| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/18/2004 | CN1521513A Error portion detecting method ,layout method and programme for semiconductor integrated circuit |
| 08/18/2004 | CN1521512A Assembly for lsi test and method for the test |
| 08/18/2004 | CN1521511A Implement method for system voltage anomaly test |
| 08/18/2004 | CN1521498A Inspecting an array of electronic components |
| 08/18/2004 | CN1163043C Display unit and electronic machine using the same and detecting method of the same |
| 08/18/2004 | CN1162863C Device for weighting cell resistances in magnetoresistive memory |
| 08/18/2004 | CN1162748C Device and method for predicting cell output voltage of digital camera |
| 08/18/2004 | CN1162715C Method and equipment for positioning failure point of power transmission line |
| 08/18/2004 | CN1162711C Instrument for measuring voltages of cell |
| 08/18/2004 | CN1162707C Detecting head for high-frequency measurement |
| 08/17/2004 | US6779160 Apparatus, method and pattern for evaluating semiconductor device characteristics |
| 08/17/2004 | US6779144 Semiconductor integrated circuit device and method of testing it |
| 08/17/2004 | US6779143 Asynchronous testing of reset operation in an integrated circuit |
| 08/17/2004 | US6779142 Apparatus and method for interfacing a high speed scan-path with slow-speed test equipment |
| 08/17/2004 | US6779140 Algorithmically programmable memory tester with test sites operating in a slave mode |
| 08/17/2004 | US6779139 Circuit for reducing test time and semiconductor memory device including the circuit |
| 08/17/2004 | US6779138 Highly reliable distributed system |
| 08/17/2004 | US6779133 IC with two state machines connected to serial scan path |
| 08/17/2004 | US6778934 Automatic measuring apparatus, automatic measurement data processing and control apparatus, network system, and recording medium of automatic measurement processing and control program that selects from a plurality of test conditions |
| 08/17/2004 | US6778932 Apparatus and method for testing snow removal equipment |
| 08/17/2004 | US6778931 Test and measurement instrument having multi-channel telecommunications mask testing capability |
| 08/17/2004 | US6778913 Multiple model systems and methods for testing electrochemical systems |
| 08/17/2004 | US6778695 Design-based reticle defect prioritization |
| 08/17/2004 | US6778650 Circuit breaker remote service system |
| 08/17/2004 | US6778602 Multi-pair gigabit ethernet transceiver |
| 08/17/2004 | US6778406 Resilient contact structures for interconnecting electronic devices |
| 08/17/2004 | US6777997 Semiconductor integrated circuit and a burn-in method thereof |
| 08/17/2004 | US6777996 Radio frequency clamping circuit |
| 08/17/2004 | US6777971 High speed wafer sort and final test |
| 08/17/2004 | US6777970 AC testing of leakage current in integrated circuits using RC time constant |
| 08/17/2004 | US6777969 Low stress test mode |
| 08/17/2004 | US6777968 Probing method and probing apparatus in which steady load is applied to main chuck |
| 08/17/2004 | US6777967 Inspection method and inspection apparatus |
| 08/17/2004 | US6777964 Probe station |
| 08/17/2004 | US6777963 Chip-mounted contact springs |
| 08/17/2004 | US6777961 Thermopile infrared sensor and method for inspecting the same |
| 08/17/2004 | US6777954 Faulty wiring detection device for air conditioner |
| 08/17/2004 | US6777953 Parallel arc fault diagnostic for aircraft wiring |
| 08/17/2004 | US6777952 Method and apparatus for testing cables |
| 08/17/2004 | US6777950 System and method for verifying wire harness connections in a fuel injector assembly |
| 08/17/2004 | US6777949 Circuit board testing apparatus and method for testing a circuit board |
| 08/17/2004 | US6777948 Method and apparatus for detecting wear in components of high voltage electrical equipment |
| 08/17/2004 | US6777946 Cell buffer with built-in test |
| 08/17/2004 | US6777945 Handheld tester for starting/charging systems |
| 08/17/2004 | US6777944 System for measuring battery current for electric vehicle |
| 08/17/2004 | US6777941 Alternator testing method and system using timed application of load |
| 08/17/2004 | US6777924 Method and magazine device for testing semiconductor devices |
| 08/17/2004 | US6777914 Method for determining the state of charge of rechargeable batteries by integration of the amounts of current flowing during charging and discharging |
| 08/17/2004 | US6777708 Apparatus and methods for determining floating body effects in SOI devices |
| 08/17/2004 | US6777707 Semiconductor integrated circuit with voltage down converter adaptable for burn-in testing |
| 08/17/2004 | US6777677 Method of inspecting pattern and inspecting instrument |
| 08/17/2004 | US6776624 Socket for electrical parts |
| 08/17/2004 | US6776060 Electronic component sucking device and electronic component testing apparatus having the same |
| 08/17/2004 | US6775899 Method for inspecting printing state and substrate |
| 08/12/2004 | WO2004068162A2 System and method for identifying and location an acoustic event (sniper) |
| 08/12/2004 | WO2004068157A1 State variable and parameter estimator comprising several partial models for an electrical energy storage device |
| 08/12/2004 | WO2004068156A1 Boundary scan circuit with integrated sensor for sensing physical operating parameters |
| 08/12/2004 | WO2004068155A1 Probe device and display substrate testing apparatus using same |
| 08/12/2004 | WO2004068154A1 Tcp handling device and positional deviation correcting method for the same |
| 08/12/2004 | WO2004068150A1 Universal measuring adapter system |
| 08/12/2004 | WO2004055533B1 Automatic test equipment pin channel with t-coil compensation |
| 08/12/2004 | WO2004038822A3 Device and method of monitoring the starting capability of a vehicle’s starter battery |
| 08/12/2004 | US20040158804 Parameter oriented graphical representation of hardware timing and triggering capabilities with contextual information |
| 08/12/2004 | US20040158789 Using pseudo-pins in generating scan test vectors for testing an embedded core while maintaining the IP contained therein |
| 08/12/2004 | US20040158787 Method for implementing self-identifying self-test output |
| 08/12/2004 | US20040158784 Microprocessor based self-diagnostic port |
| 08/12/2004 | US20040158783 System and method for analyzing electrical failure data |
| 08/12/2004 | US20040158781 Method for determining line faults in a bus system and bus system |
| 08/12/2004 | US20040158774 Low power testing of very large circuits |
| 08/12/2004 | US20040158773 Test mode control device using nonvolatile ferroelectric memory |
| 08/12/2004 | US20040158426 Apparatus and method for muliple identical continuous records of characteristics on the surface of an object after selected stages of manufacture and treatment |
| 08/12/2004 | US20040158424 Apparatus and method for verification of system interconnect upon hot-plugging of electronic field replaceable units |
| 08/12/2004 | US20040158421 Crosstalk checking method |
| 08/12/2004 | US20040158418 Battery state diagnosing device and battery state diagnosing method |
| 08/12/2004 | US20040157475 Support member assembly for electroconductive contact members |
| 08/12/2004 | US20040157350 Method for forming photo-defined micro electrical contacts |
| 08/12/2004 | US20040157113 Apparatus and method for predicting the remaining discharge time of a battery |
| 08/12/2004 | US20040157091 Multi-stack isolation detection system |
| 08/12/2004 | US20040156539 Inspecting an array of electronic components |
| 08/12/2004 | US20040156461 Multi-pair gigabit ethernet transceiver |
| 08/12/2004 | US20040156431 Demodulator for a multi-pair gigabit transceiver |
| 08/12/2004 | US20040156430 Component measures |
| 08/12/2004 | US20040156153 Arc fault detection system |
| 08/12/2004 | US20040156152 Device for Error Detection and Locking of Power Breakers |
| 08/12/2004 | US20040156006 Electro-optical device, inspection method therefor, and electronic equipment |
| 08/12/2004 | US20040155838 Apparatus and method for testing pixels of flat panel display |
| 08/12/2004 | US20040155678 Domino logic compatible scannable flip-flop |
| 08/12/2004 | US20040155667 Universal electromagnetic resonance system for detecting and measuring local non-uniformities in metal and non-metal objects |
| 08/12/2004 | US20040155666 Method and apparatus for measuring thickness of thin films with improved accuracy |
| 08/12/2004 | US20040155661 Method and system for modeling energy transfer |
| 08/12/2004 | US20040155646 Testing apparatus and method for testing the contacting between a semiconductor device and a carrier |
| 08/12/2004 | US20040155626 Battery tester and sorting apparatus |
| 08/12/2004 | US20040155241 Test assembly for integrated circuit package |
| 08/12/2004 | US20040155240 Apparatus and method for measuring semiconductor wafer electrical properties |
| 08/12/2004 | DE202004009065U1 Short circuit indicator reset mechanism for monitoring power grid has moveable permanent magnet which resets display elements from signaling state to output state |
| 08/12/2004 | DE10328055A1 Zustandsgrößen- und Parameterschätzer mit mehreren Teilmodellen für einen elektrischen Energiespeicher State variable and parameter estimator with multiple models for an electrical energy storage |
| 08/12/2004 | DE10297044T5 Programmierbarer Testsockel Programmable test socket |
| 08/11/2004 | EP1445621A1 Parallel testing of integrated circuits |
| 08/11/2004 | EP1445620A1 Wafer-level burn-in or testing method using a burn-in or test cartridge |
| 08/11/2004 | EP1444729A2 Large area silicon carbide devices and manufacturing methods therefor |