| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/06/2004 | DE10317582A1 Fahrzeuglichtmaschinen-Fehlerbestimmungsvorrichtung Vehicle alternator failure determination apparatus |
| 05/06/2004 | DE10208651B4 Verfahren zur Ladezustandsermittlung einer Batterie, insbesondere für ein Hybridfahrzeug A method for determining state of charge of a battery, in particular for a hybrid vehicle |
| 05/06/2004 | CA2503368A1 A relay test device |
| 05/06/2004 | CA2503342A1 Logic analyzer data processing method |
| 05/05/2004 | CN2614397Y Anti-theft monitoring apparatus for power distribution circuit |
| 05/05/2004 | CN2614351Y Pocket overpressure resistant insulation tester |
| 05/05/2004 | CN2614350Y Electric and radio far-transfering alarm |
| 05/05/2004 | CN1494659A Universal test interface between device undr test and test head |
| 05/05/2004 | CN1494658A Apparatus and method for detecting and calculating ground fault resistance |
| 05/05/2004 | CN1494193A Electron system for managing battery capacity and related method |
| 05/05/2004 | CN1494123A Integrated circuit packing testing equipment |
| 05/05/2004 | CN1494095A Method and apparatus for testing electronic elements |
| 05/05/2004 | CN1493886A Radio battery voltage detection system |
| 05/05/2004 | CN1493885A Power line failure recording device |
| 05/05/2004 | CN1493884A Printing board failure diagnostic system |
| 05/05/2004 | CN1148850C Power controlling circuit |
| 05/05/2004 | CN1148797C Process for finding out unity coupling coefficient of flash memory by GIDL method |
| 05/05/2004 | CN1148581C Connector apparatus for microelectronic apparatus and its probe device |
| 05/04/2004 | US6732352 System and method for creating probe masks |
| 05/04/2004 | US6732349 Method and apparatus for improving PIP coverage in programmable logic devices |
| 05/04/2004 | US6732348 Method for locating faults in a programmable logic device |
| 05/04/2004 | US6732337 Method and arrangement for testing the stability of a working point of a circuit |
| 05/04/2004 | US6732312 Test vector compression method |
| 05/04/2004 | US6732310 Peripheral partitioning and tree decomposition for partial scan |
| 05/04/2004 | US6732309 Method for testing faults in a programmable logic device |
| 05/04/2004 | US6732305 Test interface for verification of high speed embedded synchronous dynamic random access memory (SDRAM) circuitry |
| 05/04/2004 | US6732068 Memory circuit for use in hardware emulation system |
| 05/04/2004 | US6732060 System and method for an interface invariant test case |
| 05/04/2004 | US6732053 Method and apparatus for controlling a test cell |
| 05/04/2004 | US6732043 Method and arrangement for determining the starting ability of a starter battery of an internal combustion engine |
| 05/04/2004 | US6732002 Apparatus and methods for predicting multiple product chip yields through critical area matching |
| 05/04/2004 | US6731914 Determination of transmitter distortion |
| 05/04/2004 | US6731691 Multi-pair gigabit ethernet transceiver having adaptive disabling of circuit elements |
| 05/04/2004 | US6731561 Semiconductor memory and method of testing semiconductor memory |
| 05/04/2004 | US6731559 Synchronous semiconductor memory device |
| 05/04/2004 | US6731553 Memory circuit having compressed testing function |
| 05/04/2004 | US6731547 Semiconductor integrated circuit including a plurality of macros that can be operated although their operational voltages are different from each other |
| 05/04/2004 | US6731217 Electrical circuit tester |
| 05/04/2004 | US6731179 System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI) |
| 05/04/2004 | US6731139 Short circuit protection apparatus with self-clocking self-clearing latch |
| 05/04/2004 | US6731130 Method of determining gate oxide thickness of an operational MOSFET |
| 05/04/2004 | US6731128 TFI probe I/O wrap test method |
| 05/04/2004 | US6731127 Parallel integrated circuit test apparatus and test method |
| 05/04/2004 | US6731126 Apparatus for monitoring a device powered by the apparatus, and a method for monitoring a device from its power draw |
| 05/04/2004 | US6731125 Multi-channel semiconductor test system |
| 05/04/2004 | US6731124 Integrated device for testing contacts |
| 05/04/2004 | US6731123 Probe device |
| 05/04/2004 | US6731118 Connector inspection apparatus |
| 05/04/2004 | US6731116 Short-circuit detector |
| 05/04/2004 | US6731106 Measuring on-resistance of an output buffer with test terminals |
| 05/04/2004 | US6730908 Method for charging a structure comprising an insulating body |
| 05/04/2004 | US6730529 Method for chip testing |
| 05/04/2004 | US6729922 Device for inspecting element substrates and method of inspection using this device |
| 05/04/2004 | US6729027 Method of forming recessed socket contacts |
| 05/04/2004 | US6729019 Method of manufacturing a probe card |
| 04/29/2004 | WO2004036641A1 Probe device that controls temperature of object to be inspected and probe inspection method |
| 04/29/2004 | WO2004034945A1 An electrical drive system |
| 04/29/2004 | WO2003098231A3 Monolithic i-load architectures for automatic test equipment |
| 04/29/2004 | WO2002097457A3 A digital system and a method for error detection thereof |
| 04/29/2004 | WO2002019108A8 Method for providing bitwise constraints for test generation |
| 04/29/2004 | US20040083415 System and method for evaluating a multiprocessor system using a random bus traffic generation technique |
| 04/29/2004 | US20040083414 Method and apparatus for independent control of devices under test connected in parallel |
| 04/29/2004 | US20040083413 Boundary scan apparatus and interconnect test method |
| 04/29/2004 | US20040083412 Testing logic and embedded memory in parallel |
| 04/29/2004 | US20040083077 Integrated packet bit error rate tester for 10G SERDES |
| 04/29/2004 | US20040083073 Probe testing method and apparatus for determining acceptable/defective end shape of contact probe through image analysis |
| 04/29/2004 | US20040083070 Circuit and method for calibrating dram pullup Ron to pulldown Ron |
| 04/29/2004 | US20040082086 Arrangements having IC voltage and thermal resistance designated on a per IC basis |
| 04/29/2004 | US20040082083 Process parameter event monitoring system and method for process |
| 04/29/2004 | US20040081349 Probe mark reading device and probe mark reading method |
| 04/29/2004 | US20040081208 Circuit for control and observation of a scan chain |
| 04/29/2004 | US20040081008 Semiconductor memory device with test mode and testing method thereof |
| 04/29/2004 | US20040080998 Unusable block management within a non-volatile memory system |
| 04/29/2004 | US20040080442 Interleaving A/D conversion type waveform digitizer module and a test apparatus |
| 04/29/2004 | US20040080406 Apparatus of monitoring motor vehicle's electric power and method thereof |
| 04/29/2004 | US20040080344 Clock skew indicating apparatus |
| 04/29/2004 | US20040080343 Evaluation of the characteristics of electric pulses |
| 04/29/2004 | US20040080335 Method and apparatus for selecting an encryption integrated circuit operating mode |
| 04/29/2004 | US20040080333 Method and apparatus for measurement of the winding temperature of a drive motor |
| 04/29/2004 | US20040080331 IDDQ test methodology based on the sensitivity of fault current to power supply variations |
| 04/29/2004 | US20040080329 Flexible head probe for sort interface units |
| 04/29/2004 | US20040080328 Methods and structures for electronic probing arrays |
| 04/29/2004 | US20040080326 Device and method for determining the sheet resistance of samples |
| 04/29/2004 | US20040080323 Signal pre-processing for estimating attributes of a transmission line |
| 04/29/2004 | US20040080312 Method and apparatus for fully characterizing propagation delay through an n-input circuit |
| 04/29/2004 | US20040080311 Integrated circuit test system and method |
| 04/29/2004 | US20040080310 Circuit board coupon tester |
| 04/29/2004 | US20040080309 Method for performing test measurements on electrical components |
| 04/29/2004 | US20040079897 Apparatus and method for testing substrate |
| 04/29/2004 | DE4005609B4 Verfahren und Vorrichtung zur Funktionsüberwachung eines elektrischen Verbrauchers Method and device for monitoring the function of an electrical load |
| 04/29/2004 | DE19625408B4 Schaltungsanordnung zur Erdungsüberwachung und zum Schutz vor gefährlichen Körperströmen, insbesondere für Geräte mit vorgeschriebenem Potentialausgleich in TT-Netzen, sowie eine Verwendung hierfür Circuit arrangement for ground monitoring and protection against dangerous body currents, especially for devices with prescribed equipotential bonding in TT systems, and use this |
| 04/29/2004 | DE19517492B4 Analoge Stromschnittstelle Analog current interface |
| 04/29/2004 | DE10348031A1 Battery monitor for monitoring battery, has processor electrically coupled with two Kelvin connectors calculating reserve state and cracking state of health, and determining state of life as function of states |
| 04/29/2004 | DE10316117B3 Device for measuring local current/heat distribution on electrochemical electrode has current flow direction to resistance element transverse to current flow direction to current conducting element |
| 04/29/2004 | DE10311290B3 Circuit arrangement for locating cable fault has Ohmic branch parallel to choke with trigger coil or holding element forming synchronizing signal for defect location device to determine breakdown time |
| 04/29/2004 | DE10295594T5 ARB-Generator mit mehreren Ausgängen ARB generator with multiple outputs |
| 04/29/2004 | DE10248679A1 Fahrzeugbordnetz mit Batteriezustandserkennung am Pluspol der Batterie Vehicle electric system with battery state identification to the positive terminal of the battery |
| 04/29/2004 | DE10206249B4 Verfahren zum Erzeugen von Testsignalen für eine integrierte Schaltung sowie Testlogik A method for generating test signals for an integrated circuit and test logic |
| 04/29/2004 | DE10196575T5 San-Vektor-Unterstützung für ein ereignisgestütztes Prüfsystem San vector support for event-based testing system |
| 04/29/2004 | DE10020981B4 Motor-Steuergerät mit Fehlerschutzschaltung Motor controller with fault protection circuit |