| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/11/2004 | EP1299739B1 System and method for testing integrated circuits |
| 08/11/2004 | EP1287369B1 System and method for diagnosing fault conditions associated with powering an electrical load |
| 08/11/2004 | EP1232399B1 High-speed failure capture apparatus and method for automatic test equipment |
| 08/11/2004 | EP1224479A4 Built-in spare row and column replacement analysis system for embedded memories |
| 08/11/2004 | EP0990150B1 Detecting a bad cell in a storage battery |
| 08/11/2004 | EP0975984B1 Diagnosis of electrical consumers in a motor vehicle |
| 08/11/2004 | CN2632683Y Improved measuring probe devices |
| 08/11/2004 | CN1520553A Device for and method of storing identification data in integrated circuit |
| 08/11/2004 | CN1520329A Inductive sensory appts. |
| 08/11/2004 | CN1520195A Method for testing appliance comprising audio port, and respective appliance |
| 08/11/2004 | CN1520109A Protective exchanging appts. and method utilizing node group in annular ATM system |
| 08/11/2004 | CN1519973A Charger and electronic device and detection method for cell residual and diplaying control method |
| 08/11/2004 | CN1519907A Carrier of holding and electrical contact individual separated wafer |
| 08/11/2004 | CN1519577A Analog amplifier having multiplex function |
| 08/11/2004 | CN1519576A Circuit under test, integrated circuit and testing method thereof |
| 08/11/2004 | CN1519575A Circuit under test, integrated circuit and testing method thereof |
| 08/11/2004 | CN1519574A Semiconductor device and its testing method |
| 08/11/2004 | CN1519573A Integrated circuit device including scan test circuit and methods of testing same |
| 08/11/2004 | CN1519572A Transportation mechanism, mobile probe board transportation appts. using same, and detector thereof |
| 08/11/2004 | CN1519571A Special support for testing pins |
| 08/11/2004 | CN1519570A Measured reault displaying system for printed circuit substrate, and measured result displaying method |
| 08/11/2004 | CN1519569A Method for checking linewidth of power wire in wiring overall arrangement |
| 08/11/2004 | CN1519568A Base of hand operated cam for fina test of liquid crystal module (LCM) |
| 08/11/2004 | CN1519567A Automated test system |
| 08/11/2004 | CN1161832C Manufacture of semiconductor device |
| 08/11/2004 | CN1161692C Circuit board arrangement |
| 08/10/2004 | US6775809 Technique for determining performance characteristics of electronic systems |
| 08/10/2004 | US6775798 Fast sampling test bench |
| 08/10/2004 | US6775797 Method of testing an integrated circuit having a flexible timing control |
| 08/10/2004 | US6775646 Excitation signal and radial basis function methods for use in extraction of nonlinear black-box behavioral models |
| 08/10/2004 | US6775637 Test method and apparatus for source synchronous signals |
| 08/10/2004 | US6775636 Automated testing of hybrid actuator |
| 08/10/2004 | US6775635 System and method for measuring amplifier gain in a digital network |
| 08/10/2004 | US6775634 Tuning chart for devices under test |
| 08/10/2004 | US6775240 System and methods for measuring quality of communications over packet networks |
| 08/10/2004 | US6775119 Electrical connection system for vehicle |
| 08/10/2004 | US6774987 Surface inspection method, surface inspection apparatus, and recording medium and data signal for providing surface inspection program |
| 08/10/2004 | US6774958 Liquid crystal panel, apparatus for inspecting the same, and method of fabricating liquid crystal display thereof |
| 08/10/2004 | US6774785 Front panel light system for an electronic instrument which indicates the operating condition of the front panel lights and selected portions of the instrument |
| 08/10/2004 | US6774680 Comparator including a differential transistor pair and a diode arrangement |
| 08/10/2004 | US6774664 Method for automated measurement of the ohmic rotor resistance of an asynchronous machine |
| 08/10/2004 | US6774663 Circuit for the detection of a defective power supply connection |
| 08/10/2004 | US6774662 In-line D.C. testing of multiple memory modules in a panel before panel separation |
| 08/10/2004 | US6774661 Initial contact method of preventing an integrated circuit chip from being thermally destroyed, in a tester, due to a defective pressed joint |
| 08/10/2004 | US6774660 Evaluating pattern for measuring an erosion of a semiconductor wafer polished by a chemical mechanical polishing |
| 08/10/2004 | US6774657 Apparatus and method of inspecting semiconductor integrated circuit |
| 08/10/2004 | US6774656 Self-test for leakage current of driver/receiver stages |
| 08/10/2004 | US6774655 Semiconductor device, method of testing the semiconductor device, and semiconductor integrated circuit |
| 08/10/2004 | US6774654 Semiconductor-device inspecting apparatus and a method for manufacturing the same |
| 08/10/2004 | US6774650 Probe card and method of testing wafer having a plurality of semiconductor devices |
| 08/10/2004 | US6774649 Test system for conducting a function test of a semiconductor element on a wafer, and operating method |
| 08/10/2004 | US6774648 Apparatus and methods for optically detecting defects in voltage contrast test structures |
| 08/10/2004 | US6774647 Noninvasive optical method and system for inspecting or testing CMOS circuits |
| 08/10/2004 | US6774639 Partial discharge monitoring system for transformers |
| 08/10/2004 | US6774636 Method and apparatus for determining the state of charge of a lithium-ion battery |
| 08/10/2004 | US6774621 Inspection stage having a plurality of Z axes |
| 08/10/2004 | US6773938 Probe card, e.g., for testing microelectronic components, and methods for making same |
| 08/10/2004 | US6773934 Method for releasable contact-connection of a plurality of integrated semiconductor modules on a wafer |
| 08/10/2004 | CA2197475C System for monitoring a dual voltage ungrounded system |
| 08/05/2004 | WO2004066562A1 Data transmission apparatus |
| 08/05/2004 | WO2004066529A1 Optical transmission apparatus having path trace function |
| 08/05/2004 | WO2004066413A2 Condition detection and indicating means for a storage battery |
| 08/05/2004 | WO2004066378A1 Probe device with optical length-measuring device and method of inspecting probe |
| 08/05/2004 | WO2004065972A1 Laser beam inspection equipment |
| 08/05/2004 | WO2004055528A3 Apparatus and method for electrical characterization of semiconductors |
| 08/05/2004 | WO2004046741A8 Jtag testing arrangement |
| 08/05/2004 | WO2004025698A3 Circuit and method for accurately applying a voltage to a node of an integrated circuit |
| 08/05/2004 | WO2004005943A3 Frequency domain reflectometry system for testing wires and cables utilizing in-situ connectors, passive connectivity, cable fray detection, and live wires testing |
| 08/05/2004 | US20040153978 Cost-effective scan architecture and a test application scheme for scan testing with non-scan test power and test application cost |
| 08/05/2004 | US20040153932 System and method for using IDDQ pattern generation for burn-in tests |
| 08/05/2004 | US20040153931 Built-in self-test for multi-channel transceivers without data alignment |
| 08/05/2004 | US20040153930 Method of generating test pattern for integrated circuit |
| 08/05/2004 | US20040153929 Control of tristate buses during scan test |
| 08/05/2004 | US20040153928 Hierarchically-controlled automatic test pattern generation |
| 08/05/2004 | US20040153926 Method and apparatus for testing asynchronous set/reset faults in a scan-based integrated circuit |
| 08/05/2004 | US20040153924 Nonvolatile memory microcomputer chip, and a method for testing the nonvolatile memory microcomputer chip |
| 08/05/2004 | US20040153923 Method and apparatus of reloading erroneous configuration data frames during configuration of programmable logic devices |
| 08/05/2004 | US20040153921 Test method and architecture for circuits having inputs |
| 08/05/2004 | US20040153920 Semiconductor test system having multitasking algorithmic pattern generator |
| 08/05/2004 | US20040153919 Signal pin tester for AC defects in integrated circuits |
| 08/05/2004 | US20040153918 Tamper-resistant computer program product |
| 08/05/2004 | US20040153917 Method for detecting defectives in an integrated circuit |
| 08/05/2004 | US20040153916 Apparatus and method for testing integrated circuits using weighted pseudo-random test patterns |
| 08/05/2004 | US20040153915 Resetting latch circuits within a functional circuit and a test wrapper circuit |
| 08/05/2004 | US20040153908 System and method for controlling information exchange, privacy, user references and right via communications networks communications networks |
| 08/05/2004 | US20040153890 Delay management system |
| 08/05/2004 | US20040153887 Digital bus monitor integrated circuits |
| 08/05/2004 | US20040153876 Scanning a protocol signal into an IC for performing a circuit operation |
| 08/05/2004 | US20040153864 Device for aiding the locating of failure of a complex system |
| 08/05/2004 | US20040153860 Circuit with expected data memory coupled to serial input lead |
| 08/05/2004 | US20040153857 Fault-tolerant computer system, re-synchronization method thereof and re-synchronization program thereof |
| 08/05/2004 | US20040153838 System and method for multiple cycle capture of chip state |
| 08/05/2004 | US20040153836 Progressive extended compression mask for dynamic trace |
| 08/05/2004 | US20040153822 Method and system for reporting standardized and verified data |
| 08/05/2004 | US20040153820 Method for storing register properties in a datastructure and related datastructure |
| 08/05/2004 | US20040153819 Method to assist identification of a defective functional unit in a technical system |
| 08/05/2004 | US20040153806 Technique for testability of semiconductor integrated circuit |
| 08/05/2004 | US20040153801 Semiconductor integrated circuit and method for testing same |
| 08/05/2004 | US20040153797 Programmatic time-gap defect detection apparatus and method |
| 08/05/2004 | US20040153795 Analog voltage output driver LSI chip having test circuit |