/2004US20040036478 Method and system for power line network fault detection and quality monitoring
02/26/2004US20040036475 Battery monitoring
02/26/2004US20040036466 On-circuit board continuity tester
02/26/2004US20040036464 Loss measurement system
02/26/2004US20040036446 Malfunction detection apparatus and method for battery pack
02/26/2004US20040036443 Modular battery tester for scan tool
02/26/2004US20040036146 Phototransistor device with fully depleted base region
02/26/2004US20040036084 Method and device for identifying the version of integrated circuits and use controling operating sequences
02/26/2004US20040035841 Method and process of contact to a heat softened solder ball array
02/26/2004DE19756916B4 Überwachungssystem Monitoring system
02/26/2004DE19511869B4 Verfahren und Anordnung zur Responseanalyse von Halbleitermaterialien mit optischer Anregung Method and system for response analysis of semiconductor materials with optical excitation
02/26/2004DE10333817A1 Emulationsschnittstellensystem Emulation interface system
02/26/2004DE10327497A1 Vorrichtung zum Eichen einer Hochfrequenzsignalmessausrüstung Apparatus for calibrating a high frequency signal measuring equipment
02/26/2004DE10318394A1 Automatisches Prüfsystem und Vorrichtung für integrierte Schaltungen unter Verwendung eines integrativen Computers und ein Verfahren für dieselben Automatic testing system and apparatus for integrated circuits using an integrated computer and a method for the same
02/26/2004DE10310538A1 Halbleiterspeichervorrichtung mit verringerter Dauer des Tests des Speicherzellen-Datenschreibens oder -Datenlesens oder des Tests der Leseverstärkerleistung A semiconductor memory device with a reduced duration of the test of the memory cell or data writing -Datenlesens or the test, the sense amplifier power
02/26/2004DE10309598A1 Halbleitervorrichtung mit verkleinertem eingebautem Treiber A semiconductor device having a reduced built-drivers
02/26/2004DE10251001B3 Earth short-circuit fault signal provision method for multi-phase transmission line monitoring with detection of phase current transducer saturation
02/26/2004DE10237112A1 Semiconductor power module and method for monitoring the thermal integrity of its heat transfer path to a heat sink, whereby the component is heated and if a preset temperature is exceeded the component is deemed faulty
02/26/2004DE10210516B4 Verfahren und Einrichtung zum Ermitteln der Funktionsfähigkeit einer Speicherbatterie Method and apparatus for determining the operativeness of a storage battery
02/26/2004CA2490045A1 Shock absorber means for components and cards
02/25/2004EP1391990A2 Method and apparatus for producing perturbation signals
02/25/2004EP1391962A1 Voltage measuring circuit of battery pack
02/25/2004EP1391742A2 Monitoring device and method for determining the operating state of a storage battery
02/25/2004EP1391741A1 Method to identify stray current hazards
02/25/2004EP1391738A2 Probe card
02/25/2004EP1391265A1 Contactor cleaning sheet, and contactor cleaning method
02/25/2004EP1391023A2 Method and device for determining the starting capability of a vehicle
02/25/2004EP1390951A2 Dynamic memory and method for testing a dynamic memory
02/25/2004EP1390820A2 Apparatus and methods with resolution enhancement feature for improving accuracy of conversion of required chemical mechanical polishing pressure to force to be applied by polishing head to wafer
02/25/2004EP1390772A2 Method and apparatus for predicting the available energy of a battery
02/25/2004EP1390771A2 Fuel cell voltage monitoring
02/25/2004EP1390768A1 Measuring device with functional units controlled by means of a block diagram
02/25/2004EP1390764A1 Method for determining the frequency of the current ripple in the armature current of a commutated d.c motor
02/25/2004EP1303815B1 System initialization of microcode-based memory built-in self-test
02/25/2004EP0913033B1 Coherent sampling digitizer system
02/25/2004EP0834081B1 Method and apparatus for testing a megacell in an asic using jtag
02/25/2004EP0680613B1 Method of determining the charge status of a battery, in particular a vehicle starter battery
02/25/2004CN2604693Y Long and short needles therapeutical apparatus structure
02/25/2004CN2604692Y Electric heating wireless pot on-off testing machine
02/25/2004CN2604691Y Universal therapeutic equipment test platform
02/25/2004CN2604690Y Separating test platform
02/25/2004CN1478282A Method and apparatus for built-in self-repair of memoey storage arrays
02/25/2004CN1478203A Mechanism for clamping device interface board to peripheral
02/25/2004CN1477894A Mobile telephone
02/25/2004CN1477691A Method for testing probe board and semiconductor chip, capacitor and mfg. method thereof
02/25/2004CN1477690A Test method of complex semiconductor packaged structure
02/25/2004CN1477403A Receiver used in electronic testing equpment of printed circuit board
02/25/2004CN1477402A PTC thermistor zero-power voltage effect automatic testing system
02/25/2004CN1140027C Full-wave/half-wave automatic repeat frequency charging and discharging circuit
02/25/2004CN1139819C Electric leak detecting apparatus for electric motorcar
02/25/2004CN1139502C Controller for on-vehicle battery
02/24/2004US6698004 Pin toggling using an object oriented programming language
02/24/2004US6697995 Diagnostic method for logic used in vehicle
02/24/2004US6697982 Generating netlist test vectors by stripping references to a pseudo input
02/24/2004US6697981 System and method for evaluating the location of a failure in a logic circuit, and machine-readable recording medium having a recorded program
02/24/2004US6697980 Die fault testing utilizing an exclusive-or network of gates
02/24/2004US6697979 Method of repairing integrated circuits
02/24/2004US6697929 Scannable zero-catcher and one-catcher circuits for reduced clock loading and power dissipation
02/24/2004US6697768 Adaptive method and apparatus for transmission line analysis
02/24/2004US6697763 Measurement module and system for monitoring the status of armored vehicle electronic components
02/24/2004US6697755 Test apparatus
02/24/2004US6697753 Methods and apparatus for testing electronic devices
02/24/2004US6697749 Correction method of measurement errors, quality checking method for electronic components, and characteristic measuring system of electronic components
02/24/2004US6697617 Notification of a low-battery and maintaining communication in a wireless network
02/24/2004US6697285 Semiconductor memory device
02/24/2004US6697245 Electronic load for the testing of electrochemical energy conversion devices
02/24/2004US6697154 Microvia inspection system
02/24/2004US6696851 Reception line break detection apparatus