| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/31/2004 | US6784667 Estimated remaining lamp life indicator system |
| 08/31/2004 | US6784657 Handling apparatus and test set using the handling apparatus |
| 08/31/2004 | US6784656 Hybrid conductor-board for multi-conductor routing |
| 08/31/2004 | US6784640 Method and apparatus for indicating battery state of hybrid car |
| 08/31/2004 | US6784637 Battery charger/tester with storage media |
| 08/31/2004 | US6784006 Semiconductor device, method of manufacturing semiconductor device, and system for evaluating electrical characteristics of semiconductor device |
| 08/31/2004 | US6783316 Apparatus and method for testing semiconductor devices |
| 08/31/2004 | US6782614 Contact pin assembly, contact pin assembly manufacturing method, contact pin assembling structure, contact pin assembling structure manufacturing method, and socket for electrical parts |
| 08/26/2004 | WO2004073088A2 Method and system for modeling energy transfer |
| 08/26/2004 | WO2004073027A2 Microprocessor based self-diagnostic port |
| 08/26/2004 | WO2004072980A1 Multi-chip card |
| 08/26/2004 | WO2004072814A2 Arc fault detection system |
| 08/26/2004 | WO2004072670A1 Method and structure to develop a test program for semiconductor integrated circuits |
| 08/26/2004 | WO2004072669A1 Method and apparatus for testing integrated circuits |
| 08/26/2004 | WO2004072668A1 Mixed-signal-device testing |
| 08/26/2004 | WO2004072667A1 Boundary scan controller, semiconductor device, method for identifying semiconductor circuit chip of semiconductor device, and method for controlling semiconductor circuit chip of semiconductor device |
| 08/26/2004 | WO2004072666A1 Pattern inspecting sensor and inspecting device and inspecting metod using pattern inspecting sensor |
| 08/26/2004 | WO2004072665A1 Circuit check device, circuit check method, resistance measurement device, and resistance measurement method |
| 08/26/2004 | WO2004072660A2 Compressing test responses using a compactor |
| 08/26/2004 | WO2004059328A3 Composite motion probing |
| 08/26/2004 | WO2004051773A3 Method and apparatus for monitoring fuel cell voltages |
| 08/26/2004 | WO2003083904B1 Serial integrated scan-based testing of ink jet print head |
| 08/26/2004 | US20040168110 Inter-network and inter-protocol video conference privacy method, apparatus, and computer program product |
| 08/26/2004 | US20040168105 Tap and linking module for scan access of multiple cores with IEEE 1149.1 test access ports |
| 08/26/2004 | US20040168104 Method and apparatus for processor emulation |
| 08/26/2004 | US20040167764 Method and system for generating an atpg model of a memory from behavioral descriptions |
| 08/26/2004 | US20040167737 Pseudo noise generator |
| 08/26/2004 | US20040167729 Method and device of fault location |
| 08/26/2004 | US20040166771 Methods with resolution enhancement feature for improving accuracy of conversion of required chemical mechanical polishing pressure to force to be applied by polishing head to wafer |
| 08/26/2004 | US20040166702 Semiconductor device having external contact terminals and method for using the same |
| 08/26/2004 | US20040166682 Semiconductor device for charge-up damage evaluation and charge-up damage evaluation method |
| 08/26/2004 | US20040166663 Method for constructing a wafer-interposer assembly |
| 08/26/2004 | US20040165469 Semiconductor memory device and method for selecting multiple word lines in a semiconductor memory device |
| 08/26/2004 | US20040165458 Method and device for selecting the operating mode of an integrated circuit |
| 08/26/2004 | US20040165452 Semiconductor memory device including RAS guarantee circuit |
| 08/26/2004 | US20040165451 Semiconductor memory device |
| 08/26/2004 | US20040165329 Electronic load for the testing of electrochemical energy conversion devices |
| 08/26/2004 | US20040165071 Boundary scan device |
| 08/26/2004 | US20040164939 Display device comprising a plurality of leds |
| 08/26/2004 | US20040164762 Apparatus and method for managing liquid crystal substrate |
| 08/26/2004 | US20040164761 Method of measuring gate capacitance by correcting dissipation factor error |
| 08/26/2004 | US20040164760 Wireless radio frequency technique design and method for testing |
| 08/26/2004 | US20040164759 Prober |
| 08/26/2004 | US20040164756 Probe card transporting apparatus and to-be-connected body moving mechanism |
| 08/26/2004 | US20040164755 Circuit pattern inspection device, circuit pattern inspection method, and recording medium |
| 08/26/2004 | US20040164748 Variable impedance test probe |
| 08/26/2004 | US20040164747 Method and system for electrical length matching |
| 08/26/2004 | US20040164745 Method of diagnosing a fault on a transformer winding |
| 08/26/2004 | US20040164744 Abnormality detection apparatus of comparator |
| 08/26/2004 | US20040164742 Method and device for testing the quality of printed circuits |
| 08/26/2004 | US20040164741 Apparatus for detecting batteries in an uninterruptible power supply by utilizing voltage drop rate |
| 08/26/2004 | US20040164724 High-impedance mode for precision measurement unit |
| 08/26/2004 | US20040164723 Indexing device in semiconductor device handler and method for operating the same |
| 08/26/2004 | US20040164712 Method for checking power status of batteries |
| 08/26/2004 | US20040163927 Work measurement apparatus |
| 08/26/2004 | US20040163252 Contact carriers (tiles) for populating larger substrates with spring contacts |
| 08/26/2004 | US20040163244 Method of manufacturing and mounting electronic devices to limit the effects of parasitics |
| 08/26/2004 | US20040163241 Method of programming a programmable electronic device by an in-line program system |
| 08/26/2004 | DE4208146B4 Verfahren und Anordnung zum Messen einer Durchbruchspannung Method and apparatus for measuring a breakdown voltage |
| 08/26/2004 | DE19845108B4 Verfahren zur Ermittlung von CDM-Testdaten Method for determining by CDM test data |
| 08/26/2004 | DE10305116A1 Time measurement method, for semiconductor memory ball grid array tester, has dummy-load circuit to generate time reference signals to pin of semiconductor chip |
| 08/26/2004 | DE10295886T5 Wellenform-Digitalisierungsmodul vom A/D- Umwandlungs-Verschachtelungstyp und Prüfvorrichtung Waveform digitizer module from the A / D conversion Verschachtelungstyp and Tester |
| 08/26/2004 | DE102004005776A1 Isolationsdetektionssystem für eine Anordnung aus mehreren Stapeln Isolation detection system for an assembly of several stacks |
| 08/25/2004 | EP1450455A1 Method and electronic circuit for controlling of a supply voltage of a laser diode |
| 08/25/2004 | EP1450174A1 Battery state of charge indicator |
| 08/25/2004 | EP1450173A2 Method for determination of ageing of a battery |
| 08/25/2004 | EP1450172A1 Apparatus for producing an output current |
| 08/25/2004 | EP1450171A2 Wafer inspection device and wafer inspection method |
| 08/25/2004 | EP1449083A2 Method for debugging reconfigurable architectures |
| 08/25/2004 | EP1448999A1 Time resolved non-invasive diagnostics system |
| 08/25/2004 | EP1448998A2 Throughput enhancement after interruption |
| 08/25/2004 | EP1373915B1 Method of and apparatus for estimating the state of charge of a battery |
| 08/25/2004 | EP1232384A4 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool |
| 08/25/2004 | EP1199726B1 Method and apparatus for testing integrated circuits |
| 08/25/2004 | EP1102998B1 Closely-coupled multiple-winding magnetic induction-type sensor |
| 08/25/2004 | EP1064716A4 Electric motor monitoring circuit |
| 08/25/2004 | EP0880710B1 Battery management system and battery simulator |
| 08/25/2004 | EP0839323B1 Microelectronic spring contact elements |
| 08/25/2004 | CN2636253Y Discharge tester for accumulator |
| 08/25/2004 | CN2636252Y Needle disk connection adapter for circuit board tester |
| 08/25/2004 | CN1524185A A test handling apparatus and method |
| 08/25/2004 | CN1524184A Anionic polymers composed of dicarboxylic acids and uses thereof |
| 08/25/2004 | CN1524183A Testing a batch of electrical components |
| 08/25/2004 | CN1523672A 半导体集成电路器件 The semiconductor integrated circuit device |
| 08/25/2004 | CN1523653A Semiconductor device for charge-up damage evaluation and charge-up damage evaluation method |
| 08/25/2004 | CN1523614A Loading device of large-scale mobile electric generator load experimental-station |
| 08/25/2004 | CN1523368A Integrated testing circuit in integrated circuit |
| 08/25/2004 | CN1523367A Method for testing the performance and fault of EPROM |
| 08/25/2004 | CN1523366A Accurate trouble-locating method for electricity transmission lines with SC |
| 08/25/2004 | CN1523365A Thin-film sensor |
| 08/25/2004 | CN1523364A Online testing method for field programmable gate array assembly on circuit board and circuit board |
| 08/25/2004 | CN1523361A Probe, probe assembly method and probe plate |
| 08/25/2004 | CN1164083C Image signal processing device and picture element flaw detecting method |
| 08/25/2004 | CN1164004C Battery having built-in controller |
| 08/25/2004 | CN1163908C Non-volatile semiconductor memory |
| 08/25/2004 | CN1163759C Apparatus for managing group battery with accumulator |
| 08/25/2004 | CN1163758C Method for testing earthing resistance |
| 08/24/2004 | US6782515 Method for identifying test points to optimize the testing of integrated circuits using a genetic algorithm |
| 08/24/2004 | US6782502 Combinational test pattern generation method and apparatus |
| 08/24/2004 | US6782501 System for reducing test data volume in the testing of logic products |