| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/18/2004 | US6737876 Method and system for determining an operating voltage using a source/drain to gate overlap induced scaling factor |
| 05/18/2004 | US6737875 Method and apparatus for in-circuit impedance measurement |
| 05/18/2004 | US6737873 Electronic part inspection device |
| 05/18/2004 | US6737872 Procedure and device for the evaluation of the quality of a cable |
| 05/18/2004 | US6737871 Non-invasive cable tester |
| 05/18/2004 | US6737868 Electrical load disconnection detecting apparatus |
| 05/18/2004 | US6737859 Dynamic register with IDDQ testing capability |
| 05/18/2004 | US6737858 Method and apparatus for testing current sinking/sourcing capability of a driver circuit |
| 05/18/2004 | US6737857 Apparatus and method for driving circuit pins in a circuit testing system |
| 05/18/2004 | US6737852 Clock skew measuring apparatus and method |
| 05/18/2004 | US6737850 Power supply voltage detection circuit and power supply voltage detection method |
| 05/18/2004 | US6737832 Power supply apparatus |
| 05/18/2004 | US6737831 Method and apparatus using a circuit model to evaluate cell/battery parameters |
| 05/18/2004 | US6737671 Current measurement circuit and method for voltage regulated semiconductor integrated circuit devices |
| 05/18/2004 | US6737286 Apparatus and method for fabricating arrays of atomic-scale contacts and gaps between electrodes and applications thereof |
| 05/18/2004 | US6736665 Contact structure production method |
| 05/18/2004 | US6736361 Semiconductor wafer positioning system and method |
| 05/18/2004 | US6735855 Methods for electrical connector |
| 05/18/2004 | CA2210908C Method for detecting an interference radiation on board of an aircraft |
| 05/15/2004 | CA2445690A1 Apparatus for detecting arc fault |
| 05/13/2004 | WO2004040824A2 A multi-rate, multi-port, gigabit serdes transceiver |
| 05/13/2004 | WO2004040769A1 Self-adjusting programmable on-chip clock aligner |
| 05/13/2004 | WO2004040326A1 Defect analyzing device for semiconductor integrated circuits, system therefor, and detection method |
| 05/13/2004 | WO2004040325A1 Connection unit, board mounting device to be measured, probe card, and device interface unit |
| 05/13/2004 | WO2004040324A2 A method of and apparatus for testing for integrated circuit contact defects |
| 05/13/2004 | WO2004040323A2 Method and apparatus for predicting the remaining capacity of a battery in a mobile telephone |
| 05/13/2004 | WO2004040321A1 Probe card |
| 05/13/2004 | WO2002063318A9 System and method for sampling timing error reduction |
| 05/13/2004 | US20040093575 Chemically synthesized and assembled electronic devices |
| 05/13/2004 | US20040093572 System and method for executing image computation associated with a target circuit |
| 05/13/2004 | US20040093571 Circuit verification |
| 05/13/2004 | US20040093570 System and method for verifying a plurality of states associated with a target circuit |
| 05/13/2004 | US20040093544 Method and apparatus for testing a device in an electronic component |
| 05/13/2004 | US20040093543 Boundary-scan methods and apparatus |
| 05/13/2004 | US20040093542 Logic circuit test apparatus and logic circuit test method |
| 05/13/2004 | US20040093541 System and method for evaluating an erroneous state associated with a target circuit |
| 05/13/2004 | US20040093535 On-chip measurement of signal state duration |
| 05/13/2004 | US20040093534 Serial data input/output method and apparatus |
| 05/13/2004 | US20040093478 Integrated circuit device and method for applying different types of signals to internal circuit via one pin |
| 05/13/2004 | US20040093199 Method for functional verification of hardware design |
| 05/13/2004 | US20040093186 Method and apparatus for decomposing and verifying configurable hardware |
| 05/13/2004 | US20040093185 Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection |
| 05/13/2004 | US20040092049 Fabrication method of semiconductor integrated circuit device and testing method |
| 05/13/2004 | US20040091759 Methods and apparatus for indicating a fault condition in fuel cells and fuel cell components |
| 05/13/2004 | US20040091038 Multi-pair gigabit ethernet transceiver |
| 05/13/2004 | US20040090964 Means and apparatus for a scaleable congestion free switching system with intelligent control II |
| 05/13/2004 | US20040090821 Multi-mode synchronous memory device and methods of operating and testing same |
| 05/13/2004 | US20040090237 Circuit for measuring absolute spread in capacitors implemented in planary technology |
| 05/13/2004 | US20040090228 Speed sensitive field ground detection mode for a generator field winding |
| 05/13/2004 | US20040090223 Mechanism for fixing probe card |
| 05/13/2004 | US20040090221 Device and method for testing electronic components |
| 05/13/2004 | US20040090207 Apparatus to calculate remaining capacity of a battery |
| 05/13/2004 | US20040089952 Structure and method for charge sensitive electrical devices |
| 05/13/2004 | DE69907930T2 Integrierte Schaltung mit Kalibriermitteln zur Kalibrierung eines elektronischen Moduls und Verfahren zum Kalibrieren eines elektronischen Moduls in einer Integrierten Schaltung An integrated circuit comprising calibration means for calibrating an electronic module and method for calibrating an electronic module in an integrated circuit |
| 05/13/2004 | DE202004003284U1 Monitoring device for laser light conducting fiber optic cable comprises three circuits for measuring the current through a surrounding inner metallic case and for measuring capacitance and resistance between it and an outer case |
| 05/13/2004 | DE202004002641U1 Testing system for detecting damage in plastic pipes laid underground, comprising a number of helical electric conductors arranged in the pipe wall such that a detected conductor path breakage can be associated with pipe damage |
| 05/13/2004 | DE19844428B4 Prüfsonde für einen Fingertester, ein Verfahren zum Ansteuern einer Prüfsonde, Fingertester zum Prüfen von Leiterplatten und ein Verfahren zum Prüfen von Leiterplatten mit einem Fingertester Test probe for a finger tester, a method for driving a test probe, finger tester for testing circuit boards and a method of testing of circuit boards with a finger tester |
| 05/13/2004 | DE10349600A1 Checking line faults in bus system involves dominant bus subscriber comparing voltage levels on bus lines with threshold values related to internal high level or internal low level of bus subscriber |
| 05/13/2004 | DE10338003A1 Batterieanlage und Verfahren zum Überwachen des Batteriezustands Battery system and method for monitoring the battery status |
| 05/13/2004 | DE10249921A1 Verfahren zur Ermittlung des Verschleißes einer Speicherbatterie und Überwachungseinrichtung Method for determining the wear of a storage battery monitoring device and |
| 05/13/2004 | DE10249568A1 Fault analysis method for electronic control device for electric motor determines conduction resistance of each switch element of electronic control device for comparison with expected value |
| 05/13/2004 | CA2503731A1 Self-adjusting programmable on-chip clock aligner |
| 05/12/2004 | EP1418659A1 Monitoring system for parallel-connected stator windings |
| 05/12/2004 | EP1418655A2 Speed sensitive field ground detection mode for a generator field winding |
| 05/12/2004 | EP1418502A2 Unusable block management within a non-volatile memory system |
| 05/12/2004 | EP1418438A2 Environmental test chamber |
| 05/12/2004 | EP1418437A1 Method and electromagnetic sensor for measuring partial discharges in windings of electrical devices |
| 05/12/2004 | EP1418436A2 Electrical contactor, especially wafer level contactor, using fluid pressure |
| 05/12/2004 | EP1417587A2 Method and system for allocating protection path resources |
| 05/12/2004 | EP1417503A1 Methods for determining the charge state and/or the power capacity of a charge store |
| 05/12/2004 | EP1417502A2 Electronic circuit and method for testing |
| 05/12/2004 | EP1417501A2 Systems for wafer level burn-in of electronic devices |
| 05/12/2004 | EP1417500A2 Methods of conducting wafer level burn-in of electronic devices |
| 05/12/2004 | EP1417499A2 Providing current control over wafer borne semiconductor devices using overlayer patterns |
| 05/12/2004 | EP1417497A1 Virtual line switched ring (vlsr) connection state distribution scheme |
| 05/12/2004 | EP1147301B1 Method and device in vehicle control system, and system for error diagnostics in vehicle |
| 05/12/2004 | EP1123512B1 High density printed circuit board |
| 05/12/2004 | EP0792463B1 Mounting spring elements on semiconductor devices |
| 05/12/2004 | CN2616011Y Electromagnetic interference on-line detection screening apparatus |
| 05/12/2004 | CN2615676Y Single-supporting synchro generator test connecting apparatus |
| 05/12/2004 | CN2615675Y Intelligent power generating set comprehensive performance test instrument |
| 05/12/2004 | CN1496597A Anisotropic conductive connector, its mfg. method and probe member |
| 05/12/2004 | CN1496527A Method and apparatus for design validation of complex IC without using logic simulation |
| 05/12/2004 | CN1496526A Extraction method of defect density and size distributions |
| 05/12/2004 | CN1496483A A chamber for and method of processing electronic devices and use of such chamber |
| 05/12/2004 | CN1495912A Semiconductor device and its making and estimating method, and processing condition estimating method |
| 05/12/2004 | CN1495904A Semiconductor storage, semiconductor device and semiconductor device control method |
| 05/12/2004 | CN1495874A Wiring detection method for semiconductor packaged inner |
| 05/12/2004 | CN1495870A Composite intermediate connection element of microelectronic component and its making method |
| 05/12/2004 | CN1495796A Semiconductor storage and its testing method |
| 05/12/2004 | CN1495584A Equipment quick test based on model control |
| 05/12/2004 | CN1495434A Measurable technology for semiconductor integrated circuit |
| 05/12/2004 | CN1149636C Method and ap0paratus for processing wafers and substrates, and apparatus for transferring the wafers and substrates |
| 05/12/2004 | CN1149635C System and method for compensating parameter of crystal sheets |
| 05/12/2004 | CN1149402C High-voltage fault discharge on-line monitoring system for electric machine |
| 05/12/2004 | CN1149399C Method and system for performance testing of rotating electric machines |
| 05/11/2004 | US6735731 Architecture for built-in self-test of parallel optical transceivers |
| 05/11/2004 | US6735730 Integrated circuit with design for testability and method for designing the same |
| 05/11/2004 | US6735727 Flash memory device with a novel redundancy selection circuit and method of using the same |
| 05/11/2004 | US6735709 Method of timing calibration using slower data rate pattern |