| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/22/2004 | DE4338462B4 Kontrollsystem für elektrische Verbraucher in Kraftfahrzeugen Control system for electrical loads in motor vehicles |
| 04/22/2004 | DE202004000987U1 Relay testing device, especially for testing an H8 type relay used with railway auxiliary protection circuits, in which startup and cut-off voltages are applied while coil current and burn-in currents and voltages are measured |
| 04/22/2004 | DE19918360B4 Verfahren zur Bestimmung der Rekombinationslebensdauer an Metall-Isolator-Halbleiter-Strukturen Method for determining the recombination lifetime of the metal-insulator-semiconductor structures |
| 04/22/2004 | DE19836134B4 Einrichtung zum Sammeln der Kenndaten und zur verbraucherspezifischen Optimierung von Solarzellen Means for collecting the characteristics and consumer-specific optimization of solar cells |
| 04/22/2004 | DE10333072A1 Verfahren zum Vorhersagen einer Platinentestabdeckung A method for predicting a board test coverage |
| 04/22/2004 | DE10331860A1 SERDES-Kooperation mit der Grenz-Abtast-Testtechnik SERDES cooperation with the boundary-scan test technology |
| 04/22/2004 | DE10296700T5 Flusssteuerungssystem zur Verringerung der Speicherpufferanforderungen und zur Herstellung einer Prioritätsbedienung zwischen Netzen Flow control system to reduce memory requirements and buffer for the preparation of a priority operation between networks |
| 04/22/2004 | DE10296681T5 Halbleitersystem zum Testen von Halbleiterbauelementen A semiconductor system for testing semiconductor components |
| 04/22/2004 | DE10296525T5 Chipinterne Schaltungen für ein Hochgeschwindigkeitsspeichertesten mit einem langsamen Speichertester On-chip circuits for high-speed memory testing with a slow memory tester |
| 04/22/2004 | DE10296364T5 Eine Testschaltung zum Verifizieren eines Herstellungsprozesses A test circuit for verifying a manufacturing process |
| 04/22/2004 | DE10246232A1 Substrate testing apparatus, has substrate carrier to receive and hold substrate in releasable thermal contact, and directly cooled thermal radiation shield protecting substrate from thermal radiation |
| 04/22/2004 | DE10246111A1 Diagnosing resonant circuit involves comparing measured current with defined current corresponding to current for intact circuit at defined time, diagnosing current deviation above threshold as fault |
| 04/22/2004 | DE10209980B4 Verfahren und Vorrichtung zur Temperierung von Gegenständen, insbesondere von elektronischen Bauelementen oder Baugruppen, mittels gasförmiger Fluide Method and device for tempering objects, in particular of electronic components or assemblies, by means of gaseous fluids |
| 04/22/2004 | DE10196368T5 Kontaktstruktur und Verfahren zu dessen Herstellung und eine Prüfkontaktanordnung, die diese verwendet Contact structure and method for its preparation and a test contact, which uses this |
| 04/21/2004 | EP1411612A2 Apparatus and method for detecting phase state |
| 04/21/2004 | EP1411581A1 Device for diagnosing the state of corrosion of a battery, in particular that of a vehicle |
| 04/21/2004 | EP1411579A1 Battery pack |
| 04/21/2004 | EP1411577A1 Device for diagnosing the state of corrosion of a battery, in particular one of a motor vehicle |
| 04/21/2004 | EP1411435A2 Command set for a software programmable verification tool having built-in selftest (bist) for testing and debugging an embedded device under test (dut) |
| 04/21/2004 | EP1411434A2 A software programmable verification tool having a single built-in self-test (bist) module for testing and debugging multiple memory modules in a device under test (dut) |
| 04/21/2004 | EP1411433A2 A software programmable verification tool having multiple built-in self-test (bist) modules for testing and debugging multiple devices under test (dut) |
| 04/21/2004 | EP1411431A2 Method and apparatus of reloading erroneous configuration data frames during configuration of PLDs |
| 04/21/2004 | EP1411364A1 Vehicle instrument panel for identifying the state of a battery connected to the positive pole of the battery |
| 04/21/2004 | EP1411363A2 Prober |
| 04/21/2004 | EP1411362A1 Procedure for detecting a shielding fault in a multiconductor cable |
| 04/21/2004 | EP1411361A1 Signal pre-processing for estimating attributes of a transmission line |
| 04/21/2004 | EP1411360A2 Method and probe card for testing semiconductor system |
| 04/21/2004 | EP1411359A1 Probe card for semiconductor wafers and system for testing wafers |
| 04/21/2004 | EP1410053A2 Integrated testing of serializer/deserializer in fpga |
| 04/21/2004 | EP1410052A1 Multi-mode storage cell |
| 04/21/2004 | EP1410051A2 Method and device for checking for errors in electrical lines and/or electrical consumers in a vehicle |
| 04/21/2004 | EP1410048A2 Test head docking system and method |
| 04/21/2004 | EP1266234B1 Testing device for printed boards |
| 04/21/2004 | EP1221097B1 Circuit cell for test pattern generation and test pattern compression |
| 04/21/2004 | CN2612955Y 220V storage battery discharge capacity tester |
| 04/21/2004 | CN2612954Y Fault alarm device |
| 04/21/2004 | CN2612953Y Digital display vacuum tube tester |
| 04/21/2004 | CN2612952Y Measuring and switch connecting device of internal resistance of storage battery |
| 04/21/2004 | CN1491351A Testing apparatus with environmentally-controlled vibrator compartment |
| 04/21/2004 | CN1490918A Method for regulating recharge control circuits and voltage of recharged secondary battery |
| 04/21/2004 | CN1490630A Method for supporting fault functional unit of identifying technological apparatus |
| 04/21/2004 | CN1490629A Correcting method, quality checking method for electronic component and characteristic measuring system |
| 04/21/2004 | CN1490572A Apparatus and method for detecting phase state |
| 04/21/2004 | CN1146731C Semiconductor device testing apparatus |
| 04/21/2004 | CN1146730C Contact-making apparatus affording ease of servicing |
| 04/20/2004 | US6725449 Semiconductor test program debugging apparatus |
| 04/20/2004 | US6725442 Scalable and parallel processing methods and structures for testing configurable interconnect network in FPGA device |
| 04/20/2004 | US6725433 Method for assessing the reliability of interconnects |
| 04/20/2004 | US6725408 Built-in self-test for multi-channel transceivers without data alignment |
| 04/20/2004 | US6725407 Method and configuration for protecting data during a self-test of a microcontroller |
| 04/20/2004 | US6725406 Method and apparatus for failure detection utilizing functional test vectors and scan mode |
| 04/20/2004 | US6725405 Apparatus and method for providing a diagnostic problem determination methodology for complex systems |
| 04/20/2004 | US6725404 Evaluation of interconnect reliability using propagation delay through interconnect |
| 04/20/2004 | US6725177 System for monitoring connection pattern of data ports |
| 04/20/2004 | US6725171 Self-test with split, asymmetric controlled driver output stage |
| 04/20/2004 | US6725120 Apparatus and methods with resolution enhancement feature for improving accuracy of conversion of required chemical mechanical polishing pressure to force to be applied by polishing head to wafer |
| 04/20/2004 | US6725115 Dynamic testing of electronic assemblies |
| 04/20/2004 | US6724928 Real-time photoemission detection system |
| 04/20/2004 | US6724732 Dynamic adjustment of timers in a communication network |
| 04/20/2004 | US6724727 Policy-based forward error correction in packet networks |
| 04/20/2004 | US6724671 Nonvolatile semiconductor memory device and method for testing the same |
| 04/20/2004 | US6724668 Semiconductor device provided with memory chips |
| 04/20/2004 | US6724594 Over voltage protection test multiplexer and methods of operating the same |
| 04/20/2004 | US6724589 Boat electrical test and isolator system |
| 04/20/2004 | US6724214 Test structures for on-chip real-time reliability testing |
| 04/20/2004 | US6724213 Test board for testing semiconductor device |
| 04/20/2004 | US6724212 Method for testing a semiconductor integrated circuit |
| 04/20/2004 | US6724210 Method and apparatus for reduced pin count package connection verification |
| 04/20/2004 | US6724209 Method for testing signal paths between an integrated circuit wafer and a wafer tester |
| 04/20/2004 | US6724207 Structure composite-type test fixture |
| 04/20/2004 | US6724206 Device carrier and autohandler |
| 04/20/2004 | US6724203 Full wafer test configuration using memory metals |
| 04/20/2004 | US6724198 Inductive sensory apparatus |
| 04/20/2004 | US6724193 Relay circuit test extender |
| 04/20/2004 | US6724182 Tester and testing method for differential data drivers |
| 04/20/2004 | US6724181 Method of calibrating a test system for semiconductor components, and test substrate |
| 04/20/2004 | US6724178 Measuring composite distortion using a coherent multicarrier signal generator |
| 04/20/2004 | US6724172 Method for determining a maximum charge current and a maximum discharge current of a battery |
| 04/20/2004 | US6723987 Method of inspecting holes using charged-particle beam |
| 04/20/2004 | US6723964 Apparatus for heating and cooling semiconductor device in handler for testing semiconductor device |
| 04/20/2004 | US6723573 Photonic devices and PICs including sacrificial testing structures and method of making the same |
| 04/20/2004 | US6722215 Manipulator apparatus with low-cost compliance |
| 04/20/2004 | CA2315615C Fault indicator for three-phase sheathed cable |
| 04/15/2004 | WO2004032592A1 Vision inspection apparatus using a full reflection mirror |
| 04/15/2004 | WO2004032049A2 Method and apparatus for analyzing serial data streams |
| 04/15/2004 | WO2004031792A1 Method and system for establishing a relation between joule heating and a current density in a conductor |
| 04/15/2004 | WO2004031790A1 Pattern generator, memory controller, and test device |
| 04/15/2004 | WO2004031789A1 Test device and test method |
| 04/15/2004 | WO2004031788A1 Multi-strobe device, test device, and adjustment method |
| 04/15/2004 | WO2004031787A1 Integrated test circuit arrangement and test method |
| 04/15/2004 | WO2004031786A1 Circuit arrangement, in addition to method for identifying interruptions and short-circuits in coupled systems |
| 04/15/2004 | WO2004031785A1 Jitter measuring instrument and tester |
| 04/15/2004 | WO2004031782A1 Test head positioning apparatus |
| 04/15/2004 | WO2003102612A3 Fixing means for components and cards |
| 04/15/2004 | WO2002084311A8 Method of measuring electromagnetic field intensity and device therefor, method of measuring electromagnetic field intensity distribution and device thereof, method of measuring current/voltage distribution and device thereof |
| 04/15/2004 | US20040073875 Method of extracting circuit timing parameters using picosecond-scale photon timing measurements |
| 04/15/2004 | US20040073859 Method of and apparatus for validation support, computer product for validation support |
| 04/15/2004 | US20040073858 Method and apparatus for isolating faulty semiconductor devices in a graphics system |
| 04/15/2004 | US20040073857 Method and apparatus for isolating faulty semiconductor devices in a multiple stream graphics system |
| 04/15/2004 | US20040073856 Parametric testing for high pin count ASIC |