| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/31/2004 | CN1485624A Method and system for supply-and-demand plan planning |
| 03/31/2004 | CN1485623A Highly effective testing method for dynamic storage module |
| 03/31/2004 | CN1485622A Fresnel lens and the transmission style screen |
| 03/31/2004 | CN1485621A Group wiring system capable of performing wire pairs identification and method thereof |
| 03/31/2004 | CN1144313C System for managing state of storage battery |
| 03/31/2004 | CN1144294C Semiconductor memory device |
| 03/31/2004 | CN1144233C Method for testing electronic element |
| 03/31/2004 | CN1144232C Method and apparatus for detecting multiple cluster memory device with multiple memory clusters |
| 03/31/2004 | CN1144230C Semiconductor memory device with redundant decoder having small scale in circuitry |
| 03/31/2004 | CN1144150C Device for detecting electronic storage card |
| 03/31/2004 | CN1144060C Battery package, method for counting of charging/discharging and providing residual electricity quantity of battery package |
| 03/31/2004 | CN1144059C Recovering unit for copying machine |
| 03/31/2004 | CN1144058C Accident point positioning system |
| 03/31/2004 | CN1144057C Device for measuring capacitance of electrical wires |
| 03/30/2004 | US6715135 Formal verification method |
| 03/30/2004 | US6715134 Method and apparatus to facilitate generating simulation modules for testing system designs |
| 03/30/2004 | US6715119 Test data generating system and method to test high-speed actual operation |
| 03/30/2004 | US6715118 Configuration for generating signal impulses of defined lengths in a module with a bist-function |
| 03/30/2004 | US6715117 Method of testing a semiconductor memory device |
| 03/30/2004 | US6715114 Test method and apparatus for semiconductor device |
| 03/30/2004 | US6715112 Method and apparatus for displaying triggered waveform on an error performance analyzer |
| 03/30/2004 | US6715105 Method for reducing stored patterns for IC test by embedding built-in-self-test circuitry for chip logic into a scan test access port |
| 03/30/2004 | US6714888 Apparatus for testing semiconductor integrated circuit |
| 03/30/2004 | US6714887 Portable disc drive testing apparatus |
| 03/30/2004 | US6714883 System and method for displaying operator-generated annotations of a trigger specification in a signal measurement system |
| 03/30/2004 | US6714549 High resiliency network infrastructure |
| 03/30/2004 | US6714516 Congestion control mechanism for SSCOP protocol |
| 03/30/2004 | US6714478 Semiconductor memory device having divided word line structure |
| 03/30/2004 | US6714466 System of performing a repair analysis for a semiconductor memory device having a redundant architecture |
| 03/30/2004 | US6714395 Method for detecting faults internal to a distribution equipment configuration |
| 03/30/2004 | US6714063 Current pulse receiving circuit |
| 03/30/2004 | US6714049 Logic state transition sensor circuit |
| 03/30/2004 | US6714037 Methodology for an assessment of the degree of barrier permeability at via bottom during electromigration using dissimilar barrier thickness |
| 03/30/2004 | US6714036 Monitor circuitry and method for testing analog and/or mixed signal integrated circuits |
| 03/30/2004 | US6714035 System and method for measuring fault coverage in an integrated circuit |
| 03/30/2004 | US6714034 Integrated circuit testing apparatus having stable ground reference |
| 03/30/2004 | US6714032 Integrated circuit early life failure detection by monitoring changes in current signatures |
| 03/30/2004 | US6714031 Semiconductor device for wafer examination |
| 03/30/2004 | US6714027 Method and apparatus for calculating the electrical characteristics of materials of thin film transistors |
| 03/30/2004 | US6714021 Integrated time domain reflectometry (TDR) tester |
| 03/30/2004 | US6714019 Failure detection method and apparatus for sensor network |
| 03/30/2004 | US6714017 Method and system for infrared detection of electrical short defects |
| 03/30/2004 | US6714002 Integrated semiconductor circuit and multi-chip module with a plurality of integrated semiconductor circuits |
| 03/30/2004 | US6713885 Power supply, a semiconductor making apparatus and a semiconductor wafer fabricating method using the same |
| 03/30/2004 | US6713842 Mask for and method of forming a character on a substrate |
| 03/30/2004 | US6713311 Method for screening semiconductor devices for contact coplanarity |
| 03/30/2004 | US6712903 Mask for evaluating selective epitaxial growth process |
| 03/30/2004 | US6711961 Methods and apparatus for recycling cryogenic liquid or gas from test chambers |
| 03/30/2004 | CA2386670C Method and apparatus for testing circuits with multiple clocks |
| 03/30/2004 | CA2309411C Abnormality detecting apparatus for a rotating electric machine |
| 03/25/2004 | WO2004025838A1 Coding of information in integrated circuits |
| 03/25/2004 | WO2004025811A2 Method and device for detecting sparking and spark erosion in electric machines |
| 03/25/2004 | WO2004025698A2 Circuit and method for accurately applying a voltage to a node of an integrated circuit |
| 03/25/2004 | WO2004025493A1 Integrated circuit comprising multiplexers for switching between normal mode and test mode |
| 03/25/2004 | WO2004025316A1 Device and method for monitoring and/or analyzing electric machines in operation |
| 03/25/2004 | WO2004025315A1 Method and system for integrated circuit information transfer |
| 03/25/2004 | WO2004025314A1 A method and apparatus for iddq measuring |
| 03/25/2004 | WO2004025313A1 Reduced chip testing scheme at wafer level |
| 03/25/2004 | WO2004025312A1 Method and apparatus for detecting wear in components of high voltage electrical equipment |
| 03/25/2004 | WO2004025311A1 System and method for detecting alternator condition |
| 03/25/2004 | WO2004025309A1 Interface comprising a thin pcb with protrusions for testing an integrated circuit |
| 03/25/2004 | WO2004025232A2 Method and device for detecting oscillations of the shafting of an electric machine |
| 03/25/2004 | WO2004003572A3 Methods and apparatus for test process enhancement |
| 03/25/2004 | WO2003102610A3 Method and device for detection in the frequency range, based on a time range measurement |
| 03/25/2004 | WO2003052429A9 Method and apparatus for in-circuit impedance measurement |
| 03/25/2004 | WO2003027685A3 Method for transmitting messages between stations |
| 03/25/2004 | US20040060020 Photolithography process using a mask, selectively modifying transistor gate lengths to improve the speed of critical transistor, reducing static power consumption; making semiconductor chips |
| 03/25/2004 | US20040060017 On-chip testing of integrated circuits |
| 03/25/2004 | US20040059977 Method of processing test patterns for an integrated circuit |
| 03/25/2004 | US20040059976 Semiconductor integrated circuit device having a test circuit of a random access memory |
| 03/25/2004 | US20040059975 Methodology to accurately test clock to signal valid and slew rates of PCI signals |
| 03/25/2004 | US20040059973 Apparatus for testing a device under test using a high speed bus and method therefor |
| 03/25/2004 | US20040059972 System and method for heterogeneous multi-site testing |
| 03/25/2004 | US20040059971 Device under test interface card with on-board testing |
| 03/25/2004 | US20040059959 Semiconductor integrated circuit |
| 03/25/2004 | US20040059537 Test mode control circuit for reconfiguring a device pin of an integrated circuit chip |
| 03/25/2004 | US20040059536 Multiple sweep point testing of circuit devices |
| 03/25/2004 | US20040059535 Circuit with interconnect test unit |
| 03/25/2004 | US20040059527 Electric appliance, computer apparatus, intelligent battery, battery diagnosis method, program, and storage medium |
| 03/25/2004 | US20040059524 Clock skew measurement circuit on a microprocessor die |
| 03/25/2004 | US20040059523 Method and system for on-line monitoring of bearing insulation in an electrical generatior |
| 03/25/2004 | US20040059437 Tester system having multiple instruction memories |
| 03/25/2004 | US20040058487 Segmented contactor |
| 03/25/2004 | US20040058461 Lot-optimized wafer level burn-in |
| 03/25/2004 | US20040057541 Transition adjustment |
| 03/25/2004 | US20040057491 Condition diagnosing |
| 03/25/2004 | US20040057308 Semiconductor storage device |
| 03/25/2004 | US20040057181 Polling loop short and overload isolator (VSOI) |
| 03/25/2004 | US20040057178 Directional ground relay system |
| 03/25/2004 | US20040056725 Oscillation circuit and a communication semiconductor integrated circuit |
| 03/25/2004 | US20040056706 Power supply, a semiconductor making apparatus and a semiconductor wafer fabricating method using the same |
| 03/25/2004 | US20040056677 High speed semiconductor test system |
| 03/25/2004 | US20040056676 Probe title for probing semiconductor wafer |
| 03/25/2004 | US20040056675 Locking apparatus and loadboard assembly |
| 03/25/2004 | US20040056674 Multi-point probe |
| 03/25/2004 | US20040056673 Test method for semiconductor components using conductive polymer contact system |
| 03/25/2004 | US20040056672 High resolution analytical probe station |
| 03/25/2004 | US20040056665 Power monitoring unit, control method therefor, and exposure apparatus |
| 03/25/2004 | US20040056662 Semiconductor device tester and its method |
| 03/25/2004 | US20040056650 Disc drive slider test socket |