| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/04/2004 | US20040041595 Semiconductor integrated circuit device, and adjustment method of semiconductor integrated circuit device |
| 03/04/2004 | US20040041581 Method of measuring contact resistance of probe and method of testing semiconductor device |
| 03/04/2004 | US20040041580 Multichip module and testing method thereof |
| 03/04/2004 | US20040041579 Semiconductor chip test system and test method thereof |
| 03/04/2004 | US20040041578 Internal generation of reference voltage |
| 03/04/2004 | US20040041577 Lead protusion tester |
| 03/04/2004 | US20040041576 Stress relieved contact array |
| 03/04/2004 | US20040041575 Apparatus and method for detecting photon emissions from transistors |
| 03/04/2004 | US20040041569 Voltage measuring circuit of battery pack |
| 03/04/2004 | US20040041557 Tester incorporating opening and closing mechanism |
| 03/04/2004 | US20040041275 Semiconductor device mounting chip having tracing function |
| 03/04/2004 | US20040040149 Probe card , e.g., for testing microelectronic components, and methods for making same |
| 03/04/2004 | DE10260723A1 Status monitoring of components in a road vehicle braking system is based upon current measurement at the end of a control period |
| 03/04/2004 | DE10239965A1 Device for optical or acoustic indication of 3-phase device connection consistent with phase rotation direction e.g. for motor, has part for attaching in front of opening in housing for 3-phase device and/or connector |
| 03/04/2004 | DE10239460A1 Continuous insulated electrical wire manufacturing test unit has conducting rollers with high voltage connection and bus controlled test electronics |
| 03/04/2004 | DE10236958A1 Verfahren zur Ermittlung der entnehmbaren Ladungsmenge einer Speicherbatterie und Überwachungseinrichtung für eine Speicherbatterie Method for determining the amount of charge of a storage battery monitoring device and for a storage battery |
| 03/04/2004 | DE10236943A1 Verfahren zum Erkennen von Gefährdungen durch Streuströme A method of detecting hazards by stray currents |
| 03/04/2004 | DE10228806B3 Einrichtung und Verfahren zum Bestimmen eines Ladezustands einer Batterie Apparatus and method for determining a state of charge of a battery |
| 03/04/2004 | DE10154511B4 Netzwerkanalysator und Verfahren zur Vektorcharakterisierung von Frequenzumsetzungsvorrichtungen Network analyzer and method for vector characterization of frequency conversion devices |
| 03/04/2004 | CA2833510A1 Methods for transmitting a waveform having a controllable attenuation and propagation velocity |
| 03/04/2004 | CA2496322A1 Methods for transmitting a waveform having a controllable attenuation and propagation velocity |
| 03/03/2004 | EP1394943A2 Ring oscillator and test method and apparatus employing a ring oscillator for verifying fabrication of transistors in an integrated circuit |
| 03/03/2004 | EP1394847A1 Wafer prober |
| 03/03/2004 | EP1394812A1 Test circuit for semiconductor memory |
| 03/03/2004 | EP1394561A1 Method for determining the remaining charge of a battery and monitoring circuit for a battery |
| 03/03/2004 | EP1394560A2 Semiconductor chip test system and test method thereof |
| 03/03/2004 | EP1394559A1 Method and apparatus for wire fault detection and correction |
| 03/03/2004 | EP1394556A2 Modular mechanical fixturing and automated handling of printed circuit assemblies on automated test equipment |
| 03/03/2004 | EP1394397A2 Method, control and/or regulation device for operation of an internal combustion engine |
| 03/03/2004 | EP1393497A2 Dual mode service platform within network communication system |
| 03/03/2004 | EP1393491A1 Device for testing the conformity of an electronic connection |
| 03/03/2004 | EP1393280A1 Safety device |
| 03/03/2004 | EP1393176A2 Method and apparatus for fault tolerant and flexible test signature generator |
| 03/03/2004 | EP1393154A2 Measuring device with dialog control occurring via dialog windows and corresponding method |
| 03/03/2004 | EP1393090A2 Method and apparatus for contactless capacitive testing of integrated circuits |
| 03/03/2004 | EP1393089A1 Display device comprising a plurality of leds |
| 03/03/2004 | EP1393088A2 Device for holding an electronic circuit in a pre-determined state |
| 03/03/2004 | EP1393087A1 Method for measuring fuse resistance in a fuse array |
| 03/03/2004 | EP1236051B1 Bit fail map compression with fail signature analysis |
| 03/03/2004 | EP1166136A4 Simulator cart |
| 03/03/2004 | EP1153348B1 On-chip debug system |
| 03/03/2004 | EP0928425B1 Test device for an electronic tripping device |
| 03/03/2004 | CN2605580Y Time constant on-line observer for asynchronous motor rotor |
| 03/03/2004 | CN2605579Y Single-phase grounding compensation detectnig apparatus |
| 03/03/2004 | CN2605578Y Universal test chassis for circuit board |
| 03/03/2004 | CN1479911A Inspecting method, semiconductor device and display device |
| 03/03/2004 | CN1479873A Socket for electronic component test and electronic component test apparatus using the socket |
| 03/03/2004 | CN1479112A Method and equipment for charactering circuit board testing coverage rate |
| 03/03/2004 | CN1479111A Method and equipment for charactering circuit board testing coverage rate |
| 03/03/2004 | CN1479109A Method of judging continuous failure occuring position using wave shape |
| 03/03/2004 | CN1479108A 电极 Electrode |
| 03/03/2004 | CN1479107A Failure analysis monitoring method and system device used on power supply network |
| 03/03/2004 | CN1479106A Moving limiting unit of electron element testing socket |
| 03/03/2004 | CN1479105A Lockable pressure controlled frame of electron element testing socket |
| 03/03/2004 | CN1479104A Measuring vibration circuit based on sample data string obtained by ideal period signal |
| 03/03/2004 | CN1478682A Fault diagnosing system for tractor of seat belt |
| 03/03/2004 | CN1140950C Cell voltage detection circuit, and method of detecting cell voltage |
| 03/03/2004 | CN1140814C Battery voltage measuring device |
| 03/03/2004 | CN1140813C Measuring apparatus and method for measuring characteristic of solar cell |
| 03/03/2004 | CN1140812C Electric service life monitor system for contact of breaker |
| 03/03/2004 | CN1140811C Fault locating system |
| 03/03/2004 | CN1140805C Automatic tester for plug |
| 03/02/2004 | US6701497 Method for effective capacitance calculation of interconnect portion and delay calculation of electronic circuit |
| 03/02/2004 | US6701494 Method of using testbench tests to avoid task collisions in hardware description language |
| 03/02/2004 | US6701491 Input/output probing apparatus and input/output probing method using the same, and mixed emulation/simulation method based on it |
| 03/02/2004 | US6701476 Test access mechanism for supporting a configurable built-in self-test circuit and method thereof |
| 03/02/2004 | US6701475 Boundary scanning element and communication equipment using the same |
| 03/02/2004 | US6701474 System and method for testing integrated circuits |
| 03/02/2004 | US6701473 Electrical circuit and method for testing a circuit component of the electrical circuit |
| 03/02/2004 | US6701461 Method and apparatus for testing a cache |
| 03/02/2004 | US6701401 Method for testing a USB port and the device for the same |
| 03/02/2004 | US6701283 Apparatus for processing items of electronic equipment |
| 03/02/2004 | US6701280 System and method to provide measurement capabilities for both single-ended and differential signals with software switching |
| 03/02/2004 | US6701270 Method for reliability testing leakage characteristics in an electronic circuit and a testing device for accomplishing the source |
| 03/02/2004 | US6701269 Jitter measurement extrapolation and calibration for bit error ratio detection |
| 03/02/2004 | US6701095 Office information system having a device which provides an operational message of the system when a specific event occurs |
| 03/02/2004 | US6701003 Component identification system for electronic board testers |
| 03/02/2004 | US6700873 Apparatus for and method of detecting operation administration and maintenance (OAM) cell |
| 03/02/2004 | US6700872 Method and system for testing a utopia network element |
| 03/02/2004 | US6700659 Semiconductor analysis arrangement and method therefor |
| 03/02/2004 | US6700603 Inspection system for inspecting discrete wiring patterns formed on a continuous substrate sheet of a flexible material |
| 03/02/2004 | US6700515 Digitizer apparatus and semiconductor testing apparatus |
| 03/02/2004 | US6700416 Input buffer and method for voltage level detection |
| 03/02/2004 | US6700402 Output control circuit and output control method |
| 03/02/2004 | US6700398 In-line D.C. testing of multiple memory modules in a panel before panel separation |
| 03/02/2004 | US6700397 Triaxial probe assembly |
| 03/02/2004 | US6700388 Methods and apparatus for detecting electromagnetic interference |
| 03/02/2004 | US6700384 Circuit for detecting leakage in power supply |
| 03/02/2004 | US6700383 Method of detecting and resolving memory effect |
| 03/02/2004 | US6700301 Method and device for detecting a fault current across a piezoelectric actuator of an injector or its high voltage supply lead |
| 03/02/2004 | US6700122 Wafer inspection system and wafer inspection process using charged particle beam |
| 03/02/2004 | US6700099 Wafer chuck having thermal plate with interleaved heating and cooling elements, interchangeable top surface assemblies and hard coated layer surfaces |
| 03/02/2004 | US6699781 Conductive material for integrated circuit fabrication |
| 02/27/2004 | CA2438252A1 Method and arrangement for detecting and correcting line defects |
| 02/26/2004 | WO2004017695A1 Shock absorber means for components and cards |
| 02/26/2004 | WO2004017485A1 Rapid charging battery charging system |
| 02/26/2004 | WO2004017474A2 Photonic devices and pics including sacrificial testing structures and method of making the same |
| 02/26/2004 | WO2004017215A1 Sensor, controller and method for monitoring at least one sensor |
| 02/26/2004 | WO2004017083A1 Module, electronic device and evaluation tool |
| 02/26/2004 | WO2004017082A1 Semiconductor inspection device and semiconductor device manufacturing method |