| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 03/11/2004 | DE69627749T2 Verfahren zur Synchronisation zweier zentraler Verarbeitungseinheiten für Duplex-Lock-Step-Operationen Method for synchronization of two central processing units for duplex lock-step operations |
| 03/11/2004 | DE10316568A1 Jitter-Messschaltung Jitter measurement circuit |
| 03/11/2004 | DE10241045A1 Electronic component on wafer test procedure for light emitting and laser diodes uses integrated field effect transistor switch matrix |
| 03/11/2004 | DE10240329A1 Verfahren zur Ermittlung der entnehmbaren Ladungsmenge einer Speicherbatterie und Überwachungseinrichtung für eine Speicherbatterie Method for determining the amount of charge of a storage battery monitoring device and for a storage battery |
| 03/11/2004 | DE10240243A1 Current measurement arrangement, comprising two current sensors for low and high current ranges, has zero point drift compensation based on combined evaluation of current measurements from both sensors |
| 03/11/2004 | DE10239415A1 Appliance for testing correct functioning of motor vehicle components under effect of electromagnetic interference, in particular airbags, simulates acceleration conditions on occurrence of collision |
| 03/11/2004 | DE10132159B4 Verfahren und Vorrichtung zum gleichzeitigen Testen einer Mehrzahl von integrierten Schaltungen Method and device for simultaneously testing a plurality of integrated circuits |
| 03/10/2004 | EP1396929A2 Measurement of the rate of change of current in switched reluctance machines |
| 03/10/2004 | EP1396863A1 Semiconductor memory device and method for testing semiconductor memory device |
| 03/10/2004 | EP1396729A1 Method of diagnosing a motor vehicle battery |
| 03/10/2004 | EP1396066A2 Self-diagnosis system for an energy storage device |
| 03/10/2004 | EP1396065A2 Back-up power system |
| 03/10/2004 | EP1396063A2 Circuit for monitoring cells of a multi-cell battery during charge |
| 03/10/2004 | EP1395842A2 Electrical component measuring instrument |
| 03/10/2004 | EP1395841A2 Low noise microwave synthesizer employing high frequency combs for tuning drift cancel loop |
| 03/10/2004 | EP1395840A1 Fault detection system and method |
| 03/10/2004 | EP1395839A2 Apparatus with interchangeable modules for measuring characteristics of cables and networks |
| 03/10/2004 | EP1216419B1 Measuring probe for measuring high frequencies |
| 03/10/2004 | CN1481507A System and method for pre-programming electronic device's memory |
| 03/10/2004 | CN1481010A Method for testing chips of wideband data communicatioin and chip |
| 03/10/2004 | CN1480949A 半导体存储器件及其控制方法 The semiconductor memory device and control method |
| 03/10/2004 | CN1480948A Semiconductor memory able to reduce input/output terminal |
| 03/10/2004 | CN1480947A Semiconductor memory device and its checking method |
| 03/10/2004 | CN1480741A Device for monitoring operating voltage of each cell in fuel cells and making safety alarming as well as its method |
| 03/10/2004 | CN1480740A Wavelet diagnostic system for initial failure of electromotor and method for diagnosing malfunction of electromotor |
| 03/10/2004 | CN1480739A Equipment for detecting and arlarming fault of distribution network in low voltage of electric power |
| 03/10/2004 | CN1480738A Constant current constant voltage method for testing convertor driven by pulses in quasi-sinusoidal power under room temperature |
| 03/10/2004 | CN1480737A Integrated intelligent testing system for large power convertor assembly |
| 03/10/2004 | CN1141737C Non-destructive method and device for measuring depth of buried interface |
| 03/10/2004 | CN1141597C Solar cell assembly testing instrument with pulse xenon lamp linear light source bench |
| 03/10/2004 | CN1141596C Burn-out fault detecting method and equipment |
| 03/10/2004 | CN1141595C Method for measuring real-time power-angle and power generator |
| 03/10/2004 | CN1141594C Semiconductor integrated circuit |
| 03/10/2004 | CN1141593C IC testing method and IC testing device using same |
| 03/10/2004 | CN1141592C Impulse valtage generator circuit and additional element for such circuit |
| 03/10/2004 | CN1141591C Abnormal detector of electric rotating machinery |
| 03/10/2004 | CN1141590C Method for detecting short-circuit conditions and device which uses this method |
| 03/09/2004 | US6704904 Method and apparatus for permuting code sequences and initial context of code sequences for improved electrical verification |
| 03/09/2004 | US6704897 Semiconductor device and the test system for the same |
| 03/09/2004 | US6704896 Method of and device for getting internal bus information |
| 03/09/2004 | US6704895 Integrated circuit with emulation register in JTAG JAP |
| 03/09/2004 | US6704894 Fault insertion using on-card reprogrammable devices |
| 03/09/2004 | US6704893 Method for testing integrated circuits with an automatic test equipment |
| 03/09/2004 | US6704892 Automated clock alignment for testing processors in a bypass mode |
| 03/09/2004 | US6704889 Enhanced embedded logic analyzer |
| 03/09/2004 | US6704676 Method and circuit configuration for identifying an operating property of an integrated circuit |
| 03/09/2004 | US6704675 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same |
| 03/09/2004 | US6704629 Device for monitoring motor vehicle's electric power and method therefor |
| 03/09/2004 | US6704277 Testing for digital signaling |
| 03/09/2004 | US6704238 Semiconductor memory device including data bus pairs respectively dedicated to data writing and data reading |
| 03/09/2004 | US6704231 Semiconductor memory device with circuit executing burn-in testing |
| 03/09/2004 | US6704229 Semiconductor test circuit for testing a semiconductor memory device having a write mask function |
| 03/09/2004 | US6703938 Electrical panel safety monitor |
| 03/09/2004 | US6703856 Test method of electro-optical device, test circuit of electro-optical device, electro-optical device, and electronic equipment |
| 03/09/2004 | US6703854 Burn-in apparatus having average voltage calculating circuit |
| 03/09/2004 | US6703850 Method of inspecting circuit pattern and inspecting instrument |
| 03/09/2004 | US6703849 Inspection apparatus, inspection method and inspection unit therefor |
| 03/09/2004 | US6703844 Method for determining the transit time of electrical signals on printed circuit boards using automatic standard test equipment |
| 03/09/2004 | US6703842 Method for discriminating abnormal current including arc current in AC load circuit and apparatus for executing the same |
| 03/09/2004 | US6703839 Synthetic making/breaking-capacity test circuit for high-voltage alternating-current circuit-breakers |
| 03/09/2004 | US6703825 Separating device response signals from composite signals |
| 03/09/2004 | US6703823 Method and apparatus for electronic meter testing |
| 03/09/2004 | US6703820 Method and circuit for testing high frequency mixed signal circuits with low frequency signals |
| 03/09/2004 | US6703573 Method for sorting integrated circuit devices |
| 03/09/2004 | US6703469 Biodegradable; enhance nutrient uptake |
| 03/09/2004 | US6703311 Method for estimating capacitance of deep trench capacitors |
| 03/09/2004 | US6703251 Semiconductor wafer |
| 03/09/2004 | US6702669 Numerical total keno game |
| 03/09/2004 | US6702609 IC socket contact medium having uniform contact force |
| 03/04/2004 | WO2004019501A2 Methods for transmitting a waveform having a controllable attenuation and propagation velocity |
| 03/04/2004 | WO2004019407A1 Method of evaluating core based system-on-a-chip |
| 03/04/2004 | WO2004008291A3 Context aware transmission management method |
| 03/04/2004 | WO2003102747A3 Method and control circuitry for accessing multiple taps (test access ports) via a single tap |
| 03/04/2004 | WO2003100837A3 Large substrate test system |
| 03/04/2004 | WO2003074974A3 Evaluating a multi-layered structure for voids |
| 03/04/2004 | WO2003067274B1 Method and device for detecting faults on integrated circuits |
| 03/04/2004 | WO2002075341A8 Semiconductor device and its test method |
| 03/04/2004 | US20040044973 Methods and apparatus for characterizing board test coverage |
| 03/04/2004 | US20040044948 Method and apparatus for testing a high speed data receiver for jitter tolerance |
| 03/04/2004 | US20040044938 System for testing different types of semiconductor devices in parallel at the same time |
| 03/04/2004 | US20040044937 Boundary scan of integrated circuits |
| 03/04/2004 | US20040044936 Systems and methods for facilitating testing of pads of integrated circuits |
| 03/04/2004 | US20040044499 Method and system for determining motor reliability |
| 03/04/2004 | US20040044498 Methods and apparatus for characterizing board test coverage |
| 03/04/2004 | US20040044491 Test circuit provided with built-in self test function |
| 03/04/2004 | US20040044488 Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal |
| 03/04/2004 | US20040044486 Non-linear electronics for sensing maximum dynamic range |
| 03/04/2004 | US20040044485 Failure analysis system and failure analysis method of logic LIS |
| 03/04/2004 | US20040043621 Method and apparatus for endpoint detection in electron beam assisted etching |
| 03/04/2004 | US20040042393 Apparatus and method for data acquisition from network elements having reserved resources for specialized traffic |
| 03/04/2004 | US20040042332 Semiconductor integrated circuit having latching means capable of scanning |
| 03/04/2004 | US20040042331 Semiconductor memory device with test mode |
| 03/04/2004 | US20040042312 Memory devices with selectively enabled output circuits for test mode and method of testing the same |
| 03/04/2004 | US20040042301 Semiconductor memory device |
| 03/04/2004 | US20040042293 Semiconductor memory and method of testing the same |
| 03/04/2004 | US20040042281 Semiconductor memory device |
| 03/04/2004 | US20040042279 Semiconductor device and a method of testing thereof |
| 03/04/2004 | US20040042145 Distributed diode fault check |
| 03/04/2004 | US20040041641 Test method and apparatus for verifying fabrication of transistors in an integrated circuit |
| 03/04/2004 | US20040041610 Scan design for double-edge-triggered flip-flops |