| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/25/2004 | US20040056648 Method and apparatus for measuring photoelectric conversion device, and process and apparatus for producing photoelectric conversion device |
| 03/25/2004 | US20040056643 Method of determining the output capacitance of a voltage supply device |
| 03/25/2004 | US20040056634 Circuit arrangement for monitoring the state of charge of an accummulator |
| 03/25/2004 | US20040055395 Measurement of the rate of change of current in switched reluctance machines |
| 03/25/2004 | DE69627750T2 Verfahren zur Divergenzdetektion zwischen einem Paar von synchronisierten Duplexprozessorelementen A method of detecting divergence between a pair of synchronized duplex processor elements |
| 03/25/2004 | DE20309593U1 Arrangement for displaying thresholds of DC voltage has LED drive circuit with LEDs for displaying thresholds and optocoupler that is connected to output of LED drive circuit for respective LED |
| 03/25/2004 | DE10342275A1 Die testing system for integrated circuit, compares original data from write registers and read data received from the dies of semiconductor wafer and generates test result of die |
| 03/25/2004 | DE10341554A1 Semiconductor die isolation system for integrated circuit, has routing mechanism connected to isolation block and die electrically disconnected from routing mechanism when block is activated |
| 03/25/2004 | DE10323230A1 Verfahren und Vorrichtungen zum Charakterisieren von Platinentestabdeckung Methods and devices for characterizing cover board test |
| 03/25/2004 | DE10249712B3 Circuit for monitoring power semiconducting components has each isolated contact surface/group connected via active and/or passive component(s) to star circuit(s) star point, external contact surface |
| 03/25/2004 | DE10248982A1 Current consumption monitoring device for checking an electronic circuit's consumption comprises a capacitor arranged in parallel to the circuit to be monitored together with a switch for isolating the so created parallel circuit |
| 03/25/2004 | DE10241385A1 Integrated circuit for mobile radio equipment having function blocks with individual control systems |
| 03/25/2004 | DE10240143A1 Component testing apparatus e.g. for circuit board inspection, detects fault in component based on diffuse field measured by elements comprising pairs of electrodes |
| 03/25/2004 | DE10240060A1 Power loss measurement method for use in detecting local power loss distributions in optically sensitive semiconductors, e.g. solar cells, whereby components are illuminated with modulated radiation and thermographically imaged |
| 03/25/2004 | CA2498105A1 Method and apparatus for detection of brush sparking and spark erosion on electrical machines |
| 03/25/2004 | CA2496970A1 System and method for detecting alternator condition |
| 03/24/2004 | EP1400804A1 Method and device for measuring thermoelectric characteristics of combinatorial specimen |
| 03/24/2004 | EP1400745A1 Device for the uniform illumination of a planar surface |
| 03/24/2004 | EP1400042A2 Method and apparatus for creating and testing a channel decoder with built-in self-test (bist) |
| 03/24/2004 | EP1399831A2 Device and method for converting a diagnostic interface to spi standard |
| 03/24/2004 | EP1399747A1 Method for charging a structure comprising an insulating body |
| 03/24/2004 | EP0975953B1 Device for inspecting test objects and the use thereof |
| 03/24/2004 | EP0956690B1 Emergency telephone with automatic low-battery signaling |
| 03/24/2004 | CN2607582Y Cell measuring clamp |
| 03/24/2004 | CN1484799A System and method for generating hardware description code |
| 03/24/2004 | CN1484767A Manipulator for a test head with active compliance |
| 03/24/2004 | CN1484035A Group delay test method and device thereof |
| 03/24/2004 | CN1484034A On-line intelligent monitoring system for transformer and intelligent analysis diagnosis method thereof |
| 03/24/2004 | CN1143321C Decision method for semiconductor integrated circuit whether on not qualified and semiconductor integrated circuit |
| 03/24/2004 | CN1143320C Synchronous semiconductor storage device |
| 03/24/2004 | CN1143317C Semiconductor memory device having test mode |
| 03/24/2004 | CN1143138C Key path searching method and system |
| 03/24/2004 | CN1143126C Model-based fault detection system for electric motors |
| 03/23/2004 | US6711723 Hybrid semi-physical and data fitting HEMT modeling approach for large signal and non-linear microwave/millimeter wave circuit CAD |
| 03/23/2004 | US6711708 Boundary-scan test method and device |
| 03/23/2004 | US6711707 Process of controlling plural test access ports |
| 03/23/2004 | US6711706 Method and apparatus for elastic shorts testing, a hardware-assisted wire test mechanism |
| 03/23/2004 | US6711705 Method of analyzing a relief of failure cell in a memory and memory testing apparatus having a failure relief analyzer using the method |
| 03/23/2004 | US6711519 Method for the testing of electronic components taking the drift of the mean into account |
| 03/23/2004 | US6711512 Pole transformer load monitoring system using wireless internet network |
| 03/23/2004 | US6711511 Electromagnetic wave analyzing apparatus and computer readable storage medium |
| 03/23/2004 | US6711075 Semiconductor wafer, semiconductor chip, and manufacturing method of semiconductor device |
| 03/23/2004 | US6711057 Nonvolatile semiconductor memory device and method of retrieving faulty in the same |
| 03/23/2004 | US6711042 Semiconductor device whereon memory chip and logic chip are mounted, making testing of memory chip possible |
| 03/23/2004 | US6710798 Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card |
| 03/23/2004 | US6710675 Transmission line parasitic element discontinuity cancellation |
| 03/23/2004 | US6710616 Wafer level dynamic burn-in |
| 03/23/2004 | US6710615 Semiconductor element test apparatus, and method of testing semiconductor element using the apparatus |
| 03/23/2004 | US6710614 Methods for using an interposer/converter to allow single-sided contact to circuit modules |
| 03/23/2004 | US6710613 Temperature test system with test rings concentric with a centrifugal fan |
| 03/23/2004 | US6710611 Test plate for ceramic surface mount devices and other electronic components |
| 03/23/2004 | US6710609 Mosaic decal probe |
| 03/23/2004 | US6710607 Method and apparatus for inspection |
| 03/23/2004 | US6710605 Method and apparatus for detecting valid signal information |
| 03/23/2004 | US6710604 Device and method for directly injecting a test signal into a cable |
| 03/23/2004 | US6710590 Test head Hifix for semiconductor device testing apparatus |
| 03/23/2004 | US6710589 Diagnostic adaptor with threadless docking fixture |
| 03/23/2004 | US6710546 Remote control test apparatus |
| 03/23/2004 | US6709888 Method of decapsulating a packaged copper-technology integrated circuit |
| 03/23/2004 | US6709877 Apparatus and method for testing semiconductor devices |
| 03/23/2004 | US6709279 Contact pin module and testing device provided with the same |
| 03/23/2004 | CA2253968C Large-scale integrated circuit and method for testing a board of same |
| 03/23/2004 | CA2207707C Apparatus for detecting an insulation defect in a device connected into an electrical power transmission or distribution network and corresponding detection process |
| 03/18/2004 | WO2004023673A1 Aircraft multi-function wire and insulation tester |
| 03/18/2004 | WO2004023579A2 Battery test outputs adjusted based upon battery temperature and the state of discharge of the battery |
| 03/18/2004 | WO2004023554A1 Semiconductor integrated circuit test method and semiconductor integrated circuit test support method |
| 03/18/2004 | WO2004023552A1 Multichp semiconductor device, test method, and system board |
| 03/18/2004 | WO2004023548A1 Probing method and probe |
| 03/18/2004 | WO2004023547A1 Probing method, probe, and mechanism for reducing/plasma etching electrode |
| 03/18/2004 | WO2004023521A2 Apparatus and method for detecting photon emissions from transistors |
| 03/18/2004 | WO2004010847A3 Cardiac diagnostics using wall motion and perfusion cardiac mri imaging and systems for cardiac diagnostics |
| 03/18/2004 | WO2004001568A3 Single pin multilevel integrated circuit test interface |
| 03/18/2004 | WO2003095970A8 Hybrid mode stirred and mode tuned chamber |
| 03/18/2004 | WO2003089834A3 Test head positioner system |
| 03/18/2004 | US20040054951 System and method for testing one or more dies on a semiconductor wafer |
| 03/18/2004 | US20040054950 Apparatus and method for device selective scans in data streaming test environment for a processing unit having multiple cores |
| 03/18/2004 | US20040054948 Validating test signal connections within an integrated circuit |
| 03/18/2004 | US20040054815 Circuit and/or method for automated use of unallocated resources for a trace buffer application |
| 03/18/2004 | US20040054503 Combined off-board device and starter/charging/battery system tester |
| 03/18/2004 | US20040054500 Method and mechanism for improved performance analysis in transaction level models |
| 03/18/2004 | US20040054492 Methods and systems for enhanced automated system testing |
| 03/18/2004 | US20040054491 Apparatus and method for testing socket |
| 03/18/2004 | US20040054484 Method for monitoring the condition of a battery in a high temperature high current environment |
| 03/18/2004 | US20040054483 System and method for controlling a fuel cell testing device |
| 03/18/2004 | US20040052126 Method and circuit for determining sense amplifier sensitivity |
| 03/18/2004 | US20040052025 Electronic component production method and burn-in apparatus |
| 03/18/2004 | US20040051558 Low frequency testing, leakage control, and burn-in control for high-performance digital circuits |
| 03/18/2004 | US20040051553 Test structures for on-chip real-time reliability testing |
| 03/18/2004 | US20040051552 Test method of internal connections in a semiconductor package |
| 03/18/2004 | US20040051551 Circuit and method for accurately applying a voltage to a node of an integrated circuit |
| 03/18/2004 | US20040051550 Semiconductor die isolation system |
| 03/18/2004 | US20040051549 Semiconductor device, method of testing the semiconductor device, and semiconductor integrated circuit |
| 03/18/2004 | US20040051548 Semiconductor integrated circuit having a semiconductor storage circuit and a test circuit for testing the semiconductor storage circuit |
| 03/18/2004 | US20040051547 Semiconductor wafer testing system |
| 03/18/2004 | US20040051546 Temperature compensated vertical pin probing device |
| 03/18/2004 | US20040051545 Semiconductor burn-in thermal management system |
| 03/18/2004 | US20040051543 Nestless plunge mechanism for semiconductor testing |
| 03/18/2004 | US20040051537 Method of inspecting insulators to detect defects |
| 03/18/2004 | US20040051536 Coaxial radio frequency adapter and method |
| 03/18/2004 | US20040051534 Battery pack voltage detection apparatus |