| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 04/13/2004 | US6720774 Interchangeable fan control board with fault detection |
| 04/13/2004 | US6720758 Method and apparatus for monitoring an electrical current consuming device |
| 04/13/2004 | US6720665 Enhanced pad design for substrate |
| 04/13/2004 | US6720557 Particle beam apparatus |
| 04/13/2004 | US6719199 Credit card/smart card test device |
| 04/09/2004 | CA2444343A1 Leakage current detection interrupter extension cord with cord diagnostics |
| 04/08/2004 | WO2004030034A2 Test mode control circuit for reconfiguring a device pin of an integrated circuit chip |
| 04/08/2004 | WO2004029642A1 System and method of battery capacity estimation |
| 04/08/2004 | WO2004029641A1 Cam-ring system for electrical inter-connection between dut board and a test head |
| 04/08/2004 | WO2004029640A1 High speed semiconductor test system |
| 04/08/2004 | WO2004029639A1 Diagnosis method for an antenna connection |
| 04/08/2004 | WO2004029637A1 Electrical panel safety monitor |
| 04/08/2004 | WO2004029636A1 Rf chip testing method and system |
| 04/08/2004 | WO2004029635A1 Mobile fixing plate |
| 04/08/2004 | WO2004008162A3 Compensation for test signal degradation due to dut fault |
| 04/08/2004 | WO2003100446A3 High performance probe system for testing semiconductor wafers |
| 04/08/2004 | WO2002029357A3 Method and apparatus for evaluating integrated circuit packages having three dimensional features |
| 04/08/2004 | US20040068702 Methods for predicting board test coverage |
| 04/08/2004 | US20040068700 Method to test power distribution system |
| 04/08/2004 | US20040068699 Single board DFT integrated circuit tester |
| 04/08/2004 | US20040068685 Simulation system and method for testing IDE channels |
| 04/08/2004 | US20040068675 Circuit board having boundary scan self-testing function |
| 04/08/2004 | US20040067646 Apparatus and method for fabricating arrays of atomic-scale contacts and gaps between electrodes and applications thereof |
| 04/08/2004 | US20040066634 Multilayer wiring board, manufacturing method therefor and test apparatus thereof |
| 04/08/2004 | US20040066382 Display unit, electronic device using the same, and method of inspecting the display unit |
| 04/08/2004 | US20040066212 Programmable logic array integrated circuits |
| 04/08/2004 | US20040066207 Flexible DUT interface assembly |
| 04/08/2004 | US20040066205 Rotor angle detecting apparatus for DC brushless motor |
| 04/08/2004 | US20040066204 Wafer resistance measurement apparatus and method using capacitively coupled AC excitation signal |
| 04/08/2004 | US20040066202 Wireless multiconductor cable test system and method |
| 04/08/2004 | US20040066200 Vehicular alternator failure determination apparatus |
| 04/08/2004 | US20040065880 Optical testing of integrated circuits with temperature control |
| 04/08/2004 | DE69814184T2 Verfahren zur Analyse von Prüfpunkten logischer Schaltungen und Einrichtungen zur Analyse von Prüfpunkten logischer Schaltungen A process for the analysis of test points logical circuits and devices for the analysis of test points of logic circuits |
| 04/08/2004 | DE20319385U1 Picking up/ processing interference fields/beams involves preparing antenna signals via signal line diodes with opposed blocking directions, 2 signal lines after diode output connected via capacitor |
| 04/08/2004 | DE20316682U1 Mode 4 aircraft IFF (Identification Friend or Foe) test unit has dimensions matching cryptographic unit and is connected directly to aircraft cable interfaces to simulate digital signals |
| 04/08/2004 | DE10338082A1 Anzeigeschaltung für die Batterieladung Ad for the battery charge |
| 04/08/2004 | DE10245152A1 Integrierte Testschaltungsanordnung und Testverfahren Integrated test circuitry and test methods |
| 04/08/2004 | DE10244534A1 Schaltungsanordnung sowie Verfahren zur Erkennung von Fehlersituationen in gekoppelten Systemen Circuit arrangement and method for the detection of faults in coupled systems |
| 04/08/2004 | DE10244131A1 Technical plant assessment method in which test measurements on functional units of the plant are automatically processed to detect faulty functional unit groups and assign corresponding defectiveness probabilities |
| 04/08/2004 | DE10243972A1 Fastening plate for use in testing electronic components with a tester and a handler, whereby the plate comprises both test side and handling side plates that can be displaced and locked in position relative to each other |
| 04/08/2004 | DE10243567A1 Ease of motor vehicle engine starting determination method in which the battery voltage, starter motor speed, oil temperature and battery loading prior to starting are used in a calculation step |
| 04/08/2004 | DE10231989B3 Device for determining surface resistance of a probe, especially a semiconductor wafer, measures conductance with eddy currents and exact position of the wafer |
| 04/08/2004 | DE10229895B3 Verfahren und Anordnung zur Ermittlung des Ladezustands einer Batterie Method and apparatus for determining the state of charge of a battery |
| 04/08/2004 | DE10196304B4 Variable Verzögerungsschaltung Variable delay circuit |
| 04/08/2004 | CA2499943A1 Electrical panel safety monitor |
| 04/07/2004 | EP1406365A1 Field current supply for an electric rotary machine |
| 04/07/2004 | EP1405382A1 Electric circuit providing selectable short circuit for instrumentation applications |
| 04/07/2004 | EP1405186A1 Device for and method of storing identification data in an integrated circuit |
| 04/07/2004 | EP1405154A2 Transmitter circuit comprising timing deskewing means |
| 04/07/2004 | EP1405113A2 Fibre optic wafer probe |
| 04/07/2004 | EP1405091A2 A method and system for infrared detection of electrical short defects |
| 04/07/2004 | EP1405090A1 Testing a batch of electrical components |
| 04/07/2004 | EP1405087A1 Low leakage technique for determining power spectra of non-coherently sampled data |
| 04/07/2004 | EP1404207A1 Method for checking electrical safety of a household appliance and corresponding household appliance |
| 04/07/2004 | EP1247319B1 An improved electronic earth leakage current device |
| 04/07/2004 | EP1198748B1 method and apparatus achieving flexible selection scan test |
| 04/07/2004 | EP1181569B1 A microvia inspection system |
| 04/07/2004 | EP1135859B1 Method and apparatus for logic synchronization |
| 04/07/2004 | EP1121602B1 Improving multi-chip module testability using poled-polymer interlayer dielectrics |
| 04/07/2004 | EP1118004B1 Method and device for locating an insulation fault in an electric cable |
| 04/07/2004 | EP0855654B1 Hierarchical connection method and apparatus |
| 04/07/2004 | CN2610560Y AC. motor counter electromotive force detecting circuit |
| 04/07/2004 | CN2610346Y Intelligent battery parameter tester |
| 04/07/2004 | CN2610345Y Circuit for testing artificial IC card |
| 04/07/2004 | CN2610344Y Improved earthing device of high-voltage breakdown equipment |
| 04/07/2004 | CN2610343Y Construction acceptance testing device for communication cable |
| 04/07/2004 | CN2610342Y DC leakage indicator |
| 04/07/2004 | CN2610341Y Distance leakage testing detector |
| 04/07/2004 | CN1487663A Measurement for current change rate in switch reluctance motor |
| 04/07/2004 | CN1487641A Grounding direction relay system |
| 04/07/2004 | CN1487472A Method for checking data production and substrate checking apparatus by the same method |
| 04/07/2004 | CN1487303A Method and apparatus for detecting control |
| 04/07/2004 | CN1487302A Electric switch test detecting instrument |
| 04/07/2004 | CN1487301A Portable household appliance maintaining instrument |
| 04/07/2004 | CN1487265A Position detecting method, position detecting apparatus and method for positioning printed circuit board |
| 04/07/2004 | CN1145213C Semiconductor integrated circuit and checking method thereof, liquid crystal device and electronic device |
| 04/07/2004 | CN1145172C Semiconductor IC device with internal test circuit |
| 04/07/2004 | CN1145169C Device for assessing unit resistances in magneto-resistance memory |
| 04/07/2004 | CN1145066C Supporting frame of panel display device or probe block |
| 04/07/2004 | CN1145040C Assembly containing integrated circuit according to application |
| 04/07/2004 | CN1145039C Circuit arrangement with dactivated scanning circuit |
| 04/07/2004 | CN1145038C Method and apparatus for detecting internal electric-arc in armoured wiring |
| 04/07/2004 | CN1145037C Electricity-leakage detection method for electric appliances |
| 04/07/2004 | CN1145034C System for digital measurement of breakdown voltage of high-voltage samples |
| 04/06/2004 | US6718529 Method for calculation of cell delay time |
| 04/06/2004 | US6718524 Method and apparatus for estimating state-dependent gate leakage in an integrated circuit |
| 04/06/2004 | US6718498 Method and apparatus for the real time manipulation of a test vector to access the microprocessor state machine information using the integrated debug trigger |
| 04/06/2004 | US6718497 Method and apparatus for generating jitter test patterns on a high performance serial bus |
| 04/06/2004 | US6718495 CGROM testing device |
| 04/06/2004 | US6718494 Method and apparatus for preventing and recovering from TLB corruption by soft error |
| 04/06/2004 | US6718284 Smart module and adapter apparatus |
| 04/06/2004 | US6718276 Method and apparatus for characterizing frequency response on an error performance analyzer |
| 04/06/2004 | US6718271 Fault detection apparatus and method of detecting faults in an electrical distribution network |
| 04/06/2004 | US6717911 Telecommunications switching circuit using tri-state buffers |
| 04/06/2004 | US6717519 Method and apparatus for detecting failure in solar cell module, and solar cell module |
| 04/06/2004 | US6717499 Transformer for gas insulated electric apparatus |
| 04/06/2004 | US6717450 Monolithic I-load architecture for automatic test equipment |
| 04/06/2004 | US6717433 Reconfigurable integrated circuit with integrated debugging facilities and scalable programmable interconnect |
| 04/06/2004 | US6717432 Single axis manipulator with controlled compliance |
| 04/06/2004 | US6717430 Integrated circuit testing with a visual indicator |