| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/28/2004 | EP1414118A1 Contact for spiral contactor and spiral contactor |
| 04/28/2004 | EP1414101A2 Detecting method and detecting apparatus for detecting internal resistance of a rechargeable battery and rechargeable battery pack having said detecting apparatus therein |
| 04/28/2004 | EP1414066A1 Circuit and method for monitoring semiconductor power elements |
| 04/28/2004 | EP1414005A1 Inspecting method, semiconductor device, and display |
| 04/28/2004 | EP1413894A1 Process for determining the deterioration of a storage battery and monitoring device |
| 04/28/2004 | EP1413893A1 Measuring of low impedances |
| 04/28/2004 | EP1413892A2 Method and apparatus for measuringcharge carrier lifetime of a semiconductor wafer |
| 04/28/2004 | EP1413891A1 System and method of measuring low impedances |
| 04/28/2004 | EP1413065A1 Loop diagnostic mode for adsl modems |
| 04/28/2004 | EP1412975A1 Testing vias and contacts in integrated circuit fabrication |
| 04/28/2004 | EP1412768A1 System and method for delay line testing |
| 04/28/2004 | EP1412767A2 Method and error location in branched low voltage and medium voltage networks and evaluation circuit used thereof |
| 04/28/2004 | EP1412764A1 System and method for waveform processing |
| 04/28/2004 | EP1412139A2 Device for the targeted displacement of electronic components, using a pivoting mirror |
| 04/28/2004 | EP1292840B1 Method for demonstrating the dependence of a signal based on another signal |
| 04/28/2004 | CN2613766Y High-low impedance converter |
| 04/28/2004 | CN2613765Y Live line detector for insulator of high-voltage transmission line |
| 04/28/2004 | CN1493004A Test circuit for HVDC thyristor valve |
| 04/28/2004 | CN1493003A Remaining life prediction for field device electronics board base on microprocessor |
| 04/28/2004 | CN1492492A Quick evaluation method for microelectronic device reliability |
| 04/28/2004 | CN1147790C Semiconductor integrated circuit |
| 04/28/2004 | CN1147733C Measuring system and method for industrial frequency current in opened magnetic path |
| 04/27/2004 | US6728940 Apparatus and method for determining process width variations in integrated circuits |
| 04/27/2004 | US6728938 Knowledge-based intelligent full scan dump processing methodology |
| 04/27/2004 | US6728917 Sequential test pattern generation using combinational techniques |
| 04/27/2004 | US6728916 Hierarchical built-in self-test for system-on-chip design |
| 04/27/2004 | US6728915 IC with shared scan cells selectively connected in scan path |
| 04/27/2004 | US6728914 Random path delay testing methodology |
| 04/27/2004 | US6728903 Electric part test system |
| 04/27/2004 | US6728902 Integrated circuit having a self-test device for carrying out a self-test of the integrated circuit |
| 04/27/2004 | US6728901 Arithmetic built-in self-test of multiple scan-based integrated circuits |
| 04/27/2004 | US6728900 Microcomputer with test instruction memory |
| 04/27/2004 | US6728814 Reconfigurable IEEE 1149.1 bus interface |
| 04/27/2004 | US6728653 Method for testing multi-chip packages |
| 04/27/2004 | US6728652 Method of testing electronic components and testing apparatus for electronic components |
| 04/27/2004 | US6728648 Test and measurement instrument having telecommunications mask testing capability with an autofit to mask feature |
| 04/27/2004 | US6728587 Method for global automated process control |
| 04/27/2004 | US6728158 Semiconductor memory device |
| 04/27/2004 | US6728149 Semiconductor memory device |
| 04/27/2004 | US6728113 Method and apparatus for non-conductively interconnecting integrated circuits |
| 04/27/2004 | US6727834 Method and device for use in DC parametric tests |
| 04/27/2004 | US6727745 Integrated circuit with current sense circuit and associated methods |
| 04/27/2004 | US6727724 Characteristic evaluation apparatus for insulated gate type transistors |
| 04/27/2004 | US6727723 Test system and manufacturing of semiconductor device |
| 04/27/2004 | US6727722 Process of testing a semiconductor wafer of IC dies |
| 04/27/2004 | US6727721 Method for switching from a first operating condition of an integrated circuit to a second operating condition of the integrated circuit |
| 04/27/2004 | US6727719 Piercer combined prober for CU interconnect water-level preliminary electrical test |
| 04/27/2004 | US6727715 Test system and test contactor for electronic modules having beam spring contacts |
| 04/27/2004 | US6727714 Probe card |
| 04/27/2004 | US6727712 Apparatus and methods for testing circuit boards |
| 04/27/2004 | US6727711 Fixture-less bare board tester |
| 04/27/2004 | US6727710 Structures and methods for determining the effects of high stress currents on conducting layers and contacts in integrated circuits |
| 04/27/2004 | US6727708 Battery monitoring system |
| 04/27/2004 | US6727685 Work transfer apparatus |
| 04/27/2004 | US6727579 Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures |
| 04/27/2004 | US6725536 Methods for the fabrication of electrical connectors |
| 04/22/2004 | WO2004034074A1 Battery managing metod and device |
| 04/22/2004 | WO2004034072A1 Semiconductor testing instrument to determine safe operating area |
| 04/22/2004 | WO2004034071A1 Semiconductor monitoring instrument |
| 04/22/2004 | WO2004034070A1 Hybrid type sensor for detecting high frequency partial discharge |
| 04/22/2004 | WO2004012241A3 Radiation hardened visible p-i-n detector |
| 04/22/2004 | WO2003038450A3 Method and program product for designing hierarchical circuit for quiescent current testing |
| 04/22/2004 | WO2002095430A3 Test circuit |
| 04/22/2004 | US20040078742 Scheduling of transactions in system-level test program generation |
| 04/22/2004 | US20040078741 Scan chain element and associated method |
| 04/22/2004 | US20040078739 Semiconductor device |
| 04/22/2004 | US20040078713 Interface circuit |
| 04/22/2004 | US20040078698 Robotic Memory-Module Tester Using Adapter Cards for Vertically Mounting PC Motherboards |
| 04/22/2004 | US20040078676 Automatic computer-system-level integrated circuit testing system and method |
| 04/22/2004 | US20040078675 Device testing interface and method |
| 04/22/2004 | US20040078632 System with multiple path fail over, fail back and load balancing |
| 04/22/2004 | US20040078402 Generation of cryptographically strong random numbers using MISRS |
| 04/22/2004 | US20040078177 Test circuit for verifying a manufacturing process |
| 04/22/2004 | US20040078175 Method and apparatus for modeling and simulating the effects of bridge defects in integrated circuits |
| 04/22/2004 | US20040078165 Creation, viewing, and analysis of the results of integrated circuit test programs consisting of scan tests |
| 04/22/2004 | US20040078158 Efficient sampling of digital waveforms for eye diagram analysis |
| 04/22/2004 | US20040078156 System and method of measuring low impedances |
| 04/22/2004 | US20040078155 Integrated battery service system |
| 04/22/2004 | US20040077200 Electronic component testing socket and electronic component testing apparatus using the same |
| 04/22/2004 | US20040077188 Card connector assembly including contact lands having no damage |
| 04/22/2004 | US20040077110 Method for monitoring oxide quality |
| 04/22/2004 | US20040076872 Battery apparatus and method for monitoring battery state |
| 04/22/2004 | US20040076323 Inspection data producing method and board inspection apparatus using the method |
| 04/22/2004 | US20040076160 High resiliency network infrastructure |
| 04/22/2004 | US20040075630 Display panel having embedded test circuit |
| 04/22/2004 | US20040075591 Circuit and method for generating mode register set code |
| 04/22/2004 | US20040075484 Current pulse receiving circuit |
| 04/22/2004 | US20040075477 On-chip PLL locked frequency determination method and system |
| 04/22/2004 | US20040075471 Apparatus and method for detecting phase state |
| 04/22/2004 | US20040075460 Method and apparatus for determining defect and impurity concentration in semiconducting material of a semiconductor wafer |
| 04/22/2004 | US20040075459 Predictive, adaptive power supply for an integrated circuit under test |
| 04/22/2004 | US20040075458 Analyzing semiconductor wafers by bombarding with radiation beams, then scanning for charge differences resulting from defects and accumulating particles emitted |
| 04/22/2004 | US20040075457 Test pin unit for PCB test device and feeding device of the same |
| 04/22/2004 | US20040075456 Test fixture for printed circuit board assembly |
| 04/22/2004 | US20040075455 Mosaic decal probe |
| 04/22/2004 | US20040075453 Non-contact tester for electronic circuits |
| 04/22/2004 | US20040075451 System and method of measuring low impedances |
| 04/22/2004 | US20040075441 Device for electromagnetic characterisation of a tested structure |
| 04/22/2004 | US20040075091 Semiconductor package device testing apparatus |
| 04/22/2004 | DE69815686T2 Zeitgeber mit kurzer erholungszeit zwischen den pulsen Timer with a short recovery time between pulses |