| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/11/2004 | US6735558 Characteristic extraction device, characteristic evaluation device, characteristic extraction method, characteristic evaluation method, recording medium and semiconductor device |
| 05/11/2004 | US6735543 Method and apparatus for testing, characterizing and tuning a chip interface |
| 05/11/2004 | US6735536 Method and apparatus for testing batteries on a golf car |
| 05/11/2004 | US6735133 Semiconductor memory circuit having normal operation mode and burn-in test mode |
| 05/11/2004 | US6735088 Circuit board protection cover and circuit board having circuit board protection cover |
| 05/11/2004 | US6734925 Multiple testing bars for testing liquid crystal display and method thereof |
| 05/11/2004 | US6734744 SRAM process monitor cell |
| 05/11/2004 | US6734743 Oscillation based cycle time measurement |
| 05/11/2004 | US6734703 Circuits and methods for analyzing timing characteristics of sequential logic elements |
| 05/11/2004 | US6734698 Radio frequency oscillation detector |
| 05/11/2004 | US6734697 Die location on ungrounded wafer for back-side emission microscopy |
| 05/11/2004 | US6734694 Method and apparatus for automatically testing semiconductor device |
| 05/11/2004 | US6734693 Semiconductor integrated circuit having a semiconductor storage circuit and a test circuit for testing the semiconductor storage circuit |
| 05/11/2004 | US6734692 Inspection apparatus and sensor |
| 05/11/2004 | US6734691 Substrate for a probe card having conductive layers for supplying power to IC devices |
| 05/11/2004 | US6734687 Apparatus for detecting defect in device and method of detecting defect |
| 05/11/2004 | US6734682 Testing device for detecting and locating arc faults in an electrical system |
| 05/11/2004 | US6734681 Apparatus and methods for testing circuit boards |
| 05/11/2004 | US6734680 Ground fault interrupt analyzer method and apparatus |
| 05/11/2004 | US6734662 Microprocessor controlled fault indicator having led fault indication circuit with battery conservation mode |
| 05/11/2004 | US6734549 Semiconductor device having a device for testing the semiconductor |
| 05/11/2004 | US6734028 Method of detecting shallow trench isolation corner thinning by electrical stress |
| 05/11/2004 | US6733617 Direct detection of dielectric etch system magnet driver and coil malfunctions |
| 05/11/2004 | CA2093102C Method for locating disruptions in underground electrical cable |
| 05/06/2004 | WO2004038881A2 Apparatus and method for simultaneously detecting the power state of a plurality of circuit breaker switches |
| 05/06/2004 | WO2004038822A2 Device and method of monitoring the starting capability of a vehicle’s starter battery |
| 05/06/2004 | WO2004038786A1 Probe mark reader and probe mark reading method |
| 05/06/2004 | WO2004038589A1 Logic analyzer data processing method |
| 05/06/2004 | WO2004038554A2 System with multiple path fail over, fail back and load balancing |
| 05/06/2004 | WO2004038439A1 Storage battery diagnosing system |
| 05/06/2004 | WO2004038438A1 A relay test device |
| 05/06/2004 | WO2004038437A1 Voltage and thermal resistance classification of ics |
| 05/06/2004 | WO2004038436A1 Target value search circuit, target value search method, and semiconductor test device using the same |
| 05/06/2004 | WO2004038435A1 Wiring board inspection device, and wiring board inspection method |
| 05/06/2004 | WO2004038433A1 Sheet-form connector and production method and application therefor |
| 05/06/2004 | WO2004038429A2 Frequency domain reflectometry system for baselining and mapping of wires and cables |
| 05/06/2004 | WO2004017076A8 Press assembly for electronic board testing |
| 05/06/2004 | WO2004008492A3 Mosaic decal probe |
| 05/06/2004 | WO2003094765A3 Method and system for power line network fault detection and quality monitoring |
| 05/06/2004 | US20040088659 Semiconductor device having scan flip-flop and design method therefor |
| 05/06/2004 | US20040088631 Method and device for signaling a transmission fault on a data line |
| 05/06/2004 | US20040088630 Integrated circuit device |
| 05/06/2004 | US20040088629 Cell buffer with built-in test |
| 05/06/2004 | US20040088627 Fault simulator for verifying reliability of test pattern |
| 05/06/2004 | US20040088626 Method and apparatus for determining optimum initial value for test pattern generator |
| 05/06/2004 | US20040088624 Method for quantifying I/O chip/package resonance |
| 05/06/2004 | US20040088622 Verification of digital circuitry using range generators |
| 05/06/2004 | US20040088621 Built-in self-test circuit |
| 05/06/2004 | US20040088618 Scan chain design using skewed clocks |
| 05/06/2004 | US20040088617 Method and apparatus for conditioning of a digital pulse |
| 05/06/2004 | US20040088615 Method and apparatus for power supply noise modeling and test pattern development |
| 05/06/2004 | US20040088601 Method, system and program product for establishing a self-diagnosing and self-repairing automated system |
| 05/06/2004 | US20040088461 Microcomputer |
| 05/06/2004 | US20040088444 Multi-rate, multi-port, gigabit serdes transceiver |
| 05/06/2004 | US20040088443 Multipurpose and programmable pad ring for an integrated circuit |
| 05/06/2004 | US20040088131 System and method for generating a shmoo plot by avoiding testing in failing regions |
| 05/06/2004 | US20040088128 System and method for generating a shmoo plot by tracking the edge of the passing region |
| 05/06/2004 | US20040088126 System and method for generating a shmoo plot by varying the resolution thereof |
| 05/06/2004 | US20040088121 Apparatus, system, and method of determining loading characteristics on an integrated circuit module |
| 05/06/2004 | US20040087205 Test paddle having a universal binding post |
| 05/06/2004 | US20040087157 Method for screening semiconductor devices for contact coplanarity |
| 05/06/2004 | US20040087146 Method of preparing whole semiconductor wafer for analysis |
| 05/06/2004 | US20040087046 Method for testing chips on flat solder bumps |
| 05/06/2004 | US20040086170 Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof |
| 05/06/2004 | US20040086011 Planar and wafer level packaging of semiconductor lasers and photo detectors for transmitter optical sub-assemblies |
| 05/06/2004 | US20040085836 Memory device in semiconductor for enhancing ability of test |
| 05/06/2004 | US20040085796 System-in-package type semiconductor device |
| 05/06/2004 | US20040085155 Selection of IC Vdd for improved voltage regulation of transciever/transponder modules |
| 05/06/2004 | US20040085154 Methods for bi-directional signaling |
| 05/06/2004 | US20040085136 Providing controllable impedance at a reference plane in a circuit |
| 05/06/2004 | US20040085087 Method for error detection in a drive mechanism |
| 05/06/2004 | US20040085086 Predictive control boost current method and apparatus |
| 05/06/2004 | US20040085085 Method and apparatus for on-die voltage fluctuation detection |
| 05/06/2004 | US20040085084 Method and apparatus for stress testing integrated circuits using an adjustable AC hot carrier injection source |
| 05/06/2004 | US20040085083 Die location on ungrounded wafer for back-side emission microscopy |
| 05/06/2004 | US20040085082 High -frequency scan testability with low-speed testers |
| 05/06/2004 | US20040085074 Method for producing a fault signal which indicates a short to ground |
| 05/06/2004 | US20040085072 Method and system for monitoring state of lead acid battery |
| 05/06/2004 | US20040085071 Testing apparatus |
| 05/06/2004 | US20040085060 Method and apparatus for testing BGA-type semiconductor devices |
| 05/06/2004 | US20040085059 Method and apparatus to provide accurate high speed wide range current measurement in automated testing equipment |
| 05/06/2004 | US20040085058 Power supply device for a component testing installation |
| 05/06/2004 | US20040085057 Voltage probe |
| 05/06/2004 | US20040084765 Apparatus and method for contacting device with delicate light-transparent pane |
| 05/06/2004 | US20040084747 Parallel scan distributors and collectors and process of testing integrated circuits |
| 05/06/2004 | US20040084671 Test structure is exposed to an electron beam, emitted secondary electrons are captured from test structure to locate a short by passive voltage contrast, the critical dimension is determined as smallest space without a short |
| 05/06/2004 | US20040083568 Device for cleaning tip and side surfaces of a probe |
| 05/06/2004 | EP1416290A1 Method for storing register properties in a datastructure and related datastructure |
| 05/06/2004 | EP1416289A1 Providing a controllable impedance at a reference plane in a circuit |
| 05/06/2004 | EP1416287A1 Method of generating an error signal indicating a short-circuit to the earth |
| 05/06/2004 | EP1416285A2 Mechanism for fixing probe card |
| 05/06/2004 | EP1415169A1 Built-in test system for aircraft indication switches |
| 05/06/2004 | EP1415168A2 Application-specific testing methods for programmable logic devices |
| 05/06/2004 | EP1415167A2 Method and apparatus for evaluating a set of electronic components |
| 05/06/2004 | EP1415166A1 Apparatus and method for testing bare circuit boards |
| 05/06/2004 | EP1415086A1 Coil on plug inductive sampling method and apparatus |
| 05/06/2004 | EP1292839B1 Tool for automatic testability analysis |
| 05/06/2004 | EP1097388B1 Method of and apparatus for estimating the charge in a battery |
| 05/06/2004 | EP1031044B1 Electro-chemical deterioration test method and apparatus |
| 05/06/2004 | DE10349080A1 Electronic battery tester for vehicles, has microprocessor which is connected to removable digital module and response sensor which measures electrical response of battery |