| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/01/2004 | US20040124863 Method and probe card configuration for testing a plurality of integrated circuits in parallel |
| 07/01/2004 | US20040124860 Automated test sequence editor and engine for transformer testing |
| 07/01/2004 | US20040124859 Semiconductor device testing apparatus, semiconductor device testing system, and semiconductor device testing method for measuring and trimming the output impedance of driver devices |
| 07/01/2004 | US20040124852 Propagation delay time measuring method and testing apparatus |
| 07/01/2004 | US20040124849 Wire test method and apparatus |
| 07/01/2004 | US20040124846 Apparatus for handling electronic components and method for controlling temperature of electronic components |
| 07/01/2004 | US20040124845 Device for compensating for heat deviation in a modular IC test handler |
| 07/01/2004 | US20040124844 Process and device for testing electric motors, in particular fan motors, for functionality |
| 07/01/2004 | US20040124843 Diagnostic method for fuel cell |
| 07/01/2004 | US20040124830 Method for analyzing defect inspection parameters |
| 07/01/2004 | US20040124827 Automatic gain control (AGC) loop for characterizing continuous-time or discrete-time circuitry gain response across frequency |
| 07/01/2004 | US20040124507 Contact structure and production method thereof |
| 07/01/2004 | US20040124358 Method for finding disconnection of conductive wires formed on plate glass and apparatus therefor |
| 07/01/2004 | US20040123994 Method and structure for suppressing EMI among electrical cables for use in semiconductor test system |
| 07/01/2004 | DE19727639B4 Handgerät/Ladeständer-Anordnung mit einer Ladekontrollanzeige Handset / charging stand arrangement with a charge indicator |
| 07/01/2004 | DE19529166B4 Rückflußdämpfungsdetektor für serielle digitale Signalquellen Rückflußdämpfungsdetektor serial digital signal sources |
| 07/01/2004 | DE10356444A1 Elektronischer Batterietester Electronic battery tester |
| 07/01/2004 | DE10351442A1 Vorrichtung und Verfahren zur Bildung einer Signatur Apparatus and method for forming a signature |
| 07/01/2004 | DE10314616B3 Integrated switching network with test switch for measurement system has activation switch incorporating SR flip flop and inverters |
| 07/01/2004 | DE10296665T5 Messung der Rückseitenspannung eines integrierten Schaltkreises Measurement of the back voltage of an integrated circuit |
| 07/01/2004 | DE10261491A1 Motor vehicle starter motor battery monitoring method in which voltage and or current across the battery and through a load are measured during an engine start process and compared with reference values |
| 07/01/2004 | DE10024875B4 Bauteilhaltersystem zur Verwendung mit Testvorrichtungen zum Testen elektronischer Bauteile Component holder system for use with test apparatus for testing electronic components |
| 06/30/2004 | EP1434058A2 Addressable port circuit for test data |
| 06/30/2004 | EP1433077A1 System and method for directing clients to optimal servers in computer networks |
| 06/30/2004 | EP1433051A1 System and method for information object routing in computer networks |
| 06/30/2004 | EP1432995A2 Remote-programming of pld modules via a boundary scan in the system |
| 06/30/2004 | EP1432546A1 Optical testing device |
| 06/30/2004 | EP1040547B1 Method and apparatus for charging a rechargeable battery |
| 06/30/2004 | EP0747986B1 Method and device for judging secondary cell to be connected to charger |
| 06/30/2004 | CN2622715Y Annular radio-frequency current sensor |
| 06/30/2004 | CN2622714Y Electronic module testing clamp with contact winding displacement |
| 06/30/2004 | CN1509479A Circuit and method for test and repair |
| 06/30/2004 | CN1509478A Test method for testing data memory |
| 06/30/2004 | CN1508901A Method for scparating secodary cell |
| 06/30/2004 | CN1508859A 集成电路测试装置 IC testing apparatus |
| 06/30/2004 | CN1508640A Magnetic-field analysing process of rotary motor |
| 06/30/2004 | CN1508559A Asynchronous motor self-paramcter on-line observing method |
| 06/30/2004 | CN1508558A Method and system for feedback circulation detection on non-scanning storage element |
| 06/30/2004 | CN1508557A Organic electroluminescent diode panel full-on measuring method |
| 06/30/2004 | CN1508556A Coupling semiconductor testing device and interface circuit of the semiconductor device to be tested |
| 06/30/2004 | CN1508554A Single-phase earthing failure line-selecting method for small-current earthing system |
| 06/30/2004 | CN1508553A Open/short circuit detecting apparatus and detecting method thereof |
| 06/30/2004 | CN1508551A Insulated casing for electroscopic earthing loop |
| 06/30/2004 | CN1155834C Static frequency-measuring method and device for classifying piezoelectric ceramic chiops and devices |
| 06/30/2004 | CN1155833C Fault-line selecting method and device for small-current earthing system |
| 06/30/2004 | CN1155816C Method for measuring complex dielectric constant of solid dielectric medium |
| 06/29/2004 | US6757856 Apparatus and method for hardware-assisted diagnosis of broken logic-test shift-registers |
| 06/29/2004 | US6757855 Integrated test apparatus and method therefor |
| 06/29/2004 | US6757844 Architecture and logic to control a device without a JTAG port through a device with a JTAG port |
| 06/29/2004 | US6757665 Detection of pump cavitation/blockage and seal failure via current signature analysis |
| 06/29/2004 | US6757634 Methods and structure for maintaining state information to resume automated test processing after reset |
| 06/29/2004 | US6757632 Method and apparatus for testing integrated circuits using a synchronization signal so that all measurements are allotted a time slot of the same length |
| 06/29/2004 | US6757209 Memory cell structural test |
| 06/29/2004 | US6757205 Device with integrated SRAM memory and method of testing such a device |
| 06/29/2004 | US6757203 Semiconductor storage device |
| 06/29/2004 | US6757047 Liquid crystal display device and testing method therefor |
| 06/29/2004 | US6756807 Modular ATE power supply architecture |
| 06/29/2004 | US6756806 Method of determining location of gate oxide breakdown of MOSFET by measuring currents |
| 06/29/2004 | US6756805 System for testing integrated circuit devices |
| 06/29/2004 | US6756804 Semiconductor integrated circuit device |
| 06/29/2004 | US6756803 Semiconductor device downsizing its built-in driver |
| 06/29/2004 | US6756801 Apparatus for electrical testing of a substrate having a plurality of terminals |
| 06/29/2004 | US6756800 Semiconductor test system with easily changed interface unit |
| 06/29/2004 | US6756797 Planarizing interposer for thermal compensation of a probe card |
| 06/29/2004 | US6756792 Apparatus for measuring parasitic capacitances on an integrated circuit |
| 06/29/2004 | US6756788 Laminated core contact detection method and system |
| 06/29/2004 | US6756787 Integrated circuit having a current measuring unit |
| 06/29/2004 | US6756786 Method for detecting line-to-ground fault location in power network |
| 06/29/2004 | US6756778 Measuring and/or calibrating a test head |
| 06/29/2004 | US6756777 Method for manufacturing smart card and identification devices and the like |
| 06/29/2004 | US6756768 Method and apparatus for computing remaining battery capacity utilizing battery discharge capacity |
| 06/29/2004 | US6756736 Remote control test apparatus |
| 06/29/2004 | US6756461 Applying to plant or the earth adjacent to plants growth-enhancing amount of biodegradable anionic polymers, including recurring polymeric subunits made up of dicarboxylic monomers such as maleic anhydride, itaconic anhydride |
| 06/29/2004 | US6756244 Interconnect structure |
| 06/24/2004 | WO2004054141A1 Integrated circuit comprising a transmission channel with an integrated independent tester. |
| 06/24/2004 | WO2004053944A2 Fast localization of electrical failures on an integrated circuit system and method |
| 06/24/2004 | WO2004053928A2 Methods of measuring integrated circuit structure and preparation thereof |
| 06/24/2004 | WO2004053780A1 Apparatus end method for detecting photon emissions from transiators |
| 06/24/2004 | WO2004053511A1 Current sensor and battery remaining power sensing system |
| 06/24/2004 | WO2004053510A1 Battery charged condition computing device and battery charged condition computing method |
| 06/24/2004 | WO2004053509A1 Method for predicting the voltage of a battery |
| 06/24/2004 | WO2004053508A1 Inspection method and inspection equipment |
| 06/24/2004 | WO2004053507A1 Voltage-application current measuring instrument and current buffer with switch used therefor |
| 06/24/2004 | WO2004038881A3 Apparatus and method for simultaneously detecting the power state of a plurality of circuit breaker switches |
| 06/24/2004 | WO2004030034A3 Test mode control circuit for reconfiguring a device pin of an integrated circuit chip |
| 06/24/2004 | US20040123208 Method and apparatus for analyzing serial data streams |
| 06/24/2004 | US20040123206 System and method for evaluating an integrated circuit design |
| 06/24/2004 | US20040123205 Signal testing of integrated circuit chips |
| 06/24/2004 | US20040123204 Methods and apparatus for testing data lines |
| 06/24/2004 | US20040123202 Mechanisms for detecting silent errors in streaming media devices |
| 06/24/2004 | US20040123200 Instruction-based built-in self-test (BIST) of external memory |
| 06/24/2004 | US20040123199 Method and apparatus for detecting an error in a bit sequence |
| 06/24/2004 | US20040123198 Method and apparatus for reducing power dissipation in latches during scan operation |
| 06/24/2004 | US20040123197 Circuit and method for testing high speed data circuits |
| 06/24/2004 | US20040123196 Enabling multiple testing devices |
| 06/24/2004 | US20040123195 Systems and methods for testing tri-state bus drivers |
| 06/24/2004 | US20040123194 Systems and methods for testing tri-state bus drivers |
| 06/24/2004 | US20040123193 Method and apparatus for enhanced parallel port JTAG interface |
| 06/24/2004 | US20040122620 Apparatus and method for testing semiconductor device |
| 06/24/2004 | US20040122613 Electro-magnetic field analysis program of electric rotating machine |