| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/10/2004 | WO2004008163A3 Assembly for connecting a test device to an object to be tested |
| 06/10/2004 | WO2003052437A3 Microprocessor-based probe for integrated circuit testing |
| 06/10/2004 | WO2003046724A3 Test circuit topology reconfiguration and utilization method |
| 06/10/2004 | WO2003046590A3 Test machine for testing an integrated circuit with a comparator |
| 06/10/2004 | US20040111689 Scan path timing optimizing apparatus determining connection order of scan path circuits to realize optimum signal timings |
| 06/10/2004 | US20040111658 Scan test circuit with reset control circuit |
| 06/10/2004 | US20040111657 Semiconductor device and method for testing the same |
| 06/10/2004 | US20040111655 Microcomputer and test method therefore |
| 06/10/2004 | US20040111572 Managing processor architected state upon an interrupt |
| 06/10/2004 | US20040111252 Method and system for emulating a design under test associated with a test environment |
| 06/10/2004 | US20040111231 Integrated circuits having post-silicon adjustment control |
| 06/10/2004 | US20040111189 Data access method and data access apparatus for accessing data at on-vehicle information device |
| 06/10/2004 | US20040110047 Functional test and demonstration apparatus for fuel cell power system |
| 06/10/2004 | US20040109600 Inspection tool with partial framing camrea |
| 06/10/2004 | US20040109464 Simultaneous bi-directional buffer including self-test circuit having function of generating input signal and self testing method of the simultaneous bi-directional buffer |
| 06/10/2004 | US20040109408 Fast protection for TDM and data services |
| 06/10/2004 | US20040109406 Facilitating communications with clustered servers |
| 06/10/2004 | US20040109368 Semiconductor integrated circuit device |
| 06/10/2004 | US20040109281 Semiconductor device having relief circuit for relieving defective portion |
| 06/10/2004 | US20040108869 Method of detecting carrier dose of a semiconductor wafer |
| 06/10/2004 | US20040108868 Device speed alteration by electron-hole pair injection and device heating |
| 06/10/2004 | US20040108867 System for and method of assessing chip acceptability and increasing yield |
| 06/10/2004 | US20040108866 Process monitor for monitoring an integrated circuit chip |
| 06/10/2004 | US20040108862 Printed wiring board, multilayer printed wiring board, and method of detecting foreign matter and voids in inner layer of multilayer printed wiring board |
| 06/10/2004 | US20040108856 Electronic battery tester |
| 06/10/2004 | US20040108855 Alternator testing device and method |
| 06/10/2004 | US20040108848 Adapter method and apparatus for interfacing a tester with a device under test |
| 06/10/2004 | US20040108847 Test apparatus with loading device |
| 06/10/2004 | US20040108846 Device for positioning an electronic test head with respect to a manipulator for manipulating electronic components, in particular integrated circuits |
| 06/10/2004 | US20040108845 Structure for detecting plug/unplug status of phone-jacks by single bit generated by a resistor network |
| 06/10/2004 | US20040108296 XeF2 gas produced by sublimation in a vacuum atmosphere decomposes and gasifies grease components and removes silicon pieces by etching; with or without water |
| 06/10/2004 | CA2452400A1 A method of diagnosing a fault on a transformer winding |
| 06/09/2004 | EP1426780A2 Semiconductor device with data ports supporting simultanous bi-directional data sampling and method for testing the same |
| 06/09/2004 | EP1426779A1 Signal sampling with clock recovery |
| 06/09/2004 | EP1426777A2 An apparatus for the determination of electrical power |
| 06/09/2004 | EP1426775A1 System consisting of a first semiconductor device and a second semiconductor device connected to the first device |
| 06/09/2004 | EP1426774A1 System consisting of a first semiconductor device and a second semiconductor device connected to the first device |
| 06/09/2004 | EP1425666A2 Module, error-tolerant system and diagnostic method |
| 06/09/2004 | EP1425594A1 Multilevel signal interface testing with binary test apparatus by emulation of multilevel signals |
| 06/09/2004 | EP1425593A1 Built-in self-testing of multilevel signal interfaces |
| 06/09/2004 | EP1342094B1 Device for electromagnetic characterisation of a tested structure |
| 06/09/2004 | EP1290520B1 System for regulating the temperature of ic-chips with a fluid whose temperature is controlled quickly by a slow response cooler and a fast response heater |
| 06/09/2004 | EP0876620B1 Method of detecting and locating a high-resistance earth fault in an electric power network |
| 06/09/2004 | DE69723547T2 Verfahren und system zur bewertung eines messverfahrens und messungsinduzierter unsicherheiten in einem serienfertigungsprozess für einzelartikel Method and system for the assessment of a measurement method and measurement uncertainty induced in a mass production process for individual items |
| 06/09/2004 | DE19703982B4 Verfahren zum Prüfen von Leiterplatten A method of testing of circuit boards |
| 06/09/2004 | DE19519453B4 Halbleiterspeicher-Testvorrichtung The semiconductor memory test apparatus |
| 06/09/2004 | DE10313872B3 Integrated circuit with testing facility provided by test circuit performing test sequence for operative circuit of IC in response to test signal |
| 06/09/2004 | DE10255804A1 Steuerungseinrichtung eines Kraftfahrzeuges mit einer batteriebetriebenen Fernbedienung Control device of a motor vehicle, having a battery-operated remote control |
| 06/09/2004 | DE10254756A1 Vorrichtung und Verfahren zur Erfassung von Stressmigrations-Eigenschaften Apparatus and method for detection of stress migration properties |
| 06/09/2004 | CN2620413Y Portable electronic apparatus with charger function |
| 06/09/2004 | CN2620285Y Power battery capacity detector for electric vehicle |
| 06/09/2004 | CN2620284Y Surge current impacting test-bed |
| 06/09/2004 | CN2620283Y Automatic fast measurer for relay |
| 06/09/2004 | CN2620282Y Monitor for failure signal of power equipment |
| 06/09/2004 | CN2620281Y Live line displaying detector for microelectronic high-voltage, ultrahigh-voltage power system |
| 06/09/2004 | CN1503911A LSI inspection method and apparatus, and LSI tester |
| 06/09/2004 | CN1503422A Leakage current detection interrupter extension cord with cord diagnostics |
| 06/09/2004 | CN1503399A Device and method for valuting recharge rate of cell |
| 06/09/2004 | CN1503391A Diagnosis device and method for fuel battery |
| 06/09/2004 | CN1503135A Method for testing output port of mainboard of computer |
| 06/09/2004 | CN1503133A Non-volatile memory chip for computer and test method thereof |
| 06/09/2004 | CN1503040A Liquid crystal display and testing method thereof |
| 06/09/2004 | CN1503000A Method for caculating circulation type of intelligent battery, method and equipment for correcting full recharge capacity to intelligent battery using said method |
| 06/09/2004 | CN1502999A Multi-accumulator group instantaneous monitor equipment |
| 06/09/2004 | CN1502998A Clamp tool for testing electrode free illumination appliances |
| 06/09/2004 | CN1502995A Inspection jig for radio frequency device ,and contact probe imcorporated in the jig |
| 06/09/2004 | CN1502970A Characteristic value calculation for welding detection |
| 06/09/2004 | CN1153326C Circuits for monitoring status of accumulator and accumulator device |
| 06/09/2004 | CN1153270C Method and device for eliminating parasitic bipolar transistor effect |
| 06/09/2004 | CN1153269C Probe card and tester using said card |
| 06/09/2004 | CN1153068C Semiconductor device having contact check circuit |
| 06/09/2004 | CN1153067C Reflection interference type longitudinal electric field detector for electro-optical organic material |
| 06/09/2004 | CN1152811C Palletization transporting device for integral circuit assembly processer and transporting mehtod thereof |
| 06/08/2004 | US6748572 Power supply network analyzing method, computer program for executing the method, storage medium and power supply network analyzing apparatus |
| 06/08/2004 | US6748564 Scan stream sequencing for testing integrated circuits |
| 06/08/2004 | US6748563 Method and apparatus for testing path delays in a high-speed boundary scan implementation |
| 06/08/2004 | US6748562 Memory tester omits programming of addresses in detected bad columns |
| 06/08/2004 | US6748549 Clocking an I/O buffer, having a selectable phase difference from the system clock, to and from a remote I/O buffer clocked in phase with the system clock |
| 06/08/2004 | US6748352 Method and apparatus for scan design using a formal verification-based process |
| 06/08/2004 | US6748335 Acquisition system for a multi-channel relatively long record length digital storage oscilloscope |
| 06/08/2004 | US6748273 Method and circuit for determining the battery status in a medical implant |
| 06/08/2004 | US6748205 Integrated circuit |
| 06/08/2004 | US6747894 Nonvolatile multilevel cell memory |
| 06/08/2004 | US6747853 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system |
| 06/08/2004 | US6747473 Device under interface card with on-board testing |
| 06/08/2004 | US6747472 Temporary device attach structure for test and burn in of microjoint interconnects and method for fabricating the same |
| 06/08/2004 | US6747471 Method and apparatus to estimate burn-in time by measurement of scribe-line devices, with stacking devices, and with common pads |
| 06/08/2004 | US6747470 Method and apparatus for on-die voltage fluctuation detection |
| 06/08/2004 | US6747469 Preconditioning integrated circuit for integrated circuit testing |
| 06/08/2004 | US6747468 Circuit trimming of packaged IC chip |
| 06/08/2004 | US6747467 Assembly apparatus and method of contactor |
| 06/08/2004 | US6747466 Substrate testing apparatus and substrate testing method |
| 06/08/2004 | US6747465 Contractor, method for manufacturing the same, and probe card using the same |
| 06/08/2004 | US6747464 Wafer holder for backside viewing, frontside probing on automated wafer probe stations |
| 06/08/2004 | US6747459 Electric arc monitoring systems |
| 06/08/2004 | US6747458 Method for monitoring the ground potential of a rectifier drive |
| 06/08/2004 | US6747457 Apparatus for and method of calculating output deterioration in secondary battery |
| 06/08/2004 | US6747456 Electro-chemical deterioration test method and apparatus |
| 06/08/2004 | US6747447 Locking apparatus and loadboard assembly |
| 06/08/2004 | US6747361 Semiconductor device and packaging method thereof |