| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/24/2004 | US6782500 Statistical decision system |
| 08/24/2004 | US6782498 Semiconductor memory device allowing mounting of built-in self test circuit without addition of interface specification |
| 08/24/2004 | US6782336 Test outputs using an idle bus |
| 08/24/2004 | US6782331 Graphical user interface for testing integrated circuits |
| 08/24/2004 | US6782329 Detection of arcing faults using bifurcated wiring system |
| 08/24/2004 | US6781953 Broadcast protocol for local area networks |
| 08/24/2004 | US6781902 Semiconductor memory device and method of testing short circuits between word lines and bit lines |
| 08/24/2004 | US6781899 Semiconductor memory device and test method therof |
| 08/24/2004 | US6781862 Semiconductor memory device |
| 08/24/2004 | US6781584 Recapture of a portion of a displayed waveform without loss of existing data in the waveform display |
| 08/24/2004 | US6781406 Using observability logic for real-time debugging of ASICs |
| 08/24/2004 | US6781401 TDDB test pattern and method for testing TDDB of MOS capacitor dielectric |
| 08/24/2004 | US6781400 Method of testing semiconductor integrated circuits and testing board for use therein |
| 08/24/2004 | US6781399 On-chip ADC test for image sensors |
| 08/24/2004 | US6781397 Electrical communication system for circuitry |
| 08/24/2004 | US6781396 Low-current probe card |
| 08/24/2004 | US6781395 Contactor with greater contact pressure (adhesive force) between the wiring substrate and the semiconductor device by providing a seal between a base member and the wiring substrate |
| 08/24/2004 | US6781394 Testing circuits on substrate |
| 08/24/2004 | US6781382 Electronic battery tester |
| 08/24/2004 | US6781381 Electric arc synthesis for arc detector testing and method for arc testing |
| 08/24/2004 | US6781365 Conductive material for integrated circuit fabrication |
| 08/24/2004 | US6781364 Electron device testing apparatus having high current and low current testing features |
| 08/24/2004 | US6781363 Memory sorting method and apparatus |
| 08/24/2004 | US6781362 Engine control device having voltage adjustment circuitry |
| 08/24/2004 | US6781344 Battery tester and sorting apparatus |
| 08/24/2004 | US6781151 Failure analysis vehicle |
| 08/24/2004 | US6781053 Test unit and enclosure for testing integrated circuits |
| 08/24/2004 | US6780660 System for testing electronic devices |
| 08/19/2004 | WO2004070779A2 Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits |
| 08/19/2004 | WO2004070775A2 Light-induced capacitance spectroscopy and method for obtaining carrier lifetime with micron/nanometer scale |
| 08/19/2004 | WO2004070741A2 Power measurement in a transformer coupled plasma source |
| 08/19/2004 | WO2004070407A1 Method and device for determining the charge that can be drawn from an energy accumulator |
| 08/19/2004 | WO2004070406A1 Detection device, detection method, and program |
| 08/19/2004 | WO2004070404A1 Test device |
| 08/19/2004 | WO2004070403A1 Apparatus and method for inspecting thin film transistor active matrix substrate |
| 08/19/2004 | WO2004070402A1 Harmonic diagnosing method for electric facility |
| 08/19/2004 | WO2004070400A1 Wrist joint for positioning a test head |
| 08/19/2004 | WO2004070398A2 Method and apparatus for characterizing a signal path carrying an operational signal |
| 08/19/2004 | WO2004070395A2 Testing of integrated circuits |
| 08/19/2004 | WO2004070343A2 System and method for measuring internal resistance of electrochemical devices |
| 08/19/2004 | WO2002099449A8 Apparatus and method for driving circuit pins in a circuit testing system |
| 08/19/2004 | US20040163120 Cable modem system with sample and packet synchronization |
| 08/19/2004 | US20040163066 Low voltage swing bus analysis method using static timing analysis tool |
| 08/19/2004 | US20040163023 Method and apparatus for defect analysis of semiconductor integrated circuit |
| 08/19/2004 | US20040163022 Low overhead input and output boundary scan cells |
| 08/19/2004 | US20040163021 Method and circuit for at-speed testing of scan circuits |
| 08/19/2004 | US20040163018 Error portion detecting method and layout method for semiconductor integrated circuit |
| 08/19/2004 | US20040162704 Stepper motor automated self-test routine |
| 08/19/2004 | US20040162696 Method and system for detecting incipient failures in a traction system |
| 08/19/2004 | US20040162693 Apparatus and method for determining effect of on-chip noise on signal propagation |
| 08/19/2004 | US20040162683 Method and apparatus for generalized recursive least-squares process for battery state of charge and state of health |
| 08/19/2004 | US20040162682 Method and apparatus for performing multi-site integrated circuit device testing |
| 08/19/2004 | US20040161866 Method for inspecting a wafer and apparatus for inspecting a wafer |
| 08/19/2004 | US20040161028 Method and apparatus for use in DSP-based testing |
| 08/19/2004 | US20040160916 Method and apparatus for transmitting information within a communication system |
| 08/19/2004 | US20040160895 Failure notification method and system in an ethernet domain |
| 08/19/2004 | US20040160827 Nonvolatile semiconductor memory device and method of retrieving faulty in the same |
| 08/19/2004 | US20040160331 Cable structure having a wear detection function |
| 08/19/2004 | US20040160240 Method and apparatus for defect analysis of semiconductor integrated circuit |
| 08/19/2004 | US20040160239 Integrated circuit early life failure detection by monitoring changes in current signatures |
| 08/19/2004 | US20040160238 Semiconductor apparatus |
| 08/19/2004 | US20040160237 Assembly for LSI test and method for the test |
| 08/19/2004 | US20040160231 Capacitance measurement system |
| 08/19/2004 | US20040160229 Voltage detecting apparatus applicable to a combination battery |
| 08/19/2004 | US20040160227 Apparatus and method for determining the status of an electric power cable |
| 08/19/2004 | US20040160226 Ergonomic multi-unit test fixture |
| 08/19/2004 | US20040160225 Combination battery, light bulb, and fuse tester |
| 08/19/2004 | US20040160224 Battery capacity calculating method |
| 08/19/2004 | US20040160219 Circuit for reducing leakage current in a processor |
| 08/19/2004 | US20040160215 Method for determination of the charge drawn by an energy storage battery |
| 08/19/2004 | US20040159591 Work inspection system |
| 08/19/2004 | DE202004006164U1 Insulation error detection arrangement for unearthed alternating voltage networks, whereby an internally generated test voltage is applied and differential current measured at each circuit output |
| 08/19/2004 | DE10309913B3 Defective automobile battery identification method using simultaneous evaluation of detected oscillatory variation in battery voltage and battery current |
| 08/19/2004 | DE10304604A1 Interference environment simulation method for a motor vehicle wiring system that is used for power supply and data transmission between components, wherein the interference impulses are simulated using statistical functions |
| 08/19/2004 | DE10303682A1 Verfahren zum Bewerten lateraler Dotier- und/oder Ladungsträgerprofile A method for evaluating lateral doping and / or carrier profiles |
| 08/19/2004 | DE102004004891A1 Detektionssystem zur Erfassung vorübergehender Leitungsunterbrechungen für die elektrische Anlage eines Fahrzeugs Detection system for detecting transient line breaks for the electrical system of a vehicle |
| 08/19/2004 | DE102004003963A1 Differentialer Hochspannungswandler zum Beispiel für ein PC-gesteuertes Messgerät Differential high-voltage transformer, for example, a PC-controlled measuring device |
| 08/19/2004 | DE10122049B4 Vorrichtung zum Verriegeln von zwei miteinander zu koppelnden Einrichtungen, insbesondere eines Testkopfs und einer Prüfeinrichtung A device for interlocking two to be coupled with each other facilities, in particular a test head of a test device and |
| 08/19/2004 | DE10106557B4 Testanordnung zum parallelen Hochfrequenztest einer Mehrzahl von Halbleiterbausteinen Test arrangement for parallel high-frequency test a plurality of semiconductor devices |
| 08/19/2004 | CA2513421A1 System and method for measuring internal resistance of electrochemical devices |
| 08/18/2004 | EP1447846A2 Socket and method for connecting electronic components |
| 08/18/2004 | EP1447814A1 Method and apparatus for testing embedded memory on devices with multiple processor cores |
| 08/18/2004 | EP1447809A1 Card with multiple IC's |
| 08/18/2004 | EP1447759A1 Generation of a testbench for a representation of a device |
| 08/18/2004 | EP1447673A2 Method and device for inspecting active matrix substrate |
| 08/18/2004 | EP1447672A1 Assembly for LSI test and method for the test |
| 08/18/2004 | EP1447671A1 Apparatus for monitoring an electric network |
| 08/18/2004 | EP1446856A2 Method and system for monitoring electrical appliances |
| 08/18/2004 | EP1446675A2 Determining electrical faults on undergrounded power systems using directional element |
| 08/18/2004 | EP1446672A1 Apparatus and method for handling and testing of wafers |
| 08/18/2004 | EP1327156B1 Method for isolating an integrated circuit element |
| 08/18/2004 | EP1181564A4 Multi-ended fault location system |
| 08/18/2004 | CN2634557Y Anti-theft alarm of electricity cut nonloaded line |
| 08/18/2004 | CN2634484Y 测试元件 Test elements |
| 08/18/2004 | CN1522483A Contact for spiral contactor and spiral contactor |
| 08/18/2004 | CN1522373A Conductive contact |
| 08/18/2004 | CN1522340A Coil on plug inductive sampling method and apparatus |
| 08/18/2004 | CN1521846A Semiconductor apparatus |
| 08/18/2004 | CN1521823A After-package test parametric analysis method |
| 08/18/2004 | CN1521625A Fault-tolerant computer system, re-synchronization method thereof and re-synchronization program thereof |