| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/17/2004 | US20040117708 Pre-announce signaling for interconnect built-in self test |
| 06/17/2004 | US20040117707 Push button mode automatic pattern switching for interconnect built-in self test |
| 06/17/2004 | US20040117706 Semiconductor integrated circuit with test circuit |
| 06/17/2004 | US20040117705 Method and system for disabling a scanout line of a register flip-flop |
| 06/17/2004 | US20040117704 Semiconductor integrated circuit device with test circuit |
| 06/17/2004 | US20040117703 Stimulus generation |
| 06/17/2004 | US20040117702 Interface error monitor system and method |
| 06/17/2004 | US20040117698 Programmable management IO pads for an integrated circuit |
| 06/17/2004 | US20040117697 Feedback cycle detection across non-scan memory elements |
| 06/17/2004 | US20040117696 Method for testing semiconductor memory device and test circuit for semiconductor memory device |
| 06/17/2004 | US20040117692 High speed capture and averaging of serial data by asynchronous periodic sampling |
| 06/17/2004 | US20040117138 Method and apparatus providing concatenated data from multiple signal acquisition devices |
| 06/17/2004 | US20040117137 System and method of battery capacity estimation |
| 06/17/2004 | US20040115938 Method for producing a chalcogenide-semiconductor layer of the abc2 type with optical process monitoring |
| 06/17/2004 | US20040115842 Method of providing for an automated split runcard processing |
| 06/17/2004 | US20040114528 Method and system for performing a logical loopback test |
| 06/17/2004 | US20040114525 Method and system for retrieving link management interface status for a logical port |
| 06/17/2004 | US20040114517 Method and apparatus for hierarchial scheduling of virtual paths with underutilized bandwidth |
| 06/17/2004 | US20040113809 Method and apparatus for telemetered probing of integrated circuit operation |
| 06/17/2004 | US20040113668 Integrated circuit timing debug apparatus and method |
| 06/17/2004 | US20040113648 Method of exposing desired layers in a multi-layer semiconductor using focused ion beams for physical failure |
| 06/17/2004 | US20040113646 Heater-equipped pusher, electronic component handling apparatus, and temperature control method for electronic component |
| 06/17/2004 | US20040113645 Wafer level burn-in and electrical test system and method |
| 06/17/2004 | US20040113644 Probe card, e.g., for testing microelectronic components, and methods for making same |
| 06/17/2004 | US20040113643 Probe device |
| 06/17/2004 | US20040113642 Interface circuit coupling semiconductor test apparatus with tested semiconductor device |
| 06/17/2004 | US20040113640 Apparatus and method for limiting over travel in a probe card assembly |
| 06/17/2004 | US20040113639 Guarded tub enclosure |
| 06/17/2004 | US20040113638 Adjustable clamping device; support frame, circuit card, heat exchanger |
| 06/17/2004 | US20040113637 Circuit arrangement with several sensor elements in matrix circuit design |
| 06/17/2004 | US20040113633 Method of measuring dielectric constant of PCB for RIMM |
| 06/17/2004 | US20040113630 Voltage detecting circuit |
| 06/17/2004 | US20040113629 Energy store and method for determining the wear to an electrochemical energy store |
| 06/17/2004 | US20040113607 In-Line D.C. Testing of Multiple Memory Modules in a Panel Before Panel Separation |
| 06/17/2004 | US20040113605 Test device of A/D converter |
| 06/17/2004 | US20040113603 Probe cartridge assembly and multi-probe assembly |
| 06/17/2004 | US20040113590 Low battery detection on an electronic device |
| 06/17/2004 | US20040113496 Battery and electronic circuit; measuring power consumption; calibration |
| 06/17/2004 | US20040113176 Semiconductor device and method of the semiconductor device |
| 06/17/2004 | US20040112581 Burn-in oven heat exchanger having improved thermal conduction |
| 06/17/2004 | US20040112142 Test kit for semiconductor package and method for testing semiconductor package using the same |
| 06/17/2004 | DE10353848A1 Diagnosevorrichtung und Diagnoseverfahren für eine Brennstoffzelle Diagnostic apparatus and diagnostic method for a fuel cell |
| 06/17/2004 | DE10315743A1 Cable testing system for testing combined cable systems has a number of test modules to which individual cables or cable sets are connected with the module having a counter unit for monitoring its number of testing cycles |
| 06/17/2004 | DE10257330A1 High voltage cable and pipe precision sheath water penetration fault detection and location procedure compares voltages measured between sensor cable and ground cable for constant current |
| 06/17/2004 | DE10254615A1 Schnittstellenschaltung Interface circuit |
| 06/17/2004 | DE10254180A1 Car electromechanical actuator current measurement amplifier has low pass input filter and control signal controlled isolation switch |
| 06/17/2004 | CA2508517A1 Method and apparatus for monitoring fuel cell voltages |
| 06/16/2004 | EP1429440A2 Apparatus and method for calculating offset value for a current sensor |
| 06/16/2004 | EP1429251A2 Address range comparator for detection of multi size memory accesses with data matching qualification and full or partial overlap |
| 06/16/2004 | EP1429152A1 Method for predicting the internal resistance of a battery and a monitoring device for batteries |
| 06/16/2004 | EP1429151A1 Condition determination of batteries |
| 06/16/2004 | EP1429150A2 Diagnostic method for a fault in a transformer winding |
| 06/16/2004 | EP1428124A2 Method for transmitting messages between stations |
| 06/16/2004 | EP1428021A1 Biometric quality control process |
| 06/16/2004 | EP1428000A1 Apparatus for testing aramid fiber elevator cables |
| 06/16/2004 | EP1236120A4 Measurement module and system for monitoring the status of armored vehicle electronic components |
| 06/16/2004 | EP1226447B1 High resolution skew detection apparatus and method |
| 06/16/2004 | CN1505457A Printed circuit board fabrication-related device |
| 06/16/2004 | CN1505199A Remaining battery capacity computation system |
| 06/16/2004 | CN1505056A Nonvolatile semiconductor storage device and row-line short defect detection method |
| 06/16/2004 | CN1505050A 半导体集成电路器件 The semiconductor integrated circuit device |
| 06/16/2004 | CN1504883A Managing processor architected state upon an interrupt |
| 06/16/2004 | CN1504758A On-line circuit board detecting and analyzing system |
| 06/16/2004 | CN1504757A Intelligent multiple port system for cable test |
| 06/16/2004 | CN1504754A Apparatus for measuring leakage current and insulation impedance |
| 06/16/2004 | CN1154180C Method and apparatus for cooling semiconductor die |
| 06/16/2004 | CN1154051C Electric quantity reading device for intelligent cell |
| 06/16/2004 | CN1153980C Method and equipment for measuring insulation resistance |
| 06/16/2004 | CN1153977C System of measuring partial discharge using digital peak detection |
| 06/15/2004 | US6751768 Hierarchical creation of vectors for quiescent current (IDDQ) tests for system-on-chip circuits |
| 06/15/2004 | US6751767 Test pattern compression method, apparatus, system and storage medium |
| 06/15/2004 | US6751765 Method and system for determining repeatable yield detractors of integrated circuits |
| 06/15/2004 | US6751764 Method and apparatus for testing and debugging a circuit |
| 06/15/2004 | US6751763 Semiconductor device test method for optimizing test time |
| 06/15/2004 | US6751570 RF fixture electronics for testing RF devices |
| 06/15/2004 | US6751569 System and method for receiving information from a test apparatus |
| 06/15/2004 | US6751568 Method for testing characteristics of oscillators |
| 06/15/2004 | US6751565 Fast waveform display method and system |
| 06/15/2004 | US6751528 Residential circuit arc detection |
| 06/15/2004 | US6751190 Multihop nested tunnel restoration |
| 06/15/2004 | US6751079 Circuit for the detection of short voltage glitches in a supply voltage |
| 06/15/2004 | US6750672 Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same |
| 06/15/2004 | US6750671 Apparatus for testing semiconductor devices |
| 06/15/2004 | US6750670 Integrated test circuit |
| 06/15/2004 | US6750668 Vortex unit for providing a desired environment for a semiconductor process |
| 06/15/2004 | US6750666 Automated multi-chip module handler and testing system |
| 06/15/2004 | US6750663 Method and system for conducting continuity testing on analog devices having sensitive input nodes |
| 06/15/2004 | US6750662 Apparatus for localizing production errors in a photovoltaic element |
| 06/15/2004 | US6750656 Estimation of current consumption due to radio activities in GPRS |
| 06/15/2004 | US6750646 Apparatus for environmental testing of a device in situ, and method thereof |
| 06/15/2004 | US6750643 Group wiring patching system and method for wire pair identification |
| 06/15/2004 | US6750527 Semiconductor integrated circuit device having a plurality of wells, test method of testing the semiconductor integrated circuit device, and test device which executes the test method |
| 06/15/2004 | US6750416 Instrument for measuring and sorting resistors and method therefor |
| 06/15/2004 | US6750136 Contact structure production method |
| 06/10/2004 | WO2004049570A1 Selector circuit and semiconductor device |
| 06/10/2004 | WO2004049395A2 Probe station with low inductance path |
| 06/10/2004 | WO2004049164A2 Interface circuit |
| 06/10/2004 | WO2004048985A1 Device and method for detecting stress migration properties |
| 06/10/2004 | WO2004048984A1 Method for defining a version of an electrical appliance |
| 06/10/2004 | WO2004019501A3 Methods for transmitting a waveform having a controllable attenuation and propagation velocity |