| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/07/2004 | CN1510429A Insulator diagnostic system and local discharge detecting method |
| 07/07/2004 | CN1510428A Module power supply tester |
| 07/07/2004 | CN1510427A Electric power on/off module |
| 07/07/2004 | CN1510424A 电压检测电路 A voltage detecting circuit |
| 07/07/2004 | CN1156934C Battery state monitoring circuit and battery device |
| 07/07/2004 | CN1156854C Method for functionally testing memory cells of integrated semiconductor memory |
| 07/07/2004 | CN1156709C Modelling electrical characteristics of thin film transistors |
| 07/06/2004 | US6760904 Apparatus and methods for translating test vectors |
| 07/06/2004 | US6760898 Method and system for inserting probe points in FPGA-based system-on-chip (SoC) |
| 07/06/2004 | US6760891 Simulator of dynamic circuit for silicon critical path debug |
| 07/06/2004 | US6760889 Method for converting a logic circuit model |
| 07/06/2004 | US6760876 Scan interface chip (SIC) system and method for scan testing electronic systems |
| 07/06/2004 | US6760875 Method of testing a circuit using an output vector |
| 07/06/2004 | US6760874 Test access circuit and method of accessing embedded test controllers in integrated circuit modules |
| 07/06/2004 | US6760873 Built-in self test for speed and timing margin for a source synchronous IO interface |
| 07/06/2004 | US6760871 Circuit, system and method for arranging data output by semiconductor testers to packet-based devices under test |
| 07/06/2004 | US6760680 Testing system for printing press circuit board controllers |
| 07/06/2004 | US6760625 Battery monitoring system for an implantable medical device |
| 07/06/2004 | US6760582 Method and apparatus for testing assisted position location capable devices |
| 07/06/2004 | US6760306 Method for reserving network resources using a hierarchical/segment tree for starting and ending times of request |
| 07/06/2004 | US6760277 Arrangement for generating multiple clocks in field programmable gate arrays of a network test system |
| 07/06/2004 | US6760223 Apparatus and method for contacting device with delicate light-transparent pane |
| 07/06/2004 | US6760091 Electro-optical device, inspection method therefor, and electronic equipment |
| 07/06/2004 | US6759941 Circuit for detecting electrical signals at a given frequency |
| 07/06/2004 | US6759890 Integrated semiconductor module with a bridgeable input low-pass filter |
| 07/06/2004 | US6759870 Programmable logic array integrated circuits |
| 07/06/2004 | US6759866 Semiconductor integrated circuit and a testing method thereof |
| 07/06/2004 | US6759865 Array of dice for testing integrated circuits |
| 07/06/2004 | US6759864 System and method for testing integrated circuits by transient signal analysis |
| 07/06/2004 | US6759863 Wireless radio frequency technique design and method for testing of integrated circuits and wafers |
| 07/06/2004 | US6759862 Method and apparatus for evaluating a set of electronic components |
| 07/06/2004 | US6759860 Semiconductor device package substrate probe fixture |
| 07/06/2004 | US6759858 Integrated circuit test probe having ridge contact |
| 07/06/2004 | US6759856 Testing integrated circuits and integrated power transistors |
| 07/06/2004 | US6759855 Device for monitoring and forecasting the probability of inductive proximity sensor failure |
| 07/06/2004 | US6759854 Test apparatus for testing devices under test and method for transmitting a test signal |
| 07/06/2004 | US6759853 Automated domain reflectometry testing system |
| 07/06/2004 | US6759851 Method and apparatus for control and fault detection of an electric load circuit |
| 07/06/2004 | US6759850 System and method for non-contact electrical testing employing a CAM derived reference |
| 07/06/2004 | US6759849 Battery tester configured to receive a removable digital module |
| 07/06/2004 | US6759832 Device for detecting a battery condition based on variations in batter voltage |
| 07/06/2004 | US6759830 Method of precisely estimating effective full-charge capacity of secondary battery |
| 07/06/2004 | US6759765 Sag generator with plurality of switch technologies |
| 07/06/2004 | US6759259 Device and method for nondestructive inspection on semiconductor device |
| 07/06/2004 | US6759258 Connection device and test system |
| 07/06/2004 | US6759257 Structure and method for embedding capacitors in z-connected multi-chip modules |
| 07/06/2004 | US6759152 Rechargeable battery equipped with battery protection circuit |
| 07/06/2004 | US6757972 Method of forming socket contacts |
| 07/06/2004 | CA2294665C Communication element and communication apparatus using the same |
| 07/06/2004 | CA2268764C Method and apparatus for inspecting spark plug while spark plug is installed in engine |
| 07/01/2004 | WO2004056003A1 Cable-testing adapter |
| 07/01/2004 | WO2004055599A1 Resistor structures to electrically measure unidirectional misalignment of stitched masks |
| 07/01/2004 | WO2004055536A1 Remaining power-detecting system for battery, remaining power-calculating device, and current-detecting device |
| 07/01/2004 | WO2004055535A1 Method and circuit arrangement for the measurement of electrochemical cells in a serial circuit |
| 07/01/2004 | WO2004055534A1 Self-marking device for an integrated circuit, and associated housed integrated circuit |
| 07/01/2004 | WO2004055533A1 Automatic test equipment pin channel with t-coil compensation |
| 07/01/2004 | WO2004055532A1 Timing generation circuit and semiconductor test device having the timing generation circuit |
| 07/01/2004 | WO2004055531A1 Position sensing device, position sensing method, and electronic component transferring device |
| 07/01/2004 | WO2004055530A1 Guarded tub enclosure |
| 07/01/2004 | WO2004055529A1 Emi measuring method and its system |
| 07/01/2004 | WO2004055528A2 Apparatus and method for electrical characterization of semiconductors |
| 07/01/2004 | WO2004044600A3 Characterizing analog and digital telephone circuits and other types of wiring systems using frequency domain reflectometry (fdr) |
| 07/01/2004 | WO2004044599A3 Retrofit kit for interconnect cabling system |
| 07/01/2004 | WO2004023579A3 Battery test outputs adjusted based upon battery temperature and the state of discharge of the battery |
| 07/01/2004 | WO2004021466A3 Fuel cell with a regulated output |
| 07/01/2004 | WO2003107020A3 Integrated battery service system |
| 07/01/2004 | WO2003107019A3 A digital system and method for testing analogue and mixed-signal circuits or systems |
| 07/01/2004 | US20040128675 Software-hardware welding system |
| 07/01/2004 | US20040128635 Semiconductor integrated circuit device |
| 07/01/2004 | US20040128630 Optimization of die yield in a silicon wafer "sweet spot" |
| 07/01/2004 | US20040128603 Device for testing the conformity of an electronic connection |
| 07/01/2004 | US20040128602 Direct memory access with error correction |
| 07/01/2004 | US20040128601 Arrangements for self-measurement of I/O specifications |
| 07/01/2004 | US20040128600 Built-in self-test hierarchy for an integrated circuit |
| 07/01/2004 | US20040128599 Decompressor/PRPG for applying pseudo-random and deterministic test patterns |
| 07/01/2004 | US20040128598 Integrated circuit device including a scan test circuit and methods of testing the same |
| 07/01/2004 | US20040128596 Method and apparatus for testing embedded cores |
| 07/01/2004 | US20040128595 Compliance testing through test equipment |
| 07/01/2004 | US20040128591 On-chip jitter testing |
| 07/01/2004 | US20040128115 Hierarchical power supply noise monitoring device and system for very large scale integrated circuits |
| 07/01/2004 | US20040128110 Field transmitter with diagnostic self-test mode |
| 07/01/2004 | US20040128089 Circuit and method for determining battery impedance increase with aging |
| 07/01/2004 | US20040128088 Method of analyzing the time-varying electrical response of a stimulated target substance |
| 07/01/2004 | US20040128086 Circuit and method for monitoring battery state of charge |
| 07/01/2004 | US20040127075 Socket |
| 07/01/2004 | US20040127074 Interconnect assemblies and methods |
| 07/01/2004 | US20040126909 Method and apparatus for analyzing composition of defects |
| 07/01/2004 | US20040125930 Identification of an integrated circuit from its physical manufacture parameters |
| 07/01/2004 | US20040125675 Semiconductor device verification system and method |
| 07/01/2004 | US20040125667 Semiconductor memory device and method for testing the same |
| 07/01/2004 | US20040124999 Capacitive motor sensor |
| 07/01/2004 | US20040124990 In-use unambiguously determining the near-end-of-life state of a combustion engine battery |
| 07/01/2004 | US20040124903 On chip logic analyzer debug bus |
| 07/01/2004 | US20040124902 Resistance calibration circuit in semiconductor device |
| 07/01/2004 | US20040124881 Scan cell designs for a double-edge-triggered flip-flop |
| 07/01/2004 | US20040124870 Method and apparatus for testing a motor |
| 07/01/2004 | US20040124869 Multiple testing bars for testing liquid crystal display and method thereof |
| 07/01/2004 | US20040124867 Tfi probe i/o wrap test method |
| 07/01/2004 | US20040124866 Semiconductor testing device |
| 07/01/2004 | US20040124864 System and method for providing high RF signal isolation and low common ground inductance in an RF circuit testing environment |