| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/27/2004 | US6768360 Timing signal generation circuit and semiconductor test device with the same |
| 07/27/2004 | US6768349 Multiple-output arbitrary waveform generator and mixed lsi tester |
| 07/27/2004 | US6768333 Test circuit for input-to-output speed measurement |
| 07/27/2004 | US6768332 Semiconductor wafer and testing method for the same |
| 07/27/2004 | US6768331 Wafer-level contactor |
| 07/27/2004 | US6768326 SiC photodiode detectors for radiation detection applications |
| 07/27/2004 | US6768324 Semiconductor device tester which measures information related to a structure of a sample in a depth direction |
| 07/27/2004 | US6768323 System and method for determining location of extrusion in interconnect |
| 07/27/2004 | US6768319 Adaptive compensation of measurement error for industrial process control transmitters |
| 07/27/2004 | US6768313 Method for detecting tracking short |
| 07/27/2004 | US6768310 Method and device for detecting a current |
| 07/27/2004 | US6768309 Electronic battery condition tester |
| 07/27/2004 | US6768297 High speed VLSI digital tester architecture for real-time output timing acquisition, results accumulation, and analysis |
| 07/27/2004 | US6768292 Arrangement and method having a data word generator for testing integrated circuits |
| 07/27/2004 | US6768289 Charge/discharge protection circuit with latch circuit for protecting a charge control FET from overheating in a portable device |
| 07/27/2004 | US6768288 Circuit for detecting low battery condition on an electronic device with a changing load |
| 07/27/2004 | US6768198 Method and system for removing conductive lines during deprocessing |
| 07/27/2004 | US6768133 Semiconductor device, test method for semiconductor device, and tester for semiconductor device |
| 07/27/2004 | US6767236 Socket for electrical parts |
| 07/27/2004 | US6767221 IC socket module |
| 07/27/2004 | US6767219 Contactor, method for manufacturing such contactor, and testing method using such contactor |
| 07/27/2004 | US6766996 Manipulator |
| 07/22/2004 | WO2004062170A2 Field transmitter with diagnostic self-test mode |
| 07/22/2004 | WO2004062010A1 Apparatus and method for predicting the remaining discharge time of a battery |
| 07/22/2004 | WO2004061602A2 Method and apparatus for testing embedded cores |
| 07/22/2004 | WO2004061465A1 Semiconductor test device |
| 07/22/2004 | WO2004061463A1 Method and structure for suppressing emi among electrical cables for use in semiconductor test system |
| 07/22/2004 | WO2004061459A2 Circuit and method for testing high speed data circuits |
| 07/22/2004 | WO2004008158A3 Nestless plunge mechanism for semiconductor testing |
| 07/22/2004 | WO2003089941A3 Semiconductor test system with easily changed interface unit |
| 07/22/2004 | US20040143803 Simulated voltage contrast image generator and comparator |
| 07/22/2004 | US20040143802 Method and apparatus for generating test pattern for integrated circuit design |
| 07/22/2004 | US20040143783 Method and apparatus for generating and verifying libraries for ATPG tool |
| 07/22/2004 | US20040143782 Semiconductor integrated circuit and test system for testing the same |
| 07/22/2004 | US20040143422 Filter characteristic measuring method and system |
| 07/22/2004 | US20040143411 Test handling apparatus and method |
| 07/22/2004 | US20040143410 Method and apparatus to dynamically recalibrate VLSI chip thermal sensors through software control |
| 07/22/2004 | US20040142666 Determination of transmitter distortion |
| 07/22/2004 | US20040142499 Wafer-level testing apparatus and method |
| 07/22/2004 | US20040141531 Cross link multiplexer bus |
| 07/22/2004 | US20040141497 Cross link multiplexer bus configured to reduce cross-talk |
| 07/22/2004 | US20040140826 Method for detecting the reliability of integrated semiconductor components at high temperatures |
| 07/22/2004 | US20040140825 Apparatus and method for electrical testing of electrical circuits |
| 07/22/2004 | US20040140823 Test system, test contactor, and test method for electronic modules |
| 07/22/2004 | US20040140821 Test PCB and contactor for testing of electronic device |
| 07/22/2004 | US20040140820 Probing method and prober |
| 07/22/2004 | US20040140819 Differential voltage probe |
| 07/22/2004 | US20040140818 Circuit and method for determining at least one voltage, current and/or power value for an integrated circuit |
| 07/22/2004 | US20040140817 Current measuring circuit for measuring drive current to load |
| 07/22/2004 | US20040140794 Wafer probing test apparatus and method of docking the test head and probe card thereof |
| 07/22/2004 | US20040140466 Semiconductor device that can measure timing difference between input and output signals |
| 07/22/2004 | US20040139756 Apparatus and method for controlling the temperature of an electronic device under test |
| 07/22/2004 | DE29724824U1 Circuit for voltage state detection and indication, e.g. for medium and high voltage switching systems |
| 07/22/2004 | DE19526435B4 Schaltungsanordnung zur Fehlerstromerkennung Circuit arrangement for current detection error |
| 07/22/2004 | DE10342572A1 Verfahren und Vorrichtung zum elektrischen Charakterisieren von Tunnel-Junktion-Filmstapeln mit geringem oder ohne Prozessieren Method and apparatus for characterizing the electrical tunnel Junktion film stacks with little or no processing |
| 07/22/2004 | DE10260894A1 Verfahren und Schaltungsanordnung zur Vermessung von elektrochemischen Zellen in einer Serienverschaltung Method and circuit arrangement for the measurement of electrochemical cells in a series connection |
| 07/22/2004 | DE10260238A1 Adapter zum Testen von Leiterplatten Adapter for testing printed circuit boards |
| 07/22/2004 | DE10256588A1 Verfahren und Vorrichtung zur Batteriezustandserkennung Method and apparatus for battery state identification |
| 07/22/2004 | DE10107441B4 Verfahren zum Charakterisieren von Frequenzumsetzungsvorrichtungen Method for characterizing frequency conversion devices |
| 07/22/2004 | DE10107180B4 Testsystem zur Funktionsprüfung eines Halbleiterbauelements auf einem Wafer undVerwendung des Testsystems Test system for testing the function of a semiconductor device on a wafer undVerwendung of the test system |
| 07/22/2004 | DE10106556B4 Halbleiterbaustein mit einer Anordnung zum Selbsttest einer Mehrzahl von Interfaceschaltungen und Verwendung des Halbleiterbausteins in einem Testverfahren A semiconductor device comprising means for self-testing a plurality of interface circuits and use of the semiconductor device in a test procedure |
| 07/22/2004 | DE10019612B4 Verfahren zur Diagnose des Schaltzustandes und der Belastung eines Halbleiterschalters A method of diagnosis of the switching state and the load of a semiconductor switch |
| 07/21/2004 | EP1439719A1 Method for testing an appliance comprising an audio port and respective appliance |
| 07/21/2004 | EP1439548A1 Module for high-voltage installation |
| 07/21/2004 | EP1439399A2 Procedure and apparatus for determining the condition of a vehicle battery |
| 07/21/2004 | EP1439398A1 Scan chain arrangement |
| 07/21/2004 | EP1439397A2 Method of performing a burn-in |
| 07/21/2004 | EP1439396A2 Method for the analysis and monitoring of the partial discharge behavior of an electrical operating means |
| 07/21/2004 | EP1438662A2 Error detection on programmable logic resources |
| 07/21/2004 | EP1438598A1 Loop impedance meter |
| 07/21/2004 | EP1438597A2 Testing circuits on substrates |
| 07/21/2004 | EP1438595A1 Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring |
| 07/21/2004 | EP1438591A1 Coaxial tilt pin fixture for testing high frequency circuit boards |
| 07/21/2004 | EP1238288B1 Battery sensor device |
| 07/21/2004 | EP1234189B1 Multi-layered electronic parts |
| 07/21/2004 | EP1200963A4 Testing rambus memories |
| 07/21/2004 | EP0702239B1 A controller for implementing scan testing |
| 07/21/2004 | CN2627538Y Image signal supply circuit and electrooptical panel |
| 07/21/2004 | CN2627517Y Improved 58 probes tool structure |
| 07/21/2004 | CN1515074A Integrated circuit and method for testing integrated circuit |
| 07/21/2004 | CN1514939A Circuit pattern inspection device, circuit pattern inspection method, and recording medium |
| 07/21/2004 | CN1514491A Layered power source noise monitoring device of ultra large scale integrated circuit and system |
| 07/21/2004 | CN1514489A Temperature compensating device of module type integrated circuit test processor |
| 07/21/2004 | CN1514257A Detecting equipment of photoelectric charatcteristics of organic luminuous diode |
| 07/21/2004 | CN1514256A Teletron modulating characteristics sampling testing instrument |
| 07/21/2004 | CN1514231A Integrated vision imaging and electronic detecting and checking system |
| 07/21/2004 | CN1158783C Portable multi-band communication device and method for determining charge consumption thereof |
| 07/21/2004 | CN1158736C Automatic pole exchanging circuit with current detecting feedback function |
| 07/21/2004 | CN1158671C 信号发生器 Signal Generator |
| 07/21/2004 | CN1158535C Detection method of load impedance angle of AC motor |
| 07/20/2004 | US6766501 System and method for high-level test planning for layout |
| 07/20/2004 | US6766487 Divided scan path with decode logic receiving select control signals |
| 07/20/2004 | US6766486 Joint test action group (JTAG) tester, such as to test integrated circuits in parallel |
| 07/20/2004 | US6766485 Integrated circuit fault tester, integrated circuit fault test method and recording medium recorded with fault test control program |
| 07/20/2004 | US6766484 Method and apparatus for fully characterizing propagation delay through an n-input circuit |
| 07/20/2004 | US6766483 Semiconductor test apparatus |
| 07/20/2004 | US6766473 Test pattern selection apparatus for selecting test pattern from a plurality of check patterns |
| 07/20/2004 | US6766452 Method of checking the authenticity of an electric circuit arrangement |
| 07/20/2004 | US6766392 Electronic apparatus, control circuit for electronic apparatus, and method of controlling electronic apparatus |
| 07/20/2004 | US6766274 Determining the failure rate of an integrated circuit |