| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 03/18/2004 | US20040051533 Battery tester with CCA lookup table |
| 03/18/2004 | US20040051532 Battery tester upgrade using software key |
| 03/18/2004 | US20040051522 Techniques for electrically characterizing tunnel junction film stacks with little or no processing |
| 03/18/2004 | US20040051519 Method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment |
| 03/18/2004 | US20040051518 High speed tester with narrow output pulses |
| 03/18/2004 | US20040051517 Counter balanced vertical docking motion in a driven vertical axis test head manipulator |
| 03/18/2004 | US20040051098 Method and structure for temporarily isolating a die from a common conductor to facilitate wafer level testing |
| 03/18/2004 | US20040050656 Belt conveyer with power conduction for electrical test |
| 03/18/2004 | US20040050545 Dynamic spray system |
| 03/18/2004 | DE60002518T2 Verfahren und Vorrichtung zum adaptiven Lernen von Testfehlern zur Verminderung der Gesamtzahl von Testmessungen erforderlich in Echtzeit Method and apparatus for adaptive learning of test failures to reduce the total number of test measurements required in real-time |
| 03/18/2004 | DE19712342B4 Verfahren zum Betreiben eines batteriegespeisten Verbrauchers in einem Kraftfahrzeug Method for operating a battery-powered consumer in a motor vehicle |
| 03/18/2004 | DE10332625A1 Electrical system diagnostic apparatus used in vehicles, has microprocessor which provides digital samples related to electrical current flowing through low resistance path during vehicle operation |
| 03/18/2004 | DE10323228A1 Verfahren und Vorrichtungen zum Charakterisieren von Platinentestabdeckung Methods and devices for characterizing cover board test |
| 03/18/2004 | DE10240247A1 Leistungsgeregelte Brennstoffzelle Regulated power fuel cell |
| 03/18/2004 | CA2496734A1 Aircraft multi-function wire and insulation tester |
| 03/17/2004 | EP1398644A1 Device and method for testing a transformer |
| 03/17/2004 | EP1398640A2 Device for measuring and analyzing electrical signals of an integrated circuit component |
| 03/17/2004 | EP1398639A2 Test structures for on-chip real-time reliability testing |
| 03/17/2004 | EP1397806A1 Identification of an integrated circuit from its physical manufacture parameters |
| 03/17/2004 | EP1397699A2 Tapped delay line high speed register |
| 03/17/2004 | EP1397694A1 Method for monitoring a power supply of a control unit in a motor vehicle |
| 03/17/2004 | EP1397625A1 Apparatus and method for controlling the temperature of an electronic device under test |
| 03/17/2004 | EP1247330A4 Shaft voltage and current monitoring system |
| 03/17/2004 | EP1110096B1 Vehicle electrical circuit failure monitor |
| 03/17/2004 | EP0687363B1 Process for testing electronic controllers |
| 03/17/2004 | EP0685074B1 Device for testing the connection between an output of a means which outputs a fixed logic value and the input of a circuit |
| 03/17/2004 | CN1483147A 监测电路 Monitoring circuit |
| 03/17/2004 | CN1483146A Test head actuation system with positioning and compliant modes |
| 03/17/2004 | CN1482679A Semiconductor integrated circuit with shortened pad pitch |
| 03/17/2004 | CN1142497C System and apparatus for monitoring connection status of data ports |
| 03/17/2004 | CN1142445C Battery tester |
| 03/17/2004 | CN1142444C Test system for integrated circuits using a single memory for both the parallel and scan modes of testing |
| 03/17/2004 | CN1142443C High-accuracy failure wave-recording device and its transmission line combined failure distance-measuring method |
| 03/17/2004 | CN1142442C Autoamtic on-off tester |
| 03/17/2004 | CN1142418C Method and device for measuring mechanical characteristics of motor |
| 03/16/2004 | US6708319 Manufacturing method of semiconductor integrated circuit device |
| 03/16/2004 | US6708317 Validating integrated circuits |
| 03/16/2004 | US6708315 Method of design for testability, method of design for integrated circuits and integrated circuits |
| 03/16/2004 | US6708306 Method for diagnosing failures using invariant analysis |
| 03/16/2004 | US6708305 Deterministic random LBIST |
| 03/16/2004 | US6708304 Semiconductor device |
| 03/16/2004 | US6708303 Method and apparatus for controlling a seperate scan output of a scan circuit |
| 03/16/2004 | US6708302 Semiconductor module |
| 03/16/2004 | US6708295 Circuit and method, for storing data prior to and after determining failure |
| 03/16/2004 | US6708139 Method and apparatus for measuring the quality of delay test patterns |
| 03/16/2004 | US6707848 Demodulator for a multi-pair gigabit transceiver |
| 03/16/2004 | US6707737 Memory system capable of switching between a reference voltage for normal operation and a reference voltage for burn-in test |
| 03/16/2004 | US6707736 Semiconductor memory device |
| 03/16/2004 | US6707733 Semiconductor memory device |
| 03/16/2004 | US6707552 High precision laser bar test fixture |
| 03/16/2004 | US6707474 System and method for manipulating relationships among signals and buses of a signal measurement system on a graphical user interface |
| 03/16/2004 | US6707313 Systems and methods for testing integrated circuits |
| 03/16/2004 | US6707310 Needle load measuring method, needle load setting method and needle load detecting mechanism |
| 03/16/2004 | US6707308 Measurements using tunnelling current between elongate conductors |
| 03/16/2004 | US6707303 Electronic battery tester |
| 03/16/2004 | US6707288 Apparatus for producing and testing electronic units |
| 03/16/2004 | US6707075 Method for fabricating avalanche trench photodetectors |
| 03/16/2004 | US6707065 Semiconductor wafer capable of simultaneous burn-in of all dies, having conductive pads in inactive region which can be electrically coupled to external power supply, plurality of dies in active region, each with burn-in indicating apparatus |
| 03/16/2004 | US6706862 Backbone-cyclized BPI peptidomimetics |
| 03/16/2004 | US6706837 Addition copolymerization of maleic anhydride and itaconic acid derivatives; complexing, metallization, salt formation, free radical catalysis |
| 03/16/2004 | US6705876 Electrical interconnect assemblies and methods |
| 03/11/2004 | WO2004021498A1 Method for testing precursor of secondary cell, its testing instrument, and method for manufacturing secondary cell using the method |
| 03/11/2004 | WO2004021466A2 Fuel cell with a regulated output |
| 03/11/2004 | WO2004021249A1 Extracting semiconductor device model parameters |
| 03/11/2004 | WO2004021023A1 Method and apparatus for endpoint detection in electron beam assisted etching |
| 03/11/2004 | WO2004021022A2 Integrated circuit with embedded identification code |
| 03/11/2004 | WO2003040734A3 Method and system for compensating thermally induced motion of probe cards |
| 03/11/2004 | US20040049723 Semiconductor integrated circuit with a test circuit |
| 03/11/2004 | US20040049721 Method and apparatus for improving testability of I/O driver/receivers |
| 03/11/2004 | US20040049719 Communication system, information processing apparatus, output apparatus, control method, and memory medium |
| 03/11/2004 | US20040049711 Oscillation based access time measurement |
| 03/11/2004 | US20040049361 System and method for detecting alternator condition |
| 03/11/2004 | US20040048502 Socket for electrical parts |
| 03/11/2004 | US20040048499 Interconnect device for electrically coupling a test system to a circuit board adapted for use with a ball-grid array connector |
| 03/11/2004 | US20040047398 Method and device for measuring thermoelectric characteristics of combinatorial specimen |
| 03/11/2004 | US20040047225 Semiconductor device having shared sense amplifier configuration |
| 03/11/2004 | US20040047220 Semiconductor memory device allowing reduction of I/O terminals |
| 03/11/2004 | US20040047168 Semiconductor integrated circuit |
| 03/11/2004 | US20040047097 Method for detecting failure of a relay |
| 03/11/2004 | US20040046673 Battery charge indicating circuit |
| 03/11/2004 | US20040046615 Oscillation based cycle time measurement |
| 03/11/2004 | US20040046586 Semiconductor integrated circuit |
| 03/11/2004 | US20040046585 Real-time in-line testing of semiconductor wafers |
| 03/11/2004 | US20040046584 Test unit and enclosure for testing integrated circuits |
| 03/11/2004 | US20040046581 Socket for testing a semiconductor device and a connecting sheet used for the same |
| 03/11/2004 | US20040046580 Probe card, and testing apparatus having the same |
| 03/11/2004 | US20040046579 High performance probe system |
| 03/11/2004 | US20040046578 Wafer burn-in and test employing detachable cartridge |
| 03/11/2004 | US20040046577 Voltage testing and measurement |
| 03/11/2004 | US20040046576 Device for monitoring quiescent current of an electronic device |
| 03/11/2004 | US20040046575 Semiconductor device protecting built-in transistor from the voltage applied at test mode |
| 03/11/2004 | US20040046570 Aircraft multi-function wire and insulation tester |
| 03/11/2004 | US20040046569 Automatic jack tester |
| 03/11/2004 | US20040046568 Re-locatable partial discharge transducer head |
| 03/11/2004 | US20040046565 Estimation of current consumption due to radio activities in gprs |
| 03/11/2004 | US20040046564 Battery test outputs adjusted based upon battery temperature and the state of discharge of the battery |
| 03/11/2004 | US20040046563 Method and apparatus for detecting wear in components of high voltage electrical equipment |
| 03/11/2004 | US20040046528 Method of measuring the battery level in a mobile telephone |
| 03/11/2004 | US20040046026 Code reading apparatus and method |
| 03/11/2004 | DE69721787T2 Verfahren und Vorrichtung zur vollsichtbaren Ablaufverfolgung einer Emulation Method and apparatus for fully visible tracing of an emulation |