| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/05/2004 | US20040153793 Method and apparatus for testing embedded memory on devices with multiple processor cores |
| 08/05/2004 | US20040153788 System, method, and user interface for acceptance testing |
| 08/05/2004 | US20040153773 Diagnosing faults in electronic machines |
| 08/05/2004 | US20040153762 Hardware driven state save/restore in a data processing system |
| 08/05/2004 | US20040153747 Fault tolerant computer |
| 08/05/2004 | US20040153732 Semiconductor memory device having a test circuit |
| 08/05/2004 | US20040153626 Semiconductor device and a method for checking state transition thereof |
| 08/05/2004 | US20040153282 Device and method for substrate displacement detection |
| 08/05/2004 | US20040153276 Method and apparatus for reduced pin count package connection verification |
| 08/05/2004 | US20040153271 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process |
| 08/05/2004 | US20040153264 Automatic wire dielectric analyzer |
| 08/05/2004 | US20040153183 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process |
| 08/05/2004 | US20040153182 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process |
| 08/05/2004 | US20040153181 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process |
| 08/05/2004 | US20040153180 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process |
| 08/05/2004 | US20040153179 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process |
| 08/05/2004 | US20040152351 Group wiring device for facilitating wire pair identification |
| 08/05/2004 | US20040152348 Socket for mating with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component |
| 08/05/2004 | US20040152347 Socket assembly for test of integrated circuit, and its integrated circuit and tester |
| 08/05/2004 | US20040152222 Method of assessing lateral dopant and/or charge carrier profiles |
| 08/05/2004 | US20040152220 Method of making a monitoring pattern to measure a depth and a profile of a shallow trench isolation |
| 08/05/2004 | US20040151956 Operation state determining apparatus and method for fuel cell |
| 08/05/2004 | US20040151113 Adaptive transmit window control mechanism for packet transport in a universal port or multi-channel environment |
| 08/05/2004 | US20040151037 Test method for testing a data memory |
| 08/05/2004 | US20040151017 Test circuit for memory |
| 08/05/2004 | US20040150760 Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same |
| 08/05/2004 | US20040150490 Interface apparatus for integrated circuit testing |
| 08/05/2004 | US20040150469 Analogue amplifier with multiplexing capability |
| 08/05/2004 | US20040150441 Semiconductor device having PPL-circuit |
| 08/05/2004 | US20040150419 Semiconductor integrated circuit |
| 08/05/2004 | US20040150418 Burn-in board having an indirect fuse |
| 08/05/2004 | US20040150416 Probe station thermal chuck with shielding for capacitive current |
| 08/05/2004 | US20040150415 Test circuit and multi-chip package type semiconductor device having the test circuit |
| 08/05/2004 | US20040150414 Test circuit and multi-chip package type semiconductor device having the test circuit |
| 08/05/2004 | US20040150409 Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium |
| 08/05/2004 | US20040150407 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process |
| 08/05/2004 | US20040150406 Method for prediction of the internal resistance of an energy storage battery, and a monitoring device for energy storage batteries |
| 08/05/2004 | US20040150405 Method and apparatus for monitoring fuel cell voltages |
| 08/05/2004 | US20040150388 Testing method for a printed circuit board formed with conductive traces for high-frequency diferential signal transmission |
| 08/05/2004 | US20040150386 Power measurement mechanism for a transformer coupled plasma source |
| 08/05/2004 | US20040150383 Electrical component measuring instrument |
| 08/05/2004 | US20040150370 Method for detecting slow and small changes of electrical signals |
| 08/05/2004 | US20040150368 Electric charging apparatus, electronic apparatus, residual battery capacity detection method and battery residual capacity display control method |
| 08/05/2004 | US20040150090 Test circuit and multi-chip package type semiconductor device having the test circuit |
| 08/05/2004 | US20040150089 Test circuit and multi-chip package type semiconductor device having the test circuit |
| 08/05/2004 | US20040150007 Semiconductor integrated circuit device |
| 08/05/2004 | US20040149051 Pressure point detector |
| 08/05/2004 | DE69724742T2 Speicherfeldprüfschaltung mit Fehlermeldung Speicherfeldprüfschaltung with error message |
| 08/05/2004 | DE19801557B4 Kontakt-Prüfschaltung in einer Halbleitereinrichtung Contact check circuit in a semiconductor device |
| 08/05/2004 | DE10327234A1 Integrierte Halbleiterschaltung und Testsystem zum Testen derselben A semiconductor integrated circuit and test system for testing the same |
| 08/05/2004 | DE10304234A1 Insulation resistance measuring device, for electrical power system of e.g. electric or hybrid vehicle, has two measurement resistances between traction battery poles connected to main power supply |
| 08/05/2004 | DE10302531A1 Electric motor operating parameters measurement method, especially for measuring rotor impacts, whereby measurement units are positioned to simultaneously detect impacts in two orthogonal directions |
| 08/05/2004 | DE10297010T5 Elektrisch leitende Kontakteinheit Electrically conductive contact unit |
| 08/05/2004 | DE102004004008A1 Verfahren zur Erkennung einer defekten Batterie oder eines batterielosen Zustands in einem Kfz-Bordnetz Method for detecting a defective battery or a battery-free condition in a vehicle electrical system |
| 08/05/2004 | DE102004002417A1 Kontaktstellenbeschichtungssystem und Verriegelungsverfahren dafür Contact points coating system and locking method therefor |
| 08/05/2004 | DE10134215B4 Verfahren zum Umschalten von einem ersten Betriebszustand einer integrierten Schaltung zu einem zweiten Betriebszustand der integrierten Schaltung und integrierte Schaltung mit einer Schaltungsanordnung zum Umschalten A method of switching from a first operational state of an integrated circuit to a second operating state of the integrated circuit and integrated circuit with a circuit arrangement for switching |
| 08/05/2004 | CA2513877A1 Condition detection and indicating means for a storage battery |
| 08/04/2004 | EP1443401A2 Progressive extended compression mask for dynamic trace |
| 08/04/2004 | EP1443340A2 Method of recognising a defective car battery |
| 08/04/2004 | EP1443339A1 Method and apparatus for performing simultaneous testing of integrated circuits |
| 08/04/2004 | EP1443338A1 Secure test arrangement |
| 08/04/2004 | EP1443337A2 Electro-optic measuring instrument |
| 08/04/2004 | EP1443336A2 Method of detecting a branch with an earth fault |
| 08/04/2004 | EP1442310A2 Hardware filtering of unsolicited grant service extended headers |
| 08/04/2004 | EP1442309A2 Method and circuit for detecting a fault of semiconductor circuit elements and use thereof in electronic regulators of braking force and of dynamics movement of vehicles |
| 08/04/2004 | EP1442308A2 Impedance stabilization network for determining the electromagnetic interfering radiation of a modem |
| 08/04/2004 | EP1442307A2 Method and system for compensating thermally induced motion of probe cards |
| 08/04/2004 | EP1247112B1 Circuit arrangement for simulation of the input or output load of an analogue circuit |
| 08/04/2004 | EP1188117B1 Method of discriminating between different types of scan failures, a computer implemented circuit simulation and fault detection system |
| 08/04/2004 | EP1145018B1 Test head manipulator |
| 08/04/2004 | EP1125116A4 Apparatus and method for detecting memory effect in nickel-cadmium batteries |
| 08/04/2004 | EP0866980B1 Method for inspecting an integrated circuit |
| 08/04/2004 | EP0792462B1 Probe card assembly and method of using the same |
| 08/04/2004 | CN2630861Y Electric field capacitation type power line failure indicating device |
| 08/04/2004 | CN2630860Y DC system insulating monitoring instrument |
| 08/04/2004 | CN2630859Y Cable measuring intelligent multi-terminal device |
| 08/04/2004 | CN2630858Y Centre shared base |
| 08/04/2004 | CN2630856Y Electromagnetic drive device |
| 08/04/2004 | CN1518789A Synchronous macine |
| 08/04/2004 | CN1518743A Method for characterizing active track and latch sense-amp (comparator) in one time programmable (OTP) salicided poly fuse array |
| 08/04/2004 | CN1518086A Testing mode control device using nonvolatile ferroeletric storage |
| 08/04/2004 | CN1518005A Semiconductor memory of reducing power dissipation when ageing test |
| 08/04/2004 | CN1518004A Method of testing SDRAM device |
| 08/04/2004 | CN1517713A Workpiece checkout system |
| 08/04/2004 | CN1517666A Measuring device and method for electric machine |
| 08/04/2004 | CN1517153A Pad coating system and its interlocking method |
| 08/04/2004 | CN1160738C Intergrated storage unit having storage cells and reference unit |
| 08/04/2004 | CN1160737C Semiconductor memory testing apparatus |
| 08/03/2004 | US6772387 Cyclic redundancy checking of a field programmable gate array having an SRAM memory architecture |
| 08/03/2004 | US6772382 Driver for integrated circuit chip tester |
| 08/03/2004 | US6772381 Programmable logic device verification system and method |
| 08/03/2004 | US6772380 Smart tester and method for testing a bus connector |
| 08/03/2004 | US6772077 Electric arc monitoring systems |
| 08/03/2004 | US6771806 Multi-pixel methods and apparatus for analysis of defect information from test structures on semiconductor devices |
| 08/03/2004 | US6771805 Perspective viewing inspection system |
| 08/03/2004 | US6771725 Multi-pair gigabit ethernet transceiver |
| 08/03/2004 | US6771601 Network switch having source port queuing and methods, systems and computer program products for flow level congestion control suitable for use with a network switch having source port queuing |
| 08/03/2004 | US6771558 Semiconductor memory device |
| 08/03/2004 | US6771491 Battery pack |
| 08/03/2004 | US6771093 Implementing reference current measurement mode within reference array programming mode or reference array erase mode in a semiconductor |