| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/15/2004 | US20040073656 Testing multi-protocol message and connection applications with reusable test components sharing dynamically generated data and limited hardware resources |
| 04/15/2004 | US20040073396 Testing system for printing press circuit board controllers |
| 04/15/2004 | US20040073395 Frequency domain reflectometry system for baselining and mapping of wires and cables |
| 04/15/2004 | US20040073264 Method for monitoring end of life for battery |
| 04/15/2004 | US20040073105 Cardiac diagnostics using wall motion and perfusion cardiac MRI imaging and systems for cardiac diagnostics |
| 04/15/2004 | US20040072456 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods |
| 04/15/2004 | US20040071335 Electronic assembly video inspection system |
| 04/15/2004 | US20040071243 Multi-pair gigabit ethernet transceiver |
| 04/15/2004 | US20040071242 Multi-pair gigabit ethernet transceiver |
| 04/15/2004 | US20040071009 Compilable address magnitude comparator for memory array self-testing |
| 04/15/2004 | US20040070961 Contactor apparatus for semiconductor devices and a test method of semiconductor devices |
| 04/15/2004 | US20040070909 Digital protection relay with time sync function |
| 04/15/2004 | US20040070899 Leakage current detection interrupter extension cord with cord diagnostics |
| 04/15/2004 | US20040070511 Method for informing user of available battery time based on operating mode of hybrid terminal |
| 04/15/2004 | US20040070444 Signal generator |
| 04/15/2004 | US20040070419 Semiconductor integrated circuit |
| 04/15/2004 | US20040070416 Device testing apparatus |
| 04/15/2004 | US20040070415 Test apparatus for testing substrates at low temperatures |
| 04/15/2004 | US20040070414 Socket for inspection |
| 04/15/2004 | US20040070412 Device testing contactor, method of producing the same, and device testing carrier |
| 04/15/2004 | US20040070410 Multiple-output arbitrary waveform generator and mixed lsi tester |
| 04/15/2004 | US20040070406 Method for detection of a shielding fault in a multiwire cable |
| 04/15/2004 | US20040070404 Test probe |
| 04/15/2004 | US20040070403 Addressable open connector test circuit |
| 04/15/2004 | US20040070402 Substrate impedance measurement |
| 04/15/2004 | US20040070400 Apparatus and method for determining the performance of micromachined or microelectromechanical devices (MEMS) |
| 04/15/2004 | US20040070010 Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor |
| 04/15/2004 | US20040069988 Bonding pad with separate bonding and probing areas |
| 04/15/2004 | US20040069747 Apparatus and method for detecting an endpoint in a vapor phase etch |
| 04/15/2004 | US20040069318 Prior to cleaning with XeF2, contacting XeF2 gas with an article to be cleaned, such as a semiconductor, in a reduced-pressure or vacuum atmosphere containing a required amount of water to form HFto be |
| 04/15/2004 | US20040068869 Mounting spring elements on semiconductor devices, and wafer-level testing methodology |
| 04/15/2004 | DE19750949B4 Testhandhabungsvorrichtung für horizontalen Transport Test handler for horizontal transport |
| 04/15/2004 | DE10339940A1 System und Verfahren zum heterogenen Mehrstellentesten System and method for heterogeneous multi-site testing |
| 04/15/2004 | DE10322726A1 Verfahren und Vorrichtung zum Verbessern einer Testfähigkeit von I/O-Treiber/Empfängern A method and apparatus for improving ability of a test I / O driver / receivers |
| 04/15/2004 | DE10296464T5 Verfahren und Gerät zur Validierung des Entwurfes einer komplexen integrierten Schaltungen Method and apparatus for validation of the design of complex integrated circuits |
| 04/15/2004 | DE10296381T5 Wellenform-Ditigalisierungsvorrichtung vom A/D-Verschachtelungsumwandlungstyp Ditigalisierungsvorrichtung waveform from the A / D-Verschachtelungsumwandlungstyp |
| 04/15/2004 | DE10247776A1 Verfahren und Vorrichtung zur Diagnose von Photovoltaikgeneratoren Method and apparatus for diagnosing photovoltaic generators |
| 04/15/2004 | DE10246789B3 Integrated circuit testing arrangement comprises a measuring circuit for measuring operating values of a circuit that are representative of its operation, with an analysis circuit for detecting and evaluating voltage level changes |
| 04/15/2004 | DE10246282A1 Substrate testing apparatus, has substrate carrier to receive and hold substrate in releasable thermal contact, and directly cooled thermal radiation shield protecting substrate from thermal radiation |
| 04/15/2004 | DE10245865A1 Positioning and locking arrangement for a docking mounting, e.g. for mounting and handling of electronic components, has interlocking centering pin and guide-type rotating locking element |
| 04/15/2004 | DE10237696B3 Transmission fault detection method, for two-wire differential signal transmission line, continually monitoring average voltage of the two line signals to detect any sudden jumps |
| 04/15/2004 | CA2408200A1 Static bonding clamp with continuity indicators |
| 04/14/2004 | EP1408594A2 DC ground fault detector and system-interconnected generation device using the DC ground fault detector |
| 04/14/2004 | EP1408514A2 Semiconductor memory device and testing system and testing method |
| 04/14/2004 | EP1408409A2 Method and apparatus for validation support |
| 04/14/2004 | EP1408338A2 Method for making a probe card with multiple contact tips for testing integrated circuit |
| 04/14/2004 | EP1408337A2 Probe card assembly |
| 04/14/2004 | EP1407489A2 Device and method for measuring operating temperatures of an electrical component |
| 04/14/2004 | EP1407292A1 Imaging sonar and a detection system using one such sonar |
| 04/14/2004 | EP1407281A2 Apparatus with a test interface |
| 04/14/2004 | EP1407280A1 Method of manufacturing a probe card |
| 04/14/2004 | EP1407213A2 Methods and apparatus for recycling cryogenic liquid or gas from test chamber |
| 04/14/2004 | EP1133702B1 A reconfigurable integrated circuit with integrated debugging facilities for use in an emulation system |
| 04/14/2004 | EP1000363A4 Spreading resistance profiling system |
| 04/14/2004 | EP0998778B1 Fault-tolerant battery system employing intra-battery network architecture |
| 04/14/2004 | CN2611916Y Automatic detecting machine for button cell |
| 04/14/2004 | CN2611915Y Cable obstacle tester |
| 04/14/2004 | CN2611914Y On-line short fault diagnostic device for winding of power transformer |
| 04/14/2004 | CN2611913Y Device for testing chip compatible with chip operation system in integrated circuit card |
| 04/14/2004 | CN1489785A Connector for semiconductor device and method for testing semiconductor device |
| 04/14/2004 | CN1489699A Battery capacity calibration |
| 04/14/2004 | CN1489698A Tap changer condition diagnosing |
| 04/14/2004 | CN1489697A Tap changer condition diagnosing |
| 04/14/2004 | CN1489696A 镍合金探针卡框架层压件 Nickel alloy frame laminate probe card |
| 04/14/2004 | CN1489695A Planarizing interposer |
| 04/14/2004 | CN1489694A Method and apparatus for testing wiring |
| 04/14/2004 | CN1489342A Protocal of connecting addressable shade interface and for serial bus network |
| 04/14/2004 | CN1489237A Secondary cell sorting method |
| 04/14/2004 | CN1489156A Storage test circuit |
| 04/14/2004 | CN1488954A Method for estimating residual capacity of storage battery for electric vehicle |
| 04/14/2004 | CN1488953A Method for predicting plate-detection coverage rate |
| 04/14/2004 | CN1488952A Integrated block on-line measuring apparatus |
| 04/14/2004 | CN1488951A Intelligent AC-DC withstand voltage test apparatus |
| 04/14/2004 | CN1488950A Sensitive-element current-voltage characteristic measuring apparatus |
| 04/14/2004 | CN1488926A Automatic measuring apparatus of mechanical characteristic for motor |
| 04/14/2004 | CN1145802C Microelectronic spring contact element and electronic element thereof |
| 04/13/2004 | US6721923 System and method for generating integrated circuit boundary register description data |
| 04/13/2004 | US6721920 Systems and methods for facilitating testing of pad drivers of integrated circuits |
| 04/13/2004 | US6721916 System and method for trellis decoding in a multi-pair transceiver system |
| 04/13/2004 | US6721915 Memory testing method |
| 04/13/2004 | US6721914 Diagnosis of combinational logic circuit failures |
| 04/13/2004 | US6721913 Method and apparatus for testing an interface between separate hardware components |
| 04/13/2004 | US6721912 Data carrier module having indication means for indicating the result of a test operation |
| 04/13/2004 | US6721911 Method and apparatus for testing a memory array using compressed responses |
| 04/13/2004 | US6721910 Semiconductor memory improved for testing |
| 04/13/2004 | US6721676 Testing of semiconductor device and a fabrication process of a semiconductor device including a testing process |
| 04/13/2004 | US6721671 Directional element to determine faults on ungrounded power systems |
| 04/13/2004 | US6721277 Generic register interface for accessing registers located in different clock domains |
| 04/13/2004 | US6721276 Automated microcode test packet generation engine |
| 04/13/2004 | US6721195 Reversed memory module socket and motherboard incorporating same |
| 04/13/2004 | US6721151 Ground fault interrupter |
| 04/13/2004 | US6720792 Detection of demagnetization in a motor in an electric or partially electric motor vehicle |
| 04/13/2004 | US6720789 Method for wafer test and wafer test system for implementing the method |
| 04/13/2004 | US6720788 High resolution current measurement method |
| 04/13/2004 | US6720785 Integrated circuit with test mode, and test configuration for testing an integrated circuit |
| 04/13/2004 | US6720784 Device for testing electronic devices |
| 04/13/2004 | US6720783 IC socket and spring means of IC socket |
| 04/13/2004 | US6720782 Wafer probe station for low-current measurements |
| 04/13/2004 | US6720780 High density probe card apparatus and method of manufacture |
| 04/13/2004 | US6720779 Defect type identification using hyper-extracting-field |