| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/24/2004 | US20040122605 User interface for semiconductor evaluator |
| 06/24/2004 | US20040120203 Dynamic register with low clock rate testing capability |
| 06/24/2004 | US20040120196 Semiconductor integrated circuit device capable of shortening period required for performing data retention test |
| 06/24/2004 | US20040120192 Semiconductor memory device including power generation circuit implementing stable operation |
| 06/24/2004 | US20040120181 Semiconductor device |
| 06/24/2004 | US20040119978 Measuring a property of a layer in multilayered structure |
| 06/24/2004 | US20040119620 Method and apparatus providing multiple channel multiple instrument triggering |
| 06/24/2004 | US20040119501 Scan cell systems and methods |
| 06/24/2004 | US20040119496 Implementation of multiple flip flops as a standard cell using novel clock generation scheme |
| 06/24/2004 | US20040119493 Direct current machine monitoring system and method |
| 06/24/2004 | US20040119492 Method and apparatus for testing movement-sensitive substrates |
| 06/24/2004 | US20040119491 Multichip package test |
| 06/24/2004 | US20040119489 Apparatus and method for testing circuit modules |
| 06/24/2004 | US20040119488 Pin driver for AC and DC semiconductor device testing |
| 06/24/2004 | US20040119487 Test board for testing IC package and tester calibration method using the same |
| 06/24/2004 | US20040119486 On-wafer burn-in of semiconductor devices using thermal rollover |
| 06/24/2004 | US20040119479 Determination of a device signal response characteristic using multiple varied signals |
| 06/24/2004 | US20040119462 Semiconductor test system and method of operating the same |
| 06/24/2004 | US20040119457 Peripheral device receiver detection in a high noise environment |
| 06/24/2004 | US20040119455 Method for testing parameters of high speed data signals |
| 06/24/2004 | US20040119445 Method of and apparatus for estimating the state of charge of a battery |
| 06/24/2004 | US20040119443 Charge control circuit and method of adjusting voltage for detecting full charge of secondary battery in same |
| 06/24/2004 | US20040119441 Method for resetting a state of charge fo a battery of a hybrid electric vehicle |
| 06/24/2004 | US20040119069 Method and apparatus for optical probing of integrated circuit operation |
| 06/24/2004 | DE69531597T2 Testmethode und flipflop mit mutter- und tochtereinheit umfassender elektronischer schaltkreis Test method and flipflop with mother-and daughter unit of comprehensive electronic circuitry |
| 06/24/2004 | DE10260373A1 Arrangement for electrical energy system functional state testing uses relative deviation of state parameter of cell and/or module relative to that of other cells/modules as functional state measure |
| 06/24/2004 | DE10258034A1 Batteriezustandserkennung Battery state detection |
| 06/24/2004 | DE10256819A1 Method for testing integrated circuits employs a defined pulsating stimulation voltage in place of normal supply voltage |
| 06/24/2004 | DE10256692A1 Testing method for testing connection between semiconductor element and carrier with testing effected immediately after loading semiconductor element on carrier |
| 06/24/2004 | DE10255665A1 Measurement circuit for measuring the operating values, especially voltage, current or power of an IC, has a first circuit for measuring sequential states of a reference signal and a second circuit for measuring a clock signal |
| 06/23/2004 | EP1431771A2 Probeless testing of pad buffers on a wafer |
| 06/23/2004 | EP1431714A1 Method and device for data acquisition |
| 06/23/2004 | EP1430321A2 Electronic component |
| 06/23/2004 | EP1430320A2 Electronic component and method for measuring its qualification |
| 06/23/2004 | EP1430319A2 Electronic device |
| 06/23/2004 | EP1430318A2 Method and device for localizing a line fault |
| 06/23/2004 | EP1430317A1 Tap switch for frequency response and partial discharge measurement |
| 06/23/2004 | EP1430297A1 Method and device for controlling laminated steel sheet stacks of electrical machines in a view to detect steel sheet short-circuits |
| 06/23/2004 | EP1327249B1 Method to descramble the data mapping in memory circuits |
| 06/23/2004 | CN1507567A Data synchronizatino for a test access port |
| 06/23/2004 | CN1507148A Bandwidth-limiting analog white noise generator |
| 06/23/2004 | CN1507079A Method for producing avalanche slot optical detector and detector |
| 06/23/2004 | CN1507050A Semiconductor device with unloading circuit for removing defect part |
| 06/23/2004 | CN1507028A Testing apparatus, system and method for testing contact between semiconductor and carrier |
| 06/23/2004 | CN1507026A Method and system for observing all signals inside programmable digital IC chip |
| 06/23/2004 | CN1507007A Runcard management system and method for semiconductor manuafcture |
| 06/23/2004 | CN1506975A Memory device having page buffer with double-register |
| 06/23/2004 | CN1506883A Crosstalk detecting method |
| 06/23/2004 | CN1506694A Broken wire detecting method for voltage transformer |
| 06/23/2004 | CN1506693A Observation method of expressing leakage coefficient of asynchronous motor with fundamental variable |
| 06/23/2004 | CN1506692A IC test tool with elastic contacts |
| 06/23/2004 | CN1506691A 半导体器件及其测试方法 Semiconductor device and test methods |
| 06/23/2004 | CN1506690A Single-bit network for detecting multiple sockets |
| 06/23/2004 | CN1506671A Method of utilizing focused ion beam in exposing required layer in failure analysis of multilayer semiconductor |
| 06/23/2004 | CN1155140C Socket for integrated circuit chip |
| 06/23/2004 | CN1155070C Process for manufacturing semiconductor device |
| 06/23/2004 | CN1155069C Control system and method for semiconductor integrated circuit test process |
| 06/23/2004 | CN1155032C Classfication method for monolithic ceramic capacitors |
| 06/23/2004 | CN1154940C Configuration control in programmable logic device using non-volatile elements |
| 06/23/2004 | CN1154585C Controller for on-vehicle battery |
| 06/23/2004 | CN1154524C Wire breaking arc testing circuit for physiotherapeutic apparatus |
| 06/22/2004 | USRE38537 Self-diagnosis arrangement for a video display and method of implementing the same |
| 06/22/2004 | US6754868 Semiconductor test system having double data rate pin scrambling |
| 06/22/2004 | US6754867 Method of determining non-accessible device I/O pin speed using on chip LFSR and MISR as data source and results analyzer respectively |
| 06/22/2004 | US6754866 Testing of integrated circuit devices |
| 06/22/2004 | US6754865 Integrated circuit |
| 06/22/2004 | US6754863 Scan interface chip (SIC) system and method for scan testing electronic systems |
| 06/22/2004 | US6754862 Gaining access to internal nodes in a PLD |
| 06/22/2004 | US6754861 Circuitry for and system and substrate with circuitry for aligning output signals in massively parallel testers and other electronic devices |
| 06/22/2004 | US6754849 Method of and apparatus for testing CPU built-in RAM mixed LSI |
| 06/22/2004 | US6754763 Multi-board connection system for use in electronic design automation |
| 06/22/2004 | US6754606 Method of protecting a circuit arrangement for processing data |
| 06/22/2004 | US6754598 Calculating and estimating equivalent impedance information based on circuit and package information of large scale integrated circuit chip, calculating electromagnetic interference noise based on equivalent impedance information |
| 06/22/2004 | US6754127 Semiconductor integrated circuit device having internal synchronizing circuit responsive to test mode signal |
| 06/22/2004 | US6754125 Method and device for refreshing reference cells |
| 06/22/2004 | US6753693 Test apparatuses for semiconductor integrated circuits |
| 06/22/2004 | US6753692 Method and apparatus for testing solar panel, manufacturing method for manufacturing the solar panel, method and apparatus for inspecting solar panel generating system, insulation resistance measuring apparatus, and withstand voltage tester |
| 06/22/2004 | US6753688 Interconnect package cluster probe short removal apparatus and method |
| 06/22/2004 | US6753687 Capacitive load driving unit and method and apparatus for inspecting the same |
| 06/22/2004 | US6753684 Inspection apparatus and method adapted to a scanning technique employing a rolling wire probe |
| 06/22/2004 | US6753679 Test point monitor using embedded passive resistance |
| 06/22/2004 | US6753395 Anionic polymers composed of dicarboxylic acids and uses thereof |
| 06/22/2004 | US6753194 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 06/22/2004 | US6752643 KGD carrier and an IC mounting socket mounting it |
| 06/22/2004 | CA2341385C Projected display for portable sensor indicating the location of a detected hidden object |
| 06/22/2004 | CA2298789C Electric arc monitoring systems |
| 06/17/2004 | WO2004051773A2 Method and apparatus for monitoring fuel cell voltages |
| 06/17/2004 | WO2004051296A1 Secondary battery replacement method |
| 06/17/2004 | WO2004051295A1 Method and device for determining battery status |
| 06/17/2004 | WO2004051294A1 Method and apparatus for secure scan testing |
| 06/17/2004 | WO2004051293A1 Diagnosis system for household electric appliances |
| 06/17/2004 | WO2004051292A1 Pressing member and electronic component handling device |
| 06/17/2004 | WO2004051291A2 Method and apparatus for locating a discharge in a stator of an electrical machine |
| 06/17/2004 | WO2004051290A1 Circuit pattern inspection device and circuit pattern inspection method |
| 06/17/2004 | WO2004051066A1 Monitoring method for an actuator and corresponding driver circuit |
| 06/17/2004 | WO2004040323A3 Method and apparatus for predicting the remaining capacity of a battery in a mobile telephone |
| 06/17/2004 | WO2004038554A3 System with multiple path fail over, fail back and load balancing |
| 06/17/2004 | WO2003083904A3 Serial integrated scan-based testing of ink jet print head |
| 06/17/2004 | US20040117710 Weight compression/decompression system |
| 06/17/2004 | US20040117709 Testing methodology and apparatus for interconnects |