| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/13/2004 | US6763487 IC with latching and switched I/O buffers |
| 07/13/2004 | US6763486 Method and apparatus of boundary scan testing for AC-coupled differential data paths |
| 07/13/2004 | US6763485 Position independent testing of circuits |
| 07/13/2004 | US6763484 Body bias using scan chains |
| 07/13/2004 | US6763079 Semiconductor device allowing easy confirmation of operation of built in clock generation circuit |
| 07/13/2004 | US6763032 Cable modem system with sample and packet synchronization |
| 07/13/2004 | US6762993 DCME system with circuit switching capability |
| 07/13/2004 | US6762967 Semiconductor memory device having a circuit for fast operation |
| 07/13/2004 | US6762966 Method and circuit to investigate charge transfer array transistor characteristics and aging under realistic stress and its implementation to DRAM MOSFET array transistor |
| 07/13/2004 | US6762617 Semiconductor device having test mode entry circuit |
| 07/13/2004 | US6762616 Probe system |
| 07/13/2004 | US6762615 Parallel test board used in testing semiconductor memory devices |
| 07/13/2004 | US6762614 Systems and methods for facilitating driver strength testing of integrated circuits |
| 07/13/2004 | US6762613 Testing system and method of operation therefor including a test fixture for electrical testing of semiconductor chips above a thermal threshold temperature of an interlayer dielectric material |
| 07/13/2004 | US6762611 Test configuration and test method for testing a plurality of integrated circuits in parallel |
| 07/13/2004 | US6762608 Apparatus and method for testing fuses |
| 07/13/2004 | US6762607 Electrostatic discharges and transient signals monitoring system and method |
| 07/13/2004 | US6762598 Method for providing optical test signals for electronic meter testing |
| 07/13/2004 | US6762597 Structure, system, and method for assessing electromigration permeability of layer material within interconnect |
| 07/13/2004 | US6762590 Battery power source device and current detection method therefor |
| 07/13/2004 | US6762486 Test circuit and multi-chip package type semiconductor device having the test circuit |
| 07/13/2004 | US6762434 Electrical print resolution test die |
| 07/13/2004 | US6761526 Picking apparatus for semiconductor device test handler |
| 07/08/2004 | WO2004057501A2 Method and system for implementing circuit simulators |
| 07/08/2004 | WO2004057357A1 Connecting multiple test access port controllers through a single test access port |
| 07/08/2004 | WO2004057356A1 Device and method for creating a signature |
| 07/08/2004 | WO2004057355A1 A method and apparatus for inspection of high frequency and microwave hybrid circuits and printed circuit boards |
| 07/08/2004 | WO2004057354A1 Semiconductor test instrument |
| 07/08/2004 | WO2004057353A1 Semiconductor device and method for testing the same |
| 07/08/2004 | WO2004057352A1 Method of inducing a state in a hardware emulation circuit |
| 07/08/2004 | WO2004057351A1 Measuring method for deciding direction to a flickering source |
| 07/08/2004 | WO2004057350A1 Circuit pattern inspection instrument and pattern inspecting method |
| 07/08/2004 | WO2004008157A3 Event pipeline and summing method and apparatus for event based test system |
| 07/08/2004 | WO2001084600A8 Process perturbation to measured-modeled method for semiconductor device technology modeling |
| 07/08/2004 | US20040133867 Automatic design system for wiring on LSI, and method for wiring on LSI |
| 07/08/2004 | US20040133862 Capacitance parameters calculation method for MOSFET and program therefor |
| 07/08/2004 | US20040133834 Lsi inspection method and apparatus, and ls1 tester |
| 07/08/2004 | US20040133833 Apparatus for selecting test patterns for logic circuit, computer implemented method for selecting test patterns, and computer program product for controlling a computer system so as to select test patterns |
| 07/08/2004 | US20040133832 Semiconductor device and method for testing such a device |
| 07/08/2004 | US20040133831 Semiconductor device and method and apparatus for testing such a device |
| 07/08/2004 | US20040133830 Semiconductor device with speed binning test circuit and test method thereof |
| 07/08/2004 | US20040133825 Path delay measuring circuitry |
| 07/08/2004 | US20040133409 Method and system for design verification |
| 07/08/2004 | US20040133375 Method to provide a calibrated path for multi-signal cables in testing of integrated circuits |
| 07/08/2004 | US20040133374 System for providing a calibrated path for multi-signal cables in testing of integrated circuits |
| 07/08/2004 | US20040132222 Probe card for semiconductor wafers and method and system for testing wafers |
| 07/08/2004 | US20040131198 Noise measurement apparatus and noise measuring cable |
| 07/08/2004 | US20040130957 Method and circuit to investigate charge transfer array transistor characteristics and aging under realistic stress and its implementation to dram mosfet array transistor |
| 07/08/2004 | US20040130556 Method of controlling display brightness of portable information device, and portable information device |
| 07/08/2004 | US20040130454 Thermostatic controller and circuit tester |
| 07/08/2004 | US20040130355 High-voltage detecting circuit |
| 07/08/2004 | US20040130354 Method and device for monitoring the function of an output stage having pulse width modulation |
| 07/08/2004 | US20040130345 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 07/08/2004 | US20040130344 Systems and methods for testing receiver terminations in integrated circuits |
| 07/08/2004 | US20040130343 High density cantilevered probe for electronic devices |
| 07/08/2004 | US20040130341 Method and apparatus for measuring three-dimensional distribution of electric field |
| 07/08/2004 | US20040130334 Timing markers used in the measurement and testing of a printed circuit board's controlled impedance |
| 07/08/2004 | US20040130329 Method for testing a transformer and corresponding test device |
| 07/08/2004 | US20040130328 Hybrid type sensor for detecting high frequency partial discharge |
| 07/08/2004 | US20040130327 Ground circuit impedance measurement apparatus and method |
| 07/08/2004 | US20040130326 Ground-fault detecting device and insulation resistance measuring device |
| 07/08/2004 | US20040130325 Method of diagnosing a motor vehicle battery |
| 07/08/2004 | US20040130313 Method for reducing pin overhead in non-scan design for testability |
| 07/08/2004 | US20040130312 Composite motion probing |
| 07/08/2004 | US20040130297 Method for determining the amount of charge which can still be drawn from an energy storage battery, and an energy storage battery |
| 07/08/2004 | US20040130296 Method and assembly for determining the output capacity of a battery |
| 07/08/2004 | DE19962703B4 Verfahren und Vorrichtung zum Steuern des Beladens/Entladens von Halbleiterbauelementen Method and apparatus for controlling the loading / unloading of semiconductor devices |
| 07/08/2004 | DE19837933B4 Verfahren zur phasenrichtigen Erfassung eines Erdschlusses in einem mehrphasigen Drehstromnetz Method for in-phase detection of an earth fault in a polyphase three-phase system |
| 07/08/2004 | DE19743709B4 IC-Testgerät IC tester |
| 07/08/2004 | DE19604764B4 Halbleiterspeichereinrichtung und Verfahren zum Auswählen einer Wortleitung in einer Halbleiterspeichereinrichtung A semiconductor memory device and method for selecting a word line in a semiconductor memory device |
| 07/08/2004 | DE19510990B4 Fehleranalysator für ein IC-Testgerät und Verfahren zur Fehleranalyse Error analyzer for IC testing apparatus and method for error analysis |
| 07/08/2004 | DE10358642A1 Diagnoseverfahren für eine Brennstoffzelle Diagnostic method for a fuel cell |
| 07/08/2004 | DE10354939A1 Verfahren zur Zuverlässigkeitsprüfung A method for reliability testing |
| 07/08/2004 | DE10258511A1 Integrierte Schaltung sowie zugehörige gehäuste integrierte Schaltung Integrated circuit and associated packaged integrated circuit |
| 07/08/2004 | DE10258471A1 Cable harness testing and transport device for cable harness testing prior to vehicle installation, comprises plug frames into which cable harness plugs are connected for delivery of test data and power via a test unit |
| 07/08/2004 | DE10255378A1 Teststruktur zum Bestimmen der Stabilität elektronischer Vorrichtungen die miteinander verbundene Substrate umfassen For determining the stability of electronic devices include test structure, the substrates interconnected |
| 07/08/2004 | DE10123154B4 Halbleitervorrichtungs-Prüfvorrichtung und Verfahren zum Prüfen einer Halbleitervorrichtung The semiconductor device testing apparatus and method for testing a semiconductor device |
| 07/07/2004 | EP1435645A2 Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober |
| 07/07/2004 | EP1435524A1 Battery sensor device |
| 07/07/2004 | EP1435523A2 Method of and apparatus for setting battery alarm voltage in battery management server |
| 07/07/2004 | EP1435005A2 A digital system and a method for error detection thereof |
| 07/07/2004 | EP1435004A2 Test circuit |
| 07/07/2004 | EP0979389B1 Cable tray assembly for testing device |
| 07/07/2004 | EP0805460B1 Integrated circuit having a built-in selft-test arrangement |
| 07/07/2004 | CN2624507Y A motor with rotation indicator |
| 07/07/2004 | CN2624498Y Intelligent indicating charger |
| 07/07/2004 | CN2624419Y Alarm accumulator |
| 07/07/2004 | CN2624216Y Automatic earth fault dectector for highvoltage line |
| 07/07/2004 | CN2624215Y Intelligent digital display pocket leakage current protector detecting instrument |
| 07/07/2004 | CN1511323A Dynamic memory and method for testing dynamic memory |
| 07/07/2004 | CN1511285A Hierarchical built-in self-test for system-on-chip design |
| 07/07/2004 | CN1511264A Electrical component measuring instrument |
| 07/07/2004 | CN1511263A Apparatus and method for testing circuit modules |
| 07/07/2004 | CN1511262A Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium |
| 07/07/2004 | CN1511246A Device and method for substrate displacement detection |
| 07/07/2004 | CN1510981A Gauging point setting method for high-frequency differential signal |
| 07/07/2004 | CN1510751A Semiconductor devices |
| 07/07/2004 | CN1510731A Testing method for substandard products of integrated circuits |
| 07/07/2004 | CN1510431A Motor winding welding and coil resistance testing method and system |
| 07/07/2004 | CN1510430A Photoelectric characteristic measuring method and apparatus for organic light emitting diodes |