| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/01/2004 | US6743039 Ball grid array connector |
| 06/01/2004 | US6743033 Contactor for semiconductor device and contact method |
| 06/01/2004 | US6742981 IC handler |
| 06/01/2004 | CA2404059C Method and apparatus for providing optimized access to circuits for debug, programming, and test |
| 05/27/2004 | WO2004045172A1 Intelligent control for scaleable congestion free switching |
| 05/27/2004 | WO2004044949A2 Probe station with low noise characteristics |
| 05/27/2004 | WO2004044749A1 A method and apparatus for decomposing and verifying configurable hardware |
| 05/27/2004 | WO2004044601A1 Boundary scan with strobed pad driver enable |
| 05/27/2004 | WO2004044600A2 Characterizing analog and digital telephone circuits and other types of wiring systems using frequency domain reflectometry (fdr) |
| 05/27/2004 | WO2004044599A2 Retrofit kit for interconnect cabling system |
| 05/27/2004 | WO2003104828B1 Variable clock scan test circuitry and method |
| 05/27/2004 | WO2003103351B1 Fixing means |
| 05/27/2004 | WO2003076953A3 An electrical condition monitoring method for polymers |
| 05/27/2004 | WO2003030214A3 Method of manufacturing an integrated circuit, integrated circuit obtained in accordance with said method, wafer provided with an integrated circuit obtained in accordance with the method, and system comprising an integrated circuit obtained by means of the method |
| 05/27/2004 | US20040103399 Data trace compression map |
| 05/27/2004 | US20040103378 System and method for building a binary decision diagram associated with a target circuit |
| 05/27/2004 | US20040103357 Semiconductor testing device |
| 05/27/2004 | US20040103355 Performance built-in self test system for a device and a method of use |
| 05/27/2004 | US20040103354 Method and circuits for localizing defective interconnect resources in programmable logic devices |
| 05/27/2004 | US20040103353 Failure analysis method |
| 05/27/2004 | US20040103352 Increasing possible test patterns which can be used with sequential scanning techniques to perform speed analysis |
| 05/27/2004 | US20040103349 Programmable extended compression mask for dynamic trace |
| 05/27/2004 | US20040102948 Address range comparator for detection of multi size memory accesses with data matching qualification and full or partial overlap |
| 05/27/2004 | US20040102916 Method for testing I/O ports of a computer motherboard |
| 05/27/2004 | US20040102915 Failure analysis vehicle |
| 05/27/2004 | US20040101190 Characteristic amount calculating device for soldering inspection |
| 05/27/2004 | US20040101040 Timing recovery system for a multi-pair gigabit transceiver |
| 05/27/2004 | US20040100868 System and method for identifying and locating an acoustic event |
| 05/27/2004 | US20040100742 Electrical fault detection system |
| 05/27/2004 | US20040100468 Method and device for optimising a test programme |
| 05/27/2004 | US20040100301 Analogue/digital interface circuit |
| 05/27/2004 | US20040100300 Test probe for electrical devices having low or no wedge depression |
| 05/27/2004 | US20040100298 Method and apparatus for measuring contamination of a semiconductor substrate |
| 05/27/2004 | US20040100297 Semiconductor device inspection apparatus and inspection method |
| 05/27/2004 | US20040100296 Bonding pads for testing of a semiconductor device |
| 05/27/2004 | US20040100294 Design-for-test modes for a phase locked loop |
| 05/27/2004 | US20040100293 Test structure for determining the stability of electronic devices comprising connected substrates |
| 05/27/2004 | US20040100287 Apparatus and method for inspecting array substrate |
| 05/27/2004 | US20040100280 Noncontact measuring system for electrical conductivity |
| 05/27/2004 | US20040100279 Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits |
| 05/27/2004 | US20040100274 Arc fault tester |
| 05/27/2004 | US20040100273 Testing electrical integrity of electrically heated subsea pipelines |
| 05/27/2004 | US20040100272 Methods for locating faults in aircraft branch conductors and determining the distance to the faults |
| 05/27/2004 | US20040100270 Automated stator insulation flaw inspection tool and method of operation |
| 05/27/2004 | US20040100267 Method for determining the amount of charge which can be drawn from a storage battery and monitoring device |
| 05/27/2004 | US20040100266 Electronic battery condition tester |
| 05/27/2004 | US20040100246 Circuit configuration and method for measuring at least one operating parameter for an integrated circuit |
| 05/27/2004 | US20040100227 Apparatus and method for estimating charge rate of secondary cell |
| 05/27/2004 | DE10349784A1 Verfahren und Einrichtung zur Selbstdiagnose und Selbstreparatur Method and device for self-diagnosis and self-repair |
| 05/27/2004 | DE10332410B3 Automobile onboard electrical network sensor device using shunt measuring resistance integrated in onboard electrical network |
| 05/27/2004 | DE10321913A1 System-in-package-Halbleitervorrichtung System-in-package semiconductor device |
| 05/27/2004 | DE10307690A1 Electrical tolerance analysis circuit for tolerance analysis of digital and digitized measurement values comprises a testing arrangement for testing at least one predefined tolerance criterion and output unit for result output |
| 05/27/2004 | DE10253717A1 Vorrichtung und Methode zur Kontaktierung von Testobjekten Apparatus and method for contacting of test objects |
| 05/27/2004 | DE10252561A1 Vorrichtung und Verfahren zum Betauen eines Prüflings Apparatus and method for dewing an examinee |
| 05/27/2004 | DE10252326A1 Integrated circuit testing arrangement has an electronic element with a circuit to be tested and a comparator circuit that is integrated in a testing system for supply of reference values |
| 05/27/2004 | DE10161480B4 Verfahren zum Betreiben eines photovoltaischen Solarmoduls und photovoltaischer Solarmodul Method for operating a photovoltaic solar module and photovoltaic solar module |
| 05/27/2004 | DE10037432B4 Verfahren zur Überwachung einer Kondensatordurchführung Method for monitoring a capacitor bushing |
| 05/26/2004 | EP1422846A1 PORTABLE RADIO TERMINAL TESTING INSTRUMENT USING A SINGLE SELF−COMPLEMENTARY ANTENNA |
| 05/26/2004 | EP1422804A2 Apparatus and method for estimating charge rate of secondary cell |
| 05/26/2004 | EP1422530A2 Inspection jig for radio frequency device, and contact probe incorporated in the jig |
| 05/26/2004 | EP1421482A2 Network-based system for configuring a measurement system using programs generated based on a user specification |
| 05/26/2004 | EP1421397A1 Delay fault test circuitry and related method |
| 05/26/2004 | EP1421396A2 Providing current control over wafer borne semiconductor devices using trenches |
| 05/26/2004 | CN2618172Y Phonetical indicator for volume in electric powe charger |
| 05/26/2004 | CN1500247A Validation fub for agent |
| 05/26/2004 | CN1500246A Enhanced loopback testing of serial devices |
| 05/26/2004 | CN1499636A System combined semiconductor device |
| 05/26/2004 | CN1499599A Device and method for parallel testing semiconductor device |
| 05/26/2004 | CN1499598A Device for tesing semiconductor |
| 05/26/2004 | CN1499516A Semiconductor memory having enhanced testing power |
| 05/26/2004 | CN1499217A Dump energy calculating device for battery |
| 05/26/2004 | CN1499216A Battery management circuit and electronic machine |
| 05/26/2004 | CN1499215A Battery, machine and charger |
| 05/26/2004 | CN1499214A Method and system for monitoring lead-acid battery state |
| 05/26/2004 | CN1499213A Route delay measuring circuit |
| 05/26/2004 | CN1499212A Device for indicating capacity and method for measuring capacity |
| 05/26/2004 | CN1499211A Earth detector |
| 05/26/2004 | CN1499210A Boundary scanning method and device |
| 05/26/2004 | CN1499209A Mechanism for fixing probe card |
| 05/26/2004 | CN1499208A Method of setting up self diagnostic and self repairing system, its system and program products |
| 05/26/2004 | CN1151594C Charger and method for measuring charged level |
| 05/26/2004 | CN1151009C Fabricating interconnects and tips using sacrificial substrates |
| 05/25/2004 | US6742152 Parallel scan test software |
| 05/25/2004 | US6742151 Semiconductor integrated circuit device with scan signal converting circuit |
| 05/25/2004 | US6742150 Low redesign application-specific module |
| 05/25/2004 | US6742149 Apparatus for testing semiconductor integrated circuits |
| 05/25/2004 | US6742144 Local heating of memory modules tested on a multi-motherboard tester |
| 05/25/2004 | US6741953 Acquisition unit and method for infrequent capturing of data samples with associated timing information |
| 05/25/2004 | US6741952 Instrument timing using synchronized clocks |
| 05/25/2004 | US6741946 Systems and methods for facilitating automated test equipment functionality within integrated circuits |
| 05/25/2004 | US6741916 Accident point locating system |
| 05/25/2004 | US6741566 Remote management ethernet network and device |
| 05/25/2004 | US6741512 Integrated circuit memory devices having efficient multi-row address test capability and methods of operating same |
| 05/25/2004 | US6741511 Semiconductor memory device |
| 05/25/2004 | US6741510 Semiconductor memory device capable of performing burn-in test at high speed |
| 05/25/2004 | US6741094 Electronic apparatus test circuit |
| 05/25/2004 | US6741093 Method of determining one or more properties of a semiconductor wafer |
| 05/25/2004 | US6741092 Method and system for detecting an arc condition |
| 05/25/2004 | US6741090 Holding device for electronic part test, and device and method for electronic part test |
| 05/25/2004 | US6741086 Member for removing foreign matter adhering to probe tip and method of manufacturing the probe tip, method of cleaning foreign matter adhering to probe tip, probe, and probing apparatus |