Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2004
06/08/2004US6746883 Direct determination of interface traps in MOS devices
06/08/2004US6746252 High frequency compression mount receptacle with lineal contact members
06/04/2004CA2450848A1 Functional test and demonstration apparatus for fuel cell power system
06/03/2004WO2004047416A1 A self learning system and method for predicting remaining usage time for different modes of a mobile device
06/03/2004WO2004047215A1 Wireless battery management system
06/03/2004WO2004046941A1 Integrated circuit having multiple modes of operation
06/03/2004WO2004046742A1 Battery capacity calculating method, battery capacity calculating apparatus, and battery capacity calculating program
06/03/2004WO2004046741A1 Jtag testing arrangement
06/03/2004WO2004046740A1 Device and methods for contacting objects to be tested
06/03/2004WO2004046738A2 Virtual to physical memory address mapping within a system having a secure domain and a non-secure domain
06/03/2004WO2004046652A2 Device and method for detecting anomolies in a wire and related sensing methods
06/03/2004WO2004017474A3 Photonic devices and pics including sacrificial testing structures and method of making the same
06/03/2004WO2004017035A3 Method and apparatus for temperature control
06/03/2004WO2004015596A3 Method and system for debugging using replicated logic
06/03/2004WO2004010153A3 Probe device cleaner and method
06/03/2004WO2004008487A3 Test system and methodology
06/03/2004WO2004005946A3 Electronic circuit with test unit for testing interconnects
06/03/2004WO2003046591A3 Multi-environment testing with a responder
06/03/2004WO2003034576A3 Method and system for charge pump active gate drive
06/03/2004US20040107396 Built-in self test circuit for integrated circuits
06/03/2004US20040107395 System and method for testing circuitry using an externally generated signature
06/03/2004US20040107394 IP core design supporting user-added scan register option
06/03/2004US20040107393 Method and device for testing the mapping/implementation of a model of a logic circuit onto/in a hardware emulator
06/03/2004US20040107392 Method for predicting whether a failure of an electrical device may occur
06/03/2004US20040107058 Event pipeline and summing method and apparatus for event based test system
06/03/2004US20040106307 Socket for electrical parts
06/03/2004US20040106219 Method of accelerating test of semiconductor device
06/03/2004US20040106025 Diagnostic apparatus and diagnostic method for fuel cell
06/03/2004US20040105386 Method for scheduling of plural packet data flows
06/03/2004US20040105334 Semiconductor memory device having test mode
06/03/2004US20040105327 Nonvolatile semiconductor storage device and row-line short defect detection method
06/03/2004US20040105033 Amplifier assembly including variable gain amplifier, parallel programmable amplifiers, and AGC
06/03/2004US20040104857 Method for testing a measurement recording device and corresponding testing device
06/03/2004US20040104771 Gain control methods and systems in an amplifier assembly
06/03/2004US20040104751 Conditional clock buffer circuit
06/03/2004US20040104740 Process monitor for monitoring an integrated circuit chip
06/03/2004US20040104738 Probe card
06/03/2004US20040104732 Semiconductor integrated circuit device
06/03/2004US20040104731 Method of reliability testing
06/03/2004US20040104730 Fault locator
06/03/2004US20040104729 System and method for supervision
06/03/2004US20040104728 Alternator tester with encoded output
06/03/2004US20040104723 Method for identifying risks as a result of stray currents
06/03/2004US20040104718 Method and system for non-invasive power transistor die voltage measurement
06/03/2004US20040104706 Remaining battery capacity computation system
06/03/2004US20040104570 Automotive passenger restraint and protection apparatus
06/03/2004DE69723216T2 Schaltung zum Einstellen eines Verzögerungsunterschiedes und Phaseneinsteller Circuit for setting a delay difference and phase adjuster
06/03/2004DE20301556U1 Differential high voltage converter, for e.g. personal computer-controlled network quality analyzer in electrical power supply, has two identical high-resistance resistors positioned in measurement cable
06/03/2004DE19901922B4 Vorrichtung zum Be-/Entladen eines modularen IC's in eine bzw. aus einer Buchse einer Handhabe für modulare IC's Apparatus for loading / unloading a modular IC's in or out of a socket of a handle for modular IC's
06/03/2004DE19636338B4 Schaltungsanordnung zur Überwachung einer Elektronikauslöseeinrichtung für Niederspannungsschalter A circuit arrangement for monitoring an electronic tripping device for low-voltage switch
06/03/2004DE10344854A1 Hand-held ergonomic capacitive amplifier e.g. for tracking and identifying conductor wires in telecommunications systems, has noise-signal suppression unit coupled to input terminal and receiving input signal
06/03/2004DE10342584A1 Vorrichtung zum Messen des Magnetflusses eines Synchron-Reluktanzmotors sowie sensorfreies Steuerungssystem für einen solchen An apparatus for measuring the magnetic flux of a synchronous reluctance motor and a sensor-free control system for such a
06/03/2004DE10334821A1 Halbleiterspeicherschaltung mit normalem Betriebsmodus und Burn-in-Testmodus A semiconductor memory circuit having a normal operating mode and the burn-in test mode
06/03/2004DE10334393A1 Grenzabtast-Verfahren und -Vorrichtung Boundary scan method and apparatus
06/03/2004DE10254390A1 An integrated circuit for angle and length measurements has test signal and external connections through multiplexer to circuit board with single probe point
06/03/2004DE10253865A1 Electrical range detection method for determining electrical ranges characterizing multiphase electrical equipment uses a mathematical model to determine parameters
06/03/2004DE10253051A1 Verfahren zur Ermittlung der Ladungsaufnahme einer Speicherbatterie Method for determining the charge acceptance of a storage battery
06/03/2004DE10252760A1 Internal resistance prediction method for a storage battery involves measurement of ambient temperature and battery charge conditions
06/02/2004EP1424748A2 Microelectronic contacts and assemblies
06/02/2004EP1424565A1 Method of and device for determining the transfer function of a connection on a printed circuit board
06/02/2004EP1424564A1 Method for defining a version of an electrical appliance
06/02/2004EP1424244A2 Data access method and data access apparatus for accessing data at on-vehicle information device
06/02/2004EP1424243A2 Vehicle control device with a remote control device with integrated battery and a charge of the battery monitoring device
06/02/2004EP1423872A2 Providing photonic control over wafer borne semiconductor devices
06/02/2004EP1423719A2 Method and device for monitoring a sensor unit
06/02/2004EP1423718A1 Systems and methods for monitoring and storing performance and maintenance data related to an electrical component
06/02/2004EP1423717A1 Method and device for the diagnosis of an electric system in a motor vehicle electric system
06/02/2004EP1273010B1 Method and apparatus for improving the testing, yield and performance of very large scale integrated circuits
06/02/2004EP1171934B1 A system and a method for monitoring and warning regarding the presence of manually and temporarily fitted ground connectors on high voltage conductors, as well as a warning device and a conductor means included in the system
06/02/2004CN2619355Y Relay protection live check instrument
06/02/2004CN1502045A Weighted random pattern test using pre-stored weights
06/02/2004CN1501404A Non volatile memory
06/02/2004CN1501090A Scanning device of boundary
06/02/2004CN1501089A Method and apparatus for testing electronic components
06/02/2004CN1501088A Method for determining and charactering electric quantity of multiphase electric-technic operating device
06/02/2004CN1152421C Method for testing circuit
06/01/2004US6745374 Algorithms for determining path coverages and activity
06/01/2004US6745373 Method for insertion of test points into integrated circuit logic designs
06/01/2004US6745359 Method of masking corrupt bits during signature analysis and circuit for use therewith
06/01/2004US6745358 Enhanced fault coverage
06/01/2004US6745356 Scannable state element architecture for digital circuits
06/01/2004US6745355 Semiconductor integrated circuit
06/01/2004US6745146 Automated test system and method for device having circuit and ground connections
06/01/2004US6745145 Methods and systems for enhanced automated system testing
06/01/2004US6745140 Electronic test system with test results view filter
06/01/2004US6744735 Diagnostic device, diagnostic method, and network system having diagnostic facility
06/01/2004US6744274 Programmable logic core adapter
06/01/2004US6744271 Internal generation of reference voltage
06/01/2004US6744270 Temperature-controlled thermal platform for automated testing
06/01/2004US6744269 Burn-in board with adaptable heat sink device
06/01/2004US6744268 High resolution analytical probe station
06/01/2004US6744267 Test system and methodology
06/01/2004US6744264 Testing circuit and method for MEMS sensor packaged with an integrated circuit
06/01/2004US6744260 Tester for a plurality of circuit breakers having a range of rated currents and multiple trip functions
06/01/2004US6744259 System and method for verifying failure detect circuitry in safety compliance test instruments
06/01/2004US6744257 Apparatus, a method for testing an electrical wiring system, a computer program for testing an electrical wiring system and a computer-readable storage medium having stored thereon a computer program for testing an electrical wiring system
06/01/2004US6744256 Boundary-scan testing of opto-electronic devices
06/01/2004US6744067 Wafer-level testing apparatus and method
06/01/2004US6743521 Multifunctional polymeric tissue coatings
06/01/2004US6743043 Socket for electrical parts having separable plunger