| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/03/2004 | US6771092 Non-contact mobile charge measurement with leakage band-bending and dipole correction |
| 08/03/2004 | US6771090 Indexing rotatable chuck for a probe station |
| 08/03/2004 | US6771089 Test fixture having an adjustable capacitance and method for testing a semiconductor component |
| 08/03/2004 | US6771088 Method and apparatus for testing semiconductor devices using the back side of a circuit board |
| 08/03/2004 | US6771087 System and method for testing integrated circuit modules |
| 08/03/2004 | US6771086 Semiconductor wafer electrical testing with a mobile chiller plate for rapid and precise test temperature control |
| 08/03/2004 | US6771083 Poole-frenkel piezoconductive element and sensor |
| 08/03/2004 | US6771079 Automobile multi-purpose DC source protection monitor |
| 08/03/2004 | US6771078 Apparatus and method for fault detection on conductors |
| 08/03/2004 | US6771077 Method of testing electronic devices indicating short-circuit |
| 08/03/2004 | US6771076 Method and apparatus for measurement of length of cable having fixed impedance |
| 08/03/2004 | US6771073 Microprocessor-based hand-held electrical-testing system and method |
| 08/03/2004 | US6771062 Apparatus for supporting and manipulating a testhead in an automatic test equipment system |
| 08/03/2004 | US6771061 High speed tester with narrow output pulses |
| 08/03/2004 | US6771060 Testing circuits on substrates |
| 08/03/2004 | US6771048 Battery state monitoring circuit |
| 08/03/2004 | US6770985 In-vehicle electric load drive/controlling device incorporating power MOSFET thermal protection |
| 08/03/2004 | US6770906 Semiconductor reliability test chip |
| 08/03/2004 | US6770847 Method and system for Joule heating characterization |
| 08/03/2004 | US6770496 Method of testing electronic devices |
| 08/03/2004 | US6770495 Method for revealing active regions in a SOI structure for DUT backside inspection |
| 08/03/2004 | US6769963 IC handler and contact cleaning method |
| 07/29/2004 | WO2004063949A2 Method and system for computer-assisted testing of a machine system |
| 07/29/2004 | WO2004063758A2 Semiconductor test system storing pin calibration data, commands and other data in non-volatile memory |
| 07/29/2004 | WO2004063756A1 Method and apparatus for detecting an unused state in a semiconductor circuit |
| 07/29/2004 | WO2004063738A2 Battery monitoring system and method |
| 07/29/2004 | WO2004015540A3 Wireless local on metropolitan area network with intrusion detection features and related methods |
| 07/29/2004 | US20040148580 On-chip receiver sensitivity test mechanism |
| 07/29/2004 | US20040148554 Accelerated scan circuitry and method for reducing scan test data volume and execution time |
| 07/29/2004 | US20040148553 Scan controller and integrated circuit including such a controller |
| 07/29/2004 | US20040148549 Method for using an alternate performance test to reduce test time and improve manufacturing yield |
| 07/29/2004 | US20040148480 Virtual to physical memory address mapping within a system having a secure domain and a non-secure domain |
| 07/29/2004 | US20040148153 Memory rewind and reconstruction for hardware emulator |
| 07/29/2004 | US20040148128 Methods and apparatus for inspecting centerplane connectors |
| 07/29/2004 | US20040148123 Semiconductor device having a test circuit for testing an output circuit |
| 07/29/2004 | US20040148122 Method for testing signal paths between an integrated circuit wafer and a wafer tester |
| 07/29/2004 | US20040148118 Method for testing an appliance comprising an audio port, and a respective appliance |
| 07/29/2004 | US20040148111 Embedded integrated circuit aging sensor System |
| 07/29/2004 | US20040146132 Radio frequency built-in self test for quality monitoring of local oscillator and transmitter |
| 07/29/2004 | US20040146097 Characterizing jitter of repetitive patterns |
| 07/29/2004 | US20040146005 Protection switching apparatus and method using node group in ring ATM system |
| 07/29/2004 | US20040145953 Semiconductor memory device reduced in power consumption during burn-in test |
| 07/29/2004 | US20040145939 Non-volatile semiconductor storage device and production method thereof |
| 07/29/2004 | US20040145937 Semiconductor integrated circuit device having flip-flops that can be reset easily |
| 07/29/2004 | US20040145838 Method and apparatus for control and fault detection of a remote electrical motor |
| 07/29/2004 | US20040145733 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool |
| 07/29/2004 | US20040145718 Pad coating system and interlock method thereof |
| 07/29/2004 | US20040145486 Utility power line cable selector system |
| 07/29/2004 | US20040145464 Safety device |
| 07/29/2004 | US20040145387 Integrated monitoring burn-in test method for multi-chip package |
| 07/29/2004 | US20040145386 Probe needle test apparatus and method |
| 07/29/2004 | US20040145385 Multipoint plane measurement probe and methods of characterization and manufacturing using same |
| 07/29/2004 | US20040145384 Circuitry And Methodology To Establish Correlation Between Gate Dielectric Test Site Reliability and Product Gate Reliability |
| 07/29/2004 | US20040145383 Apparatus and method for contacting of test objects |
| 07/29/2004 | US20040145381 Test fixture for die-level testing of planar lightwave circuits |
| 07/29/2004 | US20040145380 Automatic test equipment pin channel with T-coil compensation |
| 07/29/2004 | US20040145376 Network for facilitating determination of one or more characteristics of signal propagated via transmission line |
| 07/29/2004 | US20040145375 Input-output circuit and a testing apparatus |
| 07/29/2004 | US20040145374 Automatic hi-pot, megohmeter and continuity, circuit tester |
| 07/29/2004 | US20040145372 Ground fault detection circuit detecting whether a switching regulator's power output node is grounded |
| 07/29/2004 | US20040145371 Query based electronic battery tester |
| 07/29/2004 | DE202004003941U1 Portable switching console for checking the electrical circuits of motor vehicle trailers, has a front side angled to the operator with switches for connecting and testing individual circuits |
| 07/29/2004 | DE10301827A1 Power semiconductor measurement arrangement for measuring chips still contained within a wafer, whereby a wafer support has individual recesses in which testing needles are inserted to ensure they are precisely positioned |
| 07/29/2004 | DE10301823A1 Battery available charge determination method, in which the charge remaining up to a defined limit is determined using a mathematical model of the battery, the inputs to which are determined from battery operating values |
| 07/29/2004 | DE10301529A1 Verfahren und Vorrichtung zur Ermittlung des Zustands einer Fahrzeugbatterie Method and apparatus for determining the state of a vehicle battery |
| 07/29/2004 | DE10301124A1 Universal measurement system, for adapting or contacting of different semiconductor package types, comprises an adapter for connecting a package matched socket to a standard PGA (pin grid array) socket |
| 07/29/2004 | DE10300539A1 Schaltung und Verfahren zur Erfassung von Isolationsfehlern Circuit and method of detecting insulation faults, |
| 07/29/2004 | DE10300532A1 Socket or adapter for use in semiconductor component testing systems, especially for memory component testing, is designed to permit solder-free mounting on a contact assembly |
| 07/29/2004 | DE10297088T5 Mehrplateau-Batterieaufladeverfahren und -system zum Aufladen zum zweiten Plateau More Platforms-Batterieaufladeverfahren and system for charging a second plateau |
| 07/29/2004 | CA2456283A1 Automatic hi-pot, megohmeter and continuity, circuit tester |
| 07/28/2004 | EP1441439A1 Analogue amplifier with multiplexing capability |
| 07/28/2004 | EP1441296A2 Methods and apparatus for verifying the operation of a circuit design |
| 07/28/2004 | EP1441233A1 Method and apparatus for inspecting wire breaking of an integrated circuit |
| 07/28/2004 | EP1441232A2 Method for connecting electronic components |
| 07/28/2004 | EP1440529A1 System and method for information object routing in computer networks |
| 07/28/2004 | EP1440379A1 Admission control system for home video servers |
| 07/28/2004 | EP1440328A2 Method and apparatus for calibration and validation of high performance dut power supplies |
| 07/28/2004 | EP1440324A2 Electronic component with output buffer control |
| 07/28/2004 | EP1440323A2 Method and device for phase calculation from attenuation values using a hilbert transform for reflectometric measurements in the frequency domain |
| 07/28/2004 | EP1015899B1 A method and apparatus for application of weighted random patterns to partial scan designs |
| 07/28/2004 | CN2629047Y Computer testing electric machine system |
| 07/28/2004 | CN2629046Y Element tester for printed circuit board |
| 07/28/2004 | CN1516812A Input/output circuit and test apparatus |
| 07/28/2004 | CN1516811A Open-loop for waveform acquisition |
| 07/28/2004 | CN1516255A 半导体集成电路及其检查方法 Semiconductor integrated circuit and inspection methods |
| 07/28/2004 | CN1516199A Semiconductor storage device with testing and redundant function |
| 07/28/2004 | CN1159767C Photoeletric conversion integrated circuit device |
| 07/28/2004 | CN1159757C Device for connection of test head and probe board in substrate-testing system |
| 07/28/2004 | CN1159595C Auto-lock type continuity check unit |
| 07/28/2004 | CN1159594C Horizontal transfer test handler |
| 07/27/2004 | US6769101 Systems and methods providing scan-based delay test generation |
| 07/27/2004 | US6769083 Test pattern generator, a testing device, and a method of generating a plurality of test patterns |
| 07/27/2004 | US6769082 Delay device, semiconductor testing device, semiconductor device, and oscilloscope |
| 07/27/2004 | US6769080 Scan circuit low power adapter with counter |
| 07/27/2004 | US6769039 Data processing apparatus with circuit for confirming normality of serial transmission data |
| 07/27/2004 | US6768960 System for and method of performing device-oriented tests |
| 07/27/2004 | US6768953 Test apparatus |
| 07/27/2004 | US6768952 System and method of measuring low impedances |
| 07/27/2004 | US6768951 Apparatus and method for measuring a parameter in a host device |
| 07/27/2004 | US6768653 Mount structure |