| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/20/2004 | US6766267 Automated monitoring system, virtual oven and method for stress testing logically grouped modules |
| 07/20/2004 | US6766266 Testing device and testing method for semiconductor integrated circuits |
| 07/20/2004 | US6766226 Method of monitoring utility lines with aircraft |
| 07/20/2004 | US6765864 Technique for providing dynamic modification of application specific policies in a feedback-based, adaptive data network |
| 07/20/2004 | US6765863 Network system |
| 07/20/2004 | US6765414 Low frequency testing, leakage control, and burn-in control for high-performance digital circuits |
| 07/20/2004 | US6765401 Semiconductor testing apparatus for conducting conduction tests |
| 07/20/2004 | US6765398 Conductive material for integrated circuit fabrication |
| 07/20/2004 | US6765397 Apparatus and method for testing land grid array modules |
| 07/20/2004 | US6765396 Method, apparatus and software for testing a device including both electrical and optical portions |
| 07/20/2004 | US6765390 Diagnostic wiring verification tester |
| 07/20/2004 | US6765389 Method of computing AC impedance of an energy system |
| 07/20/2004 | US6765388 Assessing a parameter of cells in the batteries of uninterruptable power supplies |
| 07/20/2004 | US6765378 Test handler apparatus for SMD (surface mount devices), BGA (ball grid arrays) and CSP (chip scale packages) |
| 07/20/2004 | US6765228 Bonding pad with separate bonding and probing areas |
| 07/20/2004 | US6765203 Pallet assembly for substrate inspection device and substrate inspection device |
| 07/20/2004 | US6764869 Method of assembling and testing an electronics module |
| 07/20/2004 | US6764866 System and method for qualifying multiple device under test (DUT) test head |
| 07/20/2004 | US6763581 Method for manufacturing spiral contactor |
| 07/20/2004 | US6763578 Method and apparatus for manufacturing known good semiconductor die |
| 07/17/2004 | CA2455276A1 Physical layers |
| 07/15/2004 | WO2004059558A1 Continuous data retrieving device |
| 07/15/2004 | WO2004059334A1 Programmable logic analyzer data analyzing method |
| 07/15/2004 | WO2004059333A1 Evaluation device and circuit design method used for the same |
| 07/15/2004 | WO2004059332A1 An ic transfer device |
| 07/15/2004 | WO2004059331A2 Apparatus and method for limiting over travel in a probe card assembly |
| 07/15/2004 | WO2004059329A1 Adapter for testing conductor arrangements |
| 07/15/2004 | WO2004059328A2 Composite motion probing |
| 07/15/2004 | WO2004058539A1 Display for checking connector of automobile |
| 07/15/2004 | US20040139406 Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits |
| 07/15/2004 | US20040139377 Method and apparatus for compact scan testing |
| 07/15/2004 | US20040139369 Device and method for converting a diagnostic interface to spi standard |
| 07/15/2004 | US20040138856 Method for analyzing final test parameters |
| 07/15/2004 | US20040138855 Robust power-on meter and method |
| 07/15/2004 | US20040138852 Fault assessment using fractional failure rates |
| 07/15/2004 | US20040138848 Testing card |
| 07/15/2004 | US20040138845 Chip design verifying and chip testing apparatus and method |
| 07/15/2004 | US20040138841 Method and apparatus for detecting an unused state in a semiconductor circuit |
| 07/15/2004 | US20040138837 Method of measuring motor constant for induction motor |
| 07/15/2004 | US20040138836 Apparatus and method for calculating offset value for an electric sensor |
| 07/15/2004 | US20040137774 Socket for electrical parts |
| 07/15/2004 | US20040137767 IC socket for a fine pitch IC package |
| 07/15/2004 | US20040136129 Electric parts drive circuit |
| 07/15/2004 | US20040135696 Method of and apparatus for setting battery alarm voltage in battery management server |
| 07/15/2004 | US20040135596 Electrical inspection method and method of fabricating semiconductor display devices |
| 07/15/2004 | US20040135595 Methods, systems, and devices for burn-in testing of optoelectronic devices |
| 07/15/2004 | US20040135593 Fabrication method of semiconductor integrated circuit device and its testing apparatus |
| 07/15/2004 | US20040135591 Method for automatically changing current ranges |
| 07/15/2004 | US20040135589 Welding system and method utilizing a ground integrity monitor |
| 07/15/2004 | US20040135582 Method for determining the wear to a storage battery, and a monitoring device |
| 07/15/2004 | US20040135581 Method and system for determining the buffer action of a battery |
| 07/15/2004 | US20040135570 Hand-held, ergonomic capacitive amplifier and hand-held tone generator to be used in conjunction with the capacitive amplifier |
| 07/15/2004 | US20040135231 An arrangement for testing semiconductor chips while incorporated on a semiconductor wafer |
| 07/15/2004 | US20040135177 Semiconductor integrated circuit having a scan test |
| 07/15/2004 | US20040135057 Machine shoe for the suppport of machines and a method |
| 07/15/2004 | US20040134979 Semiconductor device and an information management system therefore |
| 07/15/2004 | DE69629766T2 Schnell versagendes, funktionell versagendes fehlertolerantes Mehrprozessorsystem Quick-failing, a failing functional fault-tolerant multiprocessor system |
| 07/15/2004 | DE60100754T2 System und verfahren zum testen von signalverbindungen unter verwendung einer eingebauten selbsttestfunktion System and method for testing signal interconnections using a built-in self-test function |
| 07/15/2004 | DE60004628T2 Bestimmung eines Systemmodells für Fehlererkennung und Lokalisierung, insbesondere in Rechnersystemen Determining a system model for fault detection and localization, particularly in computer systems |
| 07/15/2004 | DE19957289B4 Verfahren zum Steuern von Laden und Entladen einer Batteriegruppe A method for controlling charging and discharging of a battery pack |
| 07/15/2004 | DE19581814B4 Halbleiter-Testchip mit waferintegrierter Schaltmatrix Semiconductor wafer test chip with integrated switching matrix |
| 07/15/2004 | DE19533103B4 Schaltungsanordnung zum Betrieb einer Entladungslampe Circuit arrangement for operating a discharge lamp |
| 07/15/2004 | DE10344021A1 Non-volatile memory device e.g. NAND-type flash memory, has memory cell array and gating circuit connected by page buffer whose main and auxiliary registers are controlled by operation of transistor |
| 07/15/2004 | DE10343227A1 System und Verfahren zum Testen eines Schaltungsaufbaus unter Verwendung einer extern erzeugten Signatur System and method for testing a circuit configuration using an externally generated signature |
| 07/15/2004 | DE10302451B3 Earthing connection recognition method for 3-phase network using evaluation of charge curve obtained by integration of current from voltage zero transition and zero voltage limit value point |
| 07/15/2004 | DE10300051A1 Verfahren und Vorrichtung zum Testen von Elektromotoren insbesondere Lüftermotoren auf Funktionsfähigkeit Method and device for testing of electric motors in particular fan motors for functionality |
| 07/15/2004 | DE10261848A1 Auto-transformer protection circuit testing method in which a test earth short circuit is formed in the multi-phase auto-transformer to enable checking of the operation of a current differential protection arrangement |
| 07/15/2004 | DE10260177A1 Verfahren und Vorrichtung zur Datenerfassung Method and apparatus for data collection |
| 07/15/2004 | DE10256456A1 Überwachungsverfahren für einen Aktor und zugehörige Treiberschaltung Monitoring method for an actuator and associated driver circuit |
| 07/15/2004 | DE10216786B4 Verfahren und Vorrichtung zur Konditionierung von Halbleiterwafern und/oder Hybriden Method and device for conditioning semiconductor wafers and / or hybrids |
| 07/15/2004 | DE10039928B4 Vorrichtung zum automatisierten Testen, Kalibrieren und Charakterisieren von Testadaptern Apparatus for automated testing, calibrating and characterizing test adapters |
| 07/15/2004 | CA2511394A1 Programmable logic analyzer data analyzing method |
| 07/14/2004 | EP1437600A1 Circuit and method for ground fault detection |
| 07/14/2004 | EP1436822A1 Smart awa |
| 07/14/2004 | EP1436798A2 Method and apparatus for luminance compensation for emissive displays |
| 07/14/2004 | EP1436692A2 Interface architecture for embedded field programmable gate array cores |
| 07/14/2004 | EP1436636A1 Method and apparatus for sub-micron imaging and probing on probe station |
| 07/14/2004 | EP1129408B1 Microcomputer with test instruction memory |
| 07/14/2004 | EP1040358B1 A memory test system with a means for test sequence optimisation and a method of its operation |
| 07/14/2004 | EP0979415B1 Manipulator with expanded range of motion |
| 07/14/2004 | EP0772784B1 A method of and a system for moving a measuring means above a test object |
| 07/14/2004 | EP0739482B1 Battery capacity indicator |
| 07/14/2004 | EP0653072B1 Apparatus for automatic testing of complex devices |
| 07/14/2004 | CN2626013Y Circuit for testing EEPROM |
| 07/14/2004 | CN2625911Y Highly sensitive IC plate testing fixture apparatus |
| 07/14/2004 | CN2625910Y Video image array signal line detector |
| 07/14/2004 | CN2625909Y On-line detecting device for highvoltage line insulator dirtiness |
| 07/14/2004 | CN2625211Y Real time monitor and acousto-optic alarm apparatus of car battery |
| 07/14/2004 | CN1513219A Socket connector and contact for use in socket connector |
| 07/14/2004 | CN1512560A Scanning design with nano-scanning design test cost and test vector input method |
| 07/14/2004 | CN1512556A Contactor for detecting ball grid array package chip in semiconductor |
| 07/14/2004 | CN1512511A Management of unusable block in non-volatile memory system |
| 07/14/2004 | CN1512189A Key detector and method |
| 07/14/2004 | CN1512140A Data access method and device for vehicle carried information equipment access data |
| 07/14/2004 | CN1157845C Non-synchronous motor parameter identification method |
| 07/14/2004 | CN1157791C Semiconductor storage device and method for fetch said device in test pattern |
| 07/14/2004 | CN1157775C Testing of semiconductor device and fabrication process of semiconductor device |
| 07/14/2004 | CN1157739C Memory test set |
| 07/13/2004 | US6763489 Method for scan testing of digital circuit, digital circuit for use therewith and program product for incorporating test methodology into circuit description |
| 07/13/2004 | US6763488 Generator/compactor scan circuit low power adapter with counter |