| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/06/2004 | US6717429 IC having comparator inputs connected to core circuitry and output pad |
| 04/06/2004 | US6717428 Method and apparatus for detecting defects in a circuit using spectral analysis of transient power supply voltage |
| 04/06/2004 | US6717427 Circuit arrangement |
| 04/06/2004 | US6717425 High-density PCB test jack |
| 04/06/2004 | US6717424 Electrode and fixture for measuring electronic components |
| 04/06/2004 | US6717423 Substrate impedance measurement |
| 04/06/2004 | US6717415 Circuit and method for determining the location of defect in a circuit |
| 04/06/2004 | US6717414 Self-balancing ionizer monitor |
| 04/06/2004 | US6717392 Signal generator |
| 04/06/2004 | US6717391 Lithium-ion cell voltage telemetry circuit |
| 04/06/2004 | US6717292 Method and structure for measurement of a multiple-power-source device during a test mode |
| 04/06/2004 | US6717235 Semiconductor integrated circuit device having a test path |
| 04/06/2004 | US6716683 Optical analysis for SOI integrated circuits |
| 04/06/2004 | US6716049 IC socket with bearing springs |
| 04/06/2004 | US6716037 Flexible electric-contact structure for IC package |
| 04/03/2004 | CA2790807A1 Arc fault detector with circuit interrupter |
| 04/01/2004 | WO2004027905A2 System and method for controlling a fuel cell testing device |
| 04/01/2004 | WO2004027868A2 Electrical device, a method for manufacturing an electrical device, test structure, a method for manufacturing such a test structure and a method for testing a display panel |
| 04/01/2004 | WO2004027700A1 Apparatus and method for retrieving and displaying related information on a handheld communication device |
| 04/01/2004 | WO2004027493A1 Spectrometer using diffraction lattice |
| 04/01/2004 | WO2004027440A1 Integrated circuit tester and its testing method |
| 04/01/2004 | WO2004027439A1 Measurement of lateral diffusion of diffused layers. |
| 04/01/2004 | WO2004027438A1 Method and apparatus for determining iddq |
| 04/01/2004 | WO2004027437A1 Performance board and test system |
| 04/01/2004 | WO2003091949A3 Switched fabric based inspection system |
| 04/01/2004 | WO2003034391A3 Method and system for adjusting the voltage of a precharge circuit |
| 04/01/2004 | WO2003032159A3 Error detection on programmable logic resources |
| 04/01/2004 | US20040064773 Generalized fault model for defects and circuit marginalities |
| 04/01/2004 | US20040064772 Analysis module, integrated circuit, system and method for testing an integrated circuit |
| 04/01/2004 | US20040064771 Method and system for coding test pattern for scan design |
| 04/01/2004 | US20040064770 Programmable state machine of an integrated circuit |
| 04/01/2004 | US20040064765 Deskewed differential detector employing analog-to-digital converter |
| 04/01/2004 | US20040064764 Using a network connectivity to remotely control an IEEE 1149.1 test access port of target hardware |
| 04/01/2004 | US20040064750 System and method for synchronizing multiple instrumentation devices |
| 04/01/2004 | US20040064660 Multiplexed bus with multiple timing signals |
| 04/01/2004 | US20040064288 Universal automated circuit board tester |
| 04/01/2004 | US20040064285 Automated circuit board test actuator system |
| 04/01/2004 | US20040064284 Test method of memory IC function on device board with dynamic competing cycle |
| 04/01/2004 | US20040064202 Fast plant test for model-based control |
| 04/01/2004 | US20040063340 Multilayer wiring board, manufacturing method therefor and test apparatus thereof |
| 04/01/2004 | US20040063232 Surface inspection method, surface inspection apparatus, and recording medium and data signal for providing surface inspection program |
| 04/01/2004 | US20040063225 Measurement of lateral diffusion of diffused layers |
| 04/01/2004 | US20040062135 Semiconductor integrated circuit device and self-test method of memory macro |
| 04/01/2004 | US20040062104 Semiconductor handler interface auto alignment |
| 04/01/2004 | US20040062090 Synchronous semiconductor memory device of fast random cycle system and test method thereof |
| 04/01/2004 | US20040061610 Apparatus and circuit for use with capacitive presence detection systems |
| 04/01/2004 | US20040061570 Transmission line parasitic element discontinuity cancellation |
| 04/01/2004 | US20040061561 Sram process monitor cell |
| 04/01/2004 | US20040061519 Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester |
| 04/01/2004 | US20040061517 Empirical data based test optimization method |
| 04/01/2004 | US20040061516 Multi-chip package device including a semiconductor memory chip |
| 04/01/2004 | US20040061514 Wafer probe station for low-current measurements |
| 04/01/2004 | US20040061512 Testing method for electronic component and testing device |
| 04/01/2004 | US20040061507 Accurate time measurement system circuit and method |
| 04/01/2004 | US20040061505 Differentiating between board-insertion power-on and chassis power-on |
| 04/01/2004 | US20040061503 Method for inspecting relay contacts for contact weld in battery power source device |
| 04/01/2004 | US20040061491 Test apparatus having multiple test sites at one handler and its test method |
| 04/01/2004 | US20040061472 Apparatus for measuring magnetic flux of synchronous reluctance motor and sensorless control system for the same motor |
| 04/01/2004 | US20040061159 Semiconductor device, manufacture and evaluation methods for semiconductor device, and process condition evaluation method |
| 04/01/2004 | US20040060916 Method and system for joule heating characterization |
| 04/01/2004 | DE60002827T2 Automatische testeinrichtung mit sigma-delta modulation zur erzeugung von referenzpegeln Automatic test device with sigma-delta modulation for the generation of reference pressure levels |
| 04/01/2004 | DE20313420U1 Battery-driven switch for model making supplies an operating voltage for a receiver and a servo/booster made up of a supply voltage provided by several batteries connected to the switch |
| 04/01/2004 | DE19527420B4 Elektronisches Gerät Electronic Instrument |
| 04/01/2004 | DE10342312A1 Halbleiterwafertestsystem Semiconductor wafer testing system |
| 04/01/2004 | DE10337243A1 Storage battery for vehicles, has battery test module that is coupled to two post extensions to form Kelvin connections between module and extensions, respectively, and display for outputting battery condition information |
| 04/01/2004 | DE10243983A1 Early generator defect detection e.g. for motor vehicle, involves determining switch duty cycle and stimulation current flowing in stimulation circuit, and determining generator state based on duty cycle and stimulation current |
| 04/01/2004 | DE10243603A1 Measuring or trimming impedance in semiconducting component involves determining current flowing through pull-up or pull-down switching device with both switching devices activated in common |
| 04/01/2004 | CA2495716A1 System and method for controlling a fuel cell testing device |
| 03/31/2004 | EP1403997A2 Digital protection relay with time sync function |
| 03/31/2004 | EP1403916A2 Production process for producing semiconductor devices, semiconductor devices produced thereby, and test system for carrying out yield-rate test in production of such semiconductor devices |
| 03/31/2004 | EP1403652A1 Method and apparatus for verifying the mapping/implementation of a model of a logic circuit in a hardware emulator |
| 03/31/2004 | EP1403651A2 Testing integrated circuits |
| 03/31/2004 | EP1403650A2 Lead protrusion tester |
| 03/31/2004 | EP1403649A2 Procedure and device for diagnosing photovoltaic generators |
| 03/31/2004 | EP1402684A2 Network documentation system with electronic modules |
| 03/31/2004 | EP1402665A1 Measuring system with a reference signal between a signal generator and a signal analyser |
| 03/31/2004 | EP1402636A2 Integrated circuit and method for testing the integrated circuit |
| 03/31/2004 | EP1402616A1 Synchronous machine |
| 03/31/2004 | EP1402537A1 Method for characterizing an active track and latch sense-amp (comparator) in a one time programmable (otp) salicided poly fuse array |
| 03/31/2004 | EP1402506A2 Methods and systems for measuring display attributes of a fed |
| 03/31/2004 | EP1402279A1 Battery characterization system |
| 03/31/2004 | EP1402278A1 Method and apparatus for optimized parallel testing and access of electronic circuits |
| 03/31/2004 | EP1402277A2 Method and apparatus for leak-testing an electroluminescent device |
| 03/31/2004 | EP1402276A1 Method of determining when electrode pads are unsuitable for use by detecting relative humidity |
| 03/31/2004 | EP1145262B1 Vibro-acoustic signature treatment process in high-voltage electromechanical switching system |
| 03/31/2004 | EP0985154B1 Broadband impedance matching probe |
| 03/31/2004 | CN2609179Y Improved structure of chip testing machine |
| 03/31/2004 | CN2609135Y Load device for large mobile generator load testing station |
| 03/31/2004 | CN2608996Y Voltage-stabilizing value detector for VR tube |
| 03/31/2004 | CN2608995Y Detector for cable fault |
| 03/31/2004 | CN2608994Y Power-line monitor device |
| 03/31/2004 | CN1486432A Calibrating single ended channels for differential performance |
| 03/31/2004 | CN1486431A Input/output continuity test mode circuit |
| 03/31/2004 | CN1486430A Pusher and electronic part-testing apparatus with the same |
| 03/31/2004 | CN1486429A Sweep vector support for testing system based on event |
| 03/31/2004 | CN1485975A Apparatus for measuring magnetic flux of synchronous reluctance motor and sensorless control system for the same motor |
| 03/31/2004 | CN1485964A Intellectual monitoring breaker |
| 03/31/2004 | CN1485946A Battery pack |
| 03/31/2004 | CN1485913A Multichip module and testing method thereof |
| 03/31/2004 | CN1485856A Semiconductor storage device |