| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/25/2004 | US6741085 Contact carriers (tiles) for populating larger substrates with spring contacts |
| 05/25/2004 | US6741081 Cable fault detector |
| 05/25/2004 | US6741072 Docking system for connecting a tester to a probe station using an A-type docking configuration |
| 05/25/2004 | US6740979 Semiconductor device and LSI defect analyzing method using the same |
| 05/25/2004 | US6740929 Semiconductor device and method for testing semiconductor device |
| 05/25/2004 | US6739894 Socket for IC package |
| 05/25/2004 | US6739208 Method of delivering target object to be processed, table mechanism of target object and probe apparatus |
| 05/22/2004 | CA2450321A1 Arc fault tester |
| 05/21/2004 | WO2004043074A1 Inter-network and inter-protocol video conference privacy method, apparatus and computer program product |
| 05/21/2004 | WO2004043068A1 Inter-network and inter-protocol video conference privacy method, apparatus, and computer program product |
| 05/21/2004 | WO2004042795A2 Method of preparing whole semiconductor wafer for analysis |
| 05/21/2004 | WO2004042787A2 Method and apparatus for testing asynchronous set/reset faults in a scan-based integrated circuit |
| 05/21/2004 | WO2004042786A2 High-frequency scan testability with low-speed testers |
| 05/21/2004 | WO2004042413A1 Inspecting method and apparatus for a led matrix display |
| 05/21/2004 | WO2004042412A1 Method and apparatus for diagnosis injectors |
| 05/21/2004 | WO2004042411A1 Method and device for recognizing battery-less operation of a vehicle |
| 05/21/2004 | WO2004042410A1 Device for measuring electric current intensity |
| 05/21/2004 | WO2004042320A1 Planar and wafer level packaging of semiconductor lasers and photo detectors for transmitter optical sub-assemblies |
| 05/21/2004 | WO2002067003A8 Test circuit for hvdc thyristor valves |
| 05/21/2004 | CA2502110A1 Method and apparatus for diagnosis injectors |
| 05/20/2004 | US20040098702 Method for modifying an integrated circuit |
| 05/20/2004 | US20040098687 System and method for implementing a flexible top level scan architecture using a partitioning algorithm to balance the scan chains |
| 05/20/2004 | US20040098686 Method for insertion of test points into integrated logic circuit designs |
| 05/20/2004 | US20040098682 Reachabilty-based verification of a circuit using one or more multiply rooted binary decision diagrams |
| 05/20/2004 | US20040098681 Characteristic evaluation apparatus for insulated gate type transistors |
| 05/20/2004 | US20040098649 Test data generating system and method to test high-speed actual operation |
| 05/20/2004 | US20040098648 Boundary scan with strobed pad driver enable |
| 05/20/2004 | US20040098647 System and apparatus for scanning integrated circuits with numerically controlled delay lines |
| 05/20/2004 | US20040098646 Method and apparatus to check the integrity of scan chain connectivity by traversing the test logic of the device |
| 05/20/2004 | US20040098638 PLD debugging HUB |
| 05/20/2004 | US20040098522 Apparatus and method for retrieving and displaying related information on a handheld communication device |
| 05/20/2004 | US20040098518 Integrated circuit having multiple modes of operation |
| 05/20/2004 | US20040098241 System and method for clock domain grouping using data path relationships |
| 05/20/2004 | US20040098239 Debug method for mismatches occurring during the simulation of scan patterns |
| 05/20/2004 | US20040098227 Apparatus and method for testing snow removal equipment |
| 05/20/2004 | US20040098222 Self learning system and method for predicting remaining usage time for different modes of a mobile device |
| 05/20/2004 | US20040098213 Method for determining the frequency of the current ripple in the armature current of a commutated DC motor |
| 05/20/2004 | US20040097093 Test circuit for semiconductor device |
| 05/20/2004 | US20040096994 Method of assembling and testing an electronics module |
| 05/20/2004 | US20040096643 Cleaning sheet and method for a probe |
| 05/20/2004 | US20040095890 Traffic generating switch |
| 05/20/2004 | US20040095823 Sensing circuit |
| 05/20/2004 | US20040095695 Apparatus for detecting arc fault |
| 05/20/2004 | US20040095549 Liquid crystal display and testing method thereof |
| 05/20/2004 | US20040095301 Method and system for testing driver circuits of amoled |
| 05/20/2004 | US20040095249 Method and apparatus for the continuous performance monitoring of a lead acid battery system |
| 05/20/2004 | US20040095161 Dynamic scan circuitry for B-phase |
| 05/20/2004 | US20040095158 Apparatuses configured to engage a conductive pad |
| 05/20/2004 | US20040095157 Inspection jig for radio frequency device, and contact probe incorporated in the jig |
| 05/20/2004 | US20040095144 Inspection apparatus and inspection method |
| 05/20/2004 | US20040095143 Method for determining the amount of charge which can be drawn from a storage battery and a monitoring device for a storage battery |
| 05/20/2004 | US20040095127 Apparatus for measuring current density of fuel cell |
| 05/20/2004 | US20040095093 Battery pack |
| 05/20/2004 | US20040095024 Method for determining charging capacitance of capacitor |
| 05/20/2004 | US20040094762 Extraction method of defect density and size distributions |
| 05/19/2004 | EP1420351A2 PLD debugging hub |
| 05/19/2004 | EP1420262A1 Method and system for detecting at least one failure of at least one switch |
| 05/19/2004 | EP1420261A1 Process for determination of the charge consumption of a storage battery |
| 05/19/2004 | EP1420260A1 Apparatus and method for monitoring the electrical isolation of a stator in an electrical machine |
| 05/19/2004 | EP1420259A1 Apparatus and method for contacting of test objects |
| 05/19/2004 | EP1420258A1 Measurement control apparatus |
| 05/19/2004 | EP1420257A2 Apparatus for detecting defects |
| 05/19/2004 | EP1420256A1 Method and device for determining sideband ratio of superconduction mixer using comb generator |
| 05/19/2004 | EP1419572A1 Device and method for monitoring the connection of an electrical supply unit |
| 05/19/2004 | EP1419507A2 Method and device for testing semiconductor memory devices |
| 05/19/2004 | EP1373914A4 Anionic polymers composed of dicarboxylic acids and uses thereof |
| 05/19/2004 | EP1196790B1 Apparatus and method for temperature control of ic device during test |
| 05/19/2004 | EP0764352B1 Microelectronic contacts and assemblies |
| 05/19/2004 | DE69907970T2 Dynamisches register mit der fähigkeit zur prüfung der ruhestromaufnahme (iddq) Dynamic register with the ability to test the quiescent current consumption (IDDQ) |
| 05/19/2004 | DE10346628A1 Hybridsensor zur Ermittlung einer HF-Teilentladung Hybrid sensor for detecting an RF partial discharge |
| 05/19/2004 | DE10339805A1 Verfahren zur Feststellung von Betriebsstörungen eines Relais Method for detecting malfunctions of a relay |
| 05/19/2004 | DE10326754A1 Battery charger has display for indicating state of battery holder and/or battery in it with separate display for each battery holder |
| 05/19/2004 | DE10251590A1 Motor vehicle battery-less operation detection method, in which values of generator voltage and battery voltage are evaluated by a power supply computer to determine if the battery is present and operating correctly |
| 05/19/2004 | DE10250777A1 Process and device for characterizing edge emission optical sender elements especially laser diodes and light emitting diodes has repeated displacement system to test each unit in turn |
| 05/19/2004 | DE10250520A1 Fuel cell stack monitoring device, especially for automotive use, whereby impedances are switched together and then it is determined if a measured voltage value lies within a possible value range |
| 05/19/2004 | DE10234709B3 Test module for contacts of electrical components, has conductive body with chambers containing insulated contact pins |
| 05/19/2004 | DE10059142B4 Strombegrenzungsapparat Current limiting apparatus |
| 05/19/2004 | CN1498347A Feedback device for electric high frequency signal and level measuring device provided with said device |
| 05/19/2004 | CN1498346A Method and device for testing quality of printed circuits |
| 05/19/2004 | CN1497257A Method and system of testing property of electric rotating machinery |
| 05/19/2004 | CN1150738C Mobile communication unit with bone conduction speaker |
| 05/19/2004 | CN1150605C Probe card for testing integrated circuit chip |
| 05/19/2004 | CN1150406C Insulated device diagnosing system and partial discharge detecting method |
| 05/19/2004 | CN1150405C Scanning tester for continuously testing bare PC board |
| 05/19/2004 | CN1150040C Automatic ground wire testing method of electrostatic potential loading device for treating |
| 05/18/2004 | US6738956 Circuit configuration of a chip with a graphic controller integrated and method for testing the same |
| 05/18/2004 | US6738954 Method for prediction random defect yields of integrated circuits with accuracy and computation time controls |
| 05/18/2004 | US6738940 Integrated circuit including a test signal generator |
| 05/18/2004 | US6738939 Method and apparatus for fault tolerant and flexible test signature generator |
| 05/18/2004 | US6738921 Clock controller for AC self-test timing analysis of logic system |
| 05/18/2004 | US6738853 Integrated circuit with built-in processor and internal bus observing method |
| 05/18/2004 | US6738731 Method and apparatus for using tool state information to identify faulty wafers |
| 05/18/2004 | US6738718 Method and apparatus for measuring torque and flux current in a synchronous motor |
| 05/18/2004 | US6738419 Dynamic regulation of power consumption of a high-speed communication system |
| 05/18/2004 | US6738134 Inspection method and inspection system of a terminal metal fitting |
| 05/18/2004 | US6737906 Semiconductor integrated circuit device including a negative power supply circuit |
| 05/18/2004 | US6737882 Method for universal wafer carrier for wafer level die burn-in |
| 05/18/2004 | US6737881 Apparatus for testing integrated circuits having an integrated unit for testing digital and analog signals |
| 05/18/2004 | US6737880 Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissions |
| 05/18/2004 | US6737878 Probe applied to semiconductor package test and method for testing semiconductor package |